Test Report_Classic BT

FCC ID: QISSNE-LX3

Test Report

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FCCID_4003853

FCC RF Test Report Product Name: Smart Phone Model Number: SNE-LX3 Report No.: SYBH(Z-RF)20180813013001-2004 FCC ID：QISSNE-LX3 Reliability Laboratory of Huawei Technologies Co., Ltd. (Global Compliance and Testing Center of Huawei Technologies Co., Ltd) No.2 New City Avenue Songshan Lake Sci. &Tech. Industry Park, Dongguan, Guangdong, 523808, P.R.C Tel: +86 755 28780808 Fax: +86 755 89652518

Sz isw. RF TestReporofSNELG Notce 1. The laboratory has passad the acerodtaion by China National Accrodtation Sarvice for Conformity Assescment (CNAS). The accroditation nurmber is LOB10. 2. The laboratory has passad the aceredtaion by The American Associationfor Laboratory Actreditation (A2LA} The accreditation numbar is 2174.01 3. The laboratory has been recogrized bythe US Federal Communications Commission (FCC) to perfarm compliance tasting subjecttothe Commission‘s Gortieaton rues. The Designation Number is CN1173, and the Test Firm Ragisration Number is 294140 4.. The laboratary has bean isted by Incusty Canada to perform electromagnatic amission messurements. Tre recagnition numbers oftost itare 6269A—1 5. The laboratory(Relabiity Lab of Huawei Technologias Go. Lid) is also namec "Global Complance and Tasting Certer of Huawel Technologles Co., Lb®,the both names have coedisted since 2008 8. The testreportis invaldlif not marked with the signatires ofthe persons respansible foproparing and approving thatast roport 7. The test report i invali thare is any ovidence of erasure andforfalsfeation 8. The test reportis only valifor the test samplas 3. Contantofthe tast regort, in part orinfull cannot be use for publictyandlor promotional purposes wihout pror writon approvalfrom the laboratory: ResertNo HanelPropetay and Corttenta Page 2t z2 svnemzoreoetco1900t 2004 Copylaht©HameiTeshmlages Co, L

Hwa AF TestRepot l SNELC Appllcant: Huawei Technologies Go. Lid Address: No.2 New Gity Avenue Songshan Lake Soi. ATech. Industy Park, Donggan, Guangdong, 520008, PR.C Date of Recelpt Sample: 2018.08—22 Start Date of Tost: 20e0027 End Date of Test: 2ote0010 Test Resut: Pass q Approved by Sentor 20180810 HeHao He Hao Engineer: Dare Name Signature Prepared by: 2otec00 Znoutingto ou h e ho Dare Name Signature ReporNo Hmnel Propitayard Contisertal Page aof 22 svae Aboteneraotator—ano« Copyight© HuanelTechnoboges Go d

dz isw. RF TestReporofSNELG content 1. Generalnfomaton s 14— AppledBlndtrd s 12. Testlomton s 18— TestEnviormert Gondtion s 2. TesSunmay s 3. DeserptonoliheEquimert underText (EUD 7 34. Genere Desciptn 7 52. EUTenty 7 33. TechnialDessipton s 4. GereraiTestCeeflons/Confiuratons D 41— EUT Conigurtions D 42. TextEmvionnents in 43. Antermarequiement in 44. Deserplonoftests 12 45— TextSetge is 48— TextCondtons 1e 5. MainTestInstunents zo 6. MeasizementUhecaiy 2 7 Apendies ze ResertNo HanelPropetay and Corttenta Page 4 ze svnemzoreoetco1900t 2004 Copylaht©HameiTeshmlages Co, L

