Test Report

FCC ID: R9C-R827

Test Report

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FCCID_2140214

Report No.:SZ13100153E01 FCC TEST REPQ@RT Issued to ’{f\/\\\s > utss ofk§VYG,, GUANGDONG OPPO MOBILE TELECOMMUNICATIONS CORP., LTD. For Mobile Phone Model Name: OPPO R827 Trade Name: OPPO Brand Name: OPPO FCC ID: RIC—R827 Standard: 47 CFR Part 15 Subpart B Test date: November 7, 2013 — November 19, 2013 Issue date: November 26, 2013 By hina 518101 Tested by Review by Wu i& l.' Cai Junlong Wu Zhangli (Test Engineer) (EMC Manager) Date 2s(% . [l «26 Date 213 » I{. 26 The report refers only to the sample tested and does not apply to the bulk. This report is issued in confidence to the clent and 2 will be strictly treated as such by the Shnzhen MORLAB Communication Technology Co., Ltd. t may not be reproduced rather in s entirety or in part and it may not be used for adverting. The cllent to whomthe report is issued may, however, show or send i or a certffed copy there of prepared by the Shenzhan MORLAB Telecommunication Co , Ltd to his customer. Suppler or others persons directly concerned. Shenzhen MORLAB Telecommunication Co.. Lid will not without the consent of the clent enter into any discussion of correspondance with any third party concerning the contents of the report.In the event of the improper use ofthe report, Shenzhen MORLAB Telecommunication Co., Lid reserves the rights to withdraw it and to adopt any other remedias which may be appropriate Shenzhen Morlab Communications Technology Co., Ltd. Phone: +86 (0) 755 36698555 Web site: hitp—iwww morlab.cn/ Fax: +86 (0) 755 36698525

Report No.: SZ13100153E01 TABLE OF CONTENTS 1. GENERAL INFORMATION ...................................................................................................................... 3 1.1 EUT DESCRIPTION.................................................................................................................................... 3 1.2 TEST STANDARDS AND RESULTS .............................................................................................................. 4 1.3 FACILITIES AND ACCREDITATIONS ............................................................................................................. 5 1.3.1 FACILITIES ........................................................................................................................................................5 1.3.2 FACILITIES ........................................................................................................................................................5 1.3.3 MEASUREMENT UNCERTAINTY ....................................................................................................................... 5 2. TEST CONDITIONS SETTING ................................................................................................................ 6 2.1 TEST MODE .............................................................................................................................................. 6 2.2 TEST SETUP AND EQUIPMENTS LIST ......................................................................................................... 7 2.2.1 CONDUCTED EMISSION ...................................................................................................................................7 2.2.2 RADIATED EMISSION .......................................................................................................................................8 3. 47 CFR PART 15B REQUIREMENTS ...................................................................................................10 3.1 CONDUCTED EMISSION ............................................................................................................................10 3.1.1 REQUIREMENT ...............................................................................................................................................10 3.1.2 TEST DESCRIPTION .......................................................................................................................................10 3.1.3 TEST RESULT .................................................................................................................................................10 3.2 RADIATED EMISSION ................................................................................................................................12 3.2.1 REQUIREMENT ...............................................................................................................................................12 3.2.2 TEST DESCRIPTION .......................................................................................................................................12 3.2.3 FREQUENCY RANGE OF MEASUREMENT ...................................................................................................... 12 3.2.4 TEST RESULT .................................................................................................................................................13 Change History Issue Date Reason for change 1.0 November 26, 2013 First edition Shenzhen Morlab Communications Technology Co., Ltd Phone: +86 (0) 755 36698555 Web site: http://www.morlab.cn/ Fax: +86 (0) 755 36698525 Email: info_sz@morlab.cn Page 2 of 15

