Test Report_DXX

FCC ID: P4Q-N642-M1005

Test Report

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FCCID_4481895

O Report No.: SEFF1907033—A FCC/IC TEST REPORT According to CFR47 §15.225&RSS—210 Issue 9 Applicant : Mitac Digital Technology Corporation Address : No. 200, Wen Hwa 2nd Rd., Kuei Shan Dist. 33383 Tacyuan City,TAIWAN Manufacturer : Mitac Computer (Kunshan) Co., Ltd. No. 269, 2nd Avenue, District A, Comprehensive Free Trade Zone, 215300 Address f Kunshan, Jiangsu, PEOPLES REPUBLIC OF CHINA Equipment : Tablet Model No. : N642 FCC ID : P4Q—N642—M1005 IC : 2420C—N642—M1005 Test Period : August 02, 2019~August 15, 2019 M The test result refers exclusively to the test presented test model / sample. M Without written approval of Cerpass Technology (Suzhou) Co., Ltd., the test report shall not be reproduced exc— ept in full. M The test report must not be used by the clients to claim product certification approval by any agency of the Government. I HEREBY CERTIFY THAT : The measurements shown in this test report were made in accordance with the procedures given in ANSI C63.10 — 2013&FCC Part15.225&RSS—210 Issue 9 and the energy emitted by this equipment was passed. Approved by: Laboratory Accreditation: Cerpass Technology Corporation Test Laboratory 0% O TAF LAB Code: 1439 Cerpass Technology (SuZhou) Co., Ltd. Miro Chueh M EMC/RF Manager A2LA LAB Code: 4981.01 Cerpass Technology (Suzhou) Co., Ltd. Issued Date _: Aug. 16, 2019 §—FD—506 V1.0 Page No. :0 1 of 29

12 Report No.: SEFF1907033—A Contents Summary of Test Resuls. 1 GeneralInformation. 1.1 Featire of Ecuipment under Test 1.2.— TestManner 1.3 Descripton oTestSystom 14— General Information of Test 2. Measuring Equipment 3. Antenna Requirements 3.1.— Apploable Sandard 82— Antenna Corstruction 4. Test of AC Power Line Conducted Emizsion 4d TestLimit 42— Test Procedures 48. TestSetup 44— TestResut 5. Test of Spurlous Emisslon (Redlated. 5.1 TestLimit 5.2 Test Prosedures 53— TestSatup 54— TestResul 21 6. Frequency Stabilty 81. TestLimt 82— TestProsedire 8.3 TestSotup 84— TestResul 7. 2048 Banduikdth Messurement 71— TestLimt 2e 72— TestProsedire 2e 7.3 TestSotup 2e 74 TestResul 2e Cerpass Technology (Suzhou) Go, Ltc. Iesued Date .: Aug 162019 s—ro.s0s vio Page No : porzs

12 Report No.: SEFF1907033—A History of this Test Report Report No. Version Issue Date Description SErFro0r083—A Rev 01 Aug. 16. 2019 Original Cerpass Technology (Suzhou) Go, Ltc. lesued Date Aug 16, 2018 s—ro.s0s vio Page No aore

12 * Report No.: SEFF1907033—A Summary of Test Results [Z] No devitions from the test standards [] Doviations from the tost standards as below descrption: FGC/IC Part Section(s) Test Description Test Rosult FCC CFR Tite 47 Part 15 Subpart G: 2019 Section 15203 Antorna Requirement Compliance RSS—Gen Issue 4 November 2014 Secton 83 FCC CFR Tite 47 Part 15 Subpart G: 2019 Section 15207 Conducted Emission Compliance RSS—Gen Issue 4 November 2014 Secton 88 FCC CFR Tite 47 Part 15 Subpart G: 2019 Section 15.200815.225 RSS—210 Issue 9 August 2016 Rediated Emission Compliance AnnexB B6 RSS—Gen lssue 4 November 2014 Secton 89 FCC CFR Tite 47 Part 15 Subpart G: 2019 15225(e) RSS—210 Issue 9 August 2016 Frequency Stabilty Compliance AnnexB B6 RSS—Gen lssue 4 November 2014 Section 6.11 FCC CFR Tite 47 Part 15 Subpart G: 2019 15.215(0) 2008 Bandwidth Complance RSS—Gen lssue 4 November 2014 Secton 56 + Cerpass Technology (Suzhou) Go, Ltc. leaued Date .: Aug 16,2019 s—ro.s0s vio Page No :o aorze