Sz isw. RF TestReporofSNELG 1 General information 121. Appled Standard Aopled uies 47 GFR FCO Par 2 SubpartJ 47 GFR FCG Par 15, Subpar C Test Mattd FCGPUBLIG NOTICE DA 00205 Filngand MensirementGuideFrefor Frequency HappingSprend Spectuen Systems (Released March 30,2000) ANBI CB94—2014, AmerlanNatoral landaro Methods cf Mensuremert t PRado:NoseEmiasons fom LoVotage Electieaand Bearont Equipmert Inthe Range o 9 it t 40 Gite ANBI CB3102015, Americn Natoral Glardant o Testrg Unicensed Wieiess Devces 12 Test Location TestLocaton Relatity Latorory of HraneiTechnologes Co, Lt Addess No2 New Giy Avenve Gongstan LakeSe. LTech Inliny Park,Dongpian Cuangions. RRC 1.3 Test Environment Condtion Anbort Terperntire teswaso AnbortRelativHanidty astosss Atrosshetc Pressure Notappleatie ResertNo HanelPropetay and Corttenta Page scrze svnemzoreoetco1900t 2004 Copylaht©HameiTeshmlages Co, L

Sz isw. RF TestReporofSNELG 2. Test Summary Testfm FCG Pule No Resiements Testfen Wede note 208 Emmen Beravan Gam_ tsairent _ im Forends®_ Facs > wX EoiRown CaerFrequency Sepmraton 19247100 poverstosnW, 20re0d.. Apjends 8| Pass row, oram esn Nuntert Happing Chanrel arom is »15 chamels Aovends 0 Pass Tine t Occupancy (DvelTire) 152700 <Blewilina perodor Aovendi D Pass in (4#‘hopon nurben Feo:Condizes 1w Masimun Pesk OupatPoner 19247b( uingarsnovavedapping ApjendsE Pass chameis Bdede e sroromention isome ~2 dbrito ie Ni * res |_Pereraxt * G—| Pss Condicied hE Spatass Emnen powers pover t Fecerdx Fass Redned Erissens ie TSAE oo rar tsstotedsreren AovendiH Pass Restited Bands 1smo ns 2G Fover Ure Gonaices 1saor Foo rat tostreomices Apsendic1 Poss Enisions int: Reporhe svenemnzoreoercoracot 2001 Havel Propéeiny and Cortsental Copyight© HraneiTechrologes C d Page s arce

Sz isw. RF TestReporofSNELG 3. escription of he Eoulpment under Test (EUT 9.1 General Description SNEX3 i aiserberequiment inthe GBMWODMMLTE sstem. The GBM fequencybad holdes GSMES and GENBTand DCSHand RCSHI00 The UWTS requeneybard s BI and B2 and B4 and BS nd 80. The LTE frequeneyband is B2 and B4 and BS andB7 and BIR andB17 and 828. The Mable Phane inlement uch furatons as RF signl eceingtrinmiting LTE/RRAUMTE and GSMIGPREEDGE protocal precessing voie,vdeo MS servce, GPS, AGPS, NFOard LR ets Exemaly i provides one mizro 5D cartirtefc (Rean also used as SM eardtedace), ephone ort o provide vabe svie) and one SMcart meface ali rovies Bketcot medide to ynctrorizeditabetween a C andthephone, orto use the bult in maden ofthe phone t ecess h nteretth a PG,orto exchange dits wthothe Blucaath deviees. SNE L3 may suppot sigl S or ouble SM.Madel SNEi aamartphore with un SMoringe SM. The difernce ofthem s onl fr SM CARO GNE—LS single S1Ms deleted ore SWM bysottrre Note: Onl Bluetothsestdata ncladed in h eport 9.2 EUT Identiy NOTE:— Unless trerie reed in the mpor, thefinetoral ooistled in he unts shl s seleced fom e below itb not memns l tfunctonal boarls ited below shat bfstaled in one ut 3.2.1 Board Bow Desipien Hociran Vermon SoteareVerion WanBond mesrerin sieuaezoneicon ResertNo HanelPropetay and Corttenta Page t aze svnemzoreoetco1900t 2004 Copylaht©HameiTeshmlages Co, L

