SAR Report 3

FCC ID: VUJAT870

RF Exposure Info

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FCCID_1118824

Report No.: 2008-341-055 Appendix B. Calibration Data Sheets E-Field Probe 3020 DAE 559 Dipole Antenna D835V2 481 Dipole Antenna D1900V2 5d038 Dipole Antenna D2450V2 746 1271-12, Sa-dong, Sangnok-gu, Ansan-si, Gyeonggi-do, 426-901 KOREA Tel. : +82-31-500-0133 http://www.ktl.re.kr Fax. : +82-31-500-0159 FP-204-03-01

Calibration Laboratory of Schwelzerischer Kallbrierdienst Schmid & Partner Service suisse d‘étalonnage Engineering AG Servizio svizzero dtaratura Zeughausstrasse 43, 8004 Zurich, Switzeriand Swiss Calibration Service Accredited by the Swiss Accreditation Service (SAS) Accreditation No.: SCS 108 The Swiss Accreditation Service is one of the signatories to the EA Multilatoral Agreement for the recognition of callbration certificates e * e This callbration certficate documents the traceabilty to national standards, which realize the physical units of measurements (S1) The measurements and the uncertainties wih confidence probabilty are given on the following pages and are part of the certficate. Alleallbrations have been conducted in the closed laboratory facilty: environment temperature (22 + 3)°C and humidity < 70%. Calibration Equipment used (MATE critical for calibration) Primary Standards __|io# _ Cal Date (Certficate No.) _ Scheduled Calloration Power mater E44198 cBerz0ser4 1—Apr—08 (No. 217—00788) Aprroo Power sensor E4412A mvaraoser? 1—Apr—08 (No. 217—00788) Aproo Power sensor E4412A mvatassost 1—Apr—08 (No. 217—00788) Aprog Reference 3 dB Aftenuator SN: 85054 (3c) 1—Jut—08 (No. 217—00865) Jul09 Reference 20 dB Attenuator sh: sso8e (200) 31—Mar—08 (No. 217—00787) Aprog Reference 30 dB Aftenuator SN: 85129 (30b) 1—Jut—08 (No. 217—00866) 4u—08 Reference Probe ES3DV2 s so13 2=an—08 (No. ES3—3013_Jand8) Jan—09 DAE4 SN: 660 3—ep—07 (No. DAE4—660_SepO7) Sep—08 Secondary Standards n# Check Date (in house) Scheduled Chack RF generator HP 8648C ussee2u01700 4—Aug—99 (in house check Oct—07) in house checc Oct—09 Notwork Analyzor HP 8753E usarssoses 18—0ct—01 (in house check Oct—07) in house check: 0ct.08 Name Function Signature Calborated by: Approved by: Issued: July 21, 2008 This callbration certficate shall not be reproduced except in full without written approval of the laboratory. Certficate No: ES3—3020_Jul08 Page 1 of 9

