DCD test report_rev1

FCC ID: TE7WCS200

Test Report

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FCCID_3904044

i 1SSUED BY Shenzhen BALUN Technology Co., Ltd. | FOR 10W Wireless Fast Charging Station IsSUED TO TP—Link Technologies Co., Ltd. Building 24 (floors 1,3,4,5) and 28 (floors1—4) Central Science and ) Technology Park, Shennan Rd, Nanshan, Shenzhen, China EUT Na‘me:i 10W Wireless Fast Charging Station Mode! Name: IiyinNesszlolo SenelQEuo) to—link §CSasebeEle® 47 CFR Part 15 Subpart C [SefeftJp} TEZWCS200 Test Cc‘)h_cl,usien':_: Pass cceAApr. 15, 2018 ~ Apr. 13, 2018 [pEICOAEETEA Jun. 25, 2018 NOTE: This test report oftest results only related to testing samples, which can be duplicated completelyfor the legal use withthe approval of the applicant; it shall not be reproduced except infull, withoutthe written approval ofShenzhen BALUN Technology Co., Ltd. BALUNLaboratory. Anyobjections should be raised within thirty daysfromthe date ofissue. To validate the report, please contact us. Block B, 1st FL,Baisha Science and Technology Park, Shahe Xi Road, Nanshan District, Shenzhen, Guangdong, P. R. China 518055 TEL: +86—755—66850100, FAX: +86—755—61824271 0_ S _ _ Email: qe@baluntek.com ayin e www.baluntek.com | C k . mR eeeenne

Report No.: BL-SZ1830386-402 Revision History Version Issue Date Revisions Rev. 01 May 30, 2018 Initial Issue Rev. 02 Jun. 25, 2018 Update the Frequency Range on page 5 TABLE OF CONTENTS 1 GENERAL INFORMATION ..................................................................................................................... 4 1.1 Identification of the Testing Laboratory ............................................................................................. 4 1.2 Identification of the Responsible Testing Location ............................................................................ 4 1.3 Laboratory Condition ......................................................................................................................... 4 1.4 Announce .......................................................................................................................................... 4 2 PRODUCT INFORMATION ..................................................................................................................... 5 2.1 Applicant Information ........................................................................................................................ 5 2.2 Manufacturer Information .................................................................................................................. 5 2.3 Factory Information ........................................................................................................................... 5 2.4 General Description for Equipment under Test (EUT) ...................................................................... 5 2.5 Ancillary Equipment .......................................................................................................................... 5 2.6 Technical Information ........................................................................................................................ 5 3 SUMMARY OF TEST RESULTS ............................................................................................................. 6 3.1 Test Standards .................................................................................................................................. 6 3.2 Verdict ............................................................................................................................................... 6 3.3 Test Uncertainty ................................................................................................................................ 6 4 GENERAL TEST CONFIGURATIONS .................................................................................................... 7 4.1 Test Environments ............................................................................................................................ 7 4.2 Test Equipment List .......................................................................................................................... 7 4.3 Test Setups ....................................................................................................................................... 8 5 TEST ITEMS.......................................................................................................................................... 10 5.1 Emission Tests ................................................................................................................................ 10 ANNEX A TEST RESULTS....................................................................................................................... 13 A.1 Radiated Emission .......................................................................................................................... 13 A.2 Conducted Emission ....................................................................................................................... 17 A.3 20 dB Bandwidth ............................................................................................................................. 19 2 / 20

Report No.: BL-SZ1830386-402 ANNEX B TEST SETUP PHOTOS ........................................................................................................... 20 ANNEX C EUT EXTERNAL PHOTOS ...................................................................................................... 20 ANNEX D EUT INTERNAL PHOTOS ....................................................................................................... 20 3 / 20