dz Haawer RF Test ReportofSNELX3 3.2.2 Sub— Assembly Sub—Assembly Sub—Assembly Name Mode! Manufecturer Desorition Input vatage: 100—240V ~500Hz 0.5A Adzo iwrosszosHo Huawel Technologies ol lapter — Co.td Output voltage: SV =—— 2a on oy === »a Input vaitage: 100—240V ~500Hz 0.5A Huawel Technologies Adapter Hw—ossecontia Outputvoltage: SV === 2A 0R Co.lid oy === »a Input vaitage: 100—240V ~500Hz 0.5A Huawel Technologies Adapter Hw—ossecoua Outputvoltage: SV === 2A 0R Co.lid ov 2A Input vaitage: 100—240V ~500Hz 0.5A Huawel Technologies Adapter Hw—ossecocho Outputvoltage: SV === 2A 0R Co.lid oy === »a Input vatage: 100—240V ~500Hz 0.5A ha i.000200BH0 Huawel Technologies ol lapter " Co.td Output voltage: SV =—— 2a on oy === »a Input vaitage: 100—240V ~500Hz 0.5A Huawel Technologies Adapter Hw—oo02008to 0 Outputvoltage: SV === 2A 0R o.id oy === »a Input vatage: 100—240V ~500Hz 0.5A Adzo Lw—c00200uH0 Huawel Technologies apter ol — Co.td Output voltage: SV === 2a on oy === »a Input vaitage: 100—240V ~500Hz 0.5A Huawel Technologies Adapter Hw—do0200EHo Outputvoltage: SV === 2A 0R Co.lid oy === »a Huawel Technologies Input vaitage: 100—240V ~50B0Hz 0.5A Adapter Hw—osozcono1 co. uid Outputvoltage: SV === 2A Rated capacity: G650m¥h Huawel Technologies Rechargesble Lion HBGBSEB@ECW _ |; Nominal Voitage: «sgeVv o. Gharging Voltage: 2== «40 Report No. Huawel Propretary and Confidental Page 8 of 22 SYBH(Z—RF)2018081 2013001—2004 Copyright © Huawe! Technologies Co., Ltd.

Sz isw. RF TestReporofSNELG 3. Technical Description Chamctetstes Descrpion THRKOperig 240020035 to— 2OR Mz + N 1 Mz where Rarge Hiteband fe‘Operting Frequency n Mz ChanrelNorier® wit therange tom 0078 Wedhiaton Type Core Frequercy HopginSpread Speciu(FiB) Som Grexm novex sorse Enision Desirate crac um waporsc mereso sorsicmerein Bluceath Fener Css Cl Zetema Dessipion lovonic Arterra Zeiema Type CJ ExemalBJ Inegmied Zerema Gain 0.1 d pearieara por, ma) Fover Swopy BJ 260C Adrer J roE: over: ResertNo HanelPropetay and Corttenta Pagescrze svenemnzoreoercoracot 2001 Copyight© HraneiTechrologes C d

isw. RF TestReporofSNELG 4. General Test Conditions / Confiqurations 4.1. EUT Configurations 41. General Go urations Corfauraton Deseiston Test Aiemns Pors Unilotremnse spected AMTH tests ae perfomed at l TX antema pors othe EUT, and AlRK tests e peformed t alRK antema poti l the EUT Mutiie RF Sources Onerranthe ested RF soune of he EUT e RF sousela aredanbled o snn curng messuremerts 4.12 Customized Confiqurations # EUT Gont SaralDeszriten Opertng Frequerey Thil.Des GFER modutaton, pactage uie DHhoosingon Tin_prs.cro GFER modutaton,pactage uie DHhapging o cune aremzme Tin._Dris_Ghao GFSK meddatonpactage type D. hepgig t Cune sor asn ie Tn._DH5_Ghre GFSK meddatonpaotage tye OS ropgig o. Cune rer asco uie TeZortsHep tt.0GFER modutaton, pactage ie 20hopping on Th:Zorts_Gr0 tt.0GFER modutaton, pactane ie 20hopping _ oo 0r2i0eNiz Th:Zorts_Gra tt.0GFER modutaton, pactane ie 20hopping lt oo 37 2081 ie TiZorts_Gnrd vt.0GFER modutaton, pactane ie 20hopping lt GnNio 167 2@ ie TsSorfsHep BOFC modulaionpactage tpe 3DHhoppngon Ths_Sorfs_Gr0 BOFC modulaionpactage ype SDHhoppngort cune aremzme Ths_sorts_Gra BORSC modulaionpactage tipe SDHhppngort Cune sor asn ie Th2orls_Grd BOFC modulaionpastage ype SDHhappngort Grie rer asco uie ResertNo HanelPropetay and Corttenta Page 10 or22 svenemnzoreoercoracot 2001 Copyight© HraneiTechrologes C d

