Test Report

FCC ID: S29MINI-CP

Test Report

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FCCID_1673632

SLG Asia Test Labs & Service (HK) Limited Test Report According to FCC PART 15 Subpart C FCC ID: S29MINI-CP Test Report Number: H1M21203-9872-P-15 SLG Asia Test Labs & Service (HK) Limited 26/F., Tamson Plaza, 161 Wai Yip Street Phone +852 2389 2200 Kwun Tong, Kowloon, Hong Kong Fax +852 2389 3073

SLG Asia Test Labs & Service (HK) Limited TEST REPORT Summary | FCC Part 15C Test Report No. ......................... : H1M21203-9872-P-15 Date of issue.............................. : 23.03.2012 Testing Laboratory name ....... : SLG Asia Test Labs & Service (HK) Limited Address...................................... : 26/F., Tamson Plaza, 161 Wai Yip Street, Kwun Tong, Kowloon, Hong Kong Applicant’s name ..................... : GUANGZHOU Walkera Technology Co., Ltd. Address...................................... : Taishi Industrial Park, Dongchong Town, Panyu District, 511475 Guangzhou, China Manufacturer’s name ............. : GUANGZHOU Walkera Technology Co., Ltd. Address...................................... : Taishi Industrial Park, Dongchong Town, Panyu District, 511475 Guangzhou, China Test specification Standard(s) applied ................... : FCC Rules 47 CFR Part 15 Subpart C Test item description .............. : R/C Helicopter, 2.4 GHz DSSS Transceiver Brand Name .............................. : devention, WALKERA Model and/or type reference...... : Mini-CP Rating(s) .................................... : 3.7V, 240mAh Li-Po battery Summary of Test Results Pass The Summary of Test Results based on a technical opinion belongs to the applied standard(s). Disclaimer Further details of testing are provided in particular chapters of this Test Report. This document base on General Terms and Conditions of SLG Asia Test Labs & Service (HK) Limited, which the applicant accepted with order confirmation. Emphasized conditions or project related conditions: Released Test Reports apply only to the specific samples tested under stated test conditions. It is the applicant’s responsibility to assure that additional production units of the tested model(s) are manufactured in same construction and with identical electrical and mechanical components to meet the same quality as tested model(s). The applicant/manufacturer/importer is responsible for any modifications made to the production units which result in non-compliance to the applied and/or relevant regulations. SLG Asia Test Labs & Service (HK) Limited shall have no liability for any deductions, inferences or generalizations drawn by the client or others from any kind of issued reports. Reports are confidential property of the client. As a mutual protection to the applicant, the clients, the public and ourselves, extracts from the test report shall not be reproduced except in full without our written approval. Test Report No.: H1M21203-9872-P-15 SLG Asia Test Labs & Service (HK) Limited 26/F., Tamson Plaza, 161 Wai Yip Street, Kwun Tong, Kowloon, Hong Kong Page 1 of 19

SLG Asia Test Labs & Service (HK) Limited TABLE OF CONTENTS 1 General Information 3 1.1 Test Report 3 1.2 Test Location 4 1.3 Details of applicant 4 1.4 Manufacturer 4 1.5 Application details 5 1.6 Test item 5 1.7 General Test Conditions 6 2 Test result Summary 7 3 Test results 8 3.1. 6dB Bandwidth 8 3.2. Output power 10 3.3. Power Spectral Density 11 3.4. Out-of-band Emission 12 3.5. Band edge requirement 16 4 Normative references 18 5 Disclaimer 19 5.1 Revision Notes 19 Annex: A – External Photos of test item Number of Pages 1 Annex: B – Internal Photos of test item Number of Pages 2 Annex: C – Photos of test setup Number of Pages 1 Test Report No.: H1M21203-9872-P-15 SLG Asia Test Labs & Service (HK) Limited 26/F., Tamson Plaza, 161 Wai Yip Street, Kwun Tong, Kowloon, Hong Kong Page 2 of 19