Report No.: SZ13100153E01 1. GENERAL INFORMATION 1.1 EUT Description EUT Type: Mobile Phone Serial No: (n.a., marked #1 by test site) Hardware Version: 213071 Software Version: R827AS_11_1.01_131005 Applicant: GUANGDONG OPPO MOBILE TELECOMMUNICATIONS CORP., LTD. NO.18 HAIBIN ROAD, WUSHA, CHANG'AN, DONGGUAN, GUANGDONG, CHINA Manufacturer: GUANGDONG OPPO MOBILE TELECOMMUNICATIONS CORP., LTD. NO.18 HAIBIN ROAD, WUSHA, CHANG'AN, DONGGUAN, GUANGDONG, CHINA Power supply: Battery Brand Name: OPPO Model No.: BLP563 Serial No.: (n.a. marked #1 by test site) Capacitance: 2000mAh Rated Voltage: 3.8V Charge Limit: 4.35V Ancillary Equipment: AC Adapter (Charger for Battery) Brand Name: OPPO Model No.: S01A22 Serial No.: (n.a. marked #1 by test site) Rated Input: 100-240V, 200mA, 50/60Hz Rated Output: 5V, 1000mA NOTE: 1. The EUT is a Mobile Phone, it is equipped with a T-Flash card slot, a Micro-USB port which can be connected to the ancillary equipments e.g. the PC. 2. Please refer to Annex A for the photographs of the EUT. For a more detailed description, please refer to Specification or User’s Manual supplied by the applicant and/or manufacturer. Shenzhen Morlab Communications Technology Co., Ltd Phone: +86 (0) 755 36698555 Web site: http://www.morlab.cn/ Fax: +86 (0) 755 36698525 Email: info_sz@morlab.cn Page 3 of 15

Report No.: SZ13100153E01 1.2 Test Standards and Results The objective of the report is to perform testing according to 47 CFR Part 15 Subpart B: No. Identity Document Title 1 47 CFR Part 15(10-1-12 Edition) Radio Frequency Devices Test detailed items/section required by FCC rules and results are as below: No. Section Description Result 1 15.107 Conducted Emission PASS 2 15.109 Radiated Emission PASS NOTE: The tests were performed according to the method of measurements prescribed in ANSI C63.4-2009. Shenzhen Morlab Communications Technology Co., Ltd Phone: +86 (0) 755 36698555 Web site: http://www.morlab.cn/ Fax: +86 (0) 755 36698525 Email: info_sz@morlab.cn Page 4 of 15

Report No.: SZ13100153E01 1.3 Facilities and Accreditations 1.3.1 Facilities Shenzhen Morlab Communications Technology Co., Ltd. Morlab Laboratory is a testing organization accredited by China National Accreditation Service for Conformity Assessment (CNAS) according to ISO/IEC 17025. The accreditation certificate number is L3572. All measurement facilities used to collect the measurement data are located at FL.3, Building A, FeiYang Science Park, No.8 LongChang Road, Block 67, BaoAn District, ShenZhen, GuangDong Province, P. R. China 518101. The test site is constructed in conformance with the requirements of ANSI C63.4-2009 and CISPR Publication 22:2010; the FCC registration number is 695796. 1.3.2 Facilities During the measurement, the environmental conditions were within the listed ranges: Temperature (°C): 15 - 35 Relative Humidity (%): 30 - 60 Atmospheric Pressure (kPa): 86 -106 1.3.3 Measurement Uncertainty The uncertainty is calculated using the methods suggested in the "Guide to the Expression of Uncertainty in Measurement" (GUM) published by ISO. Uncertainty of Conducted Emission: ±1.8dB Uncertainty of Radiated Emission: ±3.1dB Shenzhen Morlab Communications Technology Co., Ltd Phone: +86 (0) 755 36698555 Web site: http://www.morlab.cn/ Fax: +86 (0) 755 36698525 Email: info_sz@morlab.cn Page 5 of 15

Report No.: SZ13100153E01 2. TEST CONDITIONS SETTING 2.1 Test Mode 1 The first test mode (Data Transmission) The EUT configuration of the emission tests is EUT + TransFlash Card + Battery + PC. During the measurement, the EUT with a TransFlash Card embedded was connected with a PC via the Micro-USB port, the data is transmitting between the PC and the TransFlash Card of the EUT. 2 The second test mode (Standby) The EUT configuration of the emission tests is EUT + Battery + Charger. During the measurement, the EUT was charged by its adapter and turned on. Note: All test modes are performed, only the worst case(Data Transmission) is recorded in this report. Shenzhen Morlab Communications Technology Co., Ltd Phone: +86 (0) 755 36698555 Web site: http://www.morlab.cn/ Fax: +86 (0) 755 36698525 Email: info_sz@morlab.cn Page 6 of 15