Sz isw. RF TestReporofSNELG 42. TestEnvironments NOTE: Thevalies ied in thetest reportimay bestingentthan hedclied Envionmert Paanelr Seieded Vales buing Test Tenperauze es Reatre Hunaiy imw Znbien sevoo Znve 4.3 Antenna requirements Excerptfrom §15.200 ofthe FGCRules/Regultions: "An intenonal radator antenna shallbe desiyned to ensure that no anterna othertthat furighed by the responsble paty can be used wih thedevice. The use of a permanenty atached antenna or of an antema that uses uniquecouplng to the inlntlonalradlator shabe considered sutleentto comply wth the provsions ofthi secton" The antennas ofthe SNE—LX3 are permanently attached. Thereare no povisons for connection to an extermal artenna Conctusion: Te Smart Phone £CC 1D: GISSNELX3 un‘ comples wih the requrement of§15.200 Ch. Frequency (Wit) o. Frequency ts to 2ane so 24 To zio FrequencyChannel Operations ResertNo HanelPropetay and Corttenta Page 11 oze svnemzoreoetco1900t 2004 Copylaht©HameiTeshmlages Co, L

Sz isw. RF TestReporofSNELG 44— Descriptionoftests 4411 Bandwidih measurement () Comat EUT test portto universal communicationtastar (b) Satthe EUT t transmit maximum outpat powerat 24GHz and swich of recuency hopping function, then set the measuring froguency number, fnall tastthe bandwicth with anversal communication t 442 Carvierfrequency separation measurement () Comat EUT test portto spactrum analyzorand univarsal communicationtster (b) Satthe EUT t transmit masimum outpat powerat 24GHz and switch of recuency hopping function, then set e measured frguency number to o acfacant channals seporataly and tostthe earrirfrequency saparation with spectrum analyzor 443 Number o hopping channel () Comat EUT test porttspactrum analyzorand univarsal communicationtester (b) Satthe EUT t transmit masimum outpat powerat 24GHz and switch on recuency hopping function, then sot erough count bme (largerthan 5000 times} to yet allthe hopping reauency channal isplayedt on the serean of spectrum analyzor (¢) Gount the evartty of peaks to yatthe number of happing chainnals 444| Time of occupancy () Comas test portof EUT to spactrum analyzer and universal communicatontestor (b) Satthe EUT t transmit masimum outpat powerat 24GHz and switch on recuency hopping function (¢) Sotthe span of spectrum analyzer t0 He, and set tresolution bandirith to1 NHe and te vedto bandwicth to 1 Mz,then get the ¥me domain maasired diagram. and sat swaap timeto 2 tmes of one burst occuparcy time, and measire the tme of occupancy ofone burst (d) Satthe resoluton bandwidthtot NHz and the verdo banclvidthto3 NHe and sotthe sweep time to a periad (04 seconds mulipled by the number of happing channals employed),and count the number o the bursts (e) Caleuate the time of occupaney in a period withtime occupancy ofa burst and cuanttyof barsts 445| Peakoutput power () Comat EUT test portto spactrum analyzorand univarsal communicationtester (b) Satthe EUT t transmit masimum outpat powerat 24GHz and switch of recuency hopping function (6) Thanset the EUT to transmt athigh, mildand low freguiency and measure the conductod outpat power soparataly ResertNo HanelPropetay and Corttenta Page t2etz2 svnemzoreoetco1900t 2004 Copylaht©HameiTeshmlages Co, L

