HAC RFE Test Report

FCC ID: ZNFX212TA

Test Report

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FCCID_4080415

PCTEST ENGINEERING LABORATORY, INC. 7185 Oakland Mills Road, Columbia, MD 21046 USA Tel. 410.290.6652 / Fax 410.290.6654 http://www.pctest.com HEARING AID COMPATIBILITY Applicant Name: Date of Testing: LG Electronics U.S.A, Inc. 10/29/2018 1000 Sylvan Avenue Test Site/Location: Englewood Cliffs, NJ 07632 PCTEST Lab, Columbia, MD, USA United States Test Report Serial No.: 1M1810290199-01-R2.ZNF FCC I D: ZNFX212TA APPLI C A NT: LG ELECTRONICS U.S.A, INC. Scope of Test: RF Emissions Testing Application Type: Class II Permissive Change FCC Rule Part(s): CFR §20.19(b) HAC Standard: ANSI C63.19-2011 285076 D01 HAC Guidance v05 285076 D02 T-Coil testing for CMRS IP v03 DUT Type: Portable Handset Model: LM-X220MA Additional Model(s): LMX220MA, X220MA Test Device Serial No.: Pre-Production Sample [S/N: 02819] Class II Permissive Change(s): See FCC Change Document Original Grant Date: 03/28/2018 C63.19-2011 HAC Category: M4 (RF EMISSIONS CATEGORY, LTE B26 & B25 Only) Note: This revised Test Report (S/N: 1M1810290199-01-R2.ZNF) supersedes and replaces the previously issued test report on the same subject device for the same type of testing as indicated. Please discard or destroy the previously issued test report(s) and dispose of it accordingly. This report and category pertain only to LTE bands 26 & 25 supported by this wireless portable device. The overall category rating of the device is determined by the lowest rating obtained over all air interfaces supported by the device. This wireless portable device has been shown to be hearing-aid compatible for LTE bands 26 & 25, under the above rated category, specified in ANSI/IEEE Std. C63.19-2011 and has been tested in accordance with the specified measurement procedures. Hearing-Aid Compatibility is based on the assumption that all production units will be designed electrically identical to the device tested in this report. Test results reported herein relate only to the item(s) tested. North America bands only. I attest to the accuracy of data. All measurements reported herein were performed by me or were made under my supervision and are correct to the best of my knowledge and belief. I assume full responsibility for the completeness of these measurements and vouch for the qualifications of all persons taking them. Approved by: FCC ID: ZNFX212TA HAC (RF EMISSIONS) TEST REPORT Quality Manager Filename: Test Dates: DUT Type: Page 1 of 23 1M1810290199-01-R2.ZNF 10/29/2018 Portable Handset © 2018 PCTEST Engineering Laboratory, Inc. REV 3.2.M 04/17/2018 © 2018 PCTEST Engineering Laboratory, Inc. All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

T A B L E O F C O N T E N T S 1. INTRODUCTION ............................................................................................................................. 3 2. DUT DESCRIPTION ........................................................................................................................ 4 3. ANSI/IEEE C63.19 PERFORMANCE CATEGORIES .................................................................... 5 4. SYSTEM SPECIFICATIONS ........................................................................................................... 6 5. MODULATION INTERFERENCE FACTOR.................................................................................. 11 6. RF CONDUCTED POWER MEASUREMENTS............................................................................ 13 7. JUSTIFICATION OF HELD TO EAR MODES TESTED ............................................................... 18 8. EQUIPMENT LIST ......................................................................................................................... 19 9. MEASUREMENT UNCERTAINTY ................................................................................................ 20 10. CONCLUSION ............................................................................................................................... 21 11. REFERENCES .............................................................................................................................. 22 Approved by: FCC ID: ZNFX212TA HAC (RF EMISSIONS) TEST REPORT Quality Manager Filename: Test Dates: DUT Type: Page 2 of 23 1M1810290199-01-R2.ZNF 10/29/2018 Portable Handset © 2018 PCTEST Engineering Laboratory, Inc. REV 3.2.M 04/17/2018 © 2018 PCTEST Engineering Laboratory, Inc. All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

1. INTRODUCTION On July 10, 2003, the Federal Communications Commission (FCC) adopted new rules requiring wireless manufacturers and service providers to provide digital wireless phones that are compatible with hearing aids. The FCC has modified the exemption for wireless phones under the Hearing Aid Compatibility Act of 1998 (HAC Act) in WT Docket 01-309 RM-86581 to extend the benefits of wireless telecommunications to individuals with hearing disabilities. These benefits encompass business, social and emergency communications, which increase the value of the wireless network for everyone. An estimated more than 10% of the population in the United States show signs of hearing impairment and of that fraction, almost 80% use hearing aids. Approximately 500 million people worldwide suffer from hearing loss. Compatibility Tests Involved: The standard calls for wireless communications devices to be measured for:  RF Electric-field emissions  T-coil mode, magnetic-signal strength in the audio band  T-coil mode, magnetic-signal frequency response through the audio band  T-coil mode, magnetic-signal and noise articulation index The hearing aid must be measured for:  RF immunity in microphone mode  RF immunity in T-coil mode In the following tests and results, this report includes the evaluation for a wireless communications device. Figure 1-1 Hearing Aid in-vitu 1 FCC Rule & Order, WT Docket 01-309 RM-8658 Approved by: FCC ID: ZNFX212TA HAC (RF EMISSIONS) TEST REPORT Quality Manager Filename: Test Dates: DUT Type: Page 3 of 23 1M1810290199-01-R2.ZNF 10/29/2018 Portable Handset © 2018 PCTEST Engineering Laboratory, Inc. REV 3.2.M 04/17/2018 © 2018 PCTEST Engineering Laboratory, Inc. All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