SLG Asia Test Labs & Service (HK) Limited 1 General Information 1.1 Test Report Tested by: 23.03.2012 Mr. Karl Lau Date Test Engineer Signature Approved by: 23.03.2012 Mr. F. Schulz Date Laboratory Manager Signature Test Report No.: H1M21203-9872-P-15 SLG Asia Test Labs & Service (HK) Limited 26/F., Tamson Plaza, 161 Wai Yip Street, Kwun Tong, Kowloon, Hong Kong Page 3 of 19

SLG Asia Test Labs & Service (HK) Limited 1.2 Test Location All tests were carrying by personnel from: Name: SLG Asia Test Labs & Service (HK) Limited Address: 26/F., Tamson Plaza, 161 Wai Yip Street Kwun Tong, Kowloon, Hong Kong Telephone: +852 2389 2200 Fax: +852 2389 3073 The Test facility for radiated measurements is located at: Name : Hong Kong Productivity Council Address: EMC Centre, LG1, HKPC Building, 78 Tat Chee Avenue Kowloon, Hong Kong The Hong Kong Laboratory Accreditation Scheme (HOKLAS) Reg. No.082 FCC registered measurement facility Reg. No.90656 1.3 Details of applicant Name: GUANGZHOU Walkera Technology Co., Ltd. Address: Taishi Industrial Park, Dongchong Town, Panyu District 511475 Guangzhou, China Contact: Mr. Ya Telephone: +86 20 8491 5116 Fax: +86 20 8491 5117 1.4 Manufacturer Name: GUANGZHOU Walkera Technology Co., Ltd. Address: Taishi Industrial Park, Dongchong Town, Panyu District 511475 Guangzhou, China Contact: Mr. Ya Telephone: +86 20 8491 5116 Fax: +86 20 8491 5117 Test Report No.: H1M21203-9872-P-15 SLG Asia Test Labs & Service (HK) Limited 26/F., Tamson Plaza, 161 Wai Yip Street, Kwun Tong, Kowloon, Hong Kong Page 4 of 19

SLG Asia Test Labs & Service (HK) Limited 1.5 Application details Date of receipt of application: 15.03.2012 Date of receipt of test item: 15.03.2012 Date (s) of performance of tests: 15.03.2012 - 23.03.2012 1.6 Test item Description of test item: R/C Helicopter Type identification: Mini-CP Brand Name: devention, WALKERA Equipment category: 2.4GHz Spread Spectrum Transceiver Equipment classification: Portable use Permitted frequency range: 2400 – 2483.5 MHz Operation frequency range: 2405 – 2479 MHz Lowest Operation frequency: 2405 MHz Middles Operation frequency: 2441 MHz Highest Operation frequency: 2479 MHz Emission designator: F7D Antenna gain: ≤ 0 dBi Type of modulation: DSSS Operation mode: simplex Type of antenna: integral Power supply: 3.7V, 240mAh Li-Po battery All information was provided by the applicant) Configuration/Specification for Transmitter and R/C Helicopter: Test Report No.: H1M21203-9872-P-15 SLG Asia Test Labs & Service (HK) Limited 26/F., Tamson Plaza, 161 Wai Yip Street, Kwun Tong, Kowloon, Hong Kong Page 5 of 19