RFTest RegortotSNELX3 448 Band edge spurious emission () Comat EUT test portto spactrum analyzorand univarsal communicationtester (b) Satthe EUT t transmit masimum outpat powerat 24GHz and switch of recuency hopping function (¢) Thansot tEUT to transmitathigh, ow feeuency and measure the conductad band odge spurious soparatal (¢) Switch on thfrqueney hopping fincion, and repeat above measurement 447| Conducted RF Spurious () Comat EUT test portto spactrum analyzorand univarsal communiatontester (b) Satthe EUT t transmit masimum outpat powerat 24GHz and switch of recuency hopping function (¢) Thansot tEUT to transmitat high, mi€le and low freguiency and maasuretro condicted spurious soparatal (d) Switch on thfrqueney hopping fincion, and repeatthe above measrement 448 Rediated spurious emission & spurious in restricted band For freauncy balcw 1GHz, the tetsite semianechoic chamber has motthe requirement o NBA tolerance 4d8 according tothe standards ANSI CB3.10 (201). The EUT was setup on insulater 80em above the Ground Plano. Forreguency abave 1GHz,the test itful:—anechaic chamber has matthe requirementofANSI CB3—10 (2019). The EUT was satup on nsulator 180:m above the Ground Plane. "The setup and test methads were according to ANSI CB3.10:2013.The Raclated Distrbance messurements ware made using a Rohde and Schware Tast Recaver and contral sottware A proiminary scan and a final scan ofthe amissions were madle by using tast scrig.of sofware; the emissions ware measured using a Quasi—Pesk Detaetor below 1GHz, Paak Detactr and AV datector above 1GH. The naximal emission valie was acauired by adiusting the antonna haigh, polaration and turntable azimath in accordance wth the software setip. Normally, the height ange of antarna was tm to dn, and the azimuth range of urntable was 0‘to 360*The recaive artama has bro polarizatons V and H A portable or smal uniconsed wirelass device shallbe placed on non—motalictost firture or other normetalie supportcaring tsting. The supporing fxtre shall prmit rientation of h EUT in aach of three orthagonal(, y 2) acls postions such that amissions from the EUT are maxinized "The EUT communcatas with tBTS simalaterthrough Af nterface. The EUT transmits maximam output power at 24GHz and swich of freguney hopping function Measuroment bandwicth. 90 Mz 1000 MHz: 120 kiz Measuroment bandwicth. 1000 Mz 10° Carrer Froqueney: 1 NHe ResertNo HanelPropetay and Corttenta Page t2orz2 svnemzoreoetco1900t 2004 Copylaht©HameiTeshmlages Co, L

dz isw. RF TestReporofSNELG 449 Conducted Emission at Power Port "The Table top EUT was placed upon a nan—metaie table 08 m above the horirontal matal eference round plane. EUT was comectad toLISN and LSN was comncted toreference Ground Planc. EUT was 80m from LISN. The set—up and tost methods were according to ANSI C83.10: 2019 Condductad Disurtance at AG Port measurements were undertakon on the L and N Lines. The emissions ware measured using a Quasi—Pesk Detector and Average Detector "The EUT communcatas with tBTS simulaterthrough Af nterface, the BTS simulatercortrls the EUT totransmiterthe maximum gower which darined in specifcation of product. The EUT operated on the typical charnot Measurement bandwicth (RBW)for 1506z to 30 MHz: 9 Wiz; ResertNo HanelPropetay and Corttenta Page 14 ze svnemzoreoetco1900t 2004 Copylaht©HameiTeshmlages Co, L

isw. RF TestReporofSNELG 45— TestSetups 451. Test Setup 1 Tre Blicoth companents ntemma port(s of h EUT ae commecid tthe mensurementinstumentpean appropriate atervato: The EUT s contoled by Bhetcoth Bystem Gimatar andr POsotirare t eittheapectied sanal forthe purgose of mensuremerts winser Casir conmetng s RF Cake itapicae Masteania r—»| Atnustor |—a Measiroment | Instument + Bustooth ; i cuise + Power formaing Component Spiter duecon Buetooh Systom consonents Simulator anooason Power Conrol Supply ro 452. Test Setup2 Te senianechoi tariber and fl:arechol charier has methe requrement of ANSICB3.Thetet ditance is m The antu s accuding to ANSI OBRea cxvcer.ceiizc on ze "The maxinalemisso vlue is equted by dfustng the antenna helgt, polaison and uriatl ainuth Nomaly, the belghtrange ofactemna i 1 mtod n, theacimuth ange of urtabe so 20 and thereceive artenn has ho polatzatons Verieal VJ and Horonta ) ResertNo HanelPropetay and Corttenta Page ts orze svenemnzoreoercoracot 2001 Copyight© HraneiTechrologes C d