Report No.: BL-SZ1830386-402 1 GENERAL INFORMATION 1.1 Identification of the Testing Laboratory Company Name Shenzhen BALUN Technology Co., Ltd. Block B, 1st FL, Baisha Science and Technology Park, Shahe Xi Address Road, Nanshan District, Shenzhen, Guangdong Province, P. R. China Phone Number +86 755 6685 0100 1.2 Identification of the Responsible Testing Location Test Location Shenzhen BALUN Technology Co., Ltd. Block B, 1st FL, Baisha Science and Technology Park, Shahe Xi Address Road, Nanshan District, Shenzhen, Guangdong Province, P. R. China The laboratory has been listed by Industry Canada to perform electromagnetic emission measurements. The recognition numbers of test site are 11524A-1. The laboratory is a testing organization accredited by FCC as a accredited testing laboratory. The designation number is CN1196. Accreditation The laboratory is a testing organization accredited by American Certificate Association for Laboratory Accreditation(A2LA) according to ISO/IEC 17025.The accreditation certificate is 4344.01. The laboratory is a testing organization accredited by China National Accreditation Service for Conformity Assessment (CNAS) according to ISO/IEC 17025. The accreditation certificate number is L6791. All measurement facilities used to collect the measurement data are located at Block B, FL 1, Baisha Science and Technology Park, Shahe Description Xi Road, Nanshan District, Shenzhen, Guangdong Province, P. R. China 518055 1.3 Laboratory Condition Ambient Temperature 20℃ to 25℃ Ambient Relative 45% to 55% Humidity Ambient Pressure 100 kPa to 102 kPa 1.4 Announce (1) The test report reference to the report template version v2.5. (2) The test report is invalid if not marked with the signatures of the persons responsible for preparing and approving the test report. (3) The test report is invalid if there is any evidence and/or falsification. (4) The results documented in this report apply only to the tested sample, under the conditions and modes of operation as described herein. (5) This document may not be altered or revised in any way unless done so by BALUN and all revisions are duly noted in the revisions section. (6) Content of the test report, in part or in full, cannot be used for publicity and/or promotional purposes without prior written approval from the laboratory. 4 / 20

Report No.: BL-SZ1830386-402 2 PRODUCT INFORMATION 2.1 Applicant Information Applicant TP-Link Technologies Co., Ltd. Building 24 (floors 1,3,4,5) and 28 (floors1-4) Central Science and Address Technology Park, Shennan Rd, Nanshan, Shenzhen, China 2.2 Manufacturer Information Manufacturer TP-Link Technologies Co., Ltd. Building 24 (floors 1,3,4,5) and 28 (floors1-4) Central Science and Address Technology Park, Shennan Rd, Nanshan, Shenzhen, China 2.3 Factory Information Factory N/A Address N/A 2.4 General Description for Equipment under Test (EUT) EUT Name 10W Wireless Fast Charging Station Model Name Under Test TL-WCS200 Series Model Name N/A Description of Model N/A name differentiation Hardware Version N/A Software Version N/A Dimensions (Approx.) N/A Weight (Approx.) N/A 2.5 Ancillary Equipment Note: Not application. 2.6 Technical Information Network and Wireless QI connectivity The requirement for the following technical information of the EUT was tested in this report: Frequency Range 110.5kHz~205kHz Mobile Product Type Portable Fix Location Antenna Type Coil Antenna Antenna Gain 0 dBi The EUT support the QI and PMA technology, and they have the About Product same operating frequency. 5 / 20

Report No.: BL-SZ1830386-402 3 SUMMARY OF TEST RESULTS 3.1 Test Standards No. Identity Document Title 47 CFR Part 15, Subpart C 1 Intentional Radiators (10-1-16 Edition) American National Standard for Testing Unlicensed 2 ANSI C63.10-2013 Wireless Devices 3.2 Verdict No. Description FCC Rule Test Verdict Result 1 Radiated Emission 15.209,15.215(b) Pass Annex A.1 2 Conducted Emission, AC Ports 15.207 Pass Annex A.2 3 20 dB Bandwidth 15.215(c) Pass Annex A.3 3.3 Test Uncertainty The following measurement uncertainty levels have been estimated for tests performed on the EUT as specified in CISPR 16-4-2.This uncertainty represents an expanded uncertainty expressed at approximately the 95% confidence level using a coverage factor of k=2. Measurement Value Conducted emissions (9 kHz-30 MHz) 3.23 dB Radiated emissions (30 MHz-1 GHz) 4.30 dB Radiated emissions (1 GHz-18 GHz) 4.81 dB 6 / 20

Report No.: BL-SZ1830386-402 4 GENERAL TEST CONFIGURATIONS 4.1 Test Environments Relative Humidity 45% to 55% Atmospheric Pressure 100 kPa to 102 kPa Temperature NT (Normal Temperature) +22℃ to +25℃ Working Voltage of the EUT NV (Normal Voltage) 9V 4.2 Test Equipment List Description Manufacturer Model Serial No. Cal. Date Cal. Due EMI Receiver ROHDE&SCHWARZ ESRP 101036 2017.06.22 2018.06.21 Test Antenna- Loop(9 kHz-30 SCHWARZBECK FMZB 1519 1519-037 2017.11.07 2019.11.08 MHz) Test Antenna- Rod(9 kHz-30 SCHWARZBECK VAMP 9243 9243-556 2017.07.22 2019.07.21 MHz) Test Antenna- Bi-Log(30 MHz- SCHWARZBECK VULB 9163 9163-624 2016.07.12 2018.07.11 3 GHz) Anechoic EMC Electronic Co., 20.10*11.60*7 N/A 2016.08.09 2018.08.08 Chamber Ltd .35m EMI Receiver ROHDE&SCHWARZ ESRP 101036 2017.06.22 2018.06.21 LISN SCHWARZBECK NSLK 8127 8127-687 2017.06.22 2018.06.21 Shielded ChangNing CN-130701 130703 N/A N/A Enclosure 7 / 20