SLG Asia Test Labs & Service (HK) Limited 1.7 General Test Conditions Environmental reference conditions If not defined otherwise by the Technical Committee responsible for the generic standard and/or the product standard the climatic conditions during the tests are to be within the limits specified by the manufacturer for the operation of the EUT and the test equipment. The climatic conditions during the tests were within the following limits: Temperature Humidity Atmospheric pressure 15 °C - 35 °C 30 % - 60 % 860 hPa - 1060 hPa If explicitly required in the test base (basic) the climatic values are recorded and documented separately for the respective test. Calibration of measurement and test equipment All measurement and testing equipment that has a significant influence on the accuracy of qualitative measurements and tests is subject to a periodical in-house system of calibration and servicing that is part of the quality management system of the EMC laboratory of SLG Asia Test Labs & Service (HK) Limited. Measurement uncertainties All tests are subject to measurement uncertainties. The overall measurement uncertainty of a measurement is defined as the range of which can be supposed that it contains the true value with a specified probability. This probability is 95 % for the generally specified measurement uncertainty (so-called expanded measurement uncertainty). The limits for emission measurements and the test levels for immunity tests in the applied standards were defined taking into consideration the accuracy limits for measurement and testing equipment required by the basic standards. All measurement and test results of the EMC laboratory of SLG Asia Test Labs & Service (HK) Limited fulfil the requirements for measurement uncertainties according to the standards applied. Test Report No.: H1M21203-9872-P-15 SLG Asia Test Labs & Service (HK) Limited 26/F., Tamson Plaza, 161 Wai Yip Street, Kwun Tong, Kowloon, Hong Kong Page 6 of 19

SLG Asia Test Labs & Service (HK) Limited 2 Test result Summary Digital Transmission system (2400-2483.5MHz) Requirements according standard: FCC Rule Test description Results/Notes Limits/Requirements Verdict 15.247(a) System uses DSSS Digital modulation techniques P 15.247(a) (2) 6dB Bandwidth > 894.2 KHz > 500kHz P 15.247(b) -0.19 dBm (ERP) (3) Maximum peak E Power (0.96 mW) 1W, EIRP limited to 4W P 15.247(e) Power Spectral Density -13.32 dBm/3kHz < 8dBm/3kHz P 15.247(d) / Out-of-band Emission 15.209, 15.205 restricted 15.209, 15.205 30MHz – 25GHz All signals below Limits bands, all others < -20dBc P Band-edge requirements All frequencies inside 15.247(d) in 100kHz Bandwidth the band Within range 2405-2483.5MHz P EUT has integral 15.203 RF Connector antenna P Refer to MPE 15.247 (b)/ 15.407 (f) RF Exposure requirements calculation and User Refer to OET 65 P manual statement Test case verdicts P - Pass Test item does meet the requirement F - Fail Test item does not meet the requirement N.A. - Not Applicable Test case does not apply to the test object Test Report No.: H1M21203-9872-P-15 SLG Asia Test Labs & Service (HK) Limited 26/F., Tamson Plaza, 161 Wai Yip Street, Kwun Tong, Kowloon, Hong Kong Page 7 of 19

SLG Asia Test Labs & Service (HK) Limited 3 Test results 3.1. 6dB Bandwidth Measurement Results: FCC part 15.247 (a) (2): Signal Bandwidth Frequency Resolution bandwidth 6dB bandwidth (kHz) Limit Results (MHz) (kHz) 2405 100kHz 894.2 >500 Pass 2441 100kHz 898.2 >500 Pass 2479 100kHz 922.2 >500 Pass Lowest Operation frequency: 2405 MHz * RBW 100 kHz Att 0 dB * VBW 100 kHz D2[1] - 0.03 dB Ref -20.00 dBm * SWT 5ms 894.200000000 kHz M1[1] - 46.10 dBm 1Pk 2.404540900 GHz -30 dBm Max M3[1] - 40.09 dBm M3 2.404672700 GHz -40 dBm M1 D2 D1 -46.150 dBm -50 dBm -60 dBm -70 dBm -80 dBm -90 dBm -100 dBm -110 dBm CF 2.405 GHz Span 2.0 MHz Occupied bandwidth: 2182.4 KHz Test Report No.: H1M21203-9872-P-15 SLG Asia Test Labs & Service (HK) Limited 26/F., Tamson Plaza, 161 Wai Yip Street, Kwun Tong, Kowloon, Hong Kong Page 8 of 19