2. DUT DESCRIPTION FCC ID: ZNFX212TA Manufacturer: LG Electronics U.S.A, Inc. 1000 Sylvan Avenue Englewood Cliffs, NJ 07632 United States Model: LM-X220MA Additional Model(s): LMX220MA, X220MA Serial Number: 02819 Antenna Configurations: Internal Antenna DUT Type: Portable Handset Table 2-1 ZNFX212TA HAC Air Interfaces Band Simultaneous Air-Interface Type Transport HAC Tested Name of Voice Service (MHz) But Not Tested 850 VO No2 Yes: WIFI or BT CMRS Voice GSM 1900 GPRS/EDGE VD No2 Yes: WIFI or BT Google Duo 850 1700 VD No2 Yes: WIFI or BT CMRS Voice UMTS 1900 HSPA VD No2 Yes: WIFI or BT Google Duo 680 (B71) 700 (B12) No 2 850 (B5) 850 (B26) No1 LTE (FDD) VD Yes: WIFI or BT VoLTE, Google Duo 1700 (B4) 1700 (B66) No2 1900 (B2) 1900 (B25) No1 2450 5200 (U-NII 1) WIFI 5300 (U-NII 2A) VD No2 Yes: GSM, UMTS, or LTE VoWIFI, Google Duo 5500 (U-NII 2C) 5800 (U-NII 3) BT 2450 DT No Yes: GSM, UMTS, or LTE N/A Type Transport Notes: VO = Voice Only 1. Evaluated for MIF and low-power exemption. DT = Digital Data - Not intended for CMRS Service 2. This report only pertains to LTE Band 25 & 26. For full data, please refer to the previous VD = CMRS and IP Voice over Data Transport Certification Test Report (RFE Test Report S/N: 1M1802060016-09-R1.ZNF). Approved by: FCC ID: ZNFX212TA HAC (RF EMISSIONS) TEST REPORT Quality Manager Filename: Test Dates: DUT Type: Page 4 of 23 1M1810290199-01-R2.ZNF 10/29/2018 Portable Handset © 2018 PCTEST Engineering Laboratory, Inc. REV 3.2.M 04/17/2018 © 2018 PCTEST Engineering Laboratory, Inc. All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

3. ANSI/IEEE C63.19 PERFORMANCE CATEGORIES I. RF EMISSIONS The ANSI Standard presents performance requirements for acceptable interoperability of hearing aids with wireless communications devices. When these parameters are met, a hearing aid operates acceptably in close proximity to a wireless communications device. Category Telephone RF Parameters E-field emissions Near field Category CW dB(V/m) f < 960 MHz M1 50 to 55 M2 45 to 50 M3 40 to 45 M4 < 40 f > 960 MHz M1 40 to 45 M2 35 to 40 M3 30 to 35 M4 < 30 Table 3-1 WD near-field categories as defined in ANSI C63.19-2011 Approved by: FCC ID: ZNFX212TA HAC (RF EMISSIONS) TEST REPORT Quality Manager Filename: Test Dates: DUT Type: Page 5 of 23 1M1810290199-01-R2.ZNF 10/29/2018 Portable Handset © 2018 PCTEST Engineering Laboratory, Inc. REV 3.2.M 04/17/2018 © 2018 PCTEST Engineering Laboratory, Inc. All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

4. SYSTEM SPECIFICATIONS ER3DV6 E-Field Probe Description Construction: One dipole parallel, two dipoles normal to probe axis Built-in shielding against static charges Calibration: In air from 100 MHz to 3.0 GHz (absolute accuracy ±6.0%, k=2) Frequency: 100 MHz to > 6 GHz; Linearity: ± 0.2 dB (100 MHz to 3 GHz) Directivity ± 0.2 dB in air (rotation around probe axis) ± 0.4 dB in air (rotation normal to probe axis) Figure 4-1 Dynamic Range 2 V/m to > 1000 V/m E-field Free-space (M3 or better device readings fall well below diode Probe compression point) Linearity: ± 0.2 dB Dimensions Overall length: 330 mm (Tip: 16 mm) Tip diameter: 8 mm (Body: 12 mm) Distance from probe tip to dipole centers: 2.5 mm Probe Tip Description HAC field measurements take place in the close near field with high gradients. Increasing the measuring distance from the source will generally decrease the measured field values (in case of the validation dipole approx. 10% per mm). The electric field probes have an irregular internal geometry because it is physically not possible to have the 3 orthogonal sensors situated with the same center. The effect of the different sensor centers is accounted for in the HAC uncertainty budget ("sensor displacement"). Their geometric center is at 2.5mm from the tip, and the element ends are 1.1mm closer to the tip. The antistatic shielding inside the probe is connected to the probe connector case. Approved by: FCC ID: ZNFX212TA HAC (RF EMISSIONS) TEST REPORT Quality Manager Filename: Test Dates: DUT Type: Page 6 of 23 1M1810290199-01-R2.ZNF 10/29/2018 Portable Handset © 2018 PCTEST Engineering Laboratory, Inc. REV 3.2.M 04/17/2018 © 2018 PCTEST Engineering Laboratory, Inc. All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

Instrumentation Chain Equation 1 Probe Response to Frequency The E-field sensors have inherently a very flat frequency response. They are calibrated with a number of frequencies resulting in a common calibration factor, with the frequency behavior documented in the calibration certificate (See also below). Figure 4-2 E-Field Probe Frequency Response Approved by: FCC ID: ZNFX212TA HAC (RF EMISSIONS) TEST REPORT Quality Manager Filename: Test Dates: DUT Type: Page 7 of 23 1M1810290199-01-R2.ZNF 10/29/2018 Portable Handset © 2018 PCTEST Engineering Laboratory, Inc. REV 3.2.M 04/17/2018 © 2018 PCTEST Engineering Laboratory, Inc. All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

