Part 30 mmWave Test Report 5

FCC ID: ZNFV450VM

Test Report

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FCCID_4294187

QTM 1 - H + V Plot 7-285. Band Edge Plot (1CC 100M QPSK Low Channel – 1 RB 0 offset) Plot 7-286. Band Edge Plot (1CC 100M 16QAM Low Channel – 1 RB 0 offset) MEASUREMENT REPORT Approved by: FCC ID: ZNFV450VM (Class II Permissive Change) Quality Manager Test Report S/N: Test Dates: EUT Type: Page 179 of 202 1M1903070034-14-R2.ZNF 3/21/2019-5/3/2019 Portable Handset © 2019 PCTEST Engineering Laboratory, Inc. V1.0 All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

Plot 7-287. Band Edge Plot (1CC 100M 64QAM Low Channel – 1 RB 0 offset) Plot 7-288. Band Edge Plot (1CC 100M QPSK Low Channel – 32 RB 0 offset) MEASUREMENT REPORT Approved by: FCC ID: ZNFV450VM (Class II Permissive Change) Quality Manager Test Report S/N: Test Dates: EUT Type: Page 180 of 202 1M1903070034-14-R2.ZNF 3/21/2019-5/3/2019 Portable Handset © 2019 PCTEST Engineering Laboratory, Inc. V1.0 All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

Plot 7-289. Band Edge Plot (1CC 100M QPSK Hi Channel– 1 RB 65 offset) Plot 7-290. Band Edge Plot (1CC 100M 16QAM Hi Channel– 1 RB 65 offset) MEASUREMENT REPORT Approved by: FCC ID: ZNFV450VM (Class II Permissive Change) Quality Manager Test Report S/N: Test Dates: EUT Type: Page 181 of 202 1M1903070034-14-R2.ZNF 3/21/2019-5/3/2019 Portable Handset © 2019 PCTEST Engineering Laboratory, Inc. V1.0 All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

Plot 7-291. Band Edge Plot (1CC 100M 64QAM Hi Channel – 1 RB 65 offset) Plot 7-292. Band Edge Plot (1CC 100M QPSK Hi Channel– 32 RB 65 offset) MEASUREMENT REPORT Approved by: FCC ID: ZNFV450VM (Class II Permissive Change) Quality Manager Test Report S/N: Test Dates: EUT Type: Page 182 of 202 1M1903070034-14-R2.ZNF 3/21/2019-5/3/2019 Portable Handset © 2019 PCTEST Engineering Laboratory, Inc. V1.0 All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

7.5.8 N260 4CC 50MHz Bandwidth Band Edges QTM 0 - H + V Plot 7-293. Band Edge Plot (4CC 50M QPSK Low Channel – 1 RB 0 offset) Plot 7-294. Band Edge Plot (4CC 50M 16QAM Low Channel – 1 RB 0 offset) MEASUREMENT REPORT Approved by: FCC ID: ZNFV450VM (Class II Permissive Change) Quality Manager Test Report S/N: Test Dates: EUT Type: Page 183 of 202 1M1903070034-14-R2.ZNF 3/21/2019-5/3/2019 Portable Handset © 2019 PCTEST Engineering Laboratory, Inc. V1.0 All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

Plot 7-295. Band Edge Plot (4CC 50M 64QAM Low Channel – 1 RB 0 offset) Plot 7-296. Band Edge Plot (4CC 50M QPSK Low Channel – 32 RB 0 offset) MEASUREMENT REPORT Approved by: FCC ID: ZNFV450VM (Class II Permissive Change) Quality Manager Test Report S/N: Test Dates: EUT Type: Page 184 of 202 1M1903070034-14-R2.ZNF 3/21/2019-5/3/2019 Portable Handset © 2019 PCTEST Engineering Laboratory, Inc. V1.0 All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

Plot 7-297. Band Edge Plot (4CC 50M QPSK Hi Channel– 1 RB 0 offset) Plot 7-298. Band Edge Plot (4CC 50M 16QAM Hi Channel– 1 RB 0 offset) MEASUREMENT REPORT Approved by: FCC ID: ZNFV450VM (Class II Permissive Change) Quality Manager Test Report S/N: Test Dates: EUT Type: Page 185 of 202 1M1903070034-14-R2.ZNF 3/21/2019-5/3/2019 Portable Handset © 2019 PCTEST Engineering Laboratory, Inc. V1.0 All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

Plot 7-299. Band Edge Plot (4CC 50M 64QAM Hi Channel – 1 RB 0 offset) Plot 7-300. Band Edge Plot (4CC 50M QPSK Hi Channel– 32 RB 0 offset) MEASUREMENT REPORT Approved by: FCC ID: ZNFV450VM (Class II Permissive Change) Quality Manager Test Report S/N: Test Dates: EUT Type: Page 186 of 202 1M1903070034-14-R2.ZNF 3/21/2019-5/3/2019 Portable Handset © 2019 PCTEST Engineering Laboratory, Inc. V1.0 All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

