TCoil Test Report

FCC ID: ZNFUN160

Test Report

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FCCID_1852759

PCTEST ENGINEERING LABORATORY, INC. 6660-B Dobbin Road, Columbia, MD 21045 USA Tel. 410.290.6652 / Fax 410.290.6554 http://www.pctestlab.com HEARING AID COMPATIBILITY Applicant Name: Date of Testing: LG Electronics USA Novemeber 16-17, 2012 1000 Sylvan Avenue Test Site/Location: Englewood Cliffs, NJ 07632 PCTEST Lab, Columbia, MD, USA United States Test Report Serial No.: 0Y1211121637.ZNF FCC I D: ZNFUN160 APPLI C A NT: LG ELECTRONICS USA Scope of Test: Audio Band Magnetic Testing (T-Coil) FCC Rule Part(s): CFR § 20.19(b) HAC Standard: ANSI C63.19-2007 §6.3(v), §7.3(v) EUT Type: Portable Handset Model(s): UN160, LGUN160, LG-UN161, UN161, LGUN161 Tx Frequencies Tested: 824.70 - 848.31 MHz (Cellular CDMA) 1711.25 - 1753.75 MHz (AWS CDMA) 1851.25 - 1908.75 MHz (PCS CDMA) Test Device Serial No.: Pre-Production Sample [S/N: HAC #2 T-coil] C63.19-2007 HAC Category: T4 (SIGNAL TO NOISE CATEGORY) This wireless portable device has been shown to be hearing-aid compatible under the above rated category, specified in ANSI/IEEE Std. C63.19-2007 and had been tested in accordance with the specified measurement procedures. Hearing-Aid Compatibility is based on the assumption that all production units will be designed electrically identical to the device tested in this report. Test results reported herein relate only to the item(s) tested. For North American bands only. I attest to the accuracy of data. All measurements reported herein were performed by me or were made under my supervision and are correct to the best of my knowledge and belief. I assume full responsibility for the completeness of these measurements and vouch for the qualifications of all persons taking them. PCTEST certifies that no party to this application has been subject to a denial of Federal benefits that includes FCC benefits pursuant to Section 5301 of the Anti-Drug Abuse Act of 1988, 21 U.S.C. 862. Reviewed by: FCC ID: ZNFUN160 HAC (T-COIL) TEST REPORT Quality Manager Filename: Test Dates: EUT Type: Page 1 of 37 0Y1211121637.ZNF Novemeber 16-17, 2012 Portable Handset © 2012 PCTEST Engineering Laboratory, Inc. REV 6.4C 04/05/10

T A B L E O F C O N T E N T S 1. INTRODUCTION ............................................................................................................................. 3 2. TEST SITE LOCATION ................................................................................................................... 4 3. EUT DESCRIPTION ........................................................................................................................ 5 4. ANSI C63.19-2007 PERFORMANCE CATEGORIES .................................................................... 6 5. METHOD OF MEASUREMENT ...................................................................................................... 8 6. TEST SUMMARY .......................................................................................................................... 18 7. FCC 3G MEASUREMENTS .......................................................................................................... 22 8. MEASUREMENT UNCERTAINTY ................................................................................................ 23 9. EQUIPMENT LIST ......................................................................................................................... 24 10. CALIBRATION CERTIFICATES.................................................................................................... 25 11. CONCLUSION ............................................................................................................................... 32 12. REFERENCES .............................................................................................................................. 33 13. TEST SETUP PHOTOGRAPHS ................................................................................................... 35 Reviewed by: FCC ID: ZNFUN160 HAC (T-COIL) TEST REPORT Quality Manager Filename: Test Dates: EUT Type: Page 2 of 37 0Y1211121637.ZNF Novemeber 16-17, 2012 Portable Handset © 2012 PCTEST Engineering Laboratory, Inc. REV 6.4C 04/05/10

1. INTRODUCTION On July 10, 2003, the Federal Communications Commission (FCC) adopted new rules requiring wireless manufacturers and service providers to provide digital wireless phones that are compatible with hearing aids. The FCC has modified the exemption for wireless phones under the Hearing Aid Compatibility Act of 1998 (HAC Act) in WT Docket 01-309 RM-8658 1 to extend the benefits of wireless telecommunications to individuals with hearing disabilities. These benefits encompass business, social and emergency communications, which increase the value of the wireless network for everyone. Approximately 500 million people worldwide and 30 million people in the United States suffer from hearing loss. Compatibility Tests Involved: The standard calls for wireless communications devices to be measured for:  RF Electric-field emissions  RF Magnetic-field emissions  T-coil mode, magnetic-signal strength in the audio band  T-coil mode, magnetic-signal frequency response through the audio band  T-coil mode, magnetic-signal and noise articulation index The hearing aid must be measured for:  RF immunity in microphone mode  RF immunity in T-coil mode In the following tests and results, this report includes the evaluation for a wireless communications device. Figure 1-1 Hearing Aid in-vitu 1 FCC Rule & Order, WT Docket 01-309 RM-8658 Reviewed by: FCC ID: ZNFUN160 HAC (T-COIL) TEST REPORT Quality Manager Filename: Test Dates: EUT Type: Page 3 of 37 0Y1211121637.ZNF Novemeber 16-17, 2012 Portable Handset © 2012 PCTEST Engineering Laboratory, Inc. REV 6.4C 04/05/10

2. TEST SITE LOCATION I. Introduction The map at the right shows the location of the PCTEST LABORATORY in Columbia, Maryland. It is in proximity to the FCC Laboratory, the Baltimore-Washington International (BWI) airport, the city of Baltimore and Washington, DC (See Figure 2-1). These measurement tests were conducted at the PCTEST Engineering Laboratory, Inc. facility in New Concept Business Park, Guilford Industrial Park, Columbia, Maryland. The site address is 6660-B Dobbin Road, Columbia, MD 21045. The test site is one of the highest points in the Columbia area with an elevation of 390 feet above mean sea level. The site coordinates are 39° 11’15” N latitude and 76° 49’ 38” W longitude. The facility is 1.5 miles north of the FCC laboratory, and the ambient signal and ambient signal strength are approximately equal to those of the FCC laboratory. There are no FM or TV transmitters within 15 miles of the site. The Figure 2-1 detailed description of the measurement facility was found to be in Map of the Greater Baltimore compliance with the requirements of § 2.948 according to ANSI and Metropolitan Washington, C63.4-2003 on January 27, 2006 and Industry Canada. D.C. Area II. Test Facility / Accreditations: Measurements were performed at an independent accredited PCTEST Engineering Lab located in Columbia, MD 21045, U.S.A. • PCTEST Lab is accredited to ISO 17025-2005 by the American Association for Laboratory Accreditation (A2LA) in Specific Absorption Rate (SAR) testing, Hearing- Aid Compatibility (HAC), CTIA Test Plans, and wireless testing for FCC and Industry Canada Rules. • PCTEST Lab is accredited to ISO 17025 by U.S. National Institute of Standards and Technology (NIST) under the National Voluntary Laboratory Accreditation Program (NVLAP Lab code: 100431-0) in EMC, FCC and Telecommunications. • PCTEST facility is an FCC registered (PCTEST Reg. No. 90864) test facility with the site description report on file and has met all the requirements specified in Section 2.948 of the FCC Rules and Industry Canada (IC-2451). • PCTEST Lab is a recognized U.S. Conformity Assessment Body (CAB) in EMC and R&TTE (n.b. 0982) under the U.S.-EU Mutual Recognition Agreement (MRA). • PCTEST TCB is a Telecommunication Certification Body (TCB) accredited to ISO/IEC Guide 65 by the American National Standards Institute (ANSI) in all scopes of FCC Rules and all Industry Canada Standards (RSS). • PCTEST facility is an IC registered (IC-2451) test laboratory with the site description on file at Industry Canada. • PCTEST is a CTIA Authorized Test Laboratory (CATL) for AMPS and CDMA, and EvDO mobile phones. • PCTEST is a CTIA Authorized Test Laboratory (CATL) for Over-the-Air (OTA) Antenna Performance testing for AMPS, CDMA, GSM, GPRS, EGPRS, UMTS (W- CDMA), CDMA 1xEVDO Data, CDMA 1xRTT Data. Reviewed by: FCC ID: ZNFUN160 HAC (T-COIL) TEST REPORT Quality Manager Filename: Test Dates: EUT Type: Page 4 of 37 0Y1211121637.ZNF Novemeber 16-17, 2012 Portable Handset © 2012 PCTEST Engineering Laboratory, Inc. REV 6.4C 04/05/10