12 Report No.: SEFF1907033—A 1. General Information 1.1. Feature of Equipment under Test [Applcant vitec Digital Technology Gorporation Product Type [rable: Mode! No. Nee [Dimension 255.5 mm(Lx181.9 mm(W«26.3 mm(H) Pomer |Power over Ethornet (PoE+) (defaut) / 12¥ DC power supply (optional Internal coin battery for reaitime clock MicroSD siot Miero USB 2.0 (clenty USB Type A 2.0 (rost) IRis 10/100Mbt Ehemat (supports PoE+, 802.900) PhysicalInterface [ory contact x1 (RS—485 A+, B—, GND for accoss contro) Buit—in mic x2 (supportsnoiso cancellation} Buitin 1.5W speaker x1 Power DC jack Mode! [own 120200 Power supplyt |Input 100—2200—1.2A 50—60Hz .75A (ourpot oo 12y ~2.08 Mede! ror—ar—asssnbe Power supply2 |Input 100—2200 (ourpot Ibo sev—0.625A Note: The difference between tested model and series model was explained in the declaration lotor. Cerpass Technology (Suzhou) Go, Ltc. leaued Date .: Aug 16,2019 s—ro.s0s vio Page No : sorze

12 * Report No.: SEFF1907033—A 1.2 Test Manner a. During testing, the interface oables and equipment postions were varied according toANSI Caa.to. b. The complete test system included Notebook and EUT for RF test. 1.3. Description of Test System 1..1 Support Equipment List and Detals Device Manuacturer Model No. Serial No. Notebookk Lenove Gaso 20320 132. ExemalUO Cable Gable Tengih {m) Descripion Mero USB 2.0 7 USB Por USB TyeAzo 7 USB Por RuS 115 Ethemet Port + Cerpass Technology (Suzhou) Go, Ltc. leaued Date .: Aug 16,2019 s—ro.s0s vio Page No :. sorzs

12 Report No.: SEFF1907033—A 1.4. General Information of Test Gerpass Technology Gorporation Test Laboratory Address: No.10, In. 2, Liantu St., Luzhu Dist, Tacyuan City 88848, Test Ste Tawan (R.0.C) Telsss6—9—3220—s88 Fax+886—3—3200—881 Address: No.68—1, Shinbachongst, Shihding Township, New Taipe! Gity 223, Talwan, R.0.C. Tol +s96—2—2660—s582 TaF 189 roc TW 1o7e, Twiost assie4, aoibe T—2205 for Telecommunication Test veer C—4863 for Conducted ernission test R4309, R—4218 for Radiated emission tost G—812, G—81 3 forradiated disturbance above 1GHz Cerpass Technology (Suzhou} Co.td Address: No.86,Tengzhuang Road, Suzhou Industral Park, Test Ste Jiangsu 215006, China Tel +86—512.6017—sa88 Fax +86—.512.6017—5006 cuas ussrs roc OMrzas AZLA a981.01 zesoA1, resor2 T—1945 for Telecommunication Test veer 0—12919 for Conducted emission tost R—12670 for Radiated emission tost G—227 torrediated disturbance above 1GHz Cerpass Technology (Suzhou) Go, Ltc. leaued Date .: Aug 16,2019 s—ro.s0s vio Page No :o rerzs

