Test Report Rev 1

FCC ID: T9JRN2903

Test Report

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FCCID_3015762

Intentional Radiator Test Report For the Microchip Technology Inc. Low Power Long Range LoRa Technology Transceiver Module Model RN2903 Tested under The FCC Rules contained in Title 47 of the CFR, Part 15.247 for Digitally Transmitting Sequence / Hybrid (Class II Permissive Change) Prepared for: Microchip Technology Inc. 2355 W. Chandler Blvd. Chandler, AZ 85224-6199 Prepared By: Reviewed By: H.B. Compliance Solutions 5005 S. Ash Avenue, Suite # A-10 Tempe, Arizona 85282 Hoosamuddin Bandukwala Cert # ATL-0062-E Engineering Statement: The measurements shown in this report were made in accordance with the procedure indicated, and the emissions from this equipment were found to be within the limits applicable. I assume full responsibility for the accuracy and completeness of these measurements, and for the qualifications of all persons taking them. It is further stated that upon the basis of the measurement made, the equipment tested is capable of operation in accordance with the requirements of Part 15 of the FCC Rules under normal use and maintenance. Certificates and reports shall not be reproduced except in full, without the written permission of H.B Compliance Solutions, LLC.

Report Status Sheet Revision # Report Date Reason for Revision Ø May 18, 2016 Initial Issue 1 May/26/2016 TCB Comments HBCS Report # EMC_15028_2 Rev1 Page 2 of 11

Table of Contents EXECUTIVE SUMMARY ............................................................................................4 1. Testing Summary ........................................................................................4 EQUIPMENT CONFIGURATION ................................................................................5 1. Overview ....................................................................................................5 2. Test Facility.................................................................................................6 3. Description of Test Sample .........................................................................6 4. Equipment Configuration ...........................................................................6 5. Support Equipment .................................................................................... 6 6. Ports and Cabling Information ....................................................................7 7. Method of Monitoring EUT Operation........................................................7 8. Mode of Operation .....................................................................................7 9. Modifications .............................................................................................8 10. Disposition of EUT ......................................................................................8 Criteria for Intentional Radiators ............................................................................9 1. Radiated Spurious Emissions and Restricted Band .....................................9 I. Test Equipment .............................................................................................11 HBCS Report # EMC_15028_2 Rev1 Page 3 of 11

EXECUTIVE SUMMARY 1. Testing Summary These tests were conducted on a sample of the equipment for the purpose of demonstrating compliance with Part 15.247. All tests were conducted using measurement procedure from ANSI C63.10-2013, FCC Public Notice 558074 DTS Guide April 09, 2013 as appropriate. Test Name Test Result Comments Method/Standard Radiated Spurious 15.247(d), Pass Addition of PCB Trace Antenna – Emissions & Restricted 15.209(a), 15.205 Class II Permissive Change Band HBCS Report # EMC_15028_2 Rev1 Page 4 of 11

EQUIPMENT CONFIGURATION 1. Overview H.B Compliance Solutions was contracted by Microchip to perform testing on the Low power transceiver LoRa Technology module RN2903 under the purchase order number 60004450 This document describes the test setups, test methods, required test equipment, and the test limit criteria used to perform compliance testing of the Microchip Technology, Low power transceiver LoRa Technology module RN2903. The tests were based on FCC Part 15 Rules. The tests described in this document were formal tests as described with the objective of the testing was to evaluate compliance of the Equipment Under Test (EUT) to the requirements of the aforementioned specifications. Microchip Technology should retain a copy of this document and it should be kept on file for at least five years after the manufacturing of the EUT has been permanently discontinued. The results obtained relate only to the item(s) tested. Product Name: Low-Power Long Range LoRa Technology Transceiver Module Model(s) Tested: RN2903 FCC ID: T9JRN2903 Supply Voltage Input: Primary Power : 3.3 Vdc Frequency Range: 902.3 - 927.5MHz (Hybrid Mode) 903 – 927.5 (DTS Mode) No. of Channels: 8 (DTS) 25 or 64 (Hybrid) Necessary Bandwidth N/A Type(s) of Modulation: FSK Range of Operation Power: 0.0809W Emission Designator: N/A Channel Spacing(s) None Test Item: Pre-Production Type of Equipment : Fixed Antenna Requirement Type of Antenna: PCB Trace (§15.203) : Gain of Antenna: +1.3dBi Environmental Test Temperature: 15-35⁰C Conditions: Humidity: 30-60% Barometric Pressure: 860-1060 mbar Modification to the EUT: None Evaluated By: Staff at Artesyn Embedded & H.B. Compliance Solutions Test Date(s): 10/21/15 HBCS Report # EMC_15028_2 Rev1 Page 5 of 11

2. Test Facility Radiated Emission testing was performed at Artesyn Embedded Technologies. This facility is located at 2900 S. Diablo Way, Suite 190, Tempe, AZ 85282. All equipment used in making physical determination is accurate and bears recent traceability to the National Institute of Standards and Technology. Test facility at Artesyn Embedded Technologies is an A2LA accredited test site. The A2LA certificate number is 2716.01. The scope of accreditation covers the FCC Method - 47 CFR Part 15, ICES-003, CISPR 22, AS/NZS 3548 and VCCI Conducted testing was performed at H.B. Compliance Solutions. This facility is located at 5005 S. Ash Avenue, Suite # A-10, Tempe AZ 85282. Radiated Emissions measurements were performed in a semi-anechoic chamber (equivalent to an Open Area Test Site). In accordance with §2.948(a)(3), a complete site description is contained at Emerson Network Power. 3. Description of Test Sample The Microchip, RN2903 is a low power long range LoRa Technology transceiver module which provides an easy to use low-power solution for long range wireless data transmission902- 928MHz LoRa Technology modules with an external antenna connector. 4. Equipment Configuration Ref. ID Name / Description Model Number Serial Number #1 Low Power Long Range Transceiver RN2903 N/A Module Table 1. Equipment Configuration 5. Support Equipment All support equipment supplied is listed in the following Support Equipment List. Ref ID Name / Description Manufacturer Model # Serial # #2 Laptop Computer IBM Thinkpad T 41 99-K3967 Table 2. Support Equipment HBCS Report # EMC_15028_2 Rev1 Page 6 of 11