k EUT DESCRIPTION @ 1c FCC ID: ZNFUN160 Applicant: LG Electronics USA 1000 Sylvan Avenue Englewood Cliffs, NJ 07632 United States Model(s): UN160, LGUN160, LG—UN161, UN161, LGUN161 Serial Number: HAC #2 T—coil Tx Frequencies Tested: 824.70 — 848.31 MHz (Cellular CDMA) 1711.25 — 1753.75 MHz (AWS CDMA) 1851.25 — 1908.75 MHz (PCS CDMA) HW Version: Revision B SW Version: UN160C01 24.82 dBm (Cell. CDMA), 24.93 dBm (AWS CDMA), 25.1 Maximum Conducted Power (HAC): dBm (PCS CDMA) Antenna: Internal Antenna HAC Test Configurations: Cell. CDMA, 1013, 384, 777, BT Off AWS CDMA, 25, 450, 875, BT Off PCS CDMA, 25, 600, 1175, BT Off EUT Type: Portable Handset Ai—Interface Band Type C63.19 Simultaneous Transmissions R:::’c:rd Vom_:g::;::_'tg'tal (MHz) tested (Not to be tested) 2048 (GG) (Data) 850 CDMA 1700 Voice Yes Yes: BT N/A N/A 1900 BI 2450 Data N/A Yes: CDMA N/A N/A NOTE: HAC Rating was not based on concurrent vaice and data modes. Standalone made was found to represent worst case rating. Table 3: ZNFUN160 Air Interfaces Reviewed by: FCC ID: ZNFUN160 HAC (T—COIL} TEST REPORT . Quality Manager Filename: Test Dates: EUT Type: Page 5 of 37 0Y1211121637.2NF Novemeber 16—17, 2012 Portable Handset 9 © 2012 PCTEST Engineering Laboratory, Inc. REV 6.4C 04/05710

4. ANSI C63.19-2007 PERFORMANCE CATEGORIES I. MAGNETIC COUPLING Axial and Radial Field Intensity All orientations of the magnetic field, in the axial, horizontal and vertical position along the measurement plane shall be ≥ -18 dB(A/m) at 1 kHz in a 1/3 octave band filter per 7.3.1. Frequency Response The frequency response of the axial component of the magnetic field shall follow the response curve specified in EIA RS-504-1983, over the frequency range 300 Hz – 3000 Hz per 7.3.2. MAGNETIC FIELD STRENGTH RELATIVE TO 1000 Hz 20 dB Relative to Value at 1 kHz -4 dB/Oct. 10 +2 dB -2 dB 0 -6 dB/Oct. -10 6 dB/Oct. -20 300 500 1000 2000 3000 FREQUENCY (Hz) Figure 4-1 Magnetic field frequency response for Wireless Devices with an axial field ≤ -15 dB (A/m) at 1 kHz MAGNETIC FIELD STRENGTH RELATIVE TO 1000 Hz 20 -4 dB/Oct. dB Relative to Value at 1 kHz 10 +2 dB -2 dB 0 -7 dB/Oct. -10 6 dB/Oct. -12 dB/Oct. -20 300 500 1000 2000 3000 FREQUENCY (Hz) Figure 4-2 Magnetic Field frequency response for wireless devices with an axial field that exceeds -15 dB(A/m) at 1 kHz Reviewed by: FCC ID: ZNFUN160 HAC (T-COIL) TEST REPORT Quality Manager Filename: Test Dates: EUT Type: Page 6 of 37 0Y1211121637.ZNF Novemeber 16-17, 2012 Portable Handset © 2012 PCTEST Engineering Laboratory, Inc. REV 6.4C 04/05/10

Signal Quality The table below provides the signal quality requirement for the intended audio magnetic signal from a wireless device. Only the RF immunity of the hearing aid is measured in T-coil mode. It is assumed that a hearing aid can have no immunity to an interference signal in the audio band, which is the intended reception band for this mode. The only criterion that can be measured is the RF immunity in T-coil mode. This is measured using the same procedure as the audio coupling mode at the same levels. The signal quality of the axial and radial components of the magnetic field was used to determine the T-coil mode category. Telephone RF Parameters Category Wireless Device Signal Quality (Signal + Noise-to-noise ratio in dB) T1 0 to 10 dB T2 10 to 20 dB T3 20 to 30 dB T4 > 30 dB Table 4-1 Magnetic Coupling Parameters Reviewed by: FCC ID: ZNFUN160 HAC (T-COIL) TEST REPORT Quality Manager Filename: Test Dates: EUT Type: Page 7 of 37 0Y1211121637.ZNF Novemeber 16-17, 2012 Portable Handset © 2012 PCTEST Engineering Laboratory, Inc. REV 6.4C 04/05/10

5. METHOD OF MEASUREMENT I. Test Setup The equipment was connected as shown in an acoustic/RF hemi-anechoic chamber: Figure 5-1 Validation Setup with Helmholtz Coil Figure 5-2 T-Coil Test Setup Reviewed by: FCC ID: ZNFUN160 HAC (T-COIL) TEST REPORT Quality Manager Filename: Test Dates: EUT Type: Page 8 of 37 0Y1211121637.ZNF Novemeber 16-17, 2012 Portable Handset © 2012 PCTEST Engineering Laboratory, Inc. REV 6.4C 04/05/10

II. Scanning Mechanism Manufacturer: TEM Accuracy: + 0.83 cm/meter Minimum Step Size: 0.1 mm Maximum speed 6.1 cm/sec Line Voltage: 115 VAC Line Frequency: 60 Hz Material Composite: Delrin (Acetal) Data Control: Parallel Port Figure 5—3 Dynamic Range (X—Y—Z2): 45 x 31.75 x 47 cm RF Near—Field Scanner Dimensions: 36" x 25" x 38" Operating Area: 36" x 49" x 55" Reflections: <—20 dB (in anechoic chamber) IIL. ITU—T P.50 Artificial Voice Manufacturer: ITU—T Active Frequency 100 Hz —8 kHz Range: Stimulus Type: Male and Female, no spaces Single Sample Duration: 20.96 seconds Activity Level: 100% Figur; 5—4 Spectral Characteristic of full P.50 Figure 5—5 Temporal Characteristic of full P.50 £) RCTEsT — Reviewed by: : © HAC (T—COIL} TEST REPORT Li FGG ID: ZNFUN160 J\’— T ) @ 6 Quality Manager i Filename : Test Dates : EUT Type: ype Page 9 of 37 0Y1211121637.2NF Novemeber 16—17, 2012 Portable Handset ©2012 PCTEST Engineering Laboratory, Inc. REV 6.4C 04/05710

