RF EXPOSURE PART 3

FCC ID: 2AEE8LAVAIRIS870

RF Exposure Info

Download: PDF
FCCID_2995848

suenemnnce nrour carimeanionneront resorneissenia 1 intropucrion "This document contains a summary of the requirements se forh by the IEEE 1528, FCC KDBsand CEVIEC 62209 standards forrefrencedipoles used for SAR measurementsstem validtionand the meassrements that were perforned to verily that the product complis with the fore mentioned standants. 2 pevice unbercrest Device Under Test Devies Tpe covosax mo kz RErERENCE prore Manatictrer mvo Modal spi900 SorNumber sy ons bre rosnsor Product Condiion en T med) New A yearly callbation inferval s recommended. 3 PRODUCT DESCRIPTION 31— oinpmal.inrormiation MVG‘s COMOSAR Valitation Dipols ar buil n accordanceto the IEEE 1828, FCC KDBsand CEVTEC 6220 standards. The produc i designed for use wth the COMOSAR testbenchony, Eigure 1 ~AfFG COMOSIR Valdaton Dipole Pae Th tronat i mterarinet enit j uon e waeaproayi encoarmittraiialestt ul1ihepe$nd inudtontatina erieninnbrpeamuemmensea ue

suenemnnce nrour carimeanionneront resornerssmia a astreentent vietnon Th IEEE 182%, ECC KDBs and CENIEC 62209 standands provide requircments for rference diles ied foyatem alidtion measirements. Th folwing measiroments were perforned to eritythatheproduct complis with thefore meoned standards 11. ricfury ross reourrEmeNts ‘The dipols usefor SAR yatem validation measurcmentsand checks must have a rctrm los o—20 dB or better. "The xtum low measurementshall beperforned against a lquid Ailed Aat phantom, wih phantom constucted as oulinedin thfore mentionad standards 12. ammenanicat reoumEvenns The 1BB 8. 1828 and CEMIEC 62209 standards specity the mechanical components and dimensions ofthe vali¢ation dioles, with the dimensions fequencyand phantom shell thickness dependent, ‘he COMOSAR test bench cmploys a 2 mm phantom shell thickness threfore the diples soldfor use withthe COMOSAR text bench comply wthe equirements sut forth foa 2 m phantom shell thicknos s wexr incernanty All uncetaintesied below represent an panded uncstaintyexprssedatapprovimatelythe 95%G confidnce evel using a coverige facto of 2. rscesble t the Inemationally Accepted Guideto Meastment Uncertainty si— rrturxioss "Thfllowing uncetaintics appl o therturn oss measurement requenc band pandcd Uncertainty on Retum Low wo—cmonie sran s2. pinpsion vicastkement "Thfllowing uncetainies apply o the dimension meamurements Tenath m Expanded Uncortaity onLength 3—30 005 im s3 vaupation vtastrmvent "The qvidelies outined in the IEEE 182%, FCC Kbe, CENELEC ENSO361 and CBITEC 62209 standands wer ollowed t generate the mcasuromentuncertaintyforvalidton meastroments Passsi2 Th ons imterarinet entw j uo ts waeaproayio encmelitva ol uie t brpeeho tehieadrntetaman erieninnbrpeamuemmensea ue

sumremence nrour canmeanionneront resornerssmia Scm Volume ded Uncertamty Ts Ta% Ts zark 6. caumaation n castreentent resturs 1. iucfury Loss anp fvripance in itEA Liouip 6 quee it Hetum Low @B Requirement B Impedance io si7 o ©s0—20(0 62 rctuay Loss anptupipance iy popy Liouth regune(viln Hetum Lox @B Requirement @B Impedance imo m o isso. 50 Pnfi counelhirairatonntairinhrpechr acdonalioctsiimen