12 Report No.: SEFF1907033—A 2. Measuring Equipment InstrurnentAncilary —[Manutacturer| MedelNo. Serial No. Cag’;’:m’ Due Date. ENMI Test Receiver ras Esor roriea eoraos.ze eozonser Preampiier ie se amaacsers 2ors.02.25 2020, 0224 Preampitier rew AFSi—avorson 2otopae 1srs0os aora.to.14 2ore.t0.18 Loop Antenna ras Hrheze 1oorso eoras.17 2oz005.16 Suno! Bog Antenna as1 aoresier soraos.cs 20200828 Science Spectum Analyzer Aglent Neoror __|Mvastis047| 2ora.io.11 20r9.10.10 TE'“D%&‘;?E/'H“'“”’W mingle ETHseo Na 2019.2.25 2020. 0224 Hioe rass rrer ie sas00—e0030 aoe 2ora0s.05 20200308 series rower meren ANRTSU MLasosa 1e2a00s 2ore.09.05 2oz0.09.04 rowersensor |_anritsu maesg Tearess 2ors.0s.05 2orn.05.04 Cerpass Technology (Suzho) Go, Lic. leaued Oe Aug 16,2019 s—ro.s0e vio Page No nors

(G * Report No.: SEFF1907033—A 3. Antenna Requirements 3.1 Applicable Standard Forintentional device, according to FCC 47 CFR Section 15.203 and and RSS—GEN Section 8.3, an intertional radator shall be designed to onsure that no antenna other than thatfurnshed by the responsible party shall be used wh the device. The use of a permanently attached antenna or ofan antonna that uses a unique coupling to the intentional radiator shall be considered suffcient to comply with the provisions of this section. 3.2 Antenna Construction The EUT has a IFA antomna arrangement and antenna gain is 5.14 dBi, which was permanently attached, fulll the requirement o this section, please refer o the EUT photos. + Cerpass Technology (Suzhou) Go, Ltc. leaued Date .: Aug 16,2019 s—ro.s0s vio Page No :. sorze

0 o Report No.: SEFF1907033—A 4. Test of AC Power Line Conducted Emission 4.1 Test Limit Conducted Emissions were measured from 150 kHz to 30 MHz with a bandwidth of 9 KHz on the 120 VAC power and return leads of the EUT according to the methods defined in ANSI C63.10—2013 Section 6.2. The EUT was placed on a nonmetallic stand in a shielded room 0.8 meters above the ground plane as shown in section 6.2.2. The interface cables and equipment positioning were varied within limits of reasonable applications to determine the position produced maximum conducted emissions. Frequency (MHz] Quasi Peak (dB V Average (dB V 0.15 —0.5 66—56" 56—46" 0.5— 5.0 56 46 5.0 — 30.0 60 50 *Decreases with the logarithm of the frequency. 4.2 Test Procedures a. The EUT was placed 0.4 meter from the conducting wall of the shielding room was kept at least 80 centimeters from any other grounded conducting surface. b. Connect EUT to the power mains through a line impedance stabilization network (LISN). c. All the support units are connecting to the other LISN. d. The LISN provides 50 ohm coupling impedance for the measuring instrument. e. The FCC states that a 50 ohm, 50 micro—Henry LISN should be used. f.. Both sides of AC line were checked for maximum conducted emission. g. The frequency range from 150 kHz to 30 MHz was searched. h. Set the test—receiver system to Peak Detect Function and Specified Bandwidth with Maximum Hold Mode. 4.3 Test Setup @ Cerpass Technology (Suzhou) Co., Ltd. Issued Date : Aug. 16, 2019 $—FD—506 V1.0 Page No. :10 of 29