ABM1 Measurement Block Diagram: Raw Probe Measurement (mV) T-Coil Probe 1 kHz bin, 1kHz through 40 40 dB Sensitivity Factor 1/3-octave ABM1 WD dB pre-gain factor (-59.09 dBV/A/m) filter ABM2 Measurement Block Diagram: Raw Probe Measurement (mV) T-Coil Probe 40 dB 40 Half-Band IEC179 100Hz-10kHz noise Sensitivity Factor pre-gain ABM2 dB Integrator curve A-weighting curve Power Sum (-59.09 dBV/A/m) factor Figure 5-6 Magnetic Measurement Processing Steps IV. Test Procedure 1. Ambient Noise Check per C63.19 §6.2.1 a. Ambient interference was monitored using a Real-Time Analyzer between 100-10,000 Hz with 1/3 octave filtering. b. “A-weighting” and Half-Band Integration was applied to the measurements. c. Since this measurement was measured in the same method as ABM2 measurements, this level was verified to be less than 10 dB below the lowest measurement signal (which is the highest ABM2 measurement for a T4 WD). Therefore the maximum noise level for a T4 WD with an ABM1 = -18 dBA/m is: -18 - 30 - 10 = -58 dBA/m 2. Measurement System Validation (See Figure 5-1) a. The measurement system including the probe, pre-amplifier and acquisition system were validated as an entire system to ensure the reliability of test measurements. b. ABM1 Validation The magnetic field at the center of the Helmholtz coil is given by the equation (per C63.19 Annex D.9.1): V N( ) NI R Hc = = 3 r 1.25 r 1.25 3 Where Hc = magnetic field strength in amperes per meter N = number of turns per coil For the Helmholtz Coil, N=20; r=0.08m; R=10.193Ω and using V=57mV: 0.057 20 ⋅ ( ) Hc = 10.193 = 1.0003 A / m 0.08 ⋅ 1.25 3 Therefore a pure tone of 1kHz was applied into the coils such that 57 mV was observed across the 10 Ω resistor. The voltmeter used for measurement was verified to be capable of measurements in the audio band range. This theoretically generates an expected field of 1 A/m in the center of the Helmholtz coil which was used to validate the probe Reviewed by: FCC ID: ZNFUN160 HAC (T-COIL) TEST REPORT Quality Manager Filename: Test Dates: EUT Type: Page 10 of 37 0Y1211121637.ZNF Novemeber 16-17, 2012 Portable Handset © 2012 PCTEST Engineering Laboratory, Inc. REV 6.4C 04/05/10

measurement at 1 A/m. This was verified to be within ± 0.5 dB of the 1 A/m value (see Page 19). c. Frequency Response Validation The frequency response through the Helmholtz Coil was verified to be within 0.5 dB relative to 1 kHz, between 300 – 3000 Hz using the ITU-P.50 artificial speech signal as shown below: Frequency P.50 Helmholtz 40 Probe 40 dB Full-Band Subtract P.50 Response of Sensitivity pre-gain Integrator stimulus stimulus Coil dB factor curve Helmholtz (-59.09 dBV/A/m) frequency Coil character Figure 5-7 Frequency Response Validation d. ABM2 Measurement Validation WD noise measurements are filtered with A-weighting and Half-Band Integration over a frequency range of 100Hz – 10kHz to process ABM2 measurements. Below is the verification of the system processing A-weighting and Half-Band integration between system input to output within 0.5 dB of the theoretical result: Table 5-1 ABM2 Frequency Response Validation HBI, A - HBI, A - f (Hz) Measured Theoretical dB Var. (dB re 1kHz) (dB re 1kHz) 100 -16.180 -16.170 -0.010 125 -13.257 -13.250 -0.007 160 -10.347 -10.340 -0.007 200 -8.017 -8.010 -0.007 250 -5.925 -5.920 -0.005 315 -4.045 -4.040 -0.005 400 -2.405 -2.400 -0.005 500 -1.212 -1.210 -0.002 630 -0.349 -0.350 0.001 800 0.071 0.070 0.001 1000 0.000 0.000 0.000 1250 -0.503 -0.500 -0.003 1600 -1.513 -1.510 -0.003 2000 -2.778 -2.780 0.002 2500 -4.316 -4.320 0.004 3150 -6.166 -6.170 0.004 4000 -8.322 -8.330 0.008 5000 -10.573 -10.590 0.017 6300 -13.178 -13.200 0.022 8000 -16.241 -16.270 0.029 10000 -19.495 -19.520 0.025 Reviewed by: FCC ID: ZNFUN160 HAC (T-COIL) TEST REPORT Quality Manager Filename: Test Dates: EUT Type: Page 11 of 37 0Y1211121637.ZNF Novemeber 16-17, 2012 Portable Handset © 2012 PCTEST Engineering Laboratory, Inc. REV 6.4C 04/05/10

ABM2 Frequency Response Validation (LISTEN) 10 0 100 1000 10000 -10 dBV, A weighted, HBI -20 -30 HBI, A - Measured HBI, A - Theoretical -40 -50 Frequency (Hz) Figure 5-8 ABM2 Frequency Response Validation The ABM2 result is a power sum from 100 Hz to 10 kHz with half-band integration and A- weighting. To verify the power sum measurement, a power sum over the full band was measured and verified to track with the source level (See Figure 5-9). Therefore the setup in this step was used to verify the power sum post-processing for ABM2 measurements. See below block diagram: Half-Band IEC179 100Hz-10kHz noise “ABM2” Integrator curve A-weighting curve Power Sum Half-Band IEC179 ABM2 noise Multmeter Integrator curve A-weighting curve using MM Figure 5-9 ABM2 Validation Block Diagram The power summed output results for a known input were compared to the multi-meter results to verify any deviation in the post-processing implemented with the power-sum. Table 5-2 ABM2 Power Sum Validation WN Input Power Sum Multimeter-Full Dev (dB) (dBV) (dBV) (dBV) -60 -60.36 -60.2 0.16 -50 -50.19 -50.13 0.06 -40 -40.14 -40.03 0.11 -30 -30.13 -30.01 0.12 -20 -20.12 -20 0.12 -10 -10.14 -10 0.14 Reviewed by: FCC ID: ZNFUN160 HAC (T-COIL) TEST REPORT Quality Manager Filename: Test Dates: EUT Type: Page 12 of 37 0Y1211121637.ZNF Novemeber 16-17, 2012 Portable Handset © 2012 PCTEST Engineering Laboratory, Inc. REV 6.4C 04/05/10

ABM2 Power Sum Validation (LISTEN) -10 -20 -30 Measured Level (dBV) -40 Power Sum (dBV) Multimeter-Full (dBV) -50 -60 -70 -60 -55 -50 -45 -40 -35 -30 -25 -20 -15 -10 WN Input (dBV) Figure 5-10 ABM2 Power Sum Validation 3. Measurement Test Setup a. Fine scan above the WD (TEM) i. A multitone signal was applied to the handset such that the phone acoustic output was stable within 1dB over the probe settling time and with the acoustic output level at the C63.19 specified levels (below). The measurement step size was in 2 mm increments at a distance of 10 mm between the surface of the wireless device as shown below: T-Coil Probe T-coil Element 10 mm Wireless Device Figure 5-11 Measurement Distance . ii. After scanning, the planar field maximum point was determined. The position of the probe was moved to this location to setup the test using the sound check system. iii. These steps were repeated for the other T-coil orientations (of axial, radial transverse, or radial longitudinal) per Figure 5-16 after a T-coil orientation was fully measured with the sound check system. Reviewed by: FCC ID: ZNFUN160 HAC (T-COIL) TEST REPORT Quality Manager Filename: Test Dates: EUT Type: Page 13 of 37 0Y1211121637.ZNF Novemeber 16-17, 2012 Portable Handset © 2012 PCTEST Engineering Laboratory, Inc. REV 6.4C 04/05/10