suenemnnce nrour carimeanionneront resornerssmia s3 remmcrins inn m dn ie newet raant mawnt muint nawnt m aeon weoun arax «o meoux weras es o mous ons en is moun crmos senn x wooun mrax rewr m winx srax zenm is wsun mous zen io mous arax zen io mrax arux Sinm To mous mrax sens ce aoun m msax ms Geun m io cmo ssum sens leo asux msak seun lico aanx iram Senm ho mvax mons Seue io ssax Sorna senm e asax maas zen io como Ees Senm S Foux Ferain Gean PS pem mernn snn 7. vaumarion yeasurenient ‘he EKSid. 1828, FCC KDHls and CENIEC 62209 standandsstte that the systomvalidaion incssurements must be peformad using a reference dipole mectingthe fore metioned reurnloss and mechanical dimension roirements. The validtion measurement must be prformed aginst liqid filed Aaphantom, with thephantom constrted asoutine in thfre mentioned standards Pe th standards, the diple shallbe posioned below the bttomofthe phartoms, with thcipole Tenithcentered and paralll to the longet dimemsion ofthe t phantom, with thopsufice ofthe diple at thedescribeddistance rom the botom surfaceofthe phantom 7. imap roum ytasurEment 2TD mueemmmane1 entamiam waind |_mwunt |_renint memc w siss enise se asex emsn Paeoie Th ons imterarinet entw j uo ts waeaproayio encmelitva ol uie t brpeeho tehieadrntetaman erieninnbrpeamuemmensea ue

suenemnnce nrour carimeanionneront resornerssinsa 7e asax cane w asex ceun xo asex omen im asex m io mask erm io arex Ern in mrex orm wo moak vows o Com ie Leaw w io monk omm S Com vomx io maex resx o msex ioi 2o mrex mak se moek iocess ie msex rouk io Fos Hnew 12 sar vrasurmv marsure wem ran uoun "The IEEE S1d. 1828 and CEIIEC 62209 standards stale that the ystem valiaion meamurements should produce the SAR valics shown below (for phantom thcknss of 2 mn), wiin the unceraintyfor the notem validaion All SARvalus are nomalized to 1 W farvard power In Iracket the messured SAR i given wtheused nput power Sz omsuye Tericn c swm Fube mnrmrous Toud rcummnmcomur—rar Dss temee Smantieud 100 am Amrcaarectnen dcinetpim en Sanaones dctemidindrian rews smge mt en ies Gee Tal reopunee ce tmunlt is g= resoomem mesemmam aind |_mawnd maint_| memunt w is in so iss ie 7 va ass Pacom Th ons imterarinet entw j uo ts waeaproayio Thenirnin meivalieaini e teropaj inndenmientinae erieninnbrpeamuemmensea ue

sumremence nrour canmeanionneront resornerssmia mrase mupe Aal 73. noby oup rasurenibnt F®n® munepmmaren nssm Td mes m|d 15| asss cese 300| mase ons 450| wraw es 750| nses en as srex corm 5i gonx in 5is some ern Pagsons Pm erereint versatl is jton e on uen sats Pnfi counelhirairatonntairinhrpechr acdonalioctsiimen erieninnbrpeamuemmensea ue

suenemnnce nrour carimeanionneront resornerssmia mso wons En o0 mask vous 1s00 sys erm im sys me imaw ns 2000 mss ferm 20 Srex ies 2s srex imak zo0 wsex meis 2000 Eum aman Eo wrex Smsw sn Emm siouon Bu asron mmow sim arnon orm ssoo mevion sermon sen assox srmon se azron sremo 74 Smz omsuy Fcicn sizecam uze sommme tw ltLinad Taker on Sipgne Te DnecsEuin ie cntigad ioome Arsanrectien dcinnpinn Ten Santnsises dclemipindrien Te mom Trea poer 3dn Taud Tenpaure ce Tah reopaize mws TaTfemiy in mz & ressuwnenn weswmnam naw mevea o Eomm Eorm Passion2 Th ons imterarinet entw j uo ts waeaproayio encmelitva ol uie t brpeeho tehieadrntetaman erieninnbrpeamuemmensea ue

sumremence nrour canmeanionneront resornerssmia Puciine Pnfi counelhirairatonntairinhrpechr acdonalioctsiimen

suenemnnce nrour carimeanionneront resornerssinsa x: uistorroumnient Mesens ya |~R"~ armnltortanl" SA rarion myo suzsnssauy: fartries Nowl faides No caf EouOStRrentseras] vemons ms fariies oo furees No ol Nevormrayee Camer snmooee wane se Caen ces cureno| mane e Rdcemsrote we |sreresuiam| roae Tans mammew remeyzom vesos Tans Tae spuicemate apersumce inascrown ts Tane mota mmom sus |nesnreeemngnt uns weme wmrue mm rane romsons wecresa usmees man wae Duoucas| messa e |aneoses ecerued TRSUSEAN commiconmay tmeste soor soors Pacion Th ons imterarinet entw j uo ts waeaproayio Thenirnin meivalieaini e teropaj inndenmientinae erieninnbrpeamuemmensea ue