Calibration Laboratory of Schweizerischer Kallbrierdienst Schmid & Partner Service sulsse d‘étalonnage Engineering AG Servizio svizzero di taratura Zeughausstrasse 43, 8004 Zurich, Switzerland Swiss Callbration Service Accredited by the Swiss Accreditation Service (SAS) Accreditation No.: SCS 108 The Swiss Accreditation Service is one of the signatories to the EA Multilateral Agroement for the recognition of callbration certificates Glossary: TSL tissue simulating liquid NORMx,y,z sensitivity in free space ConvF sensitivity in TSL / NORMx.y,z DCP diode compression point Polarization p @ rotation around probe axis Polarization $ $ rotation around an axis thatis in the plane normal to probe axis (at measurement center), i.e., 8 = 0 is normal to probe axis Calibration is Performed According to the Following Standards: a) IEEE Std 1528—2003, "IEEE Recommended Practice for Determining the Peak Spatial— Averaged Specific Absorption Rate (SAR) in the Human Head from Wireless Communications Devices: Measurement Techniques", December 2003 b) IEC 62209—1, "Procedure to measure the Specific Absorption Rate (SAR) for hand—held devices used in close proximity to the ear(frequency range of 300 MHz to 3 GHz)", February 2005 Methods Applied and Interpretation of Parameters: NORMx,y,z: Assessed for E—field polarization 8 = 0 (f < 900 MHz in TEM—cell; f > 1800 MHz: R22 waveguide). NORMx,y,z are only intermediate values, i.e., the uncertainties of NORMx,y,z does not effect the E*—field uncertainty inside TSL (see below ConvF). NORM(Mx,y,z = NORMx,y,z * frequency_response (see Frequency Response Chart). This linearization is implemented in DASY4 software versions later than 4.2. The uncertainty of the frequency responseis included in the stated uncertainty of ConV. DCPx,y,z: DCP are numerical linearization parameters assessed based on the data of power sweep (no uncertainty required). DCP does not depend on frequency nor media. ConvF and Boundary Effect Parameters: Assessed in flat phantom using E—field (or Temperature Transfer Standard for f < 800 MHz) and inside waveguide using analytical field distributions based on power measurements for f > 800 MHz. The same setups are used for assessment of the parameters applied for boundary compensation (alpha, depth) of which typical uncertainty values are given. These parameters are used in DASY4 software to improve probe accuracy close to the boundary. The sensitivity in TSL corresponds to NORMx,y,z * ConvF whereby the uncertainty corresponds to that given for ConvF. A frequency dependent ConvF is used in DASY version 4.4 and higher which allows extending the validity from + 50 MHz to £ 100 MHz. Spherical isotropy (3D deviation from isotropy): in a field of low gradients realized using a flat phantom exposed by a patch antenna. Sensor Offset: The sensor offset corresponds to the offset of virtual measurement center from the probetip (on probe axis). No tolerance required. Certificate No: ES3—3020_Jul08 Page 2 of 9

ES3DV2 SN:3020 July 21, 2008 Probe ES3DV2 SN:3020 Manufactured: December 5, 2002 Last calibrated: July 18, 2007 Recalibrated: July 21, 2008 Calibrated for DASY Systems (Note: non—compatible with DASY2 system!) Certificate No: ES3—3020_Jul08 Page 3 of 9

ES3DV2 SN:3020 July 21, 2008 DASY — Parameters of Probe: ES3DV2 SN:3020 Sensitivity in Free Space® Diode Compression® NormX 110 £10.1% pVi(Vim) DCP x 95 mV Norm¥ 0.99 £10.1% uV/(V/im)" DCP Y 95 mV NormZ 1.03 £10.1% pV/(V/im)® DCP Z 95 mV Sensitivity in Tissue Simulating Liquid (Conversion Factors) Please see Page 8. Boundary Effect TSL 900 MHz Typical SAR gradient: 5 % per mm Sensor Center to Phantom Surface Distance 3.0 mm 4.0 mm SARse [%] Without Correction Algorithm 7.A 4.3 SARse [%] With Correction Algorithm 0.8 0.5 TSL 1810 MHz Typical SAR gradient: 10 % per mm Sensor Center to Phantom Surface Distance 3.0 mm 4.0 mm SARs, [%] Without Correction Algorithm 6.8 4.1 SARse [%] With Correction Algorithm 0.8 0.6 Sensor Offset Probe Tip to Sensor Center 2.1 mm (The reported uncertainty of measurementis stated as the standard uncertainty of measurement multiplied by the coverage factor k=2, which for a normaldistribution corresponds to a coverage probability of approximately 95%. * The uncertaintis of NormX,Y,Z do not affect the E—feld uncertainty inside TSL (see Page 8). * Numerical linearization parameter: uncertainty not required. Certificate No: ES3—3020_Jul08 Page 4 of 9