SLG Asia Test Labs & Service (HK) Limited Middles Operation frequency: 2441 MHz * RBW 100 kHz Att 0 dB * VBW 100 kHz D2[1] 0.05 dB Ref -20.00 dBm * SWT 5ms 898.200000000 kHz M1[1] - 43.41 dBm 1Pk 2.440548900 GHz -30 dBm Max M3 M3[1] - 37.53 dBm 2.440668700 GHz -40 dBm M1 D2 D1 -43.530 dBm -50 dBm -60 dBm -70 dBm -80 dBm -90 dBm -100 dBm -110 dBm CF 2.441 GHz Span 2.0 MHz Occupied bandwidth: 2182.4 KHz Highest Operation frequency: 2479 MHz * RBW 100 kHz Att 0 dB * VBW 100 kHz D2[1] 0.05 dB Ref -20.00 dBm * SWT 5ms 922.200000000 kHz M1[1] - 41.05 dBm 1Pk 2.478532900 GHz -30 dBm M3 Max M3[1] - 34.33 dBm M1 2.479311400 GHz -40 dBmD1 -41.310 dBm D2 -50 dBm -60 dBm -70 dBm -80 dBm -90 dBm -100 dBm -110 dBm CF 2.479 GHz Span 2.0 MHz Occupied bandwidth: 2182.4 KHz Test Report No.: H1M21203-9872-P-15 SLG Asia Test Labs & Service (HK) Limited 26/F., Tamson Plaza, 161 Wai Yip Street, Kwun Tong, Kowloon, Hong Kong Page 9 of 19

SLG Asia Test Labs & Service (HK) Limited 3.2. Output power Measurement Results: FCC part 15.247 (b) (3): Output Power Frequency Output Power Antenna Gain Results EIRP MHz dBm mW dBi dBm mW 2405 -2.91 0.51 0 Pass -2.91 0.51 2441 -0.19 0.96 0 Pass -0.19 0.96 2479 -3.22 0.48 0 Pass -3.22 0.48 All results were measured with peak power meter. Measurement Equipment Used: Test equipment Type S/N Manufacturer Cal Due Date Spectrum Analyzer FSEK 20 836043/003 Rohde & Schwarz Sep 12 Test Report No.: H1M21203-9872-P-15 SLG Asia Test Labs & Service (HK) Limited 26/F., Tamson Plaza, 161 Wai Yip Street, Kwun Tong, Kowloon, Hong Kong Page 10 of 19

SLG Asia Test Labs & Service (HK) Limited 3.3. Power Spectral Density Measurement Results: FCC part 15.247 (e): Power spectral Density Frequency PSD Limit Results MHz dBm/3kHz dBm/3kHz 2405 -19.24 8 Pass 2441 -13.32 8 Pass 2479 -17.44 8 Pass Note 1: Power spectral density measured using RBW=3kHz, VBW=10kHz, analyzer with peak detector and with a sweep time set to ensure a dwell time of at least 1 second per 3kHz. The measurement is made at the frequency of PPSD determined from preliminary scans using Measurement Equipment Used: Test equipment Type S/N Manufacturer Cal Due Date Spectrum Analyzer FSEK 20 836043/003 Rohde & Schwarz Sep 12 Test Report No.: H1M21203-9872-P-15 SLG Asia Test Labs & Service (HK) Limited 26/F., Tamson Plaza, 161 Wai Yip Street, Kwun Tong, Kowloon, Hong Kong Page 11 of 19

SLG Asia Test Labs & Service (HK) Limited 3.4. Out-of-band Emission Measurement Procedure The equipment under test is placed on a non metallic table with 0.8 m height. The power supply and the RF connection points are close to the equipment under test at the floor inside a connection box. The cables to this connection box are shielded and below the double floor. The receiving antenna is placed in a height at 1.0 m to 4.0 m and in a distance of 3 m. Measurement Equipment Used: Test equipment Type S/N Manufacturer Cal Due Date Semi-anechoic Chamber Nil Nil Frankonia May 12 Test Reciever ESU 26 100050 Rohde & Schwarz Aug 12 Bi-conical Antenna HK116 841489/016 Rohde & Schwarz Mar 12 Log.-Periodic Antenna HL223 841516/020 Rohde & Schwarz Feb 12 Horn Antenna 3115 9002-3351 EMCO Feb 12 Active Loop Antenna 6502 9107-2651 EMCO Dec 12 Test Report No.: H1M21203-9872-P-15 SLG Asia Test Labs & Service (HK) Limited 26/F., Tamson Plaza, 161 Wai Yip Street, Kwun Tong, Kowloon, Hong Kong Page 12 of 19