SAR Reference Dipole Calibration Report Ref: ACR92.8.15.SATUA WALTEK SERVICES (SHENZHEN) CO., LTD 1/F., FUKANGTAT BUILDING, WEST BAIMA ROAD, SONGGANG STREET BAOAN DISTRICT, SHENZHEN GUANGDONG 518105, CHINA MVG COMOSAR REFERENCE DIPOLE FREQUENCY: 2450 MHZ SERIAL No.: SN 09/15 DIP 2G450—363 Calibrated at MVG US 2105 Barvet Park Dr. — Kennesaw, GA 30144 oF ms z loZcwea Re AC rcr m errolme eso osnerms [ Somay Thd en h mt and w h on BM etoo uie iiowinn petemcn m MVG USh aig the COMOSA ienbend. AlllcliRrtinrectnts mein cede o mtiond metolog intton

mva suenemence nrourcarmanionnzront resunsissma Name Furstion Dare Signanire Prepared by Srome LUC Product Manager 422015 z> Checked ty Jrome LUC Product Manager (422015 Approvedby: ——|KimRUTKOWSKI| QualtyMamager 422018 ,. w0 Custoner Nane Distibuton Iine Dae | Modifcation a azz0s Initaliclease Pacon P hconaereraaet cenoij uio becromapnna ie Aepirmmcoimnliiraiinlenitobi irrverhrantindinnteatinan Enerintlperiameerspmeaipity

mvg sucn incrmrou: caumearion reron ne sexnsissena ramre Inroduction.. la Device Under Test. m a Product Descrition a 311. GeneralInfomation Measiment Method 4 41— Rotim Low Requirements 42. Mechanical Roquirements Measirment Uncertnt S1..— Retim ow 52. Dimcnsion Measursment htion Measiroment C Calibrtion Measurement Resull........... m 6 61— Retir Los and Impedance In HexdLigud 62. Retim Low and Impodance InBedy Liquid 63. Mechanical Dimensions Validtion messurement 7 71— HeadLiquid Memurement 72. SAR MeosurementResult Witi fead Liguid 73. Body LiguidMessurement 714. SAR MeasurementResult Wit BodyLigid i2 Paesi P hconae reraaet cenoij uio becrompnea ie Aepirmmcoimnliiraiinlenitobiirrverhrantindinnteatinan berlnnineaperainrenseaoraite

suememence nrour carmeanionnzront resounsissma 1 intropucrion "This document containsa summary othe requirements se frth bythe IEEE 1528, FCC KDBsand CEVTEC 62209 standards forrefrencedipolesused for SAR measorement system alidations and the meassrements that were perforned to verfy that the productcomplis with thefore mentioned standants. 2 pevice unberrest Device Under Test mame Tcovosntamonme 6 1528, ECC KDD and CETEC 62209 standards. The produci designed fr use wth the COMOSAR testbench oly. Higure 1 —AfFG COMOSIRValdaton Dipole Pacon Pirtvonat id mt rraint nie ut e wamrnacti Penmain mamdiavaiinentt olo Wrepeeh e hnndnentantonase berlnnineaperainrenseaoraite

