test report part 4

FCC ID: TA8AKRC161644-3

Test Report

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FCCID_3650937

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-81: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-82: Conducted spurious emissions within 3600–22000 MHz, Port B, LTE, 20 MHz mid channel, QPSK Port B, LTE, 20 MHz mid channel, QPSK Figure 8.2-83: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-84: Conducted spurious emissions within 3600–22000 MHz, Port B, LTE, 20 MHz high channel, QPSK Port B, LTE, 20 MHz high channel, QPSK Report reference ID: 341175-1TRFWL-R1 Page 106 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-85: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-86: Conducted spurious emissions within 3600–22000 MHz, Port C, LTE, 20 MHz low channel, QPSK Port C, LTE, 20 MHz low channel, QPSK Figure 8.2-87: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-88: Conducted spurious emissions within 3600–22000 MHz, Port C, LTE, 20 MHz mid channel, QPSK Port C, LTE, 20 MHz mid channel, QPSK Report reference ID: 341175-1TRFWL-R1 Page 107 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-89: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-90: Conducted spurious emissions within 3600–22000 MHz, Port C, LTE, 20 MHz high channel, QPSK Port C, LTE, 20 MHz high channel, QPSK Figure 8.2-91: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-92: Conducted spurious emissions within 3600–22000 MHz, Port D, LTE, 20 MHz low channel, QPSK Port D, LTE, 20 MHz low channel, QPSK Report reference ID: 341175-1TRFWL-R1 Page 108 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-93: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-94: Conducted spurious emissions within 3600–22000 MHz, Port D, LTE, 20 MHz mid channel, QPSK Port D, LTE, 20 MHz mid channel, QPSK Figure 8.2-95: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-96: Conducted spurious emissions within 3600–22000 MHz, Port D, LTE, 20 MHz high channel, QPSK Port D, LTE, 20 MHz high channel, QPSK Report reference ID: 341175-1TRFWL-R1 Page 109 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-97: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-98: Conducted spurious emissions within 3600–22000 MHz, Port A, LTE, 2 carriers: 5 MHz each at the bottom of the band, QPSK Port A, LTE, 2 carriers: 5 MHz each at the bottom of the band, QPSK Figure 8.2-99: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-100: Conducted spurious emissions within 3600–22000 MHz, Port A, LTE, 2 carriers: 5 MHz each at the top of the band, QPSK Port A, LTE, 2 carriers: 5 MHz each at the top of the band, QPSK Report reference ID: 341175-1TRFWL-R1 Page 110 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-101: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-102: Conducted spurious emissions within 3600–22000 MHz, Port B, LTE, 2 carriers: 5 MHz each at the bottom of the band, QPSK Port B, LTE, 2 carriers: 5 MHz each at the bottom of the band, QPSK Figure 8.2-103: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-104: Conducted spurious emissions within 3600–22000 MHz, Port B, LTE, 2 carriers: 5 MHz each at the top of the band, QPSK Port B, LTE, 2 carriers: 5 MHz each at the top of the band, QPSK Report reference ID: 341175-1TRFWL-R1 Page 111 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-105: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-106: Conducted spurious emissions within 3600–22000 MHz, Port C, LTE, 2 carriers: 5 MHz each at the bottom of the band, QPSK Port C, LTE, 2 carriers: 5 MHz each at the bottom of the band, QPSK Figure 8.2-107: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-108: Conducted spurious emissions within 3600–22000 MHz, Port C, LTE, 2 carriers: 5 MHz each at the top of the band, QPSK Port C, LTE, 2 carriers: 5 MHz each at the top of the band, QPSK Report reference ID: 341175-1TRFWL-R1 Page 112 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-109: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-110: Conducted spurious emissions within 3600–22000 MHz, Port D, LTE, 2 carriers: 5 MHz each at the bottom of the band, QPSK Port D, LTE, 2 carriers: 5 MHz each at the bottom of the band, QPSK Figure 8.2-111: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-112: Conducted spurious emissions within 3600–22000 MHz, Port D, LTE, 2 carriers: 5 