SPEAG Robotic System E-field measurements are performed using the DASY5 automated dosimetric assessment system. The DASY5 is made by Schmid & Partner Engineering AG (SPEAG) in Zurich, Switzerland and consists of high precision robotics system (Staubli), robot controller, Intel CORE i7 computer, near- field probe, probe alignment sensor, and the HAC phantom. The robot is a six-axis industrial robot performing precise movements to position the probe to the location (points) of maximum electromagnetic field (EMF). Figure 4-3 SPEAG Robotic System System Hardware A cell controller system contains the power supply, robot controller, teach pendant (Joystick), and a remote control used to drive the robot motors. The PC consists of the computer with operating system and RF Measurement Software DASY5 v52.8 (with HAC Extension), A/D interface card, monitor, mouse, and keyboard. The Staubli Robot is connected to the cell controller to allow software manipulation of the robot. A data acquisition electronic (DAE) circuit that performs the signal amplification, signal multiplexing, AD-conversion, offset measurements, mechanical surface detection, collision detection, etc. is connected to the Electro-optical coupler (EOC). The EOC performs the conversion from the optical into digital electric signal of the DAE and transfers data to the PC plug-in card. Approved by: FCC ID: ZNFX212TA HAC (RF EMISSIONS) TEST REPORT Quality Manager Filename: Test Dates: DUT Type: Page 8 of 23 1M1810290199-01-R2.ZNF 10/29/2018 Portable Handset © 2018 PCTEST Engineering Laboratory, Inc. REV 3.2.M 04/17/2018 © 2018 PCTEST Engineering Laboratory, Inc. All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

System Electronics The DAE consists of a highly sensitive electrometer-grade preamplifier with auto-zeroing, a channel and gain-switching multiplexer, a fast 16 bit AD-converter and a command decoder and control logic unit. Transmission to the PC-card is accomplished through an optical downlink for data and status information and an optical uplink for commands and clock lines. The mechanical probe mounting device includes two different sensor systems for frontal and sidewise probe contacts. They are also used for mechanical surface detection and probe collision detection. The robot uses its own controller with a built in VME-bus computer. Figure 4-4 SPEAG Robotic System Diagram DASY5 Instrumentation Chain The first step of the evaluation is a linearization of the filtered input signal to account for the compression characteristics of the detector diode. The compensation depends on the input signal, the diode type and the DC-transmission factor from the diode to the evaluation electronics. If the exciting field is pulsed, the crest factor of the signal must be known to correctly compensate for peak power. The formula for each channel can be given as: Approved by: FCC ID: ZNFX212TA HAC (RF EMISSIONS) TEST REPORT Quality Manager Filename: Test Dates: DUT Type: Page 9 of 23 1M1810290199-01-R2.ZNF 10/29/2018 Portable Handset © 2018 PCTEST Engineering Laboratory, Inc. REV 3.2.M 04/17/2018 © 2018 PCTEST Engineering Laboratory, Inc. All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

The measurement/integration time per point, as specified by the system manufacturer is >500ms. The signal response time is evaluated as the time required by the system to reach 90% of the expected final value after an on/off switch of the power source with an integration time of 500ms and a probe response time of <5 ms. In the current implementation, DASY5 waits longer than 100ms after having reached the grid point before starting a measurement, i.e., the response time uncertainty is negligible. If the device under test does not emit a CW signal, the integration time applied to measure the electric field at a specific point may introduce additional uncertainties due to the discretization. The tolerances for the different systems had the worst-case of 2.6%. Approved by: FCC ID: ZNFX212TA HAC (RF EMISSIONS) TEST REPORT Quality Manager Filename: Test Dates: DUT Type: Page 10 of 23 1M1810290199-01-R2.ZNF 10/29/2018 Portable Handset © 2018 PCTEST Engineering Laboratory, Inc. REV 3.2.M 04/17/2018 © 2018 PCTEST Engineering Laboratory, Inc. All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

5. MODULATION INTERFERENCE FACTOR I. Measuring Modulation Interference Factors For any specific fixed and repeatable modulated signal, a modulation interference factor (MIF, expressed in dB) may be determined that relates its interference potential to its steady-state RMS signal level or average power level. This factor is a function only of the audio-frequency amplitude modulation characteristics of the signal and is the same for field-strength and conducted power measurements. The MIF is valid only for a specific repeatable audio-frequency amplitude modulation characteristic; any change in modulation characteristic requires determination and application of a new MIF. The MIF may be determined using a radiated RF field or a conducted RF signal: a. Using RF illumination or conducted coupling, apply the specific modulated signal in question to the measurement system at a level within its confirmed operating dynamic range. b. Measure the steady-state RMS level at the output of the fast probe or sensor. c. Measure the steady-state average level at the weighting output. d. Without changing the square-law detector or weighting system, and using RF illumination or conducted coupling, substitute for the specific modulated signal a 1 kHz, 80% amplitude modulated carrier at the same frequency and adjust its strength until the level at the weighting output equals the step c) measurement. e. Without changing the carrier level from step d), remove the 1 kHz modulation and again measure the steady-state RMS level indicated at the output of the fast probe or sensor. f. The MIF for the specific modulation characteristic is provided by the ratio of the step e) measurement to the step b) measurement, expressed in dB (20 × log[(step e)/(step b)]). The following procedure was used to measure the MIF using the SPEAG Audio Interference Analyzer (AIA), Type No: SE UMS 170 CB, Serial No.: 1010: 1. The device was placed into a simulated call using a base station simulator or set to transmit using test software for a given mode. 2. The device was then set to continuously transmit at maximum power. 3. Using a coupler if needed, the device output signal was connected to the RF In port of the AIA, which was connected to a desktop computer. Alternatively, a radiated RF signal may be used with the AIA’s built-in antenna. 4. The MIF measurement procedure in the DASY software was run, and the resulting MIF value was recorded. 5. Steps 1-4 were repeated for all CMRS air interfaces, frequency bands, and modulations. The modulation interference factors obtained were applied to readings taken of the actual wireless device in order to obtain an accurate audio interference level reading using the formula: Audio Interference Level [dB(V/m)] = 20 * log[Raw Field Value (V/m)] + MIF (dB) Because the MIF value is output power independent, MIF values for a given mode should be constant across all devices; however, per C63.19-2011 §D.7, MIF values should be measured for each device being evaluated. The voice modes for this device have been investigated in this section of the report. Approved by: FCC ID: ZNFX212TA HAC (RF EMISSIONS) TEST REPORT Quality Manager Filename: Test Dates: DUT Type: Page 11 of 23 1M1810290199-01-R2.ZNF 10/29/2018 Portable Handset © 2018 PCTEST Engineering Laboratory, Inc. REV 3.2.M 04/17/2018 © 2018 PCTEST Engineering Laboratory, Inc. All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