ES3DV2 SN:3020 July 21, 2008 Frequency Response of E—Field (TEM—Cell:ifi110 EXX, Waveguide: R22) Frequency response (normalized) 5 0.9 t t — —— I| m o8 } — } | | | | i— | || o7 o6 _ | os 1 Snsetss —| o 500 1000 1500 2000 2500 3000 f [MHz] —o—TeM —o—Rez Uncertainty of Frequency Response of E—field: £ 6.3% (k=2) Certficate No: ES3—3020_Jul08 Page 5 of 9

ES3DV2 SN:3020 July 21, 2008 Receiving Pattern (¢), 9 = 0° £= 1800 MHz, WG R22 \ ‘—.—X —@—y <@—2 —0—Tot —@—X —@—Y —@—2 —O—Tot —0—30 MHz s —m— 100 MHz $ —>—600 MHz | 5 —=— 1800 MHz & —a—2500MHz: 0 60 120 180 240 300 Uncertainty of Axial Isotropy Assessment: £ 0.5% (k=2) Certficate No: ES3—3020_Jul08 Page 6 of 9

ES3DV2 SN:3020 July 21, 2008 Dynamic Range f(SARneaq) (Waveguide R22, f = 1800 MHz) 1.E+06 3 Input Signal [uV) 1.2+03 1.6+02 1.E+01 1.E+00 — " 0.0001 0.001 0.01 0. 1 10 100 SAR [mWiem‘] —@—not compensated —4— compensated 0.001 a.01 0. 1 10 100 SAR [mWiom‘] Uncertainty of Linearity Assessment: £ 0.6% (k=2) Certificate No: ES3—3020_Jul08 Page 7 of

ES3DV2 SN:3020 July 21, 2008 Conversion Factor Assessment £= 1810 MHz, WGLS R22 (head) 30.0 ts bal o SAR[mW/cm] / W n 9 o 0 9 & 0 5.0 aip 1—W—L—L—L ‘ | 0 10 20 30 40 z[mm] —0—Measurements —O—Analytical —0— Measuremenlsr f [MHz] Validity [MHz]® TSL Permittivity Conductivity __Alpha Depth___ConvF Uncertainty 900 *50 /+ 100 Head 41.5%5% 0.97£5% 052 143 6.12 £11.0% (k=2) 1810 £50/2 100 Head 40.0£5% 140 £5% 0.48 148 5.03 £11.0% (k=2) 1950 £50/2 100 Head 40.0%5% 140 £5% 0.51 1.38 4.77 £11.0% (k2) 2450 £50/%100 Head 39.215% 1.8025% 052 1.31 4.33 £11.0% (k=2) 835 50 /+ 100 Body 55.245% 0.97£5% 0.54 1.37 6.21. £11.0% (k=2) 1950 £50/2 100 Body 53.315% 1.52+5% 0.38 1.84 4.58 £11.0% (k=2) 2450 £50/£100 Body 52.715% 1.95£5% 0.45 142 3.82. £11.0% (k=2) © The validity of £ 100 MHz only applies for DASY v4.4 and higher (see Page 2). The uncertainty is the RSS of the ConvF uncertainty at callbration frequency and the uncertainty for the indicated frequency band. Certificate No: ES3—3020_Jul08 Page 8 of 9

ES3DV2 SN:3020 July 21, 2008 Deviation from Isotropy in HSL Error (6, 3), f = 900 MHz Error [dB] m—1.00—0.80 ©—0.80—0.60 —0.60—0.40 ©—0.40—0.20 ©—0.20—0.00 ©0.00—0.20 020040 ©0.40.0.60 ©0.60—0.80 M0.80—1.00 Uncertainty of Spherical Isotropy Assessment: £ 2.6% (k=2) Certificate No: ES3—3020_Jul08 Page 9 of 9

