JFZSR5BT

FCC ID

Application Frequency Range	Final Action Date Granted
hv81puWqLRr91P3l9MiSxg== 2402.0-2480.0	2016-02-18 APPROVED

File Name	Document Type	Date	Direct
Revised Letter for Additional Model Photos	Cover Letter(s)	2016-02-18 00:00:00	pdf
Revised Confidentiality Request Letter ST	Cover Letter(s)	2016-02-18 00:00:00	pdf
Revised Confidentiality Request Letter LT	Cover Letter(s)	2016-02-18 00:00:00	pdf
Revised Letter for Additional Model	Cover Letter(s)	2016-02-18 00:00:00	pdf
Revised Authorization Letter	Cover Letter(s)	2016-02-18 00:00:00	pdf
Confidentiality Request Letter	Cover Letter(s)	2016-02-18 00:00:00	pdf
Test Report DSS 2	Test Report	2016-02-18 00:00:00	pdf
Test Report DSS 1	Test Report	2016-02-18 00:00:00	pdf
Label Location	ID Label/Location Info	2016-02-18 00:00:00	pdf
Letter for Additional Model	Cover Letter(s)	2016-02-18 00:00:00	pdf
Authorization Letter	Cover Letter(s)	2016-02-18 00:00:00	pdf
Test Setup Photos	Test Setup Photos	2016-08-16 00:00:00	pdf
Users Manual	Users Manual	2016-08-16 00:00:00	pdf
Internal Photos	Internal Photos	2016-08-16 00:00:00	pdf
External Photos	External Photos	2016-08-16 00:00:00	pdf
Block Diagram	Block Diagram		N/A
Operational Description 1	Operational Description		N/A
Operational Description 2	Operational Description		N/A
Operational Description Antenna Spec	Operational Description		N/A
Parts List	Parts List/Tune Up Info		N/A
Schematics	Schematics		N/A

Equipment	WIRELESS HEADPHONES
FRN	0004315917
Grantee Code	JFZ
Product Code	SR5BT
Applicant Business	Audio-Technica Corporation
Business Address	2-46-1 Nishi-naruse, Machida , Tokyo,N/A Japan 194-8666
TCB Scope	A4: UNII devices & low power transmitters using spread spectrum techniques
TCB Email	[email protected]
Applicant	Jackie Green – VP
Applicant Phone
Applicant Fax	330 688-3752
Applicant Email	[email protected]
Applicant MailStop
Test Firm	MOVON Corporation
Test Firm Contact	Kim Seokbong
Test Firm Phone
Test Firm Fax	+82-31-338-8847
Test Firm Email	[email protected]
Certified By	Jackie Green – Vice President R&D;