CA Report No.: SEFF1907088—A & 4.4 Test Result Test Standard: FCG_CiasaB_OP Probe: u Test tem: Conduction Emission Test Time: rersncrocese Applicant: Mitec Digital Technology Power Rating: ac r2ovionz Company Product: Tablet Temp(C)Hum.(4)(air 26(C)60%/1000hpa pdbpe): Model No.: Neez Test Engineer: Chiis Test Mode: reibaNEC Remarkc Acapter Power 1000 aowy 50 ao aiso as mna s sua0 No. Frequency Factor Reading Level Limit Margin Detector (mhz) (a8) (aBuy) (aBuy) (auy) (a8) 1 o.i819 10.13 26.00 as.0s s4.39 2748 or 2 o.i819 10.13 10.70 20.3 54.39 3258 awe 3 o.2se0 1o.ta 19.3 207 s1.24 3177 or a o.2se0 10.14 sas 16.00 s1.24 s184 awe s 06220 10.15 1698 27e se.00 2887 or s o.e220 10.15 s81 18.98 48.00 2704 awe 7 0.7940 10.18 a.s9 19.55 se.00 3845 or 8 0.7940 10.18 209 19.00 46.00 3201 awe a 40460 1023 are 17.01 se.00 38.00 or +« Cerpess Technology (Guzhou) Co.,Ltc. Issued Date Aug. 16, 2019 s—rp—s0s vio Page No 11 or29

(G Report No.: SEFF1907033—A & 10 4.0480 1023 108 T181 4s 00 3469 AfG i1 25 6900 1045 20.12 2057 80.00 2943 ar 12 25 6900 1045 10.08 2058 50.00 2947 AfG Nots: Laval = Reading > Facor Margin Level — Limt Factor (LISN or ISN or PLC or current probe) Factor + Gable Loss + Aftenuator Gerpass Technology (Suzhoo) Go, Lid. Iesues Date Aug 16, 2010 s—ro sns vio Page No 12020

CA Report No.: SEFF1907088—A & Test Standard: FCG_CiasaB_OP Probe: N Test item: Conduction Emiasion Test Time: rm9ancross s Applicant: Mitac Digital Technology Power Rating: ac raavianz Company Product: Tablet Temp{C)Hum.5)lAir 26(C)60%/1000hpa pdbpe): Model No.: neer Text Engineer: Ghiia Test Mode: reibaNeC Remarkc: Adapter Power 1000 abwy ree.cssnar so ree.clst _ave ao aiso as mna s sua0 No. Frequency Factor Reading Level Limit Margin Detector (mhz) (a8) (aBuy) (aBuy) (auy) (a8) 1 o.18e0 10.15 20.08 so.11 ss.15 2604 or 2 o.1880 10.15 m.4e 2147 5515 3208 awe 3 0.1940 10.14 2629 as.ar sase 2749 or a 0.1940 10.4 ae7 20.01 sase as85 awe s o.2s30 1o.ta 1848 20.00 s1.49 an73 or s o.2s30 10.14 4ss 14.47 s1.33 as.88 awe 7 c.e120 10.18 16.58 26.m4 se.00 2028 or 8 ceie0 10.18 a21 18.97 46.00 2783 awe +« Cerpess Technology (Guzhou) Co.,Ltc. Issued Date Aug. 16, 2019 s—rp—s0s vi.0 Page No 19 or 2

(G Report No.: SEFF1907033—A & s 12400 10.18 812 1831 58.00 go.69 ar 10 12400 10.18 074 1088 4s 00 $5.07 AfG i1 25.0400 1038 2048 2085 80.00 2915 ar 12 25.0400 1038 T25 2151 50.00 2539 AfG Nots: Laval = Reading > Facor Margin Level — Limt Factor (LISN or ISN or PLC or current probe) Factor + Gable Loss + Aftenuator * Gerpass Technology (Suzhoo) Go, Lid. Iesues Date Aug 16, 2010 s—ro sns vio Page No 14 or20