MHz each at the top of the band, QPSK Port D, LTE, 2 carriers: 5 MHz each at the top of the band, QPSK Report reference ID: 341175-1TRFWL-R1 Page 113 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-113: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-114: Conducted spurious emissions within 3600–22000 MHz, Port A, LTE, 2 carriers: 10 MHz each at the bottom of the band, QPSK Port A, LTE, 2 carriers: 10 MHz each at the bottom of the band, QPSK Figure 8.2-115: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-116: Conducted spurious emissions within 3600–22000 MHz, Port A, LTE, 2 carriers: 10 MHz each at the top of the band, QPSK Port A, LTE, 2 carriers: 10 MHz each at the top of the band, QPSK Report reference ID: 341175-1TRFWL-R1 Page 114 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-117: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-118: Conducted spurious emissions within 3600–22000 MHz, Port B, LTE, 2 carriers: 10 MHz each at the bottom of the band, QPSK Port B, LTE, 2 carriers: 10 MHz each at the bottom of the band, QPSK Figure 8.2-119: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-120: Conducted spurious emissions within 3600–22000 MHz, Port B, LTE, 2 carriers: 10 MHz each at the top of the band, QPSK Port B, LTE, 2 carriers: 10 MHz each at the top of the band, QPSK Report reference ID: 341175-1TRFWL-R1 Page 115 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-121: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-122: Conducted spurious emissions within 3600–22000 MHz, Port C, LTE, 2 carriers: 10 MHz each at the bottom of the band, QPSK Port C, LTE, 2 carriers: 10 MHz each at the bottom of the band, QPSK Figure 8.2-123: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-124: Conducted spurious emissions within 3600–22000 MHz, Port C, LTE, 2 carriers: 10 MHz each at the top of the band, QPSK Port C, LTE, 2 carriers: 10 MHz each at the top of the band, QPSK Report reference ID: 341175-1TRFWL-R1 Page 116 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-125: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-126: Conducted spurious emissions within 3600–22000 MHz, Port D, LTE, 2 carriers: 10 MHz each at the bottom of the band, QPSK Port D, LTE, 2 carriers: 10 MHz each at the bottom of the band, QPSK Figure 8.2-127: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-128: Conducted spurious emissions within 3600–22000 MHz, Port D, LTE, 2 carriers: 10 MHz each at the top of the band, QPSK Port D, LTE, 2 carriers: 10 MHz each at the top of the band, QPSK Report reference ID: 341175-1TRFWL-R1 Page 117 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-129: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-130: Conducted spurious emissions within 3600–22000 MHz, Port A, LTE, 2 carriers: 15 MHz each at the bottom of the band, QPSK Port A, LTE, 2 carriers: 15 MHz each at the bottom of the band, QPSK Figure 8.2-131: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-132: Conducted spurious emissions within 3600–22000 MHz, Port A, LTE, 2 carriers: 15 MHz each at the top of the band, QPSK Port A, LTE, 2 carriers: 15 MHz each at the top of the band, QPSK Report reference ID: 341175-1TRFWL-R1 Page 118 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-133: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-134: Conducted spurious emissions within 3600–22000 MHz, Port B, LTE, 2 carriers: 15 MHz each at the bottom of the band, QPSK Port B, LTE, 2 carriers: 15 MHz each at the bottom of the band, QPSK Figure 8.2-135: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-136: Conducted spurious emissions within 3600–22000 MHz, Port B, LTE, 2 carriers: 15 MHz each at the top of the band, QPSK Port B, LTE, 2 carriers: 15 MHz each at the top of the band, QPSK Report reference ID: 341175-1TRFWL-R1 Page 119 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-137: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-138: Conducted spurious emissions within 3600–22000 MHz, Port C, LTE, 2 carriers: 15 MHz each at the bottom of the band, QPSK Port C, LTE, 2 carriers: 15 MHz each at the bottom of the band, QPSK Figure 8.2-139: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-140: Conducted spurious emissions within 3600–22000 MHz, Port C, LTE, 2 carriers: 15 MHz each at the top of the band, QPSK Port C, LTE, 2 carriers: 15 MHz each at the top