II. MIF Measurement Block Diagrams Figure 5-1 MIF Measurement Setup for licensed modes III. Measured Modulation Interference Factors: Table 5-1 LTE FDD Modulation Interference Factors1,2 LTE Frequency Bandwidth MIF Channel Modulation RB Size RB Offset Band [MHz] [MHz] [dB] 25 1882.5 26365 20 16QAM 1 0 -10.49 26 831.5 26865 15 16QAM 1 0 -9.99 26 831.5 26865 15 QPSK 1 0 -13.53 26 831.5 26865 15 16QAM 1 36 -10.14 26 831.5 26865 15 16QAM 1 74 -10.16 26 831.5 26865 15 16QAM 36 0 -17.34 26 831.5 26865 15 16QAM 75 0 -19.65 26 831.5 26865 10 16QAM 1 0 -10.01 26 831.5 26865 5 16QAM 1 0 -10.41 26 831.5 26865 3 16QAM 1 0 -10.18 26 831.5 26865 1.4 16QAM 1 0 -9.91 26 814.7 26697 1.4 16QAM 1 0 -10.35 26 848.3 27033 1.4 16QAM 1 0 -10.43 1 Note: Measured MIF values may be lower than sample MIF values provided in ANSI C63.19-2011 Annex D.7 Table D.5 due to manufacturing variations for each device, however per Annex D.7, the sample MIF values of Table D.5 are not intended to substitute for measurements of actual devices under test and their respective operating modes. 2 Note: All FDD LTE bands were found to have substantially similar MIF values given similar RB, BW, and modulation configurations. Approved by: FCC ID: ZNFX212TA HAC (RF EMISSIONS) TEST REPORT Quality Manager Filename: Test Dates: DUT Type: Page 12 of 23 1M1810290199-01-R2.ZNF 10/29/2018 Portable Handset © 2018 PCTEST Engineering Laboratory, Inc. REV 3.2.M 04/17/2018 © 2018 PCTEST Engineering Laboratory, Inc. All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

6. RF CONDUCTED POWER MEASUREMENTS I. Procedures Used to Establish RF Signal for HAC Testing The handset was placed into a simulated call using a base station simulator in a shielded chamber. Such test signals offer a consistent means for testing HAC and are recommended for evaluating HAC. Measurements were taken with a fully charged battery. In order to verify that the device was tested and maintained at full power, this was configured with the base station simulator. II. HAC Measurement Conditions Output Power Verification Maximum output power is verified on the High, Middle and Low channels for all applicable air interfaces. See Table 6-1 for air interface specific settings of transmit power parameters. Table 6-1 Power Control Parameters and Settings by Air Interface Air Interface: Parameter Name: Parameter Set To: LTE TPC “Max Power” III. Setup Used to Measure RF Conducted Powers Power measurements for licensed modes were performed using a base station simulator under digital average power. Figure 6-1 Power Measurement Setup for licensed modes IV. LTE Conducted Powers a. LTE Band 26 Table 6-2 LTE Band 26 (831.5MHz) Conducted Powers – 15MHz Bandwidth LTE Band 26 (Cell) 15 MHz Bandwidth Mid Channel 26865 MPR Allowed per Modulation RB Size RB Offset (831.5 MHz) MPR [dB] 3GPP [dB] Conducted Power [dBm] 1 0 24.11 0 1 36 24.40 0 0 1 74 23.95 0 QPSK 36 0 23.21 1 36 18 22.94 1 0-1 36 37 22.92 1 75 0 22.92 1 1 0 22.85 1 1 36 22.67 0-1 1 1 74 22.76 1 16QAM 36 0 21.92 2 36 18 21.97 2 0-2 36 37 21.96 2 75 0 21.93 2 Note: Since LTE Band 26 at 15MHz bandwidth does not support 3 non-overlapping channels, conducted power measurements were made only on the middle channel. Approved by: FCC ID: ZNFX212TA HAC (RF EMISSIONS) TEST REPORT Quality Manager Filename: Test Dates: DUT Type: Page 13 of 23 1M1810290199-01-R2.ZNF 10/29/2018 Portable Handset © 2018 PCTEST Engineering Laboratory, Inc. REV 3.2.M 04/17/2018 © 2018 PCTEST Engineering Laboratory, Inc. All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