SLG Asia Test Labs & Service (HK) Limited Measurement Results: Low Frequency @ 2405 MHz Fundamental emission level @3m in 100khz RBV 92.32 dBV/m Limit for emission outside of restricted bands: 72.32 dBV/m Frequency Level Pol 15.209/15.247 Detector Comments MHz dBV/m V/H Limit Margin Pk/QP/Avg 198.637 19.18 V 40 20.82 Pk RB/VB 100kHz 198.640 18.02 H 40 21.98 Pk RB/VB 100kHz 478.220 28.00 V 46 18.00 Pk RB/VB 100kHz 371.560 33.00 H 46 13.00 Pk RB/VB 100kHz 4810 43.26 V 54 10.74 Avg RB/VB 1MHz 4810 45.92 H 54 8.08 Avg RB/VB 1MHz 7214 32.08 V 72.32 40.24 Avg RB/VB 1MHz 7214 32.77 H 72.32 39.55 Avg RB/VB 1MHz 9620 36.00 V 72.32 36.32 Avg RB/VB 1MHz 9620 36.25 H 72.32 36.07 Avg RB/VB 1MHz For emission in restricted band, the limit of 15,209 was used. For all other emission, the limit was set 20dB below the level of fundamental and measured in 100kHz Middle Frequency @ 2441 MHz Fundamental emission level @3m in 100khz RBV 95.04 dBV/m Limit for emission outside of restricted bands: 75.04 dBV/m Frequency Level Pol 15.209/15.247 Detector Comments MHz dBmV/m V/H Limit Margin Pk/QP/Avg 198.297 18.79 V 40 21.21 Pk RB/VB 100kHz 198.297 18.00 H 40 22.00 Pk RB/VB 100kHz 478.220 29.50 V 46 16.50 Pk RB/VB 100kHz 353.780 23.80 H 46 22.20 Pk RB/VB 100kHz 4882 44.03 V 54 9.97 Avg RB/VB 1MHz 4882 46.05 H 54 7.95 Avg RB/VB 1MHz 7327 31.97 V 54 22.03 Avg RB/VB 1MHz 7327 31.27 H 54 22.73 Avg RB/VB 1MHz 9771 38.82 V 75.04 36.22 Avg RB/VB 1MHz 9771 38.57 H 75.04 36.47 Avg RB/VB 1MHz For emission in restricted band. the limit of 15.209 was used. For all other emission. the limit was set 20dB below the level of fundamental and measured in 100kHz Test Report No.: H1M21203-9872-P-15 SLG Asia Test Labs & Service (HK) Limited 26/F., Tamson Plaza, 161 Wai Yip Street, Kwun Tong, Kowloon, Hong Kong Page 13 of 19

SLG Asia Test Labs & Service (HK) Limited High Frequency @ 2479 MHz Fundamental emission level @3m in 100khz RBV 92.01 dBV/m Limit for emission outside of restricted bands: 72.01 dBV/m Frequency Level Pol 15.209/15.247 Detector Comments MHz dBmV/m V/H Limit Margin Pk/QP/Avg 90.641 19.03 V 40 20.97 Pk RB/VB 100kHz 84.850 18.87 H 40 21.13 Pk RB/VB 100kHz 478.220 28.70 V 46 17.30 Pk RB/VB 100kHz 384.890 27.30 H 46 18.70 Pk RB/VB 100kHz 4951 43.07 V 54 10.93 Avg RB/VB 1MHz 4954 44.92 H 54 9.08 Avg RB/VB 1MHz 7438 29.92 V 54 24.08 Avg RB/VB 1MHz 7438 30.68 H 54 23.32 Avg RB/VB 1MHz 9885 39.61 V 72.01 32.40 Avg RB/VB 1MHz 9894 40.36 H 72.01 31.65 Avg RB/VB 1MHz For emission in restricted band the limit of 15.209 was used. For all other emission. the limit was set 20dB below the level of fundamental and measured in 100kHz Note: Testing is carried out with frequency rang 30MHz to the tenth harmonics which above 5th Harmonics is close to the noise base even antenna close up to 1meter distance according the measurement of ANSI C63.4. Emissions 20dB lower than the limit are not reported. Test Report No.: H1M21203-9872-P-15 SLG Asia Test Labs & Service (HK) Limited 26/F., Tamson Plaza, 161 Wai Yip Street, Kwun Tong, Kowloon, Hong Kong Page 14 of 19