Je Hamwen MF Test Repor ofSNELX3 rongit £°C ==—= bose | ReceiverJ 1 _ _ _ . Ne (Bolow 1 Giiz) ti ome | esw ecaiver L. _ _ _ Nemsi (Above 1 Giz) ReportNo: Huawe! Propristay and Gonfidantal Page 18 0r22 SYaHZ—RFJeoranet aotanor—2004 Copyright@ Huawei Technologies Go., i

RFTest RegortotSNELX3 453 Test Setup3 "The mss cable o the EUT (mayhe per AGDC Adagteg mus be connecid tLISN.The LISNshal b placed 0. m from he boundacyofUPT and bonded toa gpund reference plano LBN mourted ot of he groun refererce plane.Thiditance i between th losespots ofhe LISNandthe EUT. Al ther uns o theEUT and assccited exvipmert shal beateast .0 fom the LN Gaurd connectons, nbererequind fr sley purposes,shallb connectd o the refereme geund pin of heLISN and, where nototentseprvided orspeced y the marufactver,shallb o samelengh as e main cableand un paralel t themais convecton ata separtiondatace of t mae tan 01 m Stieing eom ‘ 04m s — | [ 5$ | | Recove —meuee—| usn e Reserthio svnemzoreoetco1900t 2004 Hhavel Proptetay and Corttenta Copylaht©HameiTeshmlages Co, L Page tr oze

RFTest RegortotSNELX3 46. TestConditions Test Gase Test Contions Contawrsten Desetpton 208 Enizion |Mess: Vemd_| DAOPTOs Banduich E8W. [Testne imw Test Seup Test Seup 1 Eurcem Tin_prs_cre. ri_os.cres, Tin_pns_cie, Thezous_c%e, Tezous_crse, te_2oisoire, ussous_ofe,Twssous_cise, ts_soisce Garie: requeney—|Ness Ned DR 0070 Separaton Texm imw Test Seup Test Soup 1 ENT Con T.Den Th2oitsHep, ussorts Hep Numberof Happng Mess Wetved DR 0070 Chanvel Text Em ima Test Seup Test Soup 1 ENT Con T.Den Th2oitsHep, ussorts Hep Tiol Gezupancy Mess: Vetred DAOPTOs (DretTing Text Em ima Test Seup Test Seup 1 EUT C Tin_prs_Ghes, Thezous_crso, ussous_crso HMaximim Peak.— Mess Ned OR 007G Condicied Oupat |Testem ima Pover Test Seup Textfeup i EUT C Tin_prs_cro. wi_ois_Gre, Tin._Drs_Oie, Thezous_c%e, Tezous_crse, te_2oisoire, Thsous_ofe,Twssous_crse,ts_sousce Burd edye sparous Mess Wemad DR 0070 enision Text En ime Test Seup Test Seup 1 EUT Con Tin_prs_cro. ri_ons_ove, Twezous_cno, Tezous_cire, ussous_on tssous.cire Corticire Mess Wetred 00070 Spurous Enisson Tescene ime ResertNo HanelPropetay and Corttenta Page 18 or z2 svnemzoreoetco1900t 2004 Copylaht©HameiTeshmlages Co, L