mvg suenemence nrou: catimarionnsront resounsissma 1. ammastireniEnt aiermon "The IEEK 1828, ECC KDH and CEIEC 62209 standards provide reqirements forreference diples wed for sytemvalidtion meassrements. The folowing measirements were performed to werifythat theproduct complis witthefore mentoned standards w1 rctury Loss rroumrEments ‘The dipols usedfor $AR syotemvaliation measurementsand checks musthave a retum losof 20 d or betr. he stum low measurcmentshall beperforned against lquid Ailed at phantom, with phantom constuctd as oulinedin thfore mentionad standards 12. vircranicaReourrevexts The EBB Sid. 1828 and CENIEC €2209 standards specity the mechanical components and dimensions ofthe validation dipoles, with the dimensions fequencyand phantom shell thickness dependent ‘The COMOSAR test bench employs a 2 mm phantom shellthickness therefore the ipolessoldfor use wit e COMOSARtstbench comply wth the requirementsset forh foa 2 m phantom shellthicknos s meastreenent excerrancy All uncetainties ied below repesentanexpandad uncertainty expressed approsinately the 95% confidnce evel using a coveragefactoofK2 trmceableto the Intemationally Accepted Guideto Measurement Uncentainty si. rrturxioss "Thfllowins uncetinies apply tothertun oss meastrement Frequency band Espanded Uncertanty on Return Lows s00—cooovitte aran s2. mt ron vrasurmniet "Thfllowing uncetainties apply o the dincrsion measurements Length (mm) \ Expanded Unceriainty on Length 3—300 605 m s3 smiov rasurevent "The puidlines outined in the IEE1828, FCC Kbis, CENELEC ENSO1 and CBITRC 2209 standands wer ollowed t penerate the measurement uncertaint fovaliation measursments Paesis Pitconae idmt ranintini j uive e waraprnae io Penmainmamdiavaiinentt olo Wrepeeh e hnndnentantonase berlnnineaperainrenseaoraite

sunmemenc resernee arsa SonFaime Expandad Uncermingy Ts man io ns 6 caumention ytastrinient resuurs 1. riefuRy Loss anp TMPEDaNCE c IfEAD LoUI _T Hetum Low(d)_|_ Requirement @0__|__ Impedance _ 427 20 aso—esj0 62 retuay Loss anp furopancein popy Liouth Freueney (Vio Hetum Los @B) Requirement @B) Impedance 2uso asis 2 sn n Pucen on itmterertent oan l npm unh rmeay e coienliiraiinlenttobi irrver k ntindinntentinan Enerintlperiameerspmeaipity

suememence nrour carmeanionnzront resounsissma s3 Immersrins tnn dn enine nowst newnt e Reoux "« Exros [ rerax | arinc ] m weoux. |_wmosin _| en is mons saux | zen x woux ux | seun mss winx [ss | zen io wrus |_sooin ~| zen wo moux aram | snn io mrax arux seum io moux arax zen io mous msax seum lno wsux ssun senn mo asux pros sins lico aous irax seum mo ssax weux senm mo ssax ms soenx ms sns ms o asux |_ en | senn weo asaum soux snn o woux |Geenx ~| sean PS sirix mernx senm 7. vaumarion yeasurnient ‘he IEEE Sid. 1528, FCC KDHM and CENIEC 62209 standards state that the system validation inessurements must be peformad using a rference dipole meetingthe fore mentioned reurn loss and mechanical dimension roquirements, he vlidtion measurement must be prformed aginst a ligud filed Aa phantom, with thephantom constvcteasoutine in the ore mentioned tandards Pe thstandards, the diple shallbe postioned below the bttom othe phntoms, with thdipole Tengthcentered and paralll to the lonpst dimemsion ofthe Nt phantom, with thop surice of the diple at the descrbeddistance from the botom surfaceofthe phantom. 71. ieab loutp \rasurEment use Pirtvonat id mt rraint nie ut e wamrnacti Penmain mamdiavaiinentt olo Wrepeeh e hnndnentantonase berlnnineaperainrenseaoraite

suememence nrour carmeanionnzront resernsissea 70 asss smie as asax cean C asix forn [ wme_ es Eo e mass imax io ares iss mss avass wous | moss wmous reax mouk resx masy roms mss inss mrex ns imaw _ moux ies msox ress msax Eon 12 sar irastrpvimerResor cap iou ‘he 16BE Sid. 1828 and CE MIEC 62209 standards state that the syatem valittion measursments should produice the SAR valies shown below (for phartom ‘hickness of2 mn}, within the uncstaintyfor the motem valiion All SAR valus are nommalized to 1 W forvard powerIn Iracket the messured SAR i iven wthe used nput power Stvec omsiawe Fharicn suane saum Frge s in woms Tond Heal Lowd Vaber on‘ 3tPagna TB Aesanrectien _ dctenitcien Ttm Seintecinon Fegere Trpa poon Eud rempmmare SabTomen Tabentiy resummenn wesemmam mind memeed eaind newwnt in_ P 70 is (sss Pacens Pirtvonat id mt rraint nie ut e wamrnacti Penmain mamdiavaiinentt olo Wrepeeh e hnndnentantonase berlnnineaperainrenseaoraite