QTM 1 - H + V Plot 7-301. Band Edge Plot (4CC 50M QPSK Low Channel – 1 RB 0 offset) Plot 7-302. Band Edge Plot (4CC 50M 16QAM Low Channel – 1 RB 0 offset) MEASUREMENT REPORT Approved by: FCC ID: ZNFV450VM (Class II Permissive Change) Quality Manager Test Report S/N: Test Dates: EUT Type: Page 187 of 202 1M1903070034-14-R2.ZNF 3/21/2019-5/3/2019 Portable Handset © 2019 PCTEST Engineering Laboratory, Inc. V1.0 All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

Plot 7-303. Band Edge Plot (4CC 50M 64QAM Low Channel – 1 RB 0 offset) Plot 7-304. Band Edge Plot (4CC 50M QPSK Low Channel – 32 RB 0 offset) MEASUREMENT REPORT Approved by: FCC ID: ZNFV450VM (Class II Permissive Change) Quality Manager Test Report S/N: Test Dates: EUT Type: Page 188 of 202 1M1903070034-14-R2.ZNF 3/21/2019-5/3/2019 Portable Handset © 2019 PCTEST Engineering Laboratory, Inc. V1.0 All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

Plot 7-305. Band Edge Plot (4CC 50M QPSK Hi Channel– 1 RB 0 offset) Plot 7-306. Band Edge Plot (4CC 50M 16QAM Hi Channel– 1 RB 0 offset) MEASUREMENT REPORT Approved by: FCC ID: ZNFV450VM (Class II Permissive Change) Quality Manager Test Report S/N: Test Dates: EUT Type: Page 189 of 202 1M1903070034-14-R2.ZNF 3/21/2019-5/3/2019 Portable Handset © 2019 PCTEST Engineering Laboratory, Inc. V1.0 All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

Plot 7-307. Band Edge Plot (4CC 50M 64QAM Hi Channel – 1 RB 0 offset) Plot 7-308. Band Edge Plot (4CC 50M QPSK Hi Channel– 32 RB 0 offset) MEASUREMENT REPORT Approved by: FCC ID: ZNFV450VM (Class II Permissive Change) Quality Manager Test Report S/N: Test Dates: EUT Type: Page 190 of 202 1M1903070034-14-R2.ZNF 3/21/2019-5/3/2019 Portable Handset © 2019 PCTEST Engineering Laboratory, Inc. V1.0 All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

7.5.9 N260 4CC 100MHz Bandwidth Band Edges QTM 0 - H + V Plot 7-309. Band Edge Plot (4CC 100M QPSK Low Channel – 1 RB 0 offset) MEASUREMENT REPORT Approved by: FCC ID: ZNFV450VM (Class II Permissive Change) Quality Manager Test Report S/N: Test Dates: EUT Type: Page 191 of 202 1M1903070034-14-R2.ZNF 3/21/2019-5/3/2019 Portable Handset © 2019 PCTEST Engineering Laboratory, Inc. V1.0 All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

Plot 7-310. Band Edge Plot (4CC 100M 16QAM Low Channel – 1 RB 0 offset) Plot 7-311. Band Edge Plot (4CC 100M 64QAM Low Channel – 1 RB 0 offset) Plot 7-312. Band Edge Plot (4CC 100M QPSK Low Channel – 66 RB 0 offset) MEASUREMENT REPORT Approved by: FCC ID: ZNFV450VM (Class II Permissive Change) Quality Manager Test Report S/N: Test Dates: EUT Type: Page 192 of 202 1M1903070034-14-R2.ZNF 3/21/2019-5/3/2019 Portable Handset © 2019 PCTEST Engineering Laboratory, Inc. V1.0 All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

Plot 7-313. Band Edge Plot (4CC 100M QPSK Hi Channel– 1 RB 65 offset) Plot 7-314. Band Edge Plot (4CC 100M 16QAM Hi Channel– 1 RB 65 offset) MEASUREMENT REPORT Approved by: FCC ID: ZNFV450VM (Class II Permissive Change) Quality Manager Test Report S/N: Test Dates: EUT Type: Page 193 of 202 1M1903070034-14-R2.ZNF 3/21/2019-5/3/2019 Portable Handset © 2019 PCTEST Engineering Laboratory, Inc. V1.0 All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

Plot 7-315. Band Edge Plot (4CC 100M 64QAM Hi Channel – 1 RB 65 offset) Plot 7-316. Band Edge Plot (4CC 100M QPSK Hi Channel– 66 RB 0 offset) MEASUREMENT REPORT Approved by: FCC ID: ZNFV450VM (Class II Permissive Change) Quality Manager Test Report S/N: Test Dates: EUT Type: Page 194 of 202 1M1903070034-14-R2.ZNF 3/21/2019-5/3/2019 Portable Handset © 2019 PCTEST Engineering Laboratory, Inc. V1.0 All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