b. Speech Signal Setup to Base Station Simulator i. C63.19 Table 6-1 states audio reference input levels for various technologies: Input Level Standard Technology (dBm0) TIA/EIA/IS-2000 CDMA -18 J-STD-007 GSM (217 Hz) -16 T1/T1P1/3GPP UMTS (WCDMA) -16 iDENTM TDMA (22 and 11 Hz) -18 The CMU200 audio levels were determined using base station simulator manufacturer calibration procedures resulting in the below corresponding voltages relative to handset test point level (in dBm0): Table 5-3 CMU200 Voltage Input Levels for Audio dBm0 Ref. Input Voltage Notes From CDMA2K "DECODER CAL". 3.14 dBm0 1052.0 mV 0.4 dBV (What is needed through Encoder for FS) -18 dBm0 92.260 mV -20.7 dBV For 8k Enhanced (Low) c. Real-Time Analyzer (RTA) i. The Real-Time Analyzer was configured to analyze measurements using 1/3 Octave band weighted filtering. d. WD Radio Configuration Selection i. The device was chosen to be tested in the worst-case ABM2 condition under RC1/SO3 (EVRC) (see below): Figure 5-12 Vocoder Analysis for ABM Noise 4. Signal Quality Data Analysis a. Narrow-band Magnetic Intensity i. The standard specifies a 1 kHz 1/3 octave band minimum field intensity for a sine tone. The ABM1 measurements were evaluated at 1kHz with 1/3 octave band filtering over an averaged period of 10 seconds. b. Frequency Response i. The appropriate frequency response curve was measured to curves in Figure 4-1 or Figure 4-2 between 300 – 3000 Hz using digital linear averaging (limit lines Reviewed by: FCC ID: ZNFUN160 HAC (T-COIL) TEST REPORT Quality Manager Filename: Test Dates: EUT Type: Page 14 of 37 0Y1211121637.ZNF Novemeber 16-17, 2012 Portable Handset © 2012 PCTEST Engineering Laboratory, Inc. REV 6.4C 04/05/10

chosen according to measurement found in step 4a.) A linear average over 3x the length of the artificial voice signal (3x sampling) was performed. A 10 second delay was configured in the measurement process of the stimulus to ensure handset vocoder latency effects and echo cancellation devices (if any) were appropriately stabilized during measurements. ii. The appropriate post-processing was applied according to the system processing chain illustrated in Figure 5-13. All R10 frequencies were plotted with respect to 0dB at 1 kHz value and aligned with respect to the EIA-504 mask. Probe 40 dB Full-Band Subtract P.50 Frequency P.50 40 WD Sensitivity pre-gain Integrator stimulus Response of stimulus dB factor curve (-59.09 dBV/A/m) frequency the WD character Figure 5-13 Frequency Response Block Diagram iii. The margin is represented by the closest measured data point on the curve to the EIA-504 limit lines, in dB. c. Signal Quality Index i. Ensuring the WD was at maximum RF power, maximum volume, backlight on, display on, maximum contrast setting, keypad lights on (when possible) with no audio signal through the vocoder, the WD was measured over at least 100 Hz – 10,000 Hz, maximized over 5 seconds with a 50ms sample time for the ABM2 measurement (5 second time period is used in noise measurements under standards such as IEEE 269, etc.) ii. After applying half-band integration and A-weighting to the result, a power sum was applied over each 1/3 octave bandwidth frequency for an ABM2 value iii. This result was subtracted from the ABM1 result in step a, to obtain the Signal Quality. V. Test Setup Integrator 1/3 Octave Bandpass Filter Probe Coil (Shown in Axial Position) RMS Voltmeter Wireless Device Graphics Recorder Reference Signal Base Station Antenna replaced Source Simulator with Coaxial Connection Controller Figure 5-14 Audio Magnetic Field Test Setup VI. Deviation from C63.19 Test Procedure Non-conducted RF connection. Reviewed by: FCC ID: ZNFUN160 HAC (T-COIL) TEST REPORT Quality Manager Filename: Test Dates: EUT Type: Page 15 of 37 0Y1211121637.ZNF Novemeber 16-17, 2012 Portable Handset © 2012 PCTEST Engineering Laboratory, Inc. REV 6.4C 04/05/10

VII. Wireless Device Channels and Frequencies The frequencies listed in the table below are those that lie in the center of the bands used for cellular telephony. Low, middle and high channels were tested in each band for FCC compliance evaluation to ensure the maximum emission is captured across the entire band. To facilitate setting of a base station simulator for ABM measurements, specific band plan channel numbers are listed that may be used in lieu of the band center frequencies. Table 5-4 Center Channels and Frequencies Test frequencies & associated channels Frequency Channel (MHz) Cellular 850 384 (CDMA) 836.52 PCS 1900 600 (CDMA) 1880 AWS 1750 450 (CDMA) 1732.50 VIII. RF Emission Effect on T-coil Measurements Figure 5-15 High power RF Emissions Effect with HAC Dipole on the T-coil Probe System 10mm between dipole maximum and magnetic probe Reviewed by: FCC ID: ZNFUN160 HAC (T-COIL) TEST REPORT Quality Manager Filename: Test Dates: EUT Type: Page 16 of 37 0Y1211121637.ZNF Novemeber 16-17, 2012 Portable Handset © 2012 PCTEST Engineering Laboratory, Inc. REV 6.4C 04/05/10

IX. Test Flow The flow diagram below was followed (From C63.19): ♦ Confirm calibration of test equipment ♦ Configure and validate test setup ♦ Establish WD reference level ♦ Scan for measurement locations ♦ Position and orient probe ♦ Measure desired audio band Signal strength ♦ Measure undesired audio Band signal strength ♦ Calculate signal strength ♦ Calculate signal quality ♦ Measure frequency response All 3 locations measured? N Y Intensity and Frequency response N compliant? Y Determine and record signal Done Quality category Figure 5-16 C63.19 T-Coil Signal Test Process Reviewed by: FCC ID: ZNFUN160 HAC (T-COIL) TEST REPORT Quality Manager Filename: Test Dates: EUT Type: Page 17 of 37 0Y1211121637.ZNF Novemeber 16-17, 2012 Portable Handset © 2012 PCTEST Engineering Laboratory, Inc. REV 6.4C 04/05/10

6. TEST SUMMARY I. T-Coil Test Summary Table 6-1 Table of Results Minimum C63.19 Sec. Mode Band Test Description Measured Verdict Limit* dBA/m dBA/m PASS/FAIL 7.3.1.1 Intensity, Axial -18 -4.5 PASS 7.3.1.2 Intensity, RadialH -18 -13.3 PASS 7.3.1.2 Intensity, RadialV -18 -14.4 PASS 7.3.3 CDMA Cellular Signal-to-Noise/Noise, Axial 20 51.7 PASS 7.3.3 Signal-to-Noise/Noise, RadialH 20 45.3 PASS 7.3.3 Signal-to-Noise/Noise, RadialV 20 36.8 PASS 7.3.2 Frequency Response, Axial 0 1.8 PASS 7.3.1.1 Intensity, Axial -18 -5.4 PASS 7.3.1.2 Intensity, RadialH -18 -13.3 PASS 7.3.1.2 Intensity, RadialV -18 -14.1 PASS 7.3.3 CDMA PCS Signal-to-Noise/Noise, Axial 20 50.5 PASS 7.3.3 Signal-to-Noise/Noise, RadialH 20 45.9 PASS 7.3.3 Signal-to-Noise/Noise, RadialV 20 36.1 PASS 7.3.2 Frequency Response, Axial 0 1.8 PASS 7.3.1.1 Intensity, Axial -18 -4.5 PASS 7.3.1.2 Intensity, RadialH -18 -13.0 PASS 7.3.1.2 Intensity, RadialV -18 -14.0 PASS 7.3.3 CDMA AWS Signal-to-Noise/Noise, Axial 20 52.4 PASS 7.3.3 Signal-to-Noise/Noise, RadialH 20 45.3 PASS 7.3.3 Signal-to-Noise/Noise, RadialV 20 37.7 PASS 7.3.2 Frequency Response, Axial 0 1.8 PASS Note: The above summary table represents the worst-case numerical values according to configurations in Table 6-3. Table 6-2 Consolidated Tabled Results Volume Cellular AWS PCS Setting Axial RadialH RadialV Axial RadialH RadialV Axial RadialH RadialV Freq. Response Margin PASS PASS PASS PASS PASS PASS PASS PASS PASS Magnetic Intensity Verdict Maximum PASS PASS PASS PASS PASS PASS PASS PASS PASS FCC SNR Verdict PASS PASS PASS PASS PASS PASS PASS PASS PASS Note: The above table represents the pass/fail verdict according to data in Table 6-3. Reviewed by: FCC ID: ZNFUN160 HAC (T-COIL) TEST REPORT Quality Manager Filename: Test Dates: EUT Type: Page 18 of 37 0Y1211121637.ZNF Novemeber 16-17, 2012 Portable Handset © 2012 PCTEST Engineering Laboratory, Inc. REV 6.4C 04/05/10

