J9CUNDP-1H

FCC ID

Equipment:

Qualcomm Technologies, Inc. UNDP-1H

5775 Morehouse Drive, San Diego, CA 92121 United States

Application
Frequency Range
Final Action Date
Granted
584PXx8mCvzN7/wmBoWtRQ==
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2008-01-23
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2008-01-23
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2008-01-23
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2008-01-23
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2008-01-23
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2008-01-23
APPROVED
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2008-05-16
APPROVED
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2008-05-16
APPROVED
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2008-05-16
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2008-05-16
APPROVED
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2008-05-16
APPROVED
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2008-05-16
APPROVED
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2008-07-08
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2008-07-08
APPROVED
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2008-07-08
APPROVED
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2008-07-08
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2008-07-08
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2008-07-08
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2008-07-30
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2008-10-21
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2008-10-21
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2008-10-21
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2008-10-21
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2008-10-21
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824.2-848.8
2009-04-23
APPROVED
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2009-04-23
APPROVED
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2009-04-23
APPROVED
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2009-04-23
APPROVED
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APPROVED
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APPROVED
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APPROVED
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2009-07-15
APPROVED
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2009-07-15
APPROVED
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2009-07-15
APPROVED
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2009-07-15
APPROVED
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2009-07-15
APPROVED
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2009-09-02
APPROVED
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2009-09-02
APPROVED
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824.7-848.31
2009-09-02
APPROVED
MGIS8z2TZ50zeIcX58cvmg==
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2009-09-02
APPROVED
MGIS8z2TZ50zeIcX58cvmg==
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2009-09-02
APPROVED
MGIS8z2TZ50zeIcX58cvmg==
1851.25-1908.75
2009-09-02
APPROVED
MGIS8z2TZ50zeIcX58cvmg==
1852.4-1907.5
2009-09-02
APPROVED
File NameDocument TypeDateDirect
RF Setup photosTest Setup Photos 2009-10-17 00:00:00 pdf
SAR PhotosTest Setup Photos 2009-10-17 00:00:00 pdf
Internal PhotosInternal Photos 2009-10-17 00:00:00 pdf
External PhotosExternal Photos 2009-10-17 00:00:00 pdf
SAR reportRF Exposure Info 2009-09-02 00:00:00 pdf
RF test reportTest Report 2009-09-02 00:00:00 pdf
Auth letterCover Letter(s) 2009-09-02 00:00:00 pdf
LabelID Label/Location Info 2009-09-02 00:00:00 pdf
Confidentiality requestCover Letter(s) 2009-09-02 00:00:00 pdf
Dielectric properties analysisRF Exposure Info 2009-09-02 00:00:00 pdf
C2PC cover letterCover Letter(s) 2009-09-02 00:00:00 pdf
Users ManualUsers Manual 2009-09-02 00:00:00 pdf
Collocated RF AnalysisRF Exposure Info 2009-09-02 00:00:00 pdf
Part 22 24 test reportTest Report 2009-07-15 00:00:00 pdf
Test Setup PhotosTest Setup Photos 2009-07-15 00:00:00 pdf
Host Manual 2 of 2Users Manual 2009-07-15 00:00:00 pdf
Host Manual 1 of 2Users Manual 2009-07-15 00:00:00 pdf