Table 6-3 LTE Band 26 (831.5MHz) Conducted Powers – 10MHz Bandwidth LTE Band 26 (Cell) 10 MHz Bandwidth Low Channel Mid Channel High Channel 26740 26865 26990 MPR Allowed per Modulation RB Size RB Offset MPR [dB] (819.0 MHz) (831.5 MHz) (844.0 MHz) 3GPP [dB] Conducted Power [dBm] 1 0 24.08 24.15 23.99 0 1 25 24.23 24.23 24.24 0 0 1 49 24.19 24.12 24.17 0 QPSK 25 0 23.23 23.22 23.24 1 25 12 23.10 23.22 23.22 1 0-1 25 25 23.05 23.15 23.22 1 50 0 23.10 23.15 23.23 1 1 0 23.23 23.02 23.17 1 1 25 23.20 23.18 23.22 0-1 1 1 49 23.18 23.01 23.23 1 16QAM 25 0 22.14 22.18 22.19 2 25 12 22.14 22.20 22.20 2 0-2 25 25 22.17 22.22 22.23 2 50 0 22.12 22.23 22.11 2 Table 6-4 LTE Band 26 (831.5MHz) Conducted Powers – 5MHz Bandwidth LTE Band 26 (Cell) 5 MHz Bandwidth Low Channel Mid Channel High Channel 26715 26865 27015 MPR Allowed per Modulation RB Size RB Offset MPR [dB] (816.5 MHz) (831.5 MHz) (846.5 MHz) 3GPP [dB] Conducted Power [dBm] 1 0 24.19 23.97 24.26 0 1 12 24.34 24.18 24.38 0 0 1 24 24.30 23.97 24.17 0 QPSK 12 0 23.34 23.29 23.42 1 12 6 23.35 23.38 23.41 1 0-1 12 13 23.25 23.30 23.30 1 25 0 23.26 23.31 23.41 1 1 0 22.96 23.30 23.04 1 1 12 22.95 23.06 22.83 0-1 1 1 24 22.98 22.91 22.75 1 16QAM 12 0 22.21 22.18 22.33 2 12 6 22.22 22.41 22.17 2 0-2 12 13 22.15 22.20 22.41 2 25 0 22.26 22.17 22.36 2 Table 6-5 LTE Band 26 (831.5MHz) Conducted Powers – 3MHz Bandwidth LTE Band 26 (Cell) 3 MHz Bandwidth Low Channel Mid Channel High Channel 26705 26865 27025 MPR Allowed per Modulation RB Size RB Offset MPR [dB] (815.5 MHz) (831.5 MHz) (847.5 MHz) 3GPP [dB] Conducted Power [dBm] 1 0 24.12 24.22 24.09 0 1 7 24.22 24.22 24.15 0 0 1 14 24.27 24.06 24.26 0 QPSK 8 0 23.27 23.22 23.20 1 8 4 23.29 23.23 23.17 1 0-1 8 7 23.27 23.17 23.06 1 15 0 23.25 23.21 23.15 1 1 0 23.20 23.22 22.96 1 1 7 22.91 23.27 23.45 0-1 1 1 14 22.82 23.12 23.21 1 16QAM 8 0 22.29 22.23 22.21 2 8 4 22.27 22.25 22.16 2 0-2 8 7 22.20 22.09 22.23 2 15 0 22.26 22.20 22.24 2 Approved by: FCC ID: ZNFX212TA HAC (RF EMISSIONS) TEST REPORT Quality Manager Filename: Test Dates: DUT Type: Page 14 of 23 1M1810290199-01-R2.ZNF 10/29/2018 Portable Handset © 2018 PCTEST Engineering Laboratory, Inc. REV 3.2.M 04/17/2018 © 2018 PCTEST Engineering Laboratory, Inc. All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

Table 6-6 LTE Band 26 (831.5MHz) Conducted Powers – 1.4MHz Bandwidth LTE Band 26 (Cell) 1.4 MHz Bandwidth Low Channel Mid Channel High Channel 26697 26865 27033 MPR Allowed per Modulation RB Size RB Offset MPR [dB] (814.7 MHz) (831.5 MHz) (848.3 MHz) 3GPP [dB] Conducted Power [dBm] 1 0 24.22 24.31 24.04 0 1 2 24.26 24.33 24.12 0 1 5 24.36 23.99 24.04 0 0 QPSK 3 0 24.22 24.21 24.37 0 3 2 24.26 24.33 24.23 0 3 3 24.20 24.30 24.27 0 6 0 23.24 23.30 23.10 0-1 1 1 0 23.25 23.21 22.88 1 1 2 23.01 23.25 22.87 1 1 5 23.19 23.02 22.84 1 0-1 16QAM 3 0 23.46 22.98 22.76 1 3 2 23.51 23.02 23.33 1 3 3 23.46 22.98 23.25 1 6 0 22.35 22.05 22.28 0-2 2 b. LTE Band 25 Table 6-7 LTE Band 25 (1882.5MHz) Conducted Powers – 20MHz Bandwidth LTE Band 25 (PCS) 20 MHz Bandwidth Low Channel Mid Channel High Channel 26140 26365 26590 MPR Allowed per Modulation RB Size RB Offset MPR [dB] (1860.0 MHz) (1882.5 MHz) (1905.0 MHz) 3GPP [dB] Conducted Power [dBm] 1 0 23.90 24.07 24.05 0 1 50 23.67 24.17 23.96 0 0 1 99 23.90 23.78 24.01 0 QPSK 50 0 22.94 22.93 22.73 1 50 25 22.89 23.01 22.89 1 0-1 50 50 22.71 22.55 22.53 1 100 0 22.78 22.80 22.68 1 1 0 22.64 22.40 22.89 1 1 50 22.81 22.63 22.71 0-1 1 1 99 22.26 22.35 22.42 1 16QAM 50 0 21.92 21.90 21.73 2 50 25 21.82 21.97 21.90 2 0-2 50 50 21.78 21.55 21.60 2 100 0 21.86 21.80 21.68 2 Table 6-8 LTE Band 25 (1882.5MHz) Conducted Powers – 15MHz Bandwidth LTE Band 25 (PCS) 15 MHz Bandwidth Low Channel Mid Channel High Channel 26115 26365 26615 MPR Allowed per Modulation RB Size RB Offset MPR [dB] (1857.5 MHz) (1882.5 MHz) (1907.5 MHz) 3GPP [dB] Conducted Power [dBm] 1 0 24.09 23.86 23.86 0 1 36 24.02 24.06 23.98 0 0 1 74 24.06 23.99 23.91 0 QPSK 36 0 23.10 23.10 22.99 1 36 18 23.01 23.08 23.04 1 0-1 36 37 23.09 23.00 22.92 1 75 0 23.07 23.06 22.91 1 1 0 23.02 23.09 23.08 1 1 36 23.09 23.09 23.09 0-1 1 1 74 23.10 23.09 23.10 1 16QAM 36 0 22.03 22.08 22.09 2 36 18 21.96 22.06 22.08 2 0-2 36 37 21.86 21.93 22.09 2 75 0 21.95 21.96 21.89 2 Approved by: FCC ID: ZNFX212TA HAC (RF EMISSIONS) TEST REPORT Quality Manager Filename: Test Dates: DUT Type: Page 15 of 23 1M1810290199-01-R2.ZNF 10/29/2018 Portable Handset © 2018 PCTEST Engineering Laboratory, Inc. REV 3.2.M 04/17/2018 © 2018 PCTEST Engineering Laboratory, Inc. All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