SLG Asia Test Labs & Service (HK) Limited FCC Part 15. Subpart C. §15.209. Radiated Emission Limits Frequency of Emission Field strength Field Strength [MHz] [V/m] [dBV/m] 30 – 88 100 40.0 88 – 216 150 43.5 216 – 960 200 46.0 Above 960 500 54.0 FCC Part 15. Subpart C. §15.205. Restricted bands of operation MHz MHz MHz GHz 0.090 - 0.110 16.42 - 16.423 399.9 - 410 4.5 - 5.15 10.495 - 0.505 16.69475 - 16.69525 608 - 614 5.35 - 5.46 2.1735 - 2.1905 16.80425 - 16.80475 960 - 1240 7.25 - 7.75 4.125 - 4.128 25.5 - 25.67 1300 - 1427 8.025 - 8.5 4.17725 - 4.17775 37.5 - 38.25 1435 - 1626.5 9.0 - 9.2 4.20725 - 4.20775 73 - 74.6 1645.5 - 1646.5 9.3 - 9.5 6.215 - 6.218 74.8 - 75.2 1660 - 1710 10.6 - 12.7 6.26775 - 6.26825 108 - 121.94 1718.8 - 1722.2 13.25 - 13.4 6.31175 - 6.31225 123 - 138 2200 - 2300 14.47 - 14.5 8.291 - 8.294 149.9 - 150.05 2310 - 2390 15.35 - 16.2 8.362 - 8.366 156.52475 - 156.52525 2483.5 - 2500 17.7 - 21.4 8.37625 - 8.38675 156.7 - 156.9 2690 - 2900 22.01 - 23.12 8.41425 - 8.41475 162.0125 - 167.17 3260 - 3267 23.6 - 24.0 12.29 - 12.293 167.72 - 173.2 3332 - 3339 31.2 - 31.8 12.51975 - 12.52025 240 - 285 3345.8 - 3358 36.43 - 36.5 12.57675 - 12.57725 322 - 335.4 3600 - 4400 13.36-13.41 Test Report No.: H1M21203-9872-P-15 SLG Asia Test Labs & Service (HK) Limited 26/F., Tamson Plaza, 161 Wai Yip Street, Kwun Tong, Kowloon, Hong Kong Page 15 of 19

SLG Asia Test Labs & Service (HK) Limited 3.5. Band edge requirement Measurement Results: FCC part 15.247 (d): Band edge requirements Resolution bandwidth 20 dB band edge Frequency (kHz) Limit Results (MHz) (MHz) 2405 100kHz 2404.4 > 2400.0 Pass 2479 100kHz 2480.0 < 2483.5 Pass Lowest Operation frequency: 2405 MHz * RBW 100 kHz Att 0 dB * VBW 100 kHz M2[1] - 34.90 dBm Ref -20.00 dBm SWT 2.5ms 2.404701000 GHz M1[1] - 54.08 dBm 1Pk 2.404371000 GHz -30 dBm M2 Max -40 dBm -50 dBm M1 D1 -56.080 dBm -60 dBm -70 dBm -80 dBm -90 dBm -100 dBm -110 dBm F1 CF 2.405 GHz Span 15.0 MHz 20bb Test Report No.: H1M21203-9872-P-15 SLG Asia Test Labs & Service (HK) Limited 26/F., Tamson Plaza, 161 Wai Yip Street, Kwun Tong, Kowloon, Hong Kong Page 16 of 19