Request for confidentiality letterCover Letter(s) 2009-07-15 00:00:00 pdf
Class II permissive change cover letterCover Letter(s) 2009-07-15 00:00:00 pdf
Host LabelID Label/Location Info 2009-07-15 00:00:00 pdf
Label formatID Label/Location Info 2009-07-15 00:00:00 pdf
Co located analysisRF Exposure Info 2009-07-15 00:00:00 pdf
SAR Test Setup PhotosTest Setup Photos 2009-07-15 00:00:00 pdf
SAR Test ReportRF Exposure Info 2009-07-15 00:00:00 pdf
Co located TX assessmentRF Exposure Info 2009-04-23 00:00:00 pdf
SAR Probe Calibration FileRF Exposure Info 2009-04-23 00:00:00 pdf
SAR 1900 Dipole Calibration FileRF Exposure Info 2009-04-23 00:00:00 pdf
SAR 835 Dipole Calibration FileRF Exposure Info 2009-04-23 00:00:00 pdf
SAR Test PlotsRF Exposure Info 2009-04-23 00:00:00 pdf
User ManualUsers Manual 2009-06-05 00:00:00 pdf
RF Test Setup PhotosTest Setup Photos 2009-06-05 00:00:00 pdf
Internal Photos 3 of 3Internal Photos 2009-06-05 00:00:00 pdf
Internal Photo 2 of 3Internal Photos 2009-06-05 00:00:00 pdf
Internal Photo 1 of 3Internal Photos 2009-06-05 00:00:00 pdf
External photosExternal Photos 2009-06-05 00:00:00 pdf
Part 22 24 Test ReportTest Report 2009-04-23 00:00:00 pdf
ID labe format and locationID Label/Location Info 2009-04-23 00:00:00 pdf
updated Part 22 24 test reportTest Report 2008-10-21 00:00:00 pdf
Request letter for superseding old fileCover Letter(s) 2008-10-21 00:00:00 pdf
Wireless User ManualUsers Manual 2008-12-05 00:00:00 pdf
SAR Dipole calibration dataRF Exposure Info 2008-10-21 00:00:00 pdf
SAR 1900 probe calibration dataRF Exposure Info 2008-10-21 00:00:00 pdf
SAR 850 probe calibration dataRF Exposure Info 2008-10-21 00:00:00 pdf
FCC Label formatID Label/Location Info 2008-10-21 00:00:00 pdf
Authorization letterCover Letter(s) 2008-10-21 00:00:00 pdf
MPERF Exposure Info 2008-07-30 00:00:00 pdf
Host ManualUsers Manual 2008-07-30 00:00:00 pdf
Class II Permissive Change LetterCover Letter(s) 2008-07-30 00:00:00 pdf
Request for ConfidentialityCover Letter(s) 2008-07-30 00:00:00 pdf
Authorization LetterCover Letter(s) 2008-07-30 00:00:00 pdf
Host User ManualUsers Manual 2008-09-01 00:00:00 pdf
Part 22 24 test setup photosTest Setup Photos 2008-09-01 00:00:00 pdf
SAR Calibration dataRF Exposure Info 2008-07-08 00:00:00 pdf
Agent authorization letterCover Letter(s) 2008-07-08 00:00:00 pdf
Class II permissive change letterCover Letter(s) 2008-07-08 00:00:00 pdf
MPE CalculationRF Exposure Info 2008-05-16 00:00:00 pdf
Host ID labelID Label/Location Info 2008-05-16 00:00:00 pdf
Request For Short Term Confidentiality LetterCover Letter(s) 2008-01-23 00:00:00 pdf
FCC ID label formatID Label/Location Info 2008-01-23 00:00:00 pdf
Cover LetterCover Letter(s) 2008-01-23 00:00:00 pdf
Bios Lock LogicOperational Description N/A
WWAN Antenna SpecificationOperational Description N/A
Two Way Bios LockOperational Description N/A
Updated Tune Up ProcedureOperational Description N/A
WWAN antenna specificationParts List/Tune Up Info N/A
AntennaRegulatory infoOperational Description N/A
Bios LockOperational Description N/A
Antenna Specification 1 of 2Parts List/Tune Up Info N/A
Antenna Specification 2 of 2Parts List/Tune Up Info N/A
Bios Lock Theory of operationOperational Description N/A
Antenna SpecificationParts List/Tune Up Info N/A
Authenitcation theory of operationOperational Description N/A
Tune Up ProcedureParts List/Tune Up Info N/A
Module authenticationOperational Description N/A

Application Details:

EquipmentUNDP-1 PCI Express Mini Card
FRN0022707111
Grantee CodeJ9C
Product CodeUNDP-1H
Applicant BusinessQualcomm Technologies, Inc.
Business Address5775 Morehouse Drive , San Diego,California United States 92121
TCB ScopeB1: Commercial mobile radio services equipment in the following 47 CFR Parts 20, 22 (cellular), 24,25 & 27
TCB Email[email protected]
ApplicantPaul Guckian – Vice President, Regulatory Engineering
Applicant Phone
Applicant Fax858-651-1547
Applicant Email[email protected]
Applicant MailStop
Test FirmNemko USA, Inc.
Test Firm ContactRhonda Saxon
Test Firm Phone 226
Test Firm Fax858-452-1810
Test Firm Email[email protected]
Certified ByJohn Forrester – Senior Staff Engineer

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