Report No.: BL-SZ1830386-402 4.3 Test Setups Test Setup 1 For Radiated Emission Test (Below 30 MHz)) Test Setup 2 (For Radiated Emission Test (30 MHz-1 GHz)) 8 / 20

Report No.: BL-SZ1830386-402 Test Setup 3 <40cm> <80cm> EUT Pulse <80cm> LISN Receiver (For Conducted Emission, AC Ports Test) 9 / 20

Report No.: BL-SZ1830386-402 5 TEST ITEMS 5.1 Emission Tests 5.1.1 Radiated Emission 5.1.1.1 Limit Frequency (MHz) Field Strength (µV/m) Measurement Distance (m) 0.009 - 0.490 2400/F(kHz) 300 0.490 - 1.705 24000/F(kHz) 30 1.705 - 30.0 30 30 30 - 88 100 3 88 - 216 150 3 216 - 960 200 3 Above 960 500 3 NOTE: 1) Field Strength (dBµV/m) = 20*log [Field Strength (µV/m)]. 2) In the emission tables above, the tighter limit applies at the band edges. 3) For above 1000 MHz, limit field strength of harmonics: 54 dBuV/m@3 m (AV) and 74 dBuV/m@3 m (PK) 4) At frequencies below 30 MHz, measurements may be performed at a distance closer than that specified in the regulations, when performing measurements at a closer distance than specified, the results shall be extrapolated to the specified distance by either making measurements at a minimum of two distances on at least one radial to determine the proper extrapolation factor or by using the square of an inverse linear distance extrapolation factor (40 dB/decade). For example, at the frequency 9 kHz, limit @10m = 20*log (2400/f) + 40log (dlimit/dmeasure) where limit = 300m, dmeasure=10m. limit @10m = 20*log (2400/9) + 40log (300/10) = 107.5 (dBµV/m). 5) At frequencies at or above 30 MHz, measurements may be performed at a distance other than what is specified provided, When performing measurements at a distance other than that specified, the results shall be extrapolated to the specified distance using an extrapolation factor of 20 dB/decade (inverse linear-distance for field strength measurements; inverse-linear-distance-squared for power density measurements). For example, at the frequency 30 MHz, limit @10m = 20*log (100) + 20log (dlimit/dmeasure) where limit = 3m, dmeasure=10m. limit @10m = 20*log (100) + 20log (3/10) = 29.5 (dBµV/m). 5.1.1.2 Test Setup Refer to 4.3 section (test setup 1 to test setup 2) for radiated emission test, the photo of test setup please refer to ANNEX B. 5.1.1.3 Test Procedure All Spurious Emission tests were performed in X, Y, Z axis direction. And only the worst axis test condition was recorded in this test report. An initial pre-scan was performed in the chamber using the EMI Receiver in peak detection mode. Quasi-peak measurements were conducted based on the peak sweep graph. The EUT was measured by Bi-Log antenna with 2 orthogonal polarities. 5.1.1.4 Test Result Please refer to ANNEX A.1. 10 / 20

Report No.: BL-SZ1830386-402 5.1.2 Conducted Emission 5.1.2.1 Test Limit Frequency range Conducted Limit (dBµV) (MHz) Quasi-peak Average 0.15 - 0.50 66 to 56 56 to 46 0.50 - 5 56 46 5 - 30 60 50 NOTE: 1) The limit is applicable to Class B ITE. 2) The lower limit shall apply at the band edges. 3) The limit decreases linearly with the logarithm of the frequency in the range 0.15 - 0.50 MHz. 5.1.2.2 Test Setup Refer to 4.3 section test (test setup 3) for conducted emission, the photo of test setup please refer to ANNEX B. 5.1.2.3 Test Procedure The EUT is connected to the power mains through a LISN which provides 50 Ω/50 µH of coupling impedance for the measuring instrument. The test frequency range is from 150 kHz to 30 MHz. The maximum conducted interference is searched using Peak (PK), Quasi-peak (QP) and Average (AV) detectors; the emission levels that are more than the AV and QP limits, and that have narrow margins from the AV and QP limits will be re-measured with AV and QP detectors. Tests for both L phase and N phase lines of the power mains connected to the EUT are performed. Devices subject to Part 15 must be tested for all available U.S. voltages and frequencies (such as a nominal 120 VAC, 50/60 Hz and 240 VAC, 50/60 Hz) for which the device is capable of operation. A device rated for 50/60 Hz operation need not be tested at both frequencies provided the radiated and line conducted emissions are the same at both frequencies. 5.1.2.4 Test Result Please refer to ANNEX A.2. 11 / 20