CA Report No.: SEFF1907088—A & Test Standard: FCG_CiasaB_OP Probe: u Test item: Conduction Emiasion Test Time: rnosnsrossar Applicant: Mitac Digital Technology Power Rating: ac raavianz Company Product: Tablet Temp{C)Hum.5)lAir 26(C)60%/1000hpa pdbpe): Model No.: neer Text Engineer: Ghiia Test Mode: reibaNeC Remarkc: POE Power 1000 abwy ree.cssnar so ree.clst _ave ao a.150 as it 5 s0 000 No. Frequency Factor Reading Level Limit Margin Detector (mhz) (a8) (aBuy) (aBuy) (auy) (a8) 1 0.1820 10.15 36.77 4s.02 ssas —r944 or 2 0.1820 10.15 17e 27.08 sea8 2740 awe 3 o.2100 10.13 2086 40.09 sa.20 2221 or a o.2100 10.13 128 2aa sa.20 28.79 awe s 0.3420 10.14 aa49 anee sa.15 —15.52 or s 0.3420 10.4 2818 as.se 49.15 1283 awe 7 n.e059 10.18 2a.79 3105 se.00 21.05 or 8 n.e059 10.18 18.50 28.08 46.00 —734 awe a 1.8100 10.18 22.79 c2.0r se.00 2303 or +« Cerpass Technology (GuzhouCo., Ltc. Issued Date Aug. 16, 2019 s—rp—s0s vi.0 Page No 15 or 2s

(G Report No.: SEFF1907033—A & 10 1810 10.18 1822 2840 4s 00 17.80 AfG i1 25.180 1045 3148 4188 80.00 48.12 ar 12 25.180 1045 25.20 3575 50.00 44.25 AfG Nots: Laval = Reading > Facor Margin Level — Limt Factor (LISN or ISN or PLC or current probe) Factor + Gable Loss + Aftenuator Gerpass Technology (Suzhoo) Go, Lid. Iesues Date Aug 16, 2010 s—ro sns vio Page No 16 at20

CA Report No.: SEFF1907088—A & Test Standard: FCG_CiasaB_OP Probe: N Test item: Conduction Emiasion Test Time: 2nosnsrouran Applicant: Mitac Digital Technology Power Rating: ac raavianz Company Product: Tablet Temp{C)Hum.5)lAir 26(C)60%/1000hpa pdbpe): Model No.: neer Text Engineer: Ghiia Test Mode: reibaNeC Remarkc: POE Power 1000 abwy ree.cssnar so ree.clst _ave ao aiso as mna s sua0 No. Frequency Factor Reading Level Limit Margin Detector (mhz) (a8) (aBuy) (aBuy) (auy) (a8) 1 0.1820 10.15 2568 45.81 ssas —19.55 or 2 0.1820 10.15 1mer 27.0 seas 2784 awe 3 o.3500 10.14 s24s 42.57 seos —16.39 or a o.3500 10.4 2412 sa2s 48.98 —14.70 awe s 1.1300 10.19 2188 c2.07 se.00 2203 or s 1.1300 10.19 rasa 2ng3 46.00 2187 awe 7 1.8100 10.19 20.17 a.as se.00 2584 or 8 1.8100 10.19 14.99 25.18 46.00 20.82 awe +« Cerpess Technology (Guzhou) Co.,Ltc. Issued Date Aug. 16, 2019 s—rp—s0s vi.0 Page No 17 or 2

(G Report No.: SEFF1907033—A & s 32180 10.22 17.88 2508 58.00 27 82 ar 10 32180 10.22 1251 2278 4s 00 2227 AfG i1 20.4880 1035 3128 4184 80.00 48.38 ar 12 20.4880 1035 2580 3585 50.00 44.05 AfG Nots: Laval = Reading > Facor Margin Level — im Factor » (LISN or ISN or PLC or current probe) Factor + Gable Loss + Aftenuator Gerpass Technology (Suzhoo) Go, Lid. Iesues Date Aug 16, 2010 s—ro sns vio Page No 10 or20