of the band, QPSK Report reference ID: 341175-1TRFWL-R1 Page 120 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-141: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-142: Conducted spurious emissions within 3600–22000 MHz, Port D, LTE, 2 carriers: 5 MHz each at the bottom of the band, QPSK Port D, LTE, 2 carriers: 15 MHz each at the bottom of the band, QPSK Figure 8.2-143: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-144: Conducted spurious emissions within 3600–22000 MHz, Port D, LTE, 2 carriers: 15 MHz each at the top of the band, QPSK Port D, LTE, 2 carriers: 15 MHz each at the top of the band, QPSK Report reference ID: 341175-1TRFWL-R1 Page 121 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-145: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-146: Conducted spurious emissions within 3600–22000 MHz, Port A, LTE, 2 carriers: 20 MHz each at the bottom of the band, QPSK Port A, LTE, 2 carriers: 20 MHz each at the bottom of the band, QPSK Figure 8.2-147: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-148: Conducted spurious emissions within 3600–22000 MHz, Port A, LTE, 2 carriers: 20 MHz each at the top of the band, QPSK Port A, LTE, 2 carriers: 20 MHz each at the top of the band, QPSK Report reference ID: 341175-1TRFWL-R1 Page 122 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-149: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-150: Conducted spurious emissions within 3600–22000 MHz, Port B, LTE, 2 carriers: 20 MHz each at the bottom of the band, QPSK Port B, LTE, 2 carriers: 20 MHz each at the bottom of the band, QPSK Figure 8.2-151: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-152: Conducted spurious emissions within 3600–22000 MHz, Port B, LTE, 2 carriers: 20 MHz each at the top of the band, QPSK Port B, LTE, 2 carriers: 20 MHz each at the top of the band, QPSK Report reference ID: 341175-1TRFWL-R1 Page 123 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-153: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-154: Conducted spurious emissions within 3600–22000 MHz, Port C, LTE, 2 carriers: 20 MHz each at the bottom of the band, QPSK Port C, LTE, 2 carriers: 20 MHz each at the bottom of the band, QPSK Figure 8.2-155: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-156: Conducted spurious emissions within 3600–22000 MHz, Port C, LTE, 2 carriers: 20 MHz each at the top of the band, QPSK Port C, LTE, 2 carriers: 20 MHz each at the top of the band, QPSK Report reference ID: 341175-1TRFWL-R1 Page 124 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-157: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-158: Conducted spurious emissions within 3600–22000 MHz, Port D, LTE, 2 carriers: 20 MHz each at the bottom of the band, QPSK Port D, LTE, 2 carriers: 20 MHz each at the bottom of the band, QPSK Figure 8.2-159: Conducted spurious emissions within 30–3600 MHz, Figure 8.2-160: Conducted spurious emissions within 3600–22000 MHz, Port D, LTE, 2 carriers: 20 MHz each at the top of the band, QPSK Port D, LTE, 2 carriers: 20 MHz each at the top of the band, QPSK Report reference ID: 341175-1TRFWL-R1 Page 125 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-161: Conducted band edge emission at 2110 MHz, Figure 8.2-162: Conducted band edge emission at 2109 MHz, Port A, LTE, 5 MHz channel, QPSK (RBW = 1% of EBW) Port A, LTE, 5 MHz channel, QPSK (RBW = 1 MHz) Figure 8.2-163: Conducted band edge emission at 2110 MHz, Figure 8.2-164: Conducted band edge emission at 2109 MHz, Port B, LTE, 5 MHz channel, QPSK (RBW = 1% of EBW) Port B, LTE, 5 MHz channel, QPSK (RBW = 1 MHz) Report reference ID: 341175-1TRFWL-R1 Page 126 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-165: Conducted band edge emission at 2110 MHz, Figure 8.2-166: Conducted band edge emission at 2109 MHz, Port C, LTE, 5 MHz channel, QPSK (RBW = 1% of EBW) Port D, LTE, 5 MHz channel, QPSK (RBW = 1 MHz) Figure 8.2-167: Conducted band edge emission at 2110 MHz, Figure 8.2-168: Conducted band edge emission at 2109 MHz, Port D, LTE, 5 MHz channel, QPSK (RBW = 1% of EBW) Port D, LTE, 5 MHz channel, QPSK (RBW = 1 MHz) Report reference ID: 341175-1TRFWL-R1 Page 127 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-169: Conducted band edge emission at 2110 MHz, Figure 8.2-170: Conducted band edge emission at 2109 MHz, Port A, LTE, 10 MHz channel, QPSK (RBW = 1% of