Report No.: BL-SZ1830386-402 5.1.3 20 dB Bandwidth 5.1.3.1 Limit FCC §15.215(c) The 20 dB bandwidth is known as the 99% emission bandwidth, or 20 dB bandwidth (10*log1%=20 dB) taking the total RF output power. 5.1.3.2 Test Setup Refer to 4.3 section test (test setup 1) for test setup description for the antenna port. The photo of test setup please refer to ANNEX B. 5.1.3.3 Test Procedure Use the following spectrum analyzer settings: Span = approximately 2 to 3 times the 20 dB bandwidth, centered on a hopping channel RBW ≥ 1% of the 20 dB bandwidth VBW ≥ RBW Sweep = auto Detector function = peak Trace = max hold The EUT should be transmitting at its maximum data rate, Allow the trace to stabilize. 5.1.3.4 Test Result Please refer to ANNEX A.3. 12 / 20

Report No.: BL-SZ1830386-402 ANNEX A TEST RESULTS A.1 Radiated Emission Note 1: The symbol of “--” in the table which means not application. Note 2: For the test data above 1 GHz, according the ANSI C63.4-2014, where limits are specified for both average and peak (or quasi-peak) detector functions, if the peak (or quasi-peak) measured value complies with the average limit, it is unnecessary to perform an average measurement. QI Test Data and Plots A.1.1 Test Antenna Vertical, 9 kHz –30 MHz No. Frequency Results Factor (dB) Limit Margin Detector Table Height ANT Verdict (MHz) (dBuV/m) (dBuV/m) (dB) (o) (cm) 1 0.016 49.65 19.77 102.6 52.95 Peak 209.00 100 Vertical Pass 2 0.136 68.61 19.79 83.9 15.29 Peak 50.00 100 Vertical N/A 3 0.404 50.78 19.81 74.5 23.72 Peak 61.00 100 Vertical Pass 4 0.672 42.87 19.98 50.1 7.23 Peak 53.00 100 Vertical Pass 5 0.941 38.01 20.09 47.1 9.09 Peak 291.00 100 Vertical Pass 6 1.143 36.54 20.09 45.5 8.96 Peak 356.00 100 Vertical Pass 13 / 20

Report No.: BL-SZ1830386-402 A.1.2 Test Antenna Horizontal, 9 kHz –30 MHz No. Frequency Results Factor (dB) Limit Margin Detector Table Height ANT Verdict (MHz) (dBuV/m) (dBuV/m) (dB) (o) (cm) 1 0.016 49.14 19.77 102.5 53.36 Peak 9.00 100 Horizontal Pass 2 0.136 68.62 19.79 83.9 15.28 Peak 43.00 100 Horizontal N/A 3 0.404 51.17 19.81 74.5 23.33 Peak 61.00 100 Horizontal Pass 4 0.672 43.38 19.98 50.1 6.72 Peak 79.00 100 Horizontal Pass 5 0.948 37.96 20.09 47.0 9.04 Peak 53.00 100 Horizontal Pass 6 1.217 35.35 20.09 44.9 9.55 Peak 61.00 100 Horizontal Pass 14 / 20

Report No.: BL-SZ1830386-402 A.1.3 Test Antenna Horizontal, 30 MHz – 1 GHz No. Frequency Results Factor (dB) Limit Margin Detector Table Height ANT Verdict (MHz) (dBuV/m) (dBuV/m) (dB) (o) (cm) 1 37.517 35.96 -25.11 40.0 4.04 Peak 48.00 100 Vertical Pass 2 47.460 35.61 -23.35 40.0 4.39 Peak 22.00 100 Vertical Pass 3 54.977 32.31 -23.55 40.0 7.69 Peak 356.00 100 Vertical Pass 4 111.480 29.97 -24.65 43.5 13.53 Peak 1.00 100 Vertical Pass 5 135.245 27.56 -27.59 43.5 15.94 Peak 237.00 100 Vertical Pass 6 233.943 27.73 -22.52 46.0 18.27 Peak 16.00 100 Vertical Pass 15 / 20