Calibration Laboratory of wg, & @/ > Schweizerischer Kalibrierdienst Schmid & Partner M Service suisse d‘étalonnage Engineering AG I m Servizio svizzero di taratura Zeughausstrasse 43, 8004 Zurich, Switzerland *4//_/\\\\3 o Swiss Calibration Service Tuhstubs Accredited by the Swiss Accreditation Service (SAS) Accreditation No.: SCS 108 The Swiss Accreditation Service is one of the signatories to the EA Multilateral Agreement for the recognition of calibration certificates Client Certificate No: DAE4—559_Mar07 [CALIBRATIONCERTIFICATE | Object DAE4 — SD 000 DO4 BA — SN: 559 Calibration procedure(s) QA CAL—O6.v12 Calibration procedure for the data acquisition electronics (DAE) Calibration date: March 13, 2008 Condition of the calibrated item In Tolerance This calibration certificate documents the traceability to national standards, which realize the physical units of measurements (S1). The measurements and the uncertainties with confidence probability are given on the following pages and are part of the certificate. All calibrations have been conducted in the closed laboratory facility: environment temperature (22 + 3)°C and humidity < 70%. Calibration Equipment used (M&TE critical for calibration) Primary Standards ID # Cal Date (Calibrated by, Certificate No.) Scheduled Calibration Fluke Process Calibrator Type 702. SN: 6295803 04—Oct—07 (Elcal AG, No: 6467) Oct—08 Keithley Multimeter Type 2001 SN: 0810278 03—Oct—07 (Elcal AG, No: 6465) Oct—08 Secondary Standards ID # Check Date (in house) Scheduled Check Calibrator Box V1.1 SE UMS 006 AB 1004 25—Jun—07 (SPEAG, in house check) In house check Jun—08 Name Function Signature Calibrated by: Dominique Steffen Technician D M\ Approved by: Fin Bomholt R&D Director ‘Nfl W Issued: March 13, 2008 This calibration certificate shall not be reproduced except in full without written approval of the laboratory. Certificate No: DAE4—559_Mar08 Page 1 of 5

Calibration Laboratory of atl?‘m, SNY\ /z Schweizerischer Kalibrierdienst Schmid & Partner M in Service suisse d‘étalonnage Engineering AG Ts Servizio svizzero di taratura zNe Zeughausstrasse 43, 8004 Zurich, Switzerland */1//_\\\\\\\0 Swiss Calibration Service "thilals Accredited by the Swiss Federal Office of Metrology and Accreditation Accreditation No.: SCS 108 The Swiss Accreditation Service is one of the signatories to the EA Multilateral Agreementfor the recognition of calibration certificates Glossary DAE data acquisition electronics Connector angle information used in DASY system to align probe sensor X to the robot coordinate system. Methods Applied and Interpretation of Parameters e DC Voltage Measurement: Calibration Factor assessed for use in DASY system by comparison with a calibrated instrument traceable to national standards. The figure given corresponds to the full scale range of the voltmeter in the respective range. * Connector angle: The angle of the connector is assessed measuring the angle mechanically by a tool inserted. Uncertainty is not required. e The following parameters as documented in the Appendix contain technical information as a result from the performance test and require no uncertainty. e DC Voltage Measurement Linearity: Verification of the Linearity at +10% and —10% of the nominal calibration voltage. Influence of offset voltage is included in this measurement. e Common mode sensitivity: Influence of a positive or negative common mode voltage on the differential measurement. e Channel separation: Influence of a voltage on the neighbor channels not subject to an input voltage. e AD Converter Values with inputs shorted: Values on the internal AD converter corresponding to zero input voltage * Input Offset Measurement: Output voltage and statistical results over a large number of zero voltage measurements. * Input Offset Current: Typical value for information; Maximum channel input offset current, not considering the input resistance. e Input resistance: DAE input resistance at the connector, during internal auto—zeroing and during measurement. e Low Battery Alarm Voltage: Typical value for information. Below this voltage, a battery alarm signal is generated. «_ Power consumption: Typical value for information. Supply currents in various operating modes. Certificate No: DAE4—559_Mar08 Page 2 of 5