6. Ports and Cabling Information Ref ID Port name Cable Qty. Length (m) Shielded? Termination on the EUT Description (Y/N) Box ID & Port ID #3 Power USB 1 2 N Laptop Table 3. Ports and Cabling Information 7. Method of Monitoring EUT Operation A test receiver will be used to monitor the data transmission from the EUT. 8. Mode of Operation The EUT will be configured to transmit at maximum power level. The modules were programmed with special test software that allowed to cycle through test modes. Test mode was provided to select the lower, middle and upper band of the. This software allowed the selection of the channel on the transmitter from three frequencies modulated and the other three in CW mode. These settings were created for testing purpose only. Description of Test Modes To investigate the maximum EMC emission characteristics generated from the EUT, the test system was pre-tested for the following EUT operation mode or test configuration mode which can produce the highest EMI emission level. Each of these EUT configuration mode(s) mentioned below was evaluated respectively. Only the highest test mode for each test has been reported. Spreading Factor (S.F) Payload 7 158 8 85 9 40 10 14 HBCS Report # EMC_15028_2 Rev1 Page 7 of 11

9. Modifications 9.1 Modifications to EUT No modifications were made to the EUT 9.2 Modifications to Test Standard No Modifications were made to the test standard. 10. Disposition of EUT The test sample including all support equipment submitted to H.B Compliance Solutions for testing will be returned to Microchip Technology upon completion of testing & certification HBCS Report # EMC_15028_2 Rev1 Page 8 of 11

Criteria for Intentional Radiators 1. Radiated Spurious Emissions and Restricted Band Test §15.247(d), 15.209(a), Test Engineer(s): Keith T. Requirement(s): 15.205 Test Results: Pass Test Date(s): 10/21/15 Test Procedures: As required by 47 CFR 15.247, Radiated spurious measurements were made in accordance with the procedures of the ANSI C63.10-2013. The EUT was placed on a non-reflective table inside a 3 meter semi- anechoic room. The EUT was set on continuous transmit. The measurement antenna was placed at a distance of 3 meters from the EUT. During the tests, the antenna height and polarization as well as EUT azimuth were varied in order to identify the maximum level of emissions from the EUT. The frequency range up to the 10th harmonic was investigated. To get a maximum emission level from the EUT, the EUT was rotated throughout the X-axis, Y-axis and Z-axis. Worst case is X-axis Detector Resolution Video Bandwidth Span Setting Bandwidth Peak 1MHz 1MHz As necessary Average 1MHz 10Hz 0 Hz Table 6. Analyzer Settings HBCS Report # EMC_15028_2 Rev1 Page 9 of 11

Peak Average Average Frequency Amplitude Peak Limit Amplitude Limit (MHz) (dbuV/m) (dBuV/m) (dBuV/m)) (dBuV/m) 1804.6 41.7 115.5 - 95.5 2706.9 38.72 54.0 - 74.0 Table 7 - Spurious Radiated Emission Data – Low Band –Chip Antenna Peak Average Average Frequency Amplitude Peak Limit Amplitude Limit (MHz) (dbuV/m) (dBuV/m) (dBuV/m) (dBuV/m) 1832 41.36 115.5 - 95.5 2744.7 39.04 54.0 - 74.0 Table 8– Spurious Radiated Emission Data – Mid Band - Chip Antenna Peak Average Average Frequency Amplitude Peak Limit Amplitude Limit (MHz) (dbuV/m) (dBuV/m) (dBuV/m) (dBuV/m) 1855 41.02 115.5 - 95.5 2782.5 38.33 54.0 - 74.0 Table 9– Spurious Radiated Emission Data – High Band - Chip Antenna NOTE 1: There were no detectable emissions found Emission marked as “N.F” is system noise floor and no detectable emission were found from the EUT. HBCS Report # EMC_15028_2 Rev1 Page 10 of 11

I. Test Equipment Equipment Manufacturer Model Serial # Last Cal Cal Due Date Date Spectrum Analyzer Agilent E4402B US41192757 Jan/270/15 Jan/27/16 Temperature Meter Control 6066N53 140536623 Aug/08/14 Aug/08/16 Company Spectrum Analyzer Hewlett 8563E 3821A09316 Oct/03/15 Oct/03/16 Packard High Pass Filter Mini-Circuits VHF-3100+ 1023 Verified High Pass Filter Mini-Circuits VHF-1320+ 1034 Verified Signal Generator R&S SMY02 1062.5502.12 NCR None Attenuator 10dB Huber+Suhner 6810.17.A 747300 Verified Horn Antenna Com Power AHA-118 711150 Feb/10/15 Feb/10/16 Bilog Antena Chase CBL6140 1040 Nov/09/14 Nov/09/15 Table 12 – Test Equipment List *Statement of Traceability: Test equipment is maintained and calibrated on a regular basis. All calibrations have been performed by a 17025 accredited test facility, traceable to National Institute of Standards and Technology (NIST) END OF TEST REPORT HBCS Report # EMC_15028_2 Rev1 Page 11 of 11


Document Created: 2016-05-26 11:47:36
Document Modified: 2016-05-26 11:47:36
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