VC3-KKSR100SE

FCC ID

Application Frequency Range	Final Action Date Granted
XdmZlJKbIPjsT+ImuexMMw== 2405.0-2475.0	2015-08-29 APPROVED
XdmZlJKbIPjsT+ImuexMMw== 13.56-13.56	2015-08-29 APPROVED

File Name	Document Type	Date	Direct
Letter of agency	Cover Letter(s)	2015-08-29 00:00:00	pdf
Attestation involved company names	Attestation Statements	2015-08-29 00:00:00	pdf
Attestation Product	Attestation Statements	2015-08-29 00:00:00	pdf
Confidentiality request	Cover Letter(s)	2015-08-29 00:00:00	pdf
Test report RFID R100-SE2 Rev. A	Test Report	2015-08-29 00:00:00	pdf
Test report RFID KS100-640-SE2 Rev. A	Test Report	2015-08-29 00:00:00	pdf
Test report RFID K100-622-SE2 Rev. A	Test Report	2015-08-29 00:00:00	pdf
Test report 2.4G R100-SE2	Test Report	2015-08-29 00:00:00	pdf
Test report 2.4G KS100-640-SE2	Test Report	2015-08-29 00:00:00	pdf
Test report 2.4G K100-622-SE2	Test Report	2015-08-29 00:00:00	pdf
Label and location info	ID Label/Location Info	2015-08-29 00:00:00	pdf
Block diagram	Block Diagram		N/A
External photos	External Photos		N/A
Internal photos 1	Internal Photos		N/A
Internal photos 2	Internal Photos		N/A
Operational description	Operational Description		N/A
Schematics	Schematics		N/A
Test setup photos	Test Setup Photos		N/A
User manual	Users Manual		N/A

Equipment	Aperio Cabinet Lock (K100-622-SE2), Aperio Server Cabinet Lock (KS100-640-SE2), Aperio Reader (K100-SE2)
FRN	0016535817
Grantee Code	VC3
Product Code	-KKSR100SE
Applicant Business	Hanchett Entry Systems, Inc.
Business Address	10027 S. 51st Street Suite 102, Phoenix,Arizona United States 85044
TCB Scope	A2: Low Power Transmitters (except Spread Spectrum) and radar detectors operating above 1 GHz
TCB Email	[email protected]
Applicant	Joshua T Peabody – Director R&D;
Applicant Phone	7115
Applicant Fax	623-582-4641
Applicant Email	[email protected]
Applicant MailStop
Test Firm	DELTA Development Technology AB
Test Firm Contact	Ulf Bjerke
Test Firm Phone
Test Firm Fax	4621314481
Test Firm Email	[email protected]
Certified By	Joshua T. Peabody – Director of R&D;