Table 6-9 LTE Band 25 (1882.5MHz) Conducted Powers – 10MHz Bandwidth LTE Band 25 (PCS) 10 MHz Bandwidth Low Channel Mid Channel High Channel 26090 26365 26640 MPR Allowed per Modulation RB Size RB Offset MPR [dB] (1855.0 MHz) (1882.5 MHz) (1910.0 MHz) 3GPP [dB] Conducted Power [dBm] 1 0 24.17 24.15 24.06 0 1 25 24.18 24.17 24.17 0 0 1 49 24.17 24.16 24.14 0 QPSK 25 0 23.11 23.17 23.17 1 25 12 23.14 23.17 23.16 1 0-1 25 25 23.14 23.05 23.04 1 50 0 23.18 23.18 23.08 1 1 0 23.17 22.57 23.10 1 1 25 23.14 23.18 23.17 0-1 1 1 49 23.18 23.10 23.16 1 16QAM 25 0 22.09 22.18 22.14 2 25 12 22.12 22.18 22.13 2 0-2 25 25 21.97 22.18 22.10 2 50 0 22.10 22.16 22.17 2 Table 6-10 LTE Band 25 (1882.5MHz) Conducted Powers – 5MHz Bandwidth LTE Band 25 (PCS) 5 MHz Bandwidth Low Channel Mid Channel High Channel 26065 26365 26665 MPR Allowed per Modulation RB Size RB Offset MPR [dB] (1852.5 MHz) (1882.5 MHz) (1912.5 MHz) 3GPP [dB] Conducted Power [dBm] 1 0 23.82 23.84 23.95 0 1 12 23.98 23.78 23.99 0 0 1 24 23.80 23.66 23.93 0 QPSK 12 0 22.93 22.99 22.98 1 12 6 22.94 22.99 22.99 1 0-1 12 13 22.96 22.96 22.95 1 25 0 23.00 22.99 22.99 1 1 0 22.81 22.86 22.73 1 1 12 22.97 22.56 22.55 0-1 1 1 24 22.87 22.46 22.53 1 16QAM 12 0 21.86 22.00 21.99 2 12 6 21.99 21.92 21.96 2 0-2 12 13 21.88 21.88 22.00 2 25 0 21.85 21.91 21.89 2 Table 6-11 LTE Band 25 (1882.5MHz) Conducted Powers – 3MHz Bandwidth LTE Band 25 (PCS) 3 MHz Bandwidth Low Channel Mid Channel High Channel 26055 26365 26675 MPR Allowed per Modulation RB Size RB Offset MPR [dB] (1851.5 MHz) (1882.5 MHz) (1913.5 MHz) 3GPP [dB] Conducted Power [dBm] 1 0 23.84 23.94 23.81 0 1 7 23.94 23.94 23.87 0 0 1 14 23.99 23.78 23.98 0 QPSK 8 0 22.99 22.94 22.92 1 8 4 23.01 22.95 22.89 1 0-1 8 7 22.99 22.89 22.78 1 15 0 22.97 22.93 22.87 1 1 0 22.92 22.94 22.68 1 1 7 22.63 22.99 23.17 0-1 1 1 14 22.54 22.84 22.93 1 16QAM 8 0 22.01 21.95 21.93 2 8 4 21.99 21.97 21.88 2 0-2 8 7 21.92 21.81 21.95 2 15 0 21.98 21.92 21.96 2 Approved by: FCC ID: ZNFX212TA HAC (RF EMISSIONS) TEST REPORT Quality Manager Filename: Test Dates: DUT Type: Page 16 of 23 1M1810290199-01-R2.ZNF 10/29/2018 Portable Handset © 2018 PCTEST Engineering Laboratory, Inc. REV 3.2.M 04/17/2018 © 2018 PCTEST Engineering Laboratory, Inc. All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

Table 6-12 LTE Band 25 (1882.5MHz) Conducted Powers – 1.4MHz Bandwidth LTE Band 25 (PCS) 1.4 MHz Bandwidth Low Channel Mid Channel High Channel 26047 26365 26683 MPR Allowed per Modulation RB Size RB Offset MPR [dB] (1850.7 MHz) (1882.5 MHz) (1914.3 MHz) 3GPP [dB] Conducted Power [dBm] 1 0 24.15 24.24 23.97 0 1 2 24.19 24.26 24.05 0 1 5 24.29 23.92 23.97 0 0 QPSK 3 0 24.15 24.14 24.30 0 3 2 24.19 24.26 24.16 0 3 3 24.13 24.23 24.20 0 6 0 23.17 23.23 23.03 0-1 1 1 0 23.18 23.14 22.81 1 1 2 22.94 23.18 22.80 1 1 5 23.12 22.95 22.77 1 0-1 16QAM 3 0 23.39 22.91 22.69 1 3 2 23.44 22.95 23.26 1 3 3 23.39 22.91 23.18 1 6 0 22.28 21.98 22.21 0-2 2 Approved by: FCC ID: ZNFX212TA HAC (RF EMISSIONS) TEST REPORT Quality Manager Filename: Test Dates: DUT Type: Page 17 of 23 1M1810290199-01-R2.ZNF 10/29/2018 Portable Handset © 2018 PCTEST Engineering Laboratory, Inc. REV 3.2.M 04/17/2018 © 2018 PCTEST Engineering Laboratory, Inc. All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