DC Voltage Measurement A/D — Converter Resolution nominal High Range: 1LSB = 6.AuV , full range = ~100... +300 mV Low Range: 1LSB = 61nv , full range = L e +3mV DASY measurement parameters: Auto Zero Time: 3 sec; Measuring time: 3 sec Calibration Factors X Y Z High Range 403.771 + 0.1% (k=2) 403.915+0.1% (k=2) 403.951+0.1% (k=2) Low Range 3.96867 + 0.7% (k=2) 3.95750 + 0.7% (k=2) 3.96987 + 0.7% (k=2) Connector Angle Connector Angle to be used in DASY system 331°%41° Certificate No: DAE4—559_Mar08 Page 3 of 5

Appendix 1. DC Voltage Linearity High Range Input (uV) Reading (uV) Error (%) Channel X + Input 200000 199999.9 0.00 Channel X + Input 20000 20000.10 0.00 Channel X — Input 20000 —20003.47 0.02 Channel Y + Input 200000 199999.6 0.00 Channel Y + Input 20000 19998.07 —0.01 Channel Y — Input 20000 —20001.18 0.01 Channel Z + Input 200000 199999.6 0.00 Channel Z + Input 20000 20001.44 0.01 Channel Z — Input 20000 —20002.87 0.01 Low Range Input (1V) Reading (uV) Error (%) Channel X + Input 2000 2000.1 0.00 Channel X + Input 200 200.18 0.09 Channel X — Input 200 ~199.56 —0.22 Channel Y + Input 2000 1999.9 0.00 Channel Y + Input 200 199.48 —0.26 Channel Y — Input 200 —200.47 0.23 Channel Z + Input 2000 2000 0.00 Channel Z + Input 200 199.36 —0.32 Channel Z — Input 200 ~200.92 0.46 2. Common mode sensitivity DASY measurement parameters: Auto Zero Time: 3 sec; Measuring time: 3 sec Common mode High Range Low Range Input Voltage (mV) Average Reading (uV) Average Reading (1V) Channel X 200 ~4.80 5.71 —200 8.30 6.41 Channel Y 200 17.28 17.42 —200 —18.47 —18.64 Channel Z 200 —8.93 —9.51 —200 8.77 8.45 3. Channel separation DASY measurement parameters: Auto Zero Time: 3 sec; Measuring time: 3 sec Input Voltage (mV) Channel X (uV) Channel Y (uV) Channel Z (uV) Channel X 200 — 144 —0.08 Channel Y 200 1.39 — 3.67 Channel Z 200 —0.59 0.22 — Certificate No: DAE4—559_Mar08 Page 4 of 5

4. AD—Converter Values with inputs shorted DASY measurement parameters: Auto Zero Time: 3 sec; Measuring time: 3 sec High Range (LSB) Low Range (LSB) Channel X 16269 14082 Channel Y 16276 16735 Channel Z 15896 14213 5. Input Offset Measurement DASY measurement parameters: Auto Zero Time: 3 sec; Measuring time: 3 sec Input 10MQ Average (1V) min. Offset (uV) max. Offset (uV) std. l():‘\;;atlon Channel X —0.00 —0.94 0.83 0.36 Channel Y ~1.06 —2.34 0.23 0.39 Channel Z 0.11 ~1.05 0.99 0.36 6. Input Offset Current Nominal Input circuitry offset current on all channels: <25fA 7. Input Resistance Zeroing (MOhm) Measuring (MOhm) Channel X 0.2001 201.6 Channel Y 0.2000 200.4 Channel Z 0.2001 201.0 8. Low Battery Alarm Voltage (verified during pre test) Typical values Alarm Level (VDC) Supply (+ Vec) +7.9 Supply (— Vec) —7.6 9. Power Consumption (verified during pre test) Typical values Switched off (mA) Stand by (mA) Transmitting (mA) Supply (+ Vec) +0.0 +6 +14 Supply (— Vec) —0.01 —8 —9 Certificate No: DAE4—559_Mar08 Page 5 of 5


Document Created: 2009-05-20 18:09:01
Document Modified: 2009-05-20 18:09:01
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