12 Report No.: SEFF1907033—A 5. Test of Spurious Emission (Radiated) 5.1 TestLimit As per FCC Part 15.225 (e) The flld strength of any emsions within the band 13.558—15.567 MHz shall not exceed 15,848 mierovoltsimeter at 30 meters. (6) Wihin the bands 19410—13.559 MHz and 19.567—19.710 MHz, the feld strength of any emissions shall not exceed 334 mlorovalts/meter at 80 meters. (6) Within the bands 13.110—18.410 MHz and 13.710—14.010 MHz the flld strength of any emissions shall not exceed 106 mlorovalts/meter at 50 meters. (¢) The feld strength of any emsions appearing outside of the 18.110=14.010 MHz band shall not exeeed the generalradiated emsion Imis in §15.203. 5.2 Test Procedures a. The EUT was placed on a rotaiable table top 0.8 moter for frequency below 1GHz and 1.Smeter for frequency above 1GHz above ground. b. The EUT was set 3 meters from the ormission recaiving antenna which was mounted on the top of a veriable height antenna tower. . The table was rotated 560 degrees to determine the positon of the highest raciation. . The antenna is a broadband antenna and !ts heightis veried between one meter and four meters above ground to find the maximum value of the fleld strengih both horizontal polarization and vertical polarization of the antenna are set to make the measurement. . For each suspected emission the EUT was arranged toits worst oase and then tune the anterna tower (from 1 M to 4 ) and turn table (from 0 degree to 550 degrees) to ind the maximum reading. 1. Set the testrecalver system to Poak or CISPR quasi—peak Detect Function and specifed bandwicth wth Maxtmurm Hold Mode. 9. Ifthe emission leve! ofthe EUT in peak mode was 3 dB lower than the Iimit specitied,then tosting wil be stopped and peak values of EUT will be reported, otherwise, the emissions which do not have 3 dB margin wil be repeated one by one using the quas‘—poak method and reported. h. For testing above 1GH, the emission leve! ofthe EUT in peak mode was 200B lower than average imit that means the ormission level in peak mode also complies with the Iimit in average mode}, then testing wil be stopped and peak values of EUT wl be reported, othemviso, the ormissions wil be measured in average mode again and reported: + Cerpass Technology (Suzhou) Go, Ltc. leaued Date .: Aug 16,2019 s—ro.s0s vio Page No s agor20

(C & Report No.: SEFF1907033—A 5.3 Test Setup 9KHz~30MHz Test Setup x 0.8 m _ 3 m _4 (Turntable) Test Receiver SOMHz~1GHz Test Setup 1 ~4 m (Antenna Tower) l Antenna > V Koi 3 m ———————4 A (Turntable) * Cerpass Technology (Suzhou) Co., Ltd. Issued Date : Aug. 16, 2019 §—FD—506 V1.0 Page No. : 20 of 29

12 Report No.: SEFF1907033—A 5.4 Test Resul t Radiated Emission $KHz—SOMHz{Adapter Power): Indicated feate Correciion orrestion FactFactor Corresied oreste foorstaare roo Pat Frequency Mamm reopay [9rr9r.( an Gabe Ane * t @auvim) Ting i neadire rastor Loss gain C507 (asuvim MarginMEX C «csw com |_@8) o) @n oer _|_asse ar sese ar 2s seso sree .95 feas _|_si7 ar a0ss |_a«s 2s ie |_ms .622 feas _|_sear ar 4057 _|_a«7 2s 7e ws n rese _|_sese ar sns |_a«7 2s mio ss 340 17e _|_sear ar sns _|_a«e 2s Tess ms 15 rase 7535 ar s07e |_a«7 as erso Toa 2240 Now Corrested Ampltud= Corrested Factor + Reading Corrested Factor = Antenna factor (Rx) + cable loss — ampifier facior Margin = Gorr Ampltude — Limt Rediated Emission $KHz—SOMHz(POE Power): Indicated feate Correciion orrestion FactFactor Corresied oreste foorstaare roo Pat Frequency Maxmm raomay BPM ocit. an [M, Gable TBR Anet( TR cowim| Ting E2 Reasiro + ain OS comvim | Mergm SM, "TS (oBuy wom w8) o) @n 127 |_ss0s ar sase |_an 2s sas ssss —ase feas Sm ar a0ss |_a«s 2s Tass ms 915 feas _|_sto1 ar 057 _|_a«7 2s mos ws 1045 12se _|_sess ar sns |_a«r 2s mar ws 280 1276 _|_soos ar sns _|_a«s 2s reis ms 135 rese es ar 07e _|_a«7 2s ease Tes zes Now Corrested Ampltud= Corrested Factor + Reading Correeted Factor = Antenna factor (Rx) + cable loss — ampifier facior Margin = Gorr Ampltude — Limt Cerpass rechnology (Suzhoo) co, Lis. Tesued Dare Aug 16. 2010 s—ro sns vio Page No 21 orzs

