HAC RFE Test Setup Photographs

FCC ID: ZNFL82VL

Test Setup Photos

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FCCID_2906055

18.           TEST PHOTOGRAPHS
See following Attached Pages for setup photographs.




                                                                                                                                                                      Reviewed by:
 FCC ID: ZNFL82VL                                                               HAC (RF EMISSIONS) TEST REPORT
                                                                                                                                                                      Quality Manager
 Filename:                    Test Dates:                                                EUT Type:
                                                                                                                                                                      Page 56 of 58
 0Y1601180114.ZNF             01/18/2016 - 01/19/2016                                    Portable Handset
© 2016 PCTEST Engineering Laboratory, Inc.                                                                                                                                        REV 3.1.M
                                                                                                                                                                                  09/23/2015
© 2015 PCTEST Engineering Laboratory, Inc. All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or
mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an
enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTESTLAB.COM.


                                                                   Figure 18-1
                                                   Ear Reference Point HAC Phantom Alignment




                                                                         Figure 18-2
                                                                 HAC Phantom Plane Alignment
                                                                                                                                                                      Reviewed by:
 FCC ID: ZNFL82VL                                                               HAC (RF EMISSIONS) TEST REPORT
                                                                                                                                                                      Quality Manager
 Filename:                    Test Dates:                                                EUT Type:
                                                                                                                                                                      Page 57 of 58
 0Y1601180114.ZNF             01/18/2016 - 01/19/2016                                    Portable Handset
© 2016 PCTEST Engineering Laboratory, Inc.                                                                                                                                        REV 3.1.M
                                                                                                                                                                                  09/23/2015
© 2015 PCTEST Engineering Laboratory, Inc. All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or
mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an
enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTESTLAB.COM.


                                                           Figure 18-3 5x5 Scan grid above WD
                                                          (Acoustic centered scan area pictured)




                                                            Figure 18-4 E-Field WD Scan overlay
                                                            (T-coil centered scan area pictured)


                                                                                                                                                                      Reviewed by:
 FCC ID: ZNFL82VL                                                               HAC (RF EMISSIONS) TEST REPORT
                                                                                                                                                                      Quality Manager
 Filename:                    Test Dates:                                                EUT Type:
                                                                                                                                                                      Page 58 of 58
 0Y1601180114.ZNF             01/18/2016 - 01/19/2016                                    Portable Handset
© 2016 PCTEST Engineering Laboratory, Inc.                                                                                                                                        REV 3.1.M
                                                                                                                                                                                  09/23/2015
© 2015 PCTEST Engineering Laboratory, Inc. All rights reserved. Unless otherwise specified, no part of this report may be reproduced or utilized in any part, form or by any means, electronic or
mechanical, including photocopying and microfilm, without permission in writing from PCTEST Engineering Laboratory, Inc. If you have any questions about this international copyright or have an
enquiry about obtaining additional rights to this report or assembly of contents thereof, please contact INFO@PCTESTLAB.COM.



Document Created: 2017-11-18 14:10:47
Document Modified: 2017-11-18 14:10:47

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