SLG Asia Test Labs & Service (HK) Limited Highest Operation frequency: 2479 MHz * RBW 100 kHz Att 0 dB * VBW 100 kHz M1[1] - 60.74 dBm Ref -20.00 dBm SWT 2.5ms 2.480018000 GHz M2[1] - 40.64 dBm 1Pk 2.478970000 GHz -30 dBm Max M2 -40 dBm -50 dBm M1 -60 dBmD1 -60.660 dBm -70 dBm -80 dBm -90 dBm -100 dBm -110 dBm F1 CF 2.479 GHz Span 15.0 MHz 20bb Test Report No.: H1M21203-9872-P-15 SLG Asia Test Labs & Service (HK) Limited 26/F., Tamson Plaza, 161 Wai Yip Street, Kwun Tong, Kowloon, Hong Kong Page 17 of 19

SLG Asia Test Labs & Service (HK) Limited 4 Normative references /1/ FCC Rules 47 CFR PART 15 Subpart: 2011 Radio Frequency Devises /2/ ANSI C63.4-2003 Methods of Measurement of Radio-Noise Emission from Low-Voltage Electrical and Electronic Equipment in the Range of 9 kHz to 40 GHz Test Report No.: H1M21203-9872-P-15 SLG Asia Test Labs & Service (HK) Limited 26/F., Tamson Plaza, 161 Wai Yip Street, Kwun Tong, Kowloon, Hong Kong Page 18 of 19

SLG Asia Test Labs & Service (HK) Limited 5 Disclaimer This document based on General Terms and Conditions of SLG Asia Test Labs & Service (HK) Limited. which the applicant accepted with order confirmation. Emphasized conditions or project related conditions: Released Test Reports apply only to the specific samples tested under stated test conditions. It is the applicant’s responsibility to assure that additional production units of the tested model(s) are manufactured in same construction and with identical electrical and mechanical components to meet the same quality as tested model(s). The applicant/manufacturer/importer is responsible for any modifications made to the production units which result in non-compliance to the applied and/or relevant regulations. SLG Asia Test Labs & Service (HK) Limited shall have no liability for any deductions. inferences or generalizations drawn by the client or others from any kind of issued reports. Reports are confidential property of the client as a mutual protection to the applicant the clients. The public and ourselves extracts from the test report shall not be reproduced except in full without our written approval. The purpose of conformity testing is to increase the probability of adherence to the essential requirements or conformity specifications. as appropriate. The complexity of the technical specifications means that full and thorough testing is impractical for both technical and economic reasons. Furthermore there is no guarantee that a test sample which has passed all the relevant tests conforms to a specification. Neither is there any guarantee that such a test sample will interact with other genuinely open systems. The existence of the tests nevertheless provides the confidence that the test sample possesses the qualities as maintained and that its performance generally conforms to representative cases of communications equipment. The test results of this test report relate exclusively to the item tested as specified in clause 1.6 of this report. The test report may only be reproduced or published in full. Reproducing or publishing extracts of the report requires the prior written approval of SLG Asia Test Labs & Service (HK) Limited. 5.1 Revision Notes This revised Report replaces the all former Test Reports based on number H1M21203-9872-P-15. These former Test Reports are not longer valid. Every Revision of the original report is recorded below and identified by the ║ symbol beside the text. Revision No. Revision H1M21203-9872-P-15 Original Test Report Test Report No.: H1M21203-9872-P-15 SLG Asia Test Labs & Service (HK) Limited 26/F., Tamson Plaza, 161 Wai Yip Street, Kwun Tong, Kowloon, Hong Kong Page 19 of 19


Document Created: 2012-04-11 10:13:34
Document Modified: 2012-04-11 10:13:34
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