II. Raw Handset Data Table 6-3 Raw Data Results Cellular Band Volume Axial RadialH RadialV 1013 384 777 1013 384 777 1013 384 777 ABM1, dBA/m -4.37 -3.99 -4.46 -13.27 -12.69 -12.95 -13.26 -13.44 -14.35 ABM2, dBA/m -56.41 -56.87 -56.17 -58.55 -58.85 -58.83 -51.30 -51.92 -51.13 Ambient Noise, dBA/m -60.36 -60.36 -60.36 -61.44 -61.44 -61.44 -60.80 -60.80 -60.80 Freq. Response Margin 1.88 2.00 1.80 1.88 1.76 1.86 2.00 1.93 1.88 (dB) Maximum S+N/N (dB) 52.04 52.88 51.71 45.28 46.16 45.88 38.04 38.48 36.78 S+N/N per orientation 51.71 45.28 36.78 (dB) PCS Band Volume Axial RadialH RadialV 25 600 1175 25 600 1175 25 600 1175 ABM1, dBA/m -4.33 -5.39 -4.73 -12.71 -13.07 -13.27 -13.37 -13.53 -14.08 ABM2, dBA/m -55.06 -56.33 -55.19 -58.59 -58.93 -59.42 -50.28 -51.37 -50.19 Ambient Noise, dBA/m -60.36 -60.36 -60.36 -61.44 -61.44 -61.44 -60.80 -60.80 -60.80 Freq. Response Margin 1.94 2.00 1.84 1.79 1.97 1.76 2.00 1.96 1.96 (dB) Maximum S+N/N (dB) 50.73 50.94 50.46 45.88 45.86 46.15 36.91 37.84 36.11 S+N/N per orientation 50.46 45.86 36.11 (dB) AWS Band Volume Axial RadialH RadialV 25 450 875 25 450 875 25 450 875 ABM1, dBA/m -4.24 -4.51 -4.16 -13.03 -12.83 -12.83 -14.04 -13.24 -14.04 ABM2, dBA/m -56.59 -57.69 -56.85 -58.33 -58.98 -59.19 -51.73 -53.74 -53.16 Ambient Noise, dBA/m -60.36 -60.36 -60.36 -61.44 -61.44 -61.44 -60.80 -60.80 -60.80 Freq. Response Margin Maximum 1.98 1.99 1.84 1.99 1.70 2.00 1.77 1.85 1.91 (dB) S+N/N (dB) 52.35 53.18 52.69 45.30 46.15 46.36 37.69 40.50 39.12 S+N/N per orientation 52.35 45.3 37.69 (dB) [x,y] from T-coil Coordinates (cm) 2.9,2.6 2.7,3.1 3.2,2.7 bottom left Note: ABM1 >> Ambient noise WD Configuration 1. Radio Configuration: RC1/SO3 (EVRC) 2. Power Configuration: Power Control Bits = "All Up" 3. Phone Condition: Mute on; Backlight on; Max Volume, Max Contrast Reviewed by: FCC ID: ZNFUN160 HAC (T-COIL) TEST REPORT Quality Manager Filename: Test Dates: EUT Type: Page 19 of 37 0Y1211121637.ZNF Novemeber 16-17, 2012 Portable Handset © 2012 PCTEST Engineering Laboratory, Inc. REV 6.4C 04/05/10

III. Frequency Response Graph Figure 6-1 Axial Frequency Response Note: This frequency response represents the worst-case ABM2 test configuration according to Table 6-3. IV. 1 kHz Vocoder Application Check CDMA2000 Pure Tone suppression characterization (example) 30 20 10 Magnetic Intensity at 1kHz, R10 (dBA/m) 0 -10 -20 -30 -40 -50 -60 -70 -50 -45 -40 -35 -30 -25 -20 -15 -10 -5 0 Audio input level (dBm0) This model was verified to be within the linear region for ABM1 measurements. This measurement was taken in the axial configuration above the ABM1 maximum location/configuration derived from Table 6-3. V. Undesirable Audio Magnetic Band Plot (ABM2) Figure 6-2 Worst-case ABM2 Plot for WD Reviewed by: FCC ID: ZNFUN160 HAC (T-COIL) TEST REPORT Quality Manager Filename: Test Dates: EUT Type: Page 20 of 37 0Y1211121637.ZNF Novemeber 16-17, 2012 Portable Handset © 2012 PCTEST Engineering Laboratory, Inc. REV 6.4C 04/05/10

Note: This plot represents the data from the location/configuration resulting in the highest ABM2 result shown in Table 6-3. VI. T-Coil Validation Test Results Figure 6-3 Helmholtz Coil Validation for Frequency Response Table 6-4 Helmholtz Coil Validation Table of Results Item Target Result Verdict Signal Validation Frequency Response, from limits 0 ± 0.5 dB 0.30 PASS Magnetic Intensity, -10 dBA/m -10 ± 0.5 dB -9.503 PASS Noise Validation Axial Environmental Noise < - 58 dBA/m -60.36 PASS RadialH Environmental Noise < - 58 dBA/m -61.44 PASS RadialV Environmental Noise < - 58 dBA/m -60.80 PASS Reviewed by: FCC ID: ZNFUN160 HAC (T-COIL) TEST REPORT Quality Manager Filename: Test Dates: EUT Type: Page 21 of 37 0Y1211121637.ZNF Novemeber 16-17, 2012 Portable Handset © 2012 PCTEST Engineering Laboratory, Inc. REV 6.4C 04/05/10

7. FCC 3G MEASUREMENTS Radio Configuration 1, Service Option 3 (thick, green data curve) was used for the testing as the worst- case configuration for the handset due to vocoder gating from the EVRC logic. See below plot for ABM noise comparison between operational field service options and radio configurations for a CDMA2000 handset: Figure 7-1 CDMA2000 Audio Band Magnetic Noise I. ABM Measurements ABM1 Pre-Test (dBA/m) RC1/SO3 RC3/SO3 RC4/SO3 Orientation Channel -13.200 -13.620 -13.440 radialV PCS 1175 ABM2 Pre-Test (dBA/m), A, HBI RC1/SO3 RC3/SO3 RC4/SO3 Orientation Channel -50.22 -59.96 -59.71 radialV PCS 1175  Mute on; Backlight on; Max Volume, Max Contrast  Power Control Bits = "All Up" Probe 40 dB 40 WD noise Sensitivity pre-gain curve dB (-59.09 dBV/A/m) factor Figure 7-2 Audio Band Magnetic Curve Measurement Block Diagram Reviewed by: FCC ID: ZNFUN160 HAC (T-COIL) TEST REPORT Quality Manager Filename: Test Dates: EUT Type: Page 22 of 37 0Y1211121637.ZNF Novemeber 16-17, 2012 Portable Handset © 2012 PCTEST Engineering Laboratory, Inc. REV 6.4C 04/05/10