Sz isw. RF TestReporofSNELG Test Gase Test Gordtons Contawaten Dessipien Test Seup Test Seup 1 ENT Con Tin_prs_cre. i_pis_ove, Tin.Dr_ome, Twezous_c%e, Tezous_crse, tve_2oisoire, ussous_ofe,Twssous_cise, ts_sousce Reciaed Enissors Mess Need DA 00705,0854, Bs 10 in te Resticted (h 20e i 1 it Barde P nawr — 100 lt VW — 200 Witz;Det — Penk Fiias RBYr «120 i: Oet » CISPR OunsiPeat 21 it ass otte Avernge:. RBW ME VBW » 10 He; Det = PealcSnceptine » Aso; Tace «Sige Peaks RBW MilyVOW «3 MMz,Det « Pea; Sneepiine «Aute: Trace# MaxHoks" 100 Text Em ima Test Seup Text Soupr ENT Con Sorime 1 itz min_pus.Gro tot Con) Tsom: Tipus_cre. Ti_pis_Gres, ri_os.ove, Tizors_one, Tezonscrso, Tizzors_Chre, Tis_sors_cne, Tssonts.crso, missous_ce sisore Thii_oi.C10 (Woree Gon), Toi.Chao (Worse Gor), T.usChrd (WereGor) Te zes one mmpus.Gra mont Com) #G Pover e Mess: Netrod AG mains concuse Condinied Pre RBW » 1010;Det = Peak Entssons ns RBH «9WDo = C6°R CnsPeak & Aveage Texm imw Test Seup TextSoups EuTo Tin prs_on ResertNo HanelPropetay and Corttenta Page toorz2 svnemzoreoetco1900t 2004 Copylaht©HameiTeshmlages Co, L

Sz isw. RF TestReporofSNELG 5. MainTest Instruments Continie Main Test Equipments Exprenttire HMandtcuzer Nedal Seral Namber Caibne Gat bue Wriess Gommuricaion #glem Nioros inoversse zuomm morce Testset Sonaizereme Forn easro instssone zowmtar zownume Spectrum Araizer igjiem neweor inaomiew zuons |_more Radiaion: Main TestEosipments EqupmentNiare Wandcurer _|_Model SeralNumber Calbue C be Testeomer ras Esure Towser zoerzs |_zorenns Testreomer mas Ese ronss zoerzs |_zoienns Specturm anaize ras reus morn zoerzs |_zoienns Spectum anaize ras rems Toorss zoerzs |_zorenns toor ms whheze rovese zons movsmas Anternss(sitt stt toor ms whheze rovess zons movsmas Anternss(sit it Trlcg Broadbond Anemna vase sommnzseox eiescsr zornaes zoremce cor—soe siss Double Rdged Wvegude ms ursor rocsos zorser moser Homrtems (1G—teGite PrromidaHor ETBLnigen stt steose 2orrzco zorenne Artencerteciteassoite ZifcalianNievon. S Ewaimo roorse mss znssy Une Ingecance ms ewers rovsee mss snosy Stiblaton Netvork Sottware nformation Testion SutenreNane Wondscurer Verion re enc ras vezso ce Euce res waso ResertNo HanelPropetay and Corttenta Page 20 t 2e svnemzoreoetco1900t 2004 Copylaht©HameiTeshmlages Co, L

Sz isw. RF TestReporofSNELG 6. Messurement Uncertainty Fora 95%contdece level(t» 2, the mensirementexpardedurceraintas fordefned stems, in secordarce with the recormendatonsot 50 17025 as folonng Test tm ExendeUncetainy Tansrit OiputPone: Datn FoverGnt u—sme Renam Wganitema mrx Bard Edge Gonplarce Ditubimse Fover en) U=0300 Spirous Emasons,Gondaaed Diurtence Roverden] Aiz—a aie: U=pede seoimndoit: U=1om8 eagn—issole. Umrake issommzroit U=take meoiezssoite. U=1 sn FeldSvergihaf Spurous Rediaten ERRNEIRF Idanl For m Ghanbec u. sooce gontte—aity u .408 (t otecity u.i cefi oi ass ols FrequereySaoity Frequency Aecurcy F5 #G PoverUre Gondled Ensions Dtrnnce Votageld@pM buy Grce buy Grce d ResertNo HanelPropetay and Corttenta Page 21 o ze svnemzoreoetco1900t 2004 Copylaht©HameiTeshmlages Co, L

Sz isw. RF TestReporofSNELG 7 Apperdises AoperdahNo Descrpion svene rnzoreoercoracot 2004 A Aoperdictor Blietaath END ResertNo HanelPropetay and Corttenta Page 2222 svnemzoreoetco1900t 2004 Copylaht©HameiTeshmlages Co, L


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