Attachment RF Hazard

This document pretains to SES-MOD-20080811-01051 for Modification on a Satellite Earth Station filing.

IBFS_SESMOD2008081101051_663661

SDM2 RF Exposure Assessment September 9, 2008 80-J9813-5 Rev A Fang Han Restricted Distribution This document contains critical information about QUALCOMM products and may not be distributed to anyone that is not an employee of QUALCOMM without the approval of Configuration Management.


QUALCOMM Incorporated 5775 Morehouse Drive San Diego, CA 92121-1714 U.S.A. Copyright © 2008 QUALCOMM Incorporated. All rights reserved. Printed in the United States of America. All data and information contained in or disclosed by this document is confidential and proprietary information of QUALCOMM Incorporated and all rights therein are expressly reserved. By accepting this material, the recipient agrees that this material and the information contained therein is held in confidence and in trust and will not be used, copied, reproduced in whole or in part, nor its contents revealed in any manner to others without the express written permission of QUALCOMM Incorporated. OmniTRACS® , Wireless Business Solutions®, and QUALCOMM® are registered trademarks and registered service marks of QUALCOMM Incorporated. Other brand, product, or service names listed in this document are the trademarks/service marks or registered trademarks/service marks of their respective holders. Export of this technology may be controlled by the U.S. Government. Diversion contrary to U.S. law prohibited. The information in this document is subject to change with subsequent software releases without notice. SDM2 RF Exposure Assessment 80-J9813-5 Rev A Fang Han September 2008

Contents Contents ................................................................................................................................ iv 1. Introduction..........................................................................................................................1 2. Antenna and SDM System Parameters..............................................................................1 3. Power Density Calculation ..................................................................................................2 3.1 Far Field Calculations.......................................................................................................2 3.2 Near-Field Calculations ....................................................................................................2 3.3 Transition Region Calculations ........................................................................................2 3.4 Antenna Surface................................................................................................................3 4. Conclusions...........................................................................................................................3 5. Reference ..............................................................................................................................4 6. Engineering Declaration......................................................................................................4 80-J9813-5 Rev A QUALCOMM Proprietary Page iv

SDM2 RF Exposure Assessment Introduction 1. Introduction This report assesses non-ionizing electromagnetic field radiation from a satellite data module (SDM2) of Ku-band OmniVISION MCP system designed, and manufactured by Qualcomm Inc., pursuant to FCC OET Bulletin, No. 65, Edition 97-01 [1]. Power flux densities generated from the antenna at far field, near field, transition region, and antenna surface are calculated based on the method recommended by the FCC Bulletin. Table 1 outlines the limits of exposure to EMF in the Ku-band in terms of power density specified by FCC and ICNIRP [2]. Table 1. Maximum permissible exposure (MPE) limits at Ku-band Power density Average time (min) Exposure environment 2 (W/m ) FCC ICNIRP General public/uncontrolled 10 30 4 (based on 68/f 1.05) Occupational/controlled 50 6 4 (based on 68/f 1.05) 2. Antenna and SDM System Parameters The antenna and system specifications for power density assessment are listed in Table 2. Table 2. Antenna and system specs Antenna aperture width W = 1.9 in = 0.0483 m Antenna aperture length L = 9.95 in = 0.2527 m Antenna aperture area Aa = W × L = 0.0122 m 2 Wavelength at mid-band 14.25 GHz λ = 0.021 m Max transmit power at antenna flange Pmax = 2.5 W Antenna gain G = 19 dBi = 79 Antenna aperture efficiency η= (Gλ 2 / 4π ) = 0.23 Aa Actual transmit duty cycle over 30-min period d = 5% 80-J9813-5 Rev A QUALCOMM Proprietary Page 1

Power Density Calculation SDM2 RF Exposure Assessment 3. Power Density Calculation 3.1 Far Field Calculations The distance to the beginning of the far field can be estimated as below [1] 0.6 L2 RFF = = 1.82 m λ The maximum on-axis power density in the far field can be calculated as follows G × Pmax (or EIRP) S FF = = 4.8 W/m 2 4πR FF 2 Considering the actual duty cycle for transmit, the average on-axis power density in the far field can be then calculated as S FF _ avg = S FF × d = 0.24 W/m 2 3.2 Near-Field Calculations The distance to the end of the near field can be calculated as follows L2 R NF = = 0.76 m 4λ The maximum on-axis power density in the near field can be determined by 16ηPmax S NF = = 45.8 W/m 2 πL2 Considering the actual duty cycle for transmit, the average on-axis power density in the near field can be then calculated as S NF _ avg = S NF × d = 2.3 W/m 2 3.3 Transition Region Calculations The transition region will be the region extending from R NF to R FF . If the location falls within this transition region, the on-axis power density can be determined by the following equation: Page 2 QUALCOMM Proprietary 80-J9813-5 Rev A

SDM2 RF Exposure Assessment Conclusions S NF R NF S TF = R The exposure level S T at the transition region R ( R NF < R < R FF ) would be less than near-field exposure level and greater than far-field exposure level, i.e., S FF < STF < S NF Therefore the average power density in transition region will not exceed 1.2 W/m 2 . 3.4 Antenna Surface The antenna is covered by a radome to prevent the antenna being touched. The distance between the radome and the antenna is approximately r=2.5 cm, and thus the equivalent aperture area at the radome surface becomes ⎛ θ⎞ AEq = L × ⎜W + 2r tan ⎟ ⎝ 2⎠ = 0.015 m 2 Antenna radome where θ is the angle of the antenna W’ aperture. The average power density at W equipment (radome) surface can be then r assessed by 24° 27° Pmax S Eq _ avg = × d = 8.3 W/m 2 AEq 4. Conclusions Table 2 summarizes the expected radiation exposure levels from the above analysis. At all regions, the EMF exposure levels satisfy MPE limits for both public environment and occupational environment. The SDM is designed to be installed on the roof of driver’s cabin and would be at least 0.5 meter away from the driver. Since the main beam of the antenna will be elevated at least 25 degree to communicate with satellite, there would be no chance of beam exposure toward inside the driver’s cabin or nearby the vehicle. Furthermore, it is required that the transmitter be turned off during equipment maintenance. Therefore, there would be no hazard risk to public and occupational personnel. 80-J9813-5 Rev A QUALCOMM Proprietary Page 3

Reference SDM2 RF Exposure Assessment Table 3. Summary of expected exposure levels Average power Region Hazard assessment density (W/m2) Far field (R>1.8 m) PD<0.24 Meet FCC MPE limit for public exposure Transition field 0.24<PD<2.3 Meet FCC MPE limit for public exposure (0.76 m<R<1.8 m) Near field (R>0.76 m) S<2.3 Meet FCC MPE limit for public exposure Antenna radome surface S=8.3 Meet FCC MPE limit for public exposure 5. Reference [1] FCC OET Bullet No. 65, Edition 97-01, “Evaluating Compliance with FCC Guidelines for Human Exposure to Radiofrequency Electromagnetic Fields”, August 1997. [2] ICNIRP Guidelines, “Guidelines for limiting exposure to time-varying electric magnetic, and electromagnetic fields”, Health Physics, Vol.74, No.4, April 1998. 6. Engineering Declaration I hereby certify that the information contained in this test report is complete and true to the best of my knowledge. All test and analysis were performed in accordance with good engineering practices. Certified by: Fang Han Regulatory Engineer, Senior Staff Qualcomm Inc. Date: September 9, 2008 Page 4 QUALCOMM Proprietary 80-J9813-5 Rev A


Document Created: 2008-09-11 11:09:36
Document Modified: 2008-09-11 11:09:36
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