Report No.: BL-SZ1830386-402 A.1.4 Test Antenna Horizontal, 30 MHz – 1 GHz No. Frequency Results Factor (dB) Limit Margin Detector Table Height ANT Verdict (MHz) (dBuV/m) (dBuV/m) (dB) (o) (cm) 1 47.460 24.41 -23.35 40.0 15.59 Peak 325.00 100 Horizontal Pass 2 67.103 20.70 -25.98 40.0 19.30 Peak 338.00 100 Horizontal Pass 3 111.480 28.65 -24.65 43.5 14.85 Peak 356.00 100 Horizontal Pass 4 236.367 29.87 -22.65 46.0 16.13 Peak 73.00 100 Horizontal Pass 5 335.793 26.74 -19.38 46.0 19.26 Peak 92.00 100 Horizontal Pass 6 592.115 28.35 -13.03 46.0 17.65 Peak 224.00 100 Horizontal Pass 16 / 20

Report No.: BL-SZ1830386-402 A.2 Conducted Emission Note: Devices subject to Part 15 must be tested for all available U.S. voltages and frequencies (such as a nominal 120 VAC, 50/60 Hz and 240 VAC, 50/60 Hz) for which the device is capable of operation. So, The configuration 120 VAC, 60 Hz and 240 VAC, 50 Hz were tested respectively, but only the worst configuration (120 VAC, 60 Hz ) shown here. QI Test Data and Plots A.2.1 L Phase No. Frequency Results Factor (dB) Limit Margin Detector Line Verdict (MHz) (dBuV) (dBuV) (dB) 1 0.268 51.0 10.04 61.2 10.20 Peak L Line Pass 1** 0.268 31.5 10.04 51.2 19.70 AV L Line Pass 2 0.416 47.7 10.04 57.5 9.80 Peak L Line Pass 2** 0.416 28.8 10.04 47.5 18.70 AV L Line Pass 3 0.694 48.6 10.05 56.0 7.40 Peak L Line Pass 3** 0.694 29.2 10.05 46.0 16.80 AV L Line Pass 4 2.444 43.3 10.10 56.0 12.70 Peak L Line Pass 4** 2.444 31.2 10.10 46.0 14.80 AV L Line Pass 5 10.126 51.2 10.32 60.0 8.80 Peak L Line Pass 5** 10.126 39.0 10.32 50.0 11.00 AV L Line Pass 6 14.540 55.4 10.44 60.0 4.60 Peak L Line Pass 6** 14.540 41.1 10.44 50.0 8.90 AV L Line Pass 17 / 20

Report No.: BL-SZ1830386-402 A.2.2 N Phase No. Frequency Results Factor (dB) Limit Margin Detector Line Verdict (MHz) (dBuV) (dBuV) (dB) 1 0.268 49.9 10.04 61.2 11.30 Peak N Line Pass 1** 0.268 31.9 10.04 51.2 19.30 AV N Line Pass 2 0.420 46.5 10.04 57.4 10.90 Peak N Line Pass 2** 0.420 28.0 10.04 47.4 19.40 AV N Line Pass 3 0.682 46.7 10.05 56.0 9.30 Peak N Line Pass 3** 0.682 28.8 10.05 46.0 17.20 AV N Line Pass 4 1.768 42.9 10.08 56.0 13.10 Peak N Line Pass 4** 1.768 26.8 10.08 46.0 19.20 AV N Line Pass 5 10.278 48.9 10.32 60.0 11.10 Peak N Line Pass 5** 10.278 33.4 10.32 50.0 16.60 AV N Line Pass 6 14.398 49.6 10.44 60.0 10.40 Peak N Line Pass 6** 14.398 35.9 10.44 50.0 14.10 AV N Line Pass 18 / 20

Report No.: BL-SZ1830386-402 A.3 20 dB Bandwidth QI Test Data and Plots 99% Occupied Bandwidth QI Test Data and Plots 19 / 20

Report No.: BL-SZ1830386-402 ANNEX B TEST SETUP PHOTOS Please refer the document “BL-SZ1830386-AE2.PDF”. ANNEX C EUT EXTERNAL PHOTOS Please refer the document “BL-SZ1830386-AW.PDF”. ANNEX D EUT INTERNAL PHOTOS Please refer the document “BL-SZ1830386-AI.PDF”. --END OF REPORT-- 20 / 20


Document Created: 2018-06-25 14:41:05
Document Modified: 2018-06-25 14:41:05
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