8. MEASUREMENT UNCERTAINTY Table 8-1 Uncertainty Estimation Table Standard Data +/- Data +/- Probability Standard Contribution Data Type Divisor Uncertainty % dB distribution uncertainty (dB) ABM Noise 7.0% 0.29 Std. Dev. Normal k=1 1.00 7.0% RF Reflections 4.7% 0.20 Specification Rectangular 1.73 2.7% Reference Signal Level 12.2% 0.50 Specification Rectangular 1.73 7.0% Positioning Accuracy 10.0% 0.41 Uncertainty Rectangular 1.73 5.8% Probe Coil Sensitivity 12.2% 0.50 Specification Rectangular 1.73 7.0% Probe Linearity 2.4% 0.10 Std. Dev. Normal k=1 1.00 2.4% Cable Loss 2.8% 0.12 Specification Rectangular 1.73 1.6% Frequency Analyzer 5.0% 0.21 Specification Rectangular 1.73 2.9% System Repeatability 5.0% 0.21 Std. Dev. Normal k=1 1.00 5.0% WD Repeatability 9.0% 0.37 Std. Dev. Normal k=1 1.00 9.0% Positioner Accuracy 1.0% 0.04 Specification Rectangular 1.73 0.6% Combined standard uncertainty, uc (k=1) 17.7% 0.71 Expanded uncertainty (k=2), 95% confidence level 35.3% 1.31 Notes: 1. Test equipments are calibrated according to techniques outlined in NIS81, NIS3003 and NIST Tech Note 1297. 2. All equipments have traceability according to NIST. Measurement Uncertainties are defined in further detail in NIS 81 and NIST Tech Note 1297 and UKAS M3003. Measurement uncertainty reflects the quality and accuracy of a measured result as compared to the true value. Such statements are generally required when stating results of measurements so that it is clear to the intended audience that the results may differ when reproduced by different facilities. Measurement results vary due to the measurement uncertainty of the instrumentation, measurement technique, and test engineer. Most uncertainties are calculated using the tolerances of the instrumentation used in the measurement, the measurement setup variability, and the technique used in performing the test. While not generally included, the variability of the equipment under test also figures into the overall measurement uncertainty. Another component of the overall uncertainty is based on the variability of repeated measurements (so-called Type A uncertainty). This may mean that the Hearing Aid compatibility tests may have to be repeated by taking down the test setup and resetting it up so that there are a statistically significant number of repeat measurements to identify the measurement uncertainty. By combining the repeat measurement results with that of the instrumentation chain using the technique contained in NIS 81 and NIS 3003, the overall measurement uncertainty was estimated. Reviewed by: FCC ID: ZNFUN160 HAC (T-COIL) TEST REPORT Quality Manager Filename: Test Dates: EUT Type: Page 23 of 37 0Y1211121637.ZNF Novemeber 16-17, 2012 Portable Handset © 2012 PCTEST Engineering Laboratory, Inc. REV 6.4C 04/05/10

9. EQUIPMENT LIST Table 9-1 Equipment List Manufacturer Model Description Cal Date Cal Interval Cal Due Serial Number Agilent E5515C Wireless Communications Test Set 2/14/2012 Annual 2/14/2013 GB43304447 Agilent E4407B ESA Spectrum Analyzer 4/3/2012 Annual 4/3/2013 US39210313 Agilent E5515C Wireless Communications Tester 4/4/2012 Annual 4/4/2013 US41140256 Control Company 36934-158 Wall-Mounted Thermometer 1/4/2012 Biennial 1/4/2014 122014497 Gigatronics 80701A (0.05-18GHz) Power Sensor 10/10/2012 Annual 10/10/2013 1833460 Gigatronics 8651A Universal Power Meter 10/10/2012 Annual 10/10/2013 8650319 Listen SoundConnect Microphone Power Supply 4/26/2012 Annual 4/26/2013 0899-PS150 Listen SoundCheck Acoustic Analyzer System 10/4/2012 Annual 10/4/2013 979921 NI 4474 Data Acquisition Card N/A N/A N/A Rohde & Schwarz CMU200 Base Station Simulator 5/22/2012 Annual 5/22/2013 109892 Seekonk NC-100 Torque Wrench (8" lb) 11/29/2011 Triennial 11/29/2014 21053 TEM Radial T-Coil Probe Radial T-Coil Probe 1/20/2012 Annual 1/20/2013 TEM-1130 TEM Axial T-Coil Probe Axial T-Coil Probe 1/20/2012 Annual 1/20/2013 TEM-1124 TEM Radial T-Coil Probe Radial T-Coil Probe 3/14/2012 Annual 3/14/2013 TEM-1133 TEM Helmholtz Coil Helmholtz Coil 4/27/2012 Annual 4/27/2013 SBI 1052 TEM C63.19 Helmholtz Coil 11/11/2011 Biennial 11/11/2013 925 TEM HAC System Controller with Software N/A N/A N/A TEM HAC Positioner N/A N/A N/A Reviewed by: FCC ID: ZNFUN160 HAC (T-COIL) TEST REPORT Quality Manager Filename: Test Dates: EUT Type: Page 24 of 37 0Y1211121637.ZNF Novemeber 16-17, 2012 Portable Handset © 2012 PCTEST Engineering Laboratory, Inc. REV 6.4C 04/05/10

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West Caldwell Calibration Laboratories Inc. Certificate of Calibration for Axial T Coil Probe Manufactured by: TEM CONSULTING Model No: Axial T Coil Probe Serial No: TEM—1124 Calibration Recall No: 21559 Submitted By: Customer: _ STEVELIU Company: PCTEST ENGINEERING LAB Address: 6660—B DOBBIN ROAD COLUMBIA MD 21045 The subject instrument was calibrated to the indieated specification using standards traceable to the National Institute of Standards and Technology or to accepted values of natural physical constants. This document certifics that theinstrument met the following specification uponits return to the submitter. West Caldwell Calibration Laboratories Procedure No. Axial T Col TEM Upon receipt for Calibration, the instrument was found to be: Within (X ) see attached Report of Calibration, the tolerance of the indieated speeification, West Caldwell Calibration Laboratories‘ calibration control system meets the requirements, ISO 10012—1 MIL—STD—45662A, ANSUNCSL Z540—1, IEC Guide 26, ISO 9001:2008 and ISO 17025. Note: With this Cartiicate, Report of Callbration is included. Approved by: \/ Calibration alibration Date: Date 20—Jan—12 an [/12/[7 / i2 t Certificate No: 21559 +1 Felix Christopher Qually Manager QA Do #1081 Rev.£.0 10/tO1 Certificate Page 1 of 1 West Caldwell 150com—ams Calibration Winmniedinini io Tussate uncompromised calibration Laboratories, Inc. uksn 1576 State Route 98, Vietor, NY 14584, U..A. Phone: (685) §86—3000 Fax.: (585) 586—4827

HCATEMC_TEM—1124_Jan—20—2012 AccnEpIATION West Caldwell isonc 17025 Calibration uncompromised calibration Laboratories, Inc. 1575 State Route 96, Victor NY 14564 15330 REPORT OF CALIBRATION TEM Consulting LP Axial T Coll Probe Model No.: AxialT Coil Probe Serlal No.: TEM—1124 Company : Petest Engineering Lab. 1. D. No: 80578 [Calibration results: Before data: ......... After data: ......... Probe Sensitivity measured with Helmholtz Coll Helmholtz Coll: Before & after data same: ...X...... the number of turns on eachcoil; 10 No. the radius of each coil, in meters; 0.204 m Laboratory Environment the current in the coils, in amperes.; 0.08 A Amblent Temperature: 224 *o Helmholtz Coll Constant; 6.98 Aim/V Ambient Humidity 30.8 % RH Helmholtz Coll magnetic field; 5.90 Alm Amblent Pressure: 100.1 kPa Callbration Date: 20—Jan—12. 1:01 PM Probe Sensitivity at 1000 Hz. Re—calibration Due: 20—Jan—13 was —60.16 dBV/AIm Report Number: 21559 41 0.981 mViAim Control Numbar: 21558 Probe resistance 904 Ohms The above listed instrument meets or exceeds the tested manufacturer‘s specifications. (This Callbration is traceable through NIST test numbers: 205342 [The expandad uncortainly of callbration: 0.30dB at 95% confidence lovel with a coveragefactor of k=2. Graph represents Probes Frequency Response. Axtal Probe Response _ 20 qe rmpevandietn B m [_—i—Measured Probe.. s 15 // e // —| & "s _ & §&3 o in § &11 8 Freq.(Hz) 1000 10000 The abovelisted instrument was checked using calibration procedure documented in West Caldwell Calibration Laboratories Inc. procedure : Rev. 5.0 Sept. 10, 2010 Doc. # 1038 HCATEMC Calibration was performed by West Caldwell Calibration Laboralories Inc. under Operating Procedures intended to implement the requirements of IS010012—1, IEC Guide 25, ANSINCSL 2540—1, (MIL—STD—45862A) and 180 9001:2008, ISO 17026 Cal. Date: 20—Jan—2012 1:01 PM Measurements performed by: Callbrated on WCCL system type 9700 Folix Christopher This document shallnot be reprodued, excepin ful, wthout tho wilten approval romWest CatdwollGat. Ltos. Ic. Rev. 8Sopt. 10, 2010 D. 1038 HCATENC Page 1 of 2 £) RCTest @uc