EBW) Port A, LTE, 10 MHz channel, QPSK (RBW = 1 MHz) Figure 8.2-171: Conducted band edge emission at 2110 MHz, Figure 8.2-172: Conducted band edge emission at 2109 MHz, Port B, LTE, 10 MHz channel, QPSK (RBW = 1% of EBW) Port B, LTE, 10 MHz channel, QPSK (RBW = 1 MHz) Report reference ID: 341175-1TRFWL-R1 Page 128 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-173: Conducted band edge emission at 2110 MHz, Figure 8.2-174: Conducted band edge emission at 2109 MHz, Port C, LTE, 10 MHz channel, QPSK (RBW = 1% of EBW) Port D, LTE, 10 MHz channel, QPSK (RBW = 1 MHz) Figure 8.2-175: Conducted band edge emission at 2110 MHz, Figure 8.2-176: Conducted band edge emission at 2109 MHz, Port D, LTE, 10 MHz channel, QPSK (RBW = 1% of EBW) Port D, LTE, 10 MHz channel, QPSK (RBW = 1 MHz) Report reference ID: 341175-1TRFWL-R1 Page 129 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-177: Conducted band edge emission at 2110 MHz, Figure 8.2-178: Conducted band edge emission at 2109 MHz, Port A, LTE, 15 MHz channel, QPSK (RBW = 1% of EBW) Port A, LTE, 15 MHz channel, QPSK (RBW = 1 MHz) Figure 8.2-179: Conducted band edge emission at 2110 MHz, Figure 8.2-180: Conducted band edge emission at 2109 MHz, Port B, LTE, 15 MHz channel, QPSK (RBW = 1% of EBW) Port B, LTE, 15 MHz channel, QPSK (RBW = 1 MHz) Report reference ID: 341175-1TRFWL-R1 Page 130 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-181: Conducted band edge emission at 2110 MHz, Figure 8.2-182: Conducted band edge emission at 2109 MHz, Port C, LTE, 15 MHz channel, QPSK (RBW = 1% of EBW) Port D, LTE, 15 MHz channel, QPSK (RBW = 1 MHz) Figure 8.2-183: Conducted band edge emission at 2110 MHz, Figure 8.2-184: Conducted band edge emission at 2109 MHz, Port D, LTE, 15 MHz channel, QPSK (RBW = 1% of EBW) Port D, LTE, 15 MHz channel, QPSK (RBW = 1 MHz) Report reference ID: 341175-1TRFWL-R1 Page 131 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-185: Conducted band edge emission at 2110 MHz, Figure 8.2-186: Conducted band edge emission at 2109 MHz, Port A, LTE, 20 MHz channel, QPSK (RBW = 1% of EBW) Port A, LTE, 20 MHz channel, QPSK (RBW = 1 MHz) Figure 8.2-187: Conducted band edge emission at 2110 MHz, Figure 8.2-188: Conducted band edge emission at 2109 MHz, Port B, LTE, 20 MHz channel, QPSK (RBW = 1% of EBW) Port B, LTE, 20 MHz channel, QPSK (RBW = 1 MHz) Report reference ID: 341175-1TRFWL-R1 Page 132 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-189: Conducted band edge emission at 2110 MHz, Figure 8.2-190: Conducted band edge emission at 2109 MHz, Port C, LTE, 20 MHz channel, QPSK (RBW = 1% of EBW) Port D, LTE, 20 MHz channel, QPSK (RBW = 1 MHz) Figure 8.2-191: Conducted band edge emission at 2110 MHz, Figure 8.2-192: Conducted band edge emission at 2109 MHz, Port D, LTE, 20 MHz channel, QPSK (RBW = 1% of EBW) Port D, LTE, 20 MHz channel, QPSK (RBW = 1 MHz) Report reference ID: 341175-1TRFWL-R1 Page 133 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-193: Conducted band edge emission at 2110 MHz, Figure 8.2-194: Conducted band edge emission at 2109 MHz, Port A, LTE, 5 MHz channel, 2 bottom carriers, QPSK (RBW = 1% of EBW) Port A, LTE, 5 MHz channel, 2 bottom carriers, QPSK (RBW = 1 MHz) Figure 8.2-195: Conducted band edge emission at 2110 MHz, Figure 8.2-196: Conducted band edge emission at 2109 MHz, Port B, LTE, 5 MHz channel, 2 bottom carriers, QPSK (RBW = 1% of EBW) Port B, LTE, 5 MHz channel, 2 bottom carriers, QPSK (RBW = 1 MHz) Report reference ID: 341175-1TRFWL-R1 Page 134 of 211

Section 8 Testing data Test name Clause 27.53 and RSS-139, 6.6 Spurious emissions at RF antenna connector Specification FCC Part 27, RSS-139, Issue 3 Figure 8.2-197: Conducted band edge emission at 2110 MHz, Figure 8.2-198: Conducted band edge emission at 2109 MHz, Port C, LTE, 5 MHz channel, 2 bottom carriers, QPSK (RBW = 1% of EBW) Port C, LTE, 5 MHz channel, 2 bottom carriers, QPSK (RBW = 1 MHz) Figure 8.2-199: Conducted band edge emission at 2110 MHz, Figure 8.2-200: Conducted band edge emission at 2109 MHz, Port D, LTE, 5 MHz channel, 2 bottom carriers, QPSK (RBW = 1% of EBW) Port D, LTE, 5 MHz channel, 2 bottom carriers, QPSK (RBW = 1 MHz) Report reference ID: 341175-1TRFWL-R1 Page 135 of 211


Document Created: 2019-09-15 22:25:54
Document Modified: 2019-09-15 22:25:54
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