Report No.: SZ13100153E01 2.2 Test Setup and Equipments List 2.2.1 Conducted Emission A. Test Setup: < 40cm > < 80cm > EUT Pulse Limiter < 80cm > LISN Receiver The EUT is placed on a 0.8m high insulating table, which stands on the grounded conducting floor, and keeps 0.4m away from the grounded conducting wall. The EUT is connected to the power mains through a LISN which provides 50Ω/50µH of coupling impedance for the measuring instrument. A Pulse Limiter is used to protect the measuring instrument. The factors of the whole test system are calibrated to correct the reading. B. Equipments List: Description Manufacturer Model Serial No. Cal. Date Due. Date Receiver Narda PMM 9010 595WX11007 12/11/2013 11/11/2014 EMC Analyzer Agilent E7405A US44210471 12/05/2013 11/05/2014 LISN Schwarzbeck NSLK 8127 812744 12/05/2013 11/05/2014 Pulse Limiter (20dB) Schwarzbeck VTSD 9561-D 9391 (n.a.) (n.a.) System Simulator Agilent E5515C GB43130131 12/05/2013 11/05/2014 T-Flash Card SanDisk 256MB (n.a.) (n.a.) (n.a.) PC Lenovo ThinkPadT61 ZZF3077 (n.a.) (n.a.) Shenzhen Morlab Communications Technology Co., Ltd Phone: +86 (0) 755 36698555 Web site: http://www.morlab.cn/ Fax: +86 (0) 755 36698525 Email: info_sz@morlab.cn Page 7 of 15

Report No.: SZ13100153E01 2.2.2 Radiated Emission A. Test Setup: 1) For radiated emissions from 9kHz to 30MHz 2) For radiated emissions from 30MHz to1GHz 3) For radiated emissions above 1GHz Shenzhen Morlab Communications Technology Co., Ltd Phone: +86 (0) 755 36698555 Web site: http://www.morlab.cn/ Fax: +86 (0) 755 36698525 Email: info_sz@morlab.cn Page 8 of 15

Report No.: SZ13100153E01 The test is performed in a 3m Semi-Anechoic Chamber; the antenna factor, cable loss and so on of the site (factors) is calculated to correct the reading. The EUT is placed on a 0.8m high insulating Turn Table, and keeps 3m away from the Test Antenna, which is mounted on a variable-height antenna master tower. For the test Antenna: 1) In the frequency range of 9KHz to 30MHz, magnetic field is measured with Loop Test Antenna. The Test Antenna is positioned with its plane vertical at 1m distance from the EUT. The center of the Loop Test Antenna is 1m above the ground. During the measurement the Loop Test Antenna rotates about its vertical axis for maximum response at each azimuth about the EUT. 2) In the frequency range above 30MHz, Bi-Log Test Antenna (30MHz to 1GHz) and Horn Test Antenna (above 1GHz) are used. Test Antenna is 3m away from the EUT. Test Antenna height is varied from 1m to 4m above the ground to determine the maximum value of the field strength. The emission levels at both horizontal and vertical polarizations should be tested. B. Equipments List: Description Manufacturer Model Serial No. Cal. Date Due. Date EMC Analyzer Agilent E7405A US44210471 12/05/2013 11/05/2014 Semi-Anechoic Albatross 9m*6m*6m (n.a.) 12/05/2012 11/05/2014 Chamber Test Antenna - Bi-Log Schwarzbeck VULB 9163 9163-274 12/05/2012 11/05/2014 Test Antenna - Horn Schwarzbeck BBHA 9120D 9120D-963 12/05/2012 11/05/2014 Test Antenna -Loop Schwarzbeck FMZB 1519 1519-022 12/05/2012 11/05/2014 T-Flash Card SanDisk 256MB (n.a.) (n.a.) (n.a.) PC Lenovo ThinkPadT61 ZZF3077 (n.a.) (n.a.) Shenzhen Morlab Communications Technology Co., Ltd Phone: +86 (0) 755 36698555 Web site: http://www.morlab.cn/ Fax: +86 (0) 755 36698525 Email: info_sz@morlab.cn Page 9 of 15