HCATEMC_TEM—1124_Jan—20—2012 West Caldwell Calibration Laboratories Inc. 1875 State Route 96, Victor NY 14664 Tol. (585) 586—3900 FAX (685) 686—4327 Calibration Data Record for TEM Consulting LP Axial T Coil Probe Model No.: Axial T Coll Probe Serial No.: TEM—1124 Company : Potest Engineering Lab. Test Function Tolerance Measured values Before Out Romarks 1.0 Probe Sensitivity at 1000 Hz. dBViAIm —60.16 dB 2.0 Probe Level Linearity 6 6.03 Ref. (0 dB) 0 0.00 —8 —6.02 12 12.03 Hz 3.0 Probe Frequency Response 100 419.9 126 17.9 158 +15.9 200 413.9 251 11.9 316 +10.0 398 —8.0 §01 —6.0 631 40 794 —2.0 Rof. (0 4B) 1000 0.0 1259 2.0 1585 4.0 1995 6.0 2512 79 3162 9.9 3981 11.9 5012 13.9 6310 15. 7943 18.0 10000 20.2 instruments used for callbration: Date of Cal. Traceabilty No. us Date P 34401A s Usssos4 17—0ct—2011 205342 16—0ct—2012 HP 34401A S/N. US361024 17—0ct—2011 205342 16—Oct—2012 HP 33120A SMN. S3604371 17—0ct—2011 206342 16—0ct—2012 B&K 2133 SIN 1492410 4—Nov—2011 68128041141 4—Nov—2012 Cal. Date: 20—Jan—2042 1:01 PM Tested by: Felix Christopher Callbrated on WCCL system type 9700 This documont shatlnot be reproducad, oxcept in ful, wihout the wrtten approval eom West Galdwell Gat.Labs.Inc Rew. 80 Sept. 10 2410 Doc. 1038 HCATENC Page 2 of 2 £) RCTest @uc

West Caldwell Calibration Laboratories Inc. Certificate of Calibration for Radial T Coil Probe Manufactured by: TEM CONSULTING Model No: Radial T Coll Probe Serial No: TEM—1130 Calibration Recall No: 21559 Submitted By: Customer: STEVE LIU Company: PCTEST ENGINEERING LAB Address: 6660—B DOBBIN ROAD COLUMBIA MD 21045 The subject instrument was calibrated to the indicated specification using standards traceable to the National Institute of Standards and Technology or to aecepted values of natural physical constants. This document certifies that the instrument met the following specification upon its returnto the submitter. West Caldwell Calibration Laboratories Procedure No. Radial T C TEM Upon reeeipt for Calibration, the instrument was foundto be: Within CX ) see attached Report of Calibration, the tolerance of the indicated specification. West Caldwell Calibration Laboratories‘ ealibration control system meets therequirements, ISO 10012—1 MIL—STD—45662A, ANSI/NCSL Z540—1, IEC Guide 25, ISO 9001:2008 and ISO 17025. Note: With this Certifcate, Report of Calibration is included. Approved by: P Calibration Date: 20—Jan—12 I ts Certificate No: 21559 +2 Felix Christopher O Boe.1081 Rev. 2.0 1001 Certificate Page 1 of 1 Quality Manager West Caldwell Egz:fl:m 4 yog: Calibration Cntatestimas uncompromised catbraton Laboratories, Inc. ruist 1575 State Roule 96, Victor, NY 14564, U.S.A. Phone: (685) 586—3900 Fax.: (§8) 586—4327 @uc

HCRTEMC_TEM—1130_Jan—20—2012 AcchEDITATON West Caldwell isorec 025 uncompromised calibration 1875 State Route 96, Victor NY 14564 Calibration Laboratories, Inc. «a1632.01 REPORT OF CALIBRATION for TEM Consulting LP Radial T Coil Probe Model No.: Radial T Coil Probe Serial No.: TEM~1130 Company : Potest Engineering Lab. 1. D. No: 80578 Calibration results: Before data ......... After data: ......... Probe Sensitivity measured with Helmholtz Coil Helmholtz Coil; Before & afterdata same: ... X...... the number ofturns on each coil; 10 No. the radius of each coil, in meters; 0.204 m Laboratory Environment: the current in the coils, in amperes.; 0.08 A Amblent Temperature: 224 o Helmholtz Coll Constant; 6.98 AlmIV Amblant Humidity: 30.8 % RH Helmholtz Coil magnetic field; 5.90 Alm Amblent Prossure: 100.1 kPa Calibration Date: 20—Jan—12 1:30 PM Probe Sensitivity at 1000 Hz. Re—callbration Due: 20—Jan—13 was —$0.50 dBV/AIm Report Number 21559 —2 0.944 mViAim Control Number: 21559 Probe resistance 803 Ohms The above listed instrument meets or exceeds the tested manufacturer‘s specifications. (This Calibration is traceable through NIST test numbers: 205342 [The expanded uncertainty of calibration: 0.30dB al 95% contidence level with a coverage factor of k=2. GI’EEH reglesel\l.s Probes Freg uency RDSE onse. Radial Probe Response — zs ® e [ —i—Measured Probo Resp. 15 4— *~ |t L7k7 A] C1 10 {— La—— @ s & 8 3 0 & § s {—— & = 10 5 —16 / 20 send — 100 Froq. (Hz) 1000 10000 The above listed instrument was checked using calibration procedure documented in West Caldwell Calibration Laboratories Inc. procedure : Rev. 5.0 Sept, 10, 2010 Doc. # 1038 HCRTEMC Callbration was performed by West Caldwell Calibration Laborataries Inc. under Oparaling Procedures intended to implement the requirements of 15010012—1, IEG Guide 25, ANSNNCSL 2540—1, (MIL—STD—45662A) and ISO 9001:2008, ISP Cal. Date: 20—Jan—2012 1:30 PM Measurements performad by: . //Z,/ 17025 Calibrated on WCCL system type 9700 Felix Chri stopher This documont shalfnot be reproduced, except in ful, wihout the written approval romWest Caldwall Ga. Labs. e Row. 60 Sopt 10, 2010 bos. # 1038 HCRTENC Page 1 of 2 £) RCTest @uc