sumemence nroucarmeanionnzront resernsissea in | | x | ies i || m | ms | ms | ma | nee ns | o m | amo me mmase n mogs ze us we se as # se @1 as 73. popy oup it urmvbyt mm Iost ism is enen | m mind _|_messest reaind nowwrt iso cea | | E0 srix ons | aso | Ts | as szex |Lomsx | soo imisn | sis iz saviss | Pecon Phitromet niratererdant vernntiie nntoabeveompred ts Aepirmmcoimnliiraiinlenitobi irrverhrantindinnteatinan Enerintlperiameerspmeaipity

suememence nrour carmeanionnzront resernsissea ie sns max iero sns ress i0 sw ferm 190| sisw isman z00| se ismm ~min sss iman 7 ns srax |ne amee zen mss _ sn s sn max Eomcs annesn sn moson siomx Erommict m samon sin arson form sson —|_mesion session san assow orm Eommco stomsn 74. saifrastirmvimer resurr witipopy Lioutp scim taat Tob Liged Ves opr ssmc 197 tiec mmodpemmeretiendt 16Gke Aersureataee ToSan knsts inieniemndrien Ieguny feowe ipapore Jge id Tepmae fee [al reopannee e resoomem wesummam omm m Ti merson mursn Puseions Pirtvonat id mt rraint nie ut e wamrnacti Penmain mamdiavaiinentt olo Wrepeeh e hnndnentantonase berlnnineaperainrenseaoraite

mva sumemence nrou carmeanionnzront resounsissma Paciinz Mictrometniraterentent Aerispn vtvnbeveompreata ts Heraiiniotaiin. beviacinatrarpe aroa

suememence nrour carmeanionnzront resounsissma x uist orouimient Equipment Summary Sheet Hescriptinn Mora CV |fentihostin N*) CanbttonDate| " Tie.= SA Prarton mo suzomamy: ferites Nowl baigeed No caf |conosi res serer) verions x pageo hog ® s Newor Arayeer @90R3| smooce cerors came Gaipen Garen caurenor ts | d Retererce Pobe mwo eroue s n sooure | sorms Motunater Keaney2000 vissess wass | wans SorelGenemr Agrereeiseo. inasoroses wans wane Angiter |— retrecoom m ireal Povertioe. woession ussezsiass wans rane Pomersemscr Weecrezsa ussrisas wans mane Drotowicoger nemerm ous eneoueeserneareie TVBnaP commicomsey meste score seos Paeions Pitconae id mt ranintini j uive e waraprnaeio Aepirmmcoimnliiraiinlenitobiirrverhrantindinnteatinan berlnnineaperainrenseaoraite

Reference No.: WTS16S0447526E V1 Page 145 of 148 16 SAR System Photos Liquid depth ≥ 15cm Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Email:info@waltek.com.cn

Reference No.: WTS16S0447526E V1 Page 146 of 148 17 Setup Photos Right Head Cheek Right Head Tilt Left Head Cheek Left Head Tilt 1.0cm 1.0cm separation separation Body-Worn(LCD UP) Body-Worn(LCD Down) Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Email:info@waltek.com.cn

Reference No.: WTS16S0447526E V1 Page 147 of 148 1.0cm 1.0cm separation separation Hotpsot(LCD UP) Hotspot(LCD Down) 1.0cm 1.0cm separation separation Hotspot(RIGHT EDGE) Hotspot(LEFT EDGE) 1.0cm separation Hotspot(BOTTOM EDGE) Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Email:info@waltek.com.cn

Reference No.: WTS16S0447526E V1 Page 148 of 148 18 EUT Photos Front side Back side Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Email:info@waltek.com.cn


Document Created: 2016-05-16 19:27:15
Document Modified: 2016-05-16 19:27:15
© 2024 FCC.report
This site is not affiliated with or endorsed by the FCC