Report No.: SZ13100153E01 3. 47 CFR PART 15B REQUIREMENTS 3.1 Conducted Emission 3.1.1 Requirement According to FCC section 15.107, the radio frequency voltage that is conducted back onto the AC power line on any frequency within the band 150kHz to 30MHz shall not exceed the limits in the following table, as measured using a 50µH/50Ω line impedance stabilization network (LISN). Conducted Limit (dBµV) Frequency range (MHz) Quasi-peak Average 0.15 - 0.50 66 to 56 56 to 46 0.50 - 5 56 46 5 - 30 60 50 NOTE: a) The limit subjects to the Class B digital device. b) The lower limit shall apply at the band edges. c) The limit decreases linearly with the logarithm of the frequency in the range 0.15 - 0.50MHz. 3.1.2 Test Description See section 2.2.1 of this report. 3.1.3 Test Result The maximum conducted interference is searched using Peak (PK), Quasi-peak (QP) and Average (AV) detectors; the emission levels more than the AV and QP limits, and that have narrow margins from the AV and QP limits will be re-measured with AV and QP detectors. Tests for both L phase and N phase lines of the power mains connected to the EUT are performed. All test modes are considered, refer to recorded points and plots below. A. Test Plot and Suspicious Points: Shenzhen Morlab Communications Technology Co., Ltd Phone: +86 (0) 755 36698555 Web site: http://www.morlab.cn/ Fax: +86 (0) 755 36698525 Email: info_sz@morlab.cn Page 10 of 15

Report No.: SZ13100153E01 (Plot A: L Phase) (Plot B: N Phase) Test Result: PASS Shenzhen Morlab Communications Technology Co., Ltd Phone: +86 (0) 755 36698555 Web site: http://www.morlab.cn/ Fax: +86 (0) 755 36698525 Email: info_sz@morlab.cn Page 11 of 15

Report No.: SZ13100153E01 3.2 Radiated Emission 3.2.1 Requirement According to FCC section 15.109(a)(e), the field strength of radiated emissions from unintentional radiators at a distance of 3 meters shall not exceed the following values: Frequency Field Strength Field Strength Limitation at 3m Measurement Dist range (MHz) µV/m Dist (uV/m) (dBuV/m) 0.009 - 0.490 2400/F(KHz) 300m 10000* 2400/F(KHz) 20log 2400/F(KHz) + 80 0.490 - 1.705 2400/F(KHz) 30m 100* 2400/F(KHz) 20log 2400/F(KHz) + 40 1.705 - 30.00 30 30m 100*30 20log 30 + 40 30.0 - 88.0 100 3m 100 20log 100 88.0 - 216.0 150 3m 150 20log 150 216.0 - 960.0 200 3m 200 20log 200 Above 960.0 500 3m 500 20log 500 Note: The limits of frequency below 30MHz is quoted from the FCC section 15.209. As shown in FCC section 15.35(b), for frequencies above 1000MHz, the field strength limits are based on average detector. When average radiated emission measurements are specified in this part, including emission measurements below 1000MHz, there also is a limit on the radio frequency emissions, as measured using instrumentation with a peak detector function, corresponding to 20dB above the maximum permitted average limit for the frequency being investigated unless a different peak emission limit is otherwise specified in the rules. Note: 1) The tighter limit shall apply at the boundary between two frequency range. 2) Limitation expressed in dBuV/m is calculated by 20log Emission Level(uV/m). 3) If measurement is made at 3m distance, then F.S Limitation at 3m distance is adjusted by using the formula of Ld1 = Ld2 * (d2/d1)2. Example: F.S Limit at 30m distance is 30uV/m, then F.S Limitation at 3m distance is adjusted as Ld1 = L1 = 30uV/m * (10)2 = 100 * 30uV/m 3.2.2 Test Description See section 2.2.2 of this report. 3.2.3 Frequency range of measurement Highest frequency generated or used in the device is the highest speed of the processor, lowest Shenzhen Morlab Communications Technology Co., Ltd Phone: +86 (0) 755 36698555 Web site: http://www.morlab.cn/ Fax: +86 (0) 755 36698525 Email: info_sz@morlab.cn Page 12 of 15