HCRTEMC_TEM—1130_Jan—20—2012 West Caldwell Calibration Laboratories Inc. 1575 Stato Route 96, Victor NY 14564 Tel. (585) 586—3900 FAX (685) 586—4327 Calibration Data Record for TEM Consulting LP Radial T Coll Probe Model No.: Radial T Goil Probe Serial No.: TEM—1130 Company : Potest Engineering Lab. Test Function Tolerance Measured values Before Out Remarks 1.0 Probe Sensitivity at 1000 Hz. dBV/Aim —80.50 dB 2.0 Probe Level Linearity 6 6.03 Ref. (0 dB) 0 0.00 —6 .02 12 ~12.02 Hz 3.0 Probe Frequency Response 100 20.0 126 18.0 158 415.9 200 413.9 251 41.9 316 +10.0 308 —8.0 501 —6.0 631 —4.0 794 —2.0 Ref. (0 dB) 1000 0.0 1259 2.0 1505 4.0 1995 6.0 2512 T.9 3162 9.9 3981 11.9 5012 13.9 6310 15.9 7943 18.0 10000 20.1 Instruments used for callbration: Dato of Cal. Traceability No. Due Date 34401A SIN US360641 17—0ct—2011 205342 16—0ct—2012 HP 34401A S US361024 17—0ct—2011 205342 16—0ct—2012 HP so120A Sm soso4ar1 17—Ont—2011 205342 16—0ct—2012 B8K 2133 SN 1492410 4—Nov—2011 681/280411—11 4—Nov—2012 Cal. Date: 20—Jan—2012 1:30 PM Tested by: Felix Christopher Callbrated on WCCL system type 9700 Thts document shallnot be reproduced, exeent t ful, wihoutthe witlen approval tom West Catdwell GaL. Lebs, nc Rev. 60 Sapt. 10, 2610 Doc. # 1098 HCRTEHC Page 2 of 2 «1more sX. 2o @uc

11. CONCLUSION The measurements indicate that the wireless communications device complies with the HAC limits specified in accordance with the ANSI C63.19 Standard and FCC WT Docket No. 01-309 RM-8658. Precise laboratory measures were taken to assure repeatability of the tests. The tested device complies with the requirements in respect to all parameters specific to the test. The test results and statements relate only to the item(s) tested. The measurement system and techniques presented in this evaluation are proposed in the ANSI standard as a means of best approximating wireless device compatibility with a hearing-aid. The literature is under continual re-construction. Reviewed by: FCC ID: ZNFUN160 HAC (T-COIL) TEST REPORT Quality Manager Filename: Test Dates: EUT Type: Page 32 of 37 0Y1211121637.ZNF Novemeber 16-17, 2012 Portable Handset © 2012 PCTEST Engineering Laboratory, Inc. REV 6.4C 04/05/10

12. REFERENCES 1. ANSI C63.19-2007, American National Standard for Methods of Measurement of Compatibility between Wireless communication devices and Hearing Aids.”, New York, NY, IEEE, June 2007 2. FCC Public Notice DA 06-1215, Wireless Telecommunications Bureau and Office of Engineering and Technology Clarify Use of Revised Wireless Phone Hearing Aid Compatibility Standard, June 6, 2006 3. FCC 3G Review Guidance, Laboratory Division OET FCC, May/June 2006 4. Berger, H. S., “Compatibility Between Hearing Aids and Wireless Devices,” Electronic Industries Forum, Boston, MA, May, 1997 5. Berger, H. S., “Hearing Aid and Cellular Phone Compatibility: Working Toward Solutions,” Wireless Telephones and Hearing Aids: New Challenges for Audiology, Gallaudet University, Washington, D.C., May, 1997 (To be reprinted in the American Journal of Audiology). 6. Berger, H. S., “Hearing Aid Compatibility with Wireless Communications Devices, “ IEEE International Symposium on Electromagnetic Compatibility, Austin, TX, August, 1997. 7. Bronaugh, E. L., “Simplifying EMI Immunity (Susceptibility) Tests in TEM Cells,” in the 1990 IEEE International Symposium on Electromagnetic Compatibility Symposium Record, Washington, D.C., August 1990, pp. 488-491 8. Byme, D. and Dillon, H., The National Acoustics Laboratory (NAL) New Procedure for Selecting the Gain and Frequency Response of a Hearing Aid, Ear and Hearing 7:257-265, 1986. 9. Crawford, M. L., “Measurement of Electromagnetic Radiation from Electronic Equipment using TEM Transmission Cells, “ U.S. Department of Commerce, National Bureau of Standards, NBSIR 73-306, Feb. 1973. 10. Crawford, M. L., and Workman, J. L., “Using a TEM Cell for EMC Measurements of Electronic Equipment,” U.S. Department of Commerce, National Bureau of Standards. Technical Note 1013, July 1981. st 11. EHIMA GSM Project, Development phase, Project Report (1 part) Revision A. Technical- Audiological Laboratory and Telecom Denmark, October 1993. 12. EHIMA GSM Project, Development phase, Part II Project Report. Technical-Audiological Laboratory and Telecom Denmark, June 1994. 13. EHIMA GSM Project Final Report, Hearing Aids and GSM Mobile Telephones: Interference Problems, Methods of Measurement and Levels of Immunity. Technical-Audiological Laboratory and Telecom Denmark, 1995. 14. HAMPIS Report, Comparison of Mobile phone electromagnetic near field with an upscaled electromagnetic far field, using hearing aid as reference, 21 October 1999. 15. Hearing Aids/GSM, Report from OTWIDAM, Technical-Audiological Laboratory and Telecom Denmark, April 1993. Reviewed by: FCC ID: ZNFUN160 HAC (T-COIL) TEST REPORT Quality Manager Filename: Test Dates: EUT Type: Page 33 of 37 0Y1211121637.ZNF Novemeber 16-17, 2012 Portable Handset © 2012 PCTEST Engineering Laboratory, Inc. REV 6.4C 04/05/10

16. IEEE 100, The Authoritative Dictionary of IEEE Standards Terms, Seventh Edition. 17. Joyner, K. H, et. al., Interference to Hearing Aids by the New Digital Mobile Telephone System, Global System for Mobile (GSM) Communication Standard, National Acoustic Laboratory, Australian Hearing Series, Sydney 1993. 18. Joyner, K. H., et. al., Interference to Hearing Aids by the Digital Mobile Telephone System, Global System for Mobile Communications (GSM), NAL Report #131, National Acoustic Laboratory, Australian Hearing Series, Sydney, 1995. 19. Kecker, W. T., Crawford, M. L., and Wilson, W. A., “Contruction of a Transverse Electromagnetic Cell”, U.S. Department of Commerce, National Bureau of Standards, Technical Note 1011, Nov. 1978. 20. Konigstein, D., and Hansen, D., “A New Family of TEM Cells with enlarged bandwidth and th Optimized working Volume,” in the Proceedings of the 7 International Symposium on EMC, Zurich, Switzerland, March 1987; 50:9, pp. 127-132. 21. Kuk, F., and Hjorstgaard, N. K., “Factors affecting interference from digital cellular telephones,” Hearing Journal, 1997; 50:9, pp 32-34. 22. Ma, M. A., and Kanda, M., ”Electromagnetic Compatibility and Interference Metrology,” U.S. Department of Commerce, National Bureau of Standards, Technical Note 1099, July 1986, pp. 17-43. 23. Ma, M. A., Sreenivashiah, I. , and Chang, D. C., “A Method of Determining the Emission and Susceptibility Levels of Electrically Small Objects Using a TEM Cell,” U.S. Department of Commerce, National Bureau of Standards, Technial Note 1040, July 1981. 24. McCandless, G. A., and Lyregaard, P. E., Prescription of Gain/Output (POGO) for Hearing Aids, Hearing Instruments 1:16-21, 1983 25. Skopec, M., “Hearing Aid Electromagnetic Interference from Digital Wireless Telephones, “IEEE Transactions on Rehabilitation Engineering, vol. 6, no. 2, pp. 235-239, June 1998. 26. Technical Report, GSM 05.90, GSM EMC Considerations, European Telecommunications Standards Institute, January 1993. 27. Victorian, T. A., “Digital Cellular Telephone Interference and Hearing Aid Compatibility—an Update,” Hearing Journal 1998; 51:10, pp. 53-60 28. Wong, G. S. K., and Embleton, T. F. W., eds., AIP Handbook of Condenser Microphones: Theory, Calibration and Measurements, AIP Press. Reviewed by: FCC ID: ZNFUN160 HAC (T-COIL) TEST REPORT Quality Manager Filename: Test Dates: EUT Type: Page 34 of 37 0Y1211121637.ZNF Novemeber 16-17, 2012 Portable Handset © 2012 PCTEST Engineering Laboratory, Inc. REV 6.4C 04/05/10


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