7. JUSTIFICATION OF HELD TO EAR MODES TESTED I. Analysis of RF Air Interface Technologies An analysis was performed, following the guidance of §4.3 and §4.4 of the ANSI standard, of the RF air interface technologies being evaluated. The factors that will affect the RF interference potential were evaluated, and the worst-case operating modes were identified and used in the evaluation. A WD’s interference potential is a function both of the WD’s average near-field field strength and of the signal’s audio-frequency amplitude modulation characteristics. Per §4.4, RF air interface technologies that have low power have been found to produce sufficiently low RF interference potential, so it is possible to exempt them from the product testing specified in Clause 5 of the ANSI standard. An RF air interface technology of a device is exempt from testing when its average antenna input power plus its MIF is ≤17dBm for all of its operating modes. RF air interface technologies exempted from testing in this manner are automatically assigned an M4 rating to be used in determining the overall rating for the WD. The worst-case MIF plus the worst-case average antenna input power for all modes are investigated below to determine the testing requirements for this device. II. Individual Mode Evaluations Table 7-1 Max Power + MIF calculations for Low Power Exemptions Maximum Worst Case Total C63.19 Air Interface Average Power MIF (Power + Testing (dBm) (dB) MIF, dB) Required LTE - FDD 24.40 -9.91 14.49 No III. Low-Power Exemption Conclusions LTE FDD is exempt from RF emissions testing and rated M4 under the low power exemption of Clause 4 of ANSI C63.19-2011. Approved by: FCC ID: ZNFX212TA HAC (RF EMISSIONS) TEST REPORT Quality Manager Filename: Test Dates: DUT Type: Page 18 of 23 1M1810290199-01-R2.ZNF 10/29/2018 Portable Handset © 2018 PCTEST Engineering Laboratory, Inc. REV 3.2.M 04/17/2018 © 2018 PCTEST Engineering Laboratory, Inc. All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

8. EQUIPMENT LIST Table 8-1 Equipment List Manufacturer Model Description Cal Date Cal Interval Cal Due Serial Number Pasternack PE2237-20 Bidirectional Coupler N/A CBT* N/A N/A Rohde & Schwarz CMW500 Radio Communication Tester 5/29/2018 Annual 5/29/2019 162125 Seekonk NC-100 Torque Wrench (8" lb) 5/10/2018 Biennial 5/10/2020 21053 SPEAG AIA Audio Interference Analzyer N/A CBT* N/A 1010 Calibration traceable to the National Institute of Standards and Technology (NIST). *Note: CBT (Calibrated Before Testing). Prior to testing, the measurement paths containing a cable, attenuator, coupler or filter were connected to a calibrated source (i.e. a signal generator) to determine the losses of the measurement path. The power meter offset was then adjusted to compensate for the measurement system losses. This level offset is stored within the power meter before measurements are made. This calibration verification procedure applies to the system verification and output power measurements. The calibrated reading is then taken directly from the power meter after compensation of the losses for all final power measurements. Approved by: FCC ID: ZNFX212TA HAC (RF EMISSIONS) TEST REPORT Quality Manager Filename: Test Dates: DUT Type: Page 19 of 23 1M1810290199-01-R2.ZNF 10/29/2018 Portable Handset © 2018 PCTEST Engineering Laboratory, Inc. REV 3.2.M 04/17/2018 © 2018 PCTEST Engineering Laboratory, Inc. All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

9. MEASUREMENT UNCERTAINTY Table 9-1 Uncertainty Estimation Table Notes: 1. Test equipments are calibrated according to techniques outlined in NIS81, NIS3003 and NIST Tech Note 1297. All equipments have traceability according to NIST. Measurement Uncertainties are defined in further detail in NIS 81 and NIST Tech Note 1297 and UKAS M3003. 2. * Uncertainty specifications from Schmidt & Partner Engineering AG (not site specific) Measurement uncertainty reflects the quality and accuracy of a measured result as compared to the true value. Such statements are generally required when stating results of measurements so that it is clear to the intended audience that the results may differ when reproduced by different facilities. Measurement results vary due to the measurement uncertainty of the instrumentation, measurement technique, and test engineer. Most uncertainties are calculated using the tolerances of the instrumentation used in the measurement, the measurement setup variability, and the technique used in performing the test. While not generally included, the variability of the equipment under test also figures into the overall measurement uncertainty. Another component of the overall uncertainty is based on the variability of repeated measurements (so-called Type A uncertainty). This may mean that the Hearing Aid immunity tests may have to be repeated by taking down the test setup and resetting it up so that there are a statistically significant number of repeat measurements to identify the measurement uncertainty. By combining the repeat measurement results with that of the instrumentation chain using the technique contained in NIS 81 and NIS 3003, the overall measurement uncertainty was estimated. Approved by: FCC ID: ZNFX212TA HAC (RF EMISSIONS) TEST REPORT Quality Manager Filename: Test Dates: DUT Type: Page 20 of 23 1M1810290199-01-R2.ZNF 10/29/2018 Portable Handset © 2018 PCTEST Engineering Laboratory, Inc. REV 3.2.M 04/17/2018 © 2018 PCTEST Engineering Laboratory, Inc. All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

10. CONCLUSION The measurements indicate that LTE bands 26 & 25 of the wireless communications device complies with the HAC limits specified in accordance with the ANSI C63.19 Standard and FCC WT Docket No. 01-309 RM-8658. Precise laboratory measures were taken to assure repeatability of the tests. The tested device complies with the requirements in respect to all parameters specific to the test. The test results and statements relate only to the item(s) tested. Please note that the M-rating for this equipment only represents the field interference possible against a hypothetical and typical hearing aid. The measurement system and techniques presented in this evaluation are proposed in the ANSI standard as a means of best approximating wireless device compatibility with a hearing-aid. The literature is under continual re-construction. Approved by: FCC ID: ZNFX212TA HAC (RF EMISSIONS) TEST REPORT Quality Manager Filename: Test Dates: DUT Type: Page 21 of 23 1M1810290199-01-R2.ZNF 10/29/2018 Portable Handset © 2018 PCTEST Engineering Laboratory, Inc. REV 3.2.M 04/17/2018 © 2018 PCTEST Engineering Laboratory, Inc. All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