Report No.: SZ13100153E01 frequency generated or used in the device is the lowest frequency of the oscillator. According to 15.33(b)(1), the frequency range of radiated measurement for the EUT is listed in the following table: Frequency generated or used in the Frequency range of radiated Frequency device measurement in the report Highest 1.3GHz 6.5GHz Lowest 32KHz 9KHz 3.2.4 Test Result The maximum radiated emission is searched using PK, QP and AV detectors; the emission levels more than the limits, and that have narrow margins from the limits will be re-measured with AV and QP detectors. Both the vertical and the horizontal polarizations of the Test Antenna are considered to perform the tests. All test modes are considered, refer to recorded points and plots below. The amplitude of spurious emissions which are attenuated more than 20 dB below the permissible value need not be reported. Note: All radiated emission tests were performed in X, Y, Z axis direction, and only the worst axis test condition was recorded in this test report. A. Test Plots and Suspicious Points: NOTE: The emissions are too small to be measured and are at least 6 dB below the limit, So all the data of marked are pass. 160DBuV No Frequency PeakAp QP-Limit AV-Limit Quasi-P Avera-P Result 1 129 K 42.81 DBuV 105.39 -- -- -- -- 140DBuV 2 1.21 M 33.49 DBuV 45.98 -- -- -- -- 120DBuV 100DBuV 80DBuV 60DBuV 1 40DBuV 2 20DBuV 0DBuV -20DBuV 9K10K 20K 30K 40K 50K60K70K80K 90K 100K 200K 300K 400K500K600K 700K 800K 900K 1M 2M 3M 4M 5M 6M 7M8M9M10M 20M 30M (Plot A: 9K – 30M) Shenzhen Morlab Communications Technology Co., Ltd Phone: +86 (0) 755 36698555 Web site: http://www.morlab.cn/ Fax: +86 (0) 755 36698525 Email: info_sz@morlab.cn Page 13 of 15

Report No.: SZ13100153E01 (Plot B: 30MHz – 8GHz, Test Antenna Vertical) NO. Fre. Pk QP AV Limit- Limit- Limit- Antenna Verdict (MHz) PK QP AV 1 97.731 N.A 27.75 N.A N.A 43.5 N.A Vertical Pass 2 158.204 N.A 33.11 N.A N.A 43.5 N.A Vertical Pass 3 390.424 N.A 31.35 N.A N.A 46.0 N.A Vertical Pass 4 479.925 N.A 23.61 N.A N.A 46.0 N.A Vertical Pass 5 680.698 N.A 34.89 N.A N.A 46.0 N.A Vertical Pass 6 2830.424 44.15 N.A N.A 74.0 N.A 54.0 Vertical Pass Shenzhen Morlab Communications Technology Co., Ltd Phone: +86 (0) 755 36698555 Web site: http://www.morlab.cn/ Fax: +86 (0) 755 36698525 Email: info_sz@morlab.cn Page 14 of 15

Report No.: SZ13100153E01 (Plot C: 30MHz – 8GHz, Test Antenna Horizontal) NO. Fre. Pk QP AV Limit- Limit- Limit- Antenna Verdict (MHz) PK QP AV 1 59.027 N.A 24.89 N.A N.A 40.0 N.A Horizontal Pass 2 167.880 N.A 32.40 N.A N.A 43.5 N.A Horizontal Pass 3 235.611 N.A 33.22 N.A N.A 46.0 N.A Horizontal Pass 4 380.748 N.A 31.47 N.A N.A 46.0 N.A Horizontal Pass 5 772.618 N.A 31.32 N.A N.A 46.0 N.A Horizontal Pass 6 2820.449 44.14 N.A N.A 74.0 N.A 54.0 Horizontal Pass Test Result: PASS **END OF REPORT ** Shenzhen Morlab Communications Technology Co., Ltd Phone: +86 (0) 755 36698555 Web site: http://www.morlab.cn/ Fax: +86 (0) 755 36698525 Email: info_sz@morlab.cn Page 15 of 15


Document Created: 2019-11-12 03:42:05
Document Modified: 2019-11-12 03:42:05
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