QTM 1 - H + V Plot 7-317. Band Edge Plot (4CC 100M QPSK Low Channel – 1 RB 0 offset) Plot 7-318. Band Edge Plot (4CC 100M 16QAM Low Channel – 1 RB 0 offset) MEASUREMENT REPORT Approved by: FCC ID: ZNFV450VM (Class II Permissive Change) Quality Manager Test Report S/N: Test Dates: EUT Type: Page 195 of 202 1M1903070034-14-R2.ZNF 3/21/2019-5/3/2019 Portable Handset © 2019 PCTEST Engineering Laboratory, Inc. V1.0 All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

Plot 7-319. Band Edge Plot (4CC 100M 64QAM Low Channel – 1 RB 0 offset) Plot 7-320. Band Edge Plot (4CC 100M QPSK Low Channel – 32 RB 0 offset) MEASUREMENT REPORT Approved by: FCC ID: ZNFV450VM (Class II Permissive Change) Quality Manager Test Report S/N: Test Dates: EUT Type: Page 196 of 202 1M1903070034-14-R2.ZNF 3/21/2019-5/3/2019 Portable Handset © 2019 PCTEST Engineering Laboratory, Inc. V1.0 All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

Plot 7-321. Band Edge Plot (4CC 100M QPSK Hi Channel– 1 RB 0 offset) Plot 7-322. Band Edge Plot (4CC 100M 16QAM Hi Channel– 1 RB 0 offset) MEASUREMENT REPORT Approved by: FCC ID: ZNFV450VM (Class II Permissive Change) Quality Manager Test Report S/N: Test Dates: EUT Type: Page 197 of 202 1M1903070034-14-R2.ZNF 3/21/2019-5/3/2019 Portable Handset © 2019 PCTEST Engineering Laboratory, Inc. V1.0 All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

Plot 7-323. Band Edge Plot (4CC 100M 64QAM Hi Channel – 1 RB 0 offset) Plot 7-324. Band Edge Plot (4CC 100M QPSK Hi Channel– 32 RB 0 offset) MEASUREMENT REPORT Approved by: FCC ID: ZNFV450VM (Class II Permissive Change) Quality Manager Test Report S/N: Test Dates: EUT Type: Page 198 of 202 1M1903070034-14-R2.ZNF 3/21/2019-5/3/2019 Portable Handset © 2019 PCTEST Engineering Laboratory, Inc. V1.0 All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

8.0 CONCLUSION The data collected relate only to the item(s) tested and show that the LG Portable Handset FCC ID: ZNFV450VM complies with all the requirements of Part 30. MEASUREMENT REPORT Approved by: FCC ID: ZNFV450VM (Class II Permissive Change) Quality Manager Test Report S/N: Test Dates: EUT Type: Page 199 of 202 1M1903070034-14-R2.ZNF 3/21/2019-5/3/2019 Portable Handset © 2019 PCTEST Engineering Laboratory, Inc. V1.0 All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

9.0 APPENDIX A 9.1 Virginia Diodes Mixer Verification Certificate MEASUREMENT REPORT Approved by: FCC ID: ZNFV450VM (Class II Permissive Change) Quality Manager Test Report S/N: Test Dates: EUT Type: Page 200 of 202 1M1903070034-14-R2.ZNF 3/21/2019-5/3/2019 Portable Handset © 2019 PCTEST Engineering Laboratory, Inc. V1.0 All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.

c) Pertesr Virginia Diodes, Inc 1 979 2nd SSE Sute 200 Cherlottesvile, VA 22902 Phone: 434—207—3257 Fax: 434—207—2258 Virginia Diodes, Inc. Certificate of Conformance To: PGTEST Engineering Laboratoy From: Viginia Diodes,Inc 6660—8 Dobbin Road aro 2na st se Columbis, MD 21045 Sute 300 Unted States Chariotesile, VA 22902 Packing ListNo: 181120 Today‘s Date: 0508718 Shipping Date: 050818 PO Numbor: 180416.0PIR Atln: Yelena Wedekind Phone: 1—410—290—6052 Guanty Ontemiob siiboad Uilt Deeriton Aumber 1. €a vomreosax 1etmB0r WR OSAX — Spectrur Analyzor Extension Module; SN: SAX 258 "The VDI produt(s in this shpment meat(s) he guidelnes for parformance specifcations estabished in accordance with the corresponding Purchase Order. Data presented in the User Guide, where applcable,has bean obtained in accordance wih VDI‘s Qualty Management System. Allinstuments,used to obtain data, which require callbration have been callirated with equipment traceableto the National Instlute of Standards and Technology (NIST) and through NIST tothe International System of Units(S1) Authorized Signaure Viginia Diodes, Io Page 1 of1 | c) meresr @1e ::z

MEASUREMENT REPORT Approved by: FCC ID: ZNFV450VM (Class II Permissive Change) Quality Manager Test Report S/N: Test Dates: EUT Type: Page 202 of 202 1M1903070034-14-R2.ZNF 3/21/2019-5/3/2019 Portable Handset © 2019 PCTEST Engineering Laboratory, Inc. V1.0 All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTEST.COM.


Document Created: 2019-05-31 20:33:04
Document Modified: 2019-05-31 20:33:04
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