11. REFERENCES 1. ANSI/IEEE C63.19-2011, “American National Standard for Methods of Measurement of Compatibility between Wireless Communication Devices and Hearing Aids.”, New York, NY, IEEE, May 2011 2. FCC Office of Engineering and Technology KDB, “285076 D01 HAC Guidance v05,” September 13, 2017 3. FCC Office of Engineering and Technology KDB, “285076 D02 T-Coil Testing for CMRS IP v03,” September 13, 2017 4. FCC Public Notice DA 06-1215, Wireless Telecommunications Bureau and Office of Engineering and Technology Clarify Use of Revised Wireless Phone Hearing Aid Compatibility Standard, June 6, 2006 5. FCC 3G Review Guidance, Laboratory Division OET FCC, May/June 2006 6. Berger, H. S., “Compatibility Between Hearing Aids and Wireless Devices,” Electronic Industries Forum, Boston, MA, May, 1997 7. Berger, H. S., “Hearing Aid and Cellular Phone Compatibility: Working Toward Solutions,” Wireless Telephones and Hearing Aids: New Challenges for Audiology, Gallaudet University, Washington, D.C., May, 1997 (To be reprinted in the American Journal of Audiology). 8. Berger, H. S., “Hearing Aid Compatibility with Wireless Communications Devices, “ IEEE International Symposium on Electromagnetic Compatibility, Austin, TX, August, 1997. 9. Bronaugh, E. L., “Simplifying EMI Immunity (Susceptibility) Tests in TEM Cells,” in the 1990 IEEE International Symposium on Electromagnetic Compatibility Symposium Record, Washington, D.C., August 1990, pp. 488-491 10. Byme, D. and Dillon, H., The National Acoustics Laboratory (NAL) New Procedure for Selecting the Gain and Frequency Response of a Hearing Aid, Ear and Hearing 7:257-265, 1986. 11. Crawford, M. L., “Measurement of Electromagnetic Radiation from Electronic Equipment using TEM Transmission Cells, “ U.S. Department of Commerce, National Bureau of Standards, NBSIR 73-306, Feb. 1973. 12. Crawford, M. L., and Workman, J. L., “Using a TEM Cell for EMC Measurements of Electronic Equipment,” U.S. Department of Commerce, National Bureau of Standards. Technical Note 1013, July 1981. 13. Decker, W. F., Crawford, M. L., and Wilson, W. A., “Construction of a Large Transverse Electromagnetic Cell”, U.S. Department of Commerce, National Bureau of Standards, Technical Note 1011, Feb. 1979. 14. EHIMA GSM Project, Development phase, Project Report (1st part) Revision A. Technical- Audiological Laboratory and Telecom Denmark, October 1993. Approved by: FCC ID: ZNFX212TA HAC (RF EMISSIONS) TEST REPORT Quality Manager Filename: Test Dates: DUT Type: Page 22 of 23 1M1810290199-01-R2.ZNF 10/29/2018 Portable Handset © 2018 PCTEST Engineering Laboratory, Inc. REV 3.2.M 04/17/2018 © 2018 PCTEST Engineering Laboratory, Inc. All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

15. EHIMA GSM Project, Development phase, Part II Project Report. Technical-Audiological Laboratory and Telecom Denmark, June 1994. 16. EHIMA GSM Project Final Report, Hearing Aids and GSM Mobile Telephones: Interference Problems, Methods of Measurement and Levels of Immunity. Technical-Audiological Laboratory and Telecom Denmark, 1995. 17. HAMPIS Report, Comparison of Mobile phone electromagnetic near field with an upscaled electromagnetic far field, using hearing aid as reference, 21 October 1999. 18. Hearing Aids/GSM, Report from OTWIDAM, Technical-Audiological Laboratory and Telecom Denmark, April 1993. 19. IEEE 100, The Authoritative Dictionary of IEEE Standards Terms, Seventh Edition. 20. Joyner, K. H, et. al., Interference to Hearing Aids by the New Digital Mobile Telephone System, Global System for Mobile (GSM) Communication Standard, National Acoustic Laboratory, Australian Hearing Series, Sydney 1993. 21. Joyner, K. H., et. al., Interference to Hearing Aids by the Digital Mobile Telephone System, Global System for Mobile Communications (GSM), NAL Report #131, National Acoustic Laboratory, Australian Hearing Series, Sydney, 1995. 22. Konigstein, D., and Hansen, D., “A New Family of TEM Cells with enlarged bandwidth and Optimized working Volume,” in the Proceedings of the 7th International Symposium on EMC, Zurich, Switzerland, March 1987; 50:9, pp. 127-132. 23. Kuk, F., and Hjorstgaard, N. K., “Factors affecting interference from digital cellular telephones,” Hearing Journal, 1997; 50:9, pp 32-34. 24. Ma, M. A., and Kanda, M., ”Electromagnetic Compatibility and Interference Metrology,” U.S. Department of Commerce, National Bureau of Standards, Technical Note 1099, July 1986, pp. 17-43. 25. Ma, M. A., Sreenivashiah, I. , and Chang, D. C., “A Method of Determining the Emission and Susceptibility Levels of Electrically Small Objects Using a TEM Cell,” U.S. Department of Commerce, National Bureau of Standards, Technial Note 1040, July 1981. 26. McCandless, G. A., and Lyregaard, P. E., Prescription of Gain/Output (POGO) for Hearing Aids, Hearing Instruments 1:16-21, 1983 27. Skopec, M., “Hearing Aid Electromagnetic Interference from Digital Wireless Telephones, “IEEE Transactions on Rehabilitation Engineering, vol. 6, no. 2, pp. 235-239, June 1998. 28. Technical Report, GSM 05.90, GSM EMC Considerations, European Telecommunications Standards Institute, January 1993. 29. Victorian, T. A., “Digital Cellular Telephone Interference and Hearing Aid Compatibility—an Update,” Hearing Journal 1998; 51:10, pp. 53-60 30. Wong, G. S. K., and Embleton, T. F. W., eds., AIP Handbook of Condenser Microphones: Theory, Calibration and Measurements, AIP Press. Approved by: FCC ID: ZNFX212TA HAC (RF EMISSIONS) TEST REPORT Quality Manager Filename: Test Dates: DUT Type: Page 23 of 23 1M1810290199-01-R2.ZNF 10/29/2018 Portable Handset © 2018 PCTEST Engineering Laboratory, Inc. REV 3.2.M 04/17/2018 © 2018 PCTEST Engineering Laboratory, Inc. All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.


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