CA Report No.: SEFF1907088—A & Radiated Emission 30MHz~1 GHz: Test Distance: 3M Test Standard: FCC Claas B 3M Radiation Ant, Polarization: Horizontal Test item: Radiation Emission Test Time: rnseasiecest Applicant: Mitac Digital Technology Power Rating: aC rrovisatie Company Product: Tablet Temp{G)Hum.(%o)Alr p(hpa): 26(C)/60%0903hpa Model No.: neer Test Engineer: Ghis Test Mode: reibaNeC Remarkc: Adapter Power 800 dtwin FCC Closs 2M Radation Haigh 5 an an _,—‘ : > s : an wam r2re >am shm ow Sm ciem on mm Toom o0 ie No. Frequency Factor Reading Level Limit Margin Det. (meiz) (aB/m) (aBuy) (aBuvim) (aBuvim) (as) 1 1a2.sr08 1207 41g2 2ass 42.50 1865 peak 2 2re.3100 «38 a7se 20.20 4s.00 «s.80 poak a 2s0.e000 4.77 4504 3727 4s.00 ars poak 4 sar.8100 7.20 anag a7.2e 4s.00 a.77 poak s s00.1708 1182 sse3 a7.0s 4s.00 a.05 poak s ara.eoos a.s0 seas 3503 sa.00 18.07_| peak Note: Measure Level (dBuVim) = Reading Level (dBuV) + Factor (0B) Factor (dB) = Cable Loss (dB) + Antenna Factor (dB/m) — Pre_Ampltier Gain (B) * Cerpass Technology (GuzhouCo., Ltc. Issued Date Aug. 16, 2019 S—rp—508 ¥1.0 Page No 22 of 29

CA Report No.: SEFF1907088—A & Test Distance: 3M Test Standard: FCC Claas B 3M Radiation Ant, Polarization: Verticat Test item: Radiation Emission Test Time: rnse4st63295 Applicant: Mitac Digital Technology Power Rating: aC rrovisatie Company Product: Tablet Temp{G)Hum.(%o)Alr p(hpa): 26(C)/60%0903hpa Model No.: neer Test Engineer: Ghis Test Mode: reibaNeC Remarkc: Adapter Power 800 dtwin FCC Closs 2M Radation Haigh 5 an a I C# : s t an avom r2rm hm sn hm siom ciem room en Toom oo e No. Frequency Factor Reading Level Limit Margin Det (meiz) (aB/m) (aBuy) (aBuvim) (aBuvim) (as) 1 20.0000 .25 4522 40.07 40.00 n.a7 poak 2 20.2500 438 arss as.t9 40.00 81 or a 127.0000 42.12 4s.o9 2207 42.50 1063 peak 4 2a1.7s08 1008 as.o3 35.07 4s.00 1093 peak s as2.ea00 z.01 4s.e0 a7.go 4s.00 #1 poak s see.sq00 aor as.s0 s2e3 4s.00 41817 peak 7 700.208 2.00 ces as.a8 4s.00 .02 poak Note: Measure Level (dBuVim) = Reading Level (dBuV) + Factor (0B) Factor (dB) = Cable Loss (dB) + Antenna Factor (dB/m) — Pre_Ampltier Gain (B) * Cerpass Technology (GuzhouCo., Ltc. Issued Date Aug. 16, 2019 S—rp—508 ¥1.0 Page No 28 of 29

CA * Report No.: SEFF1907088—A Test Distance: 3M Test Standard: FCC Class 3M Radiation Ant. Polarization: Horizontal Test tem: Radiation Emission Test Time: rorseasmooo Applicant: Mitec Digital Technology Power Rating: ac rroveone Company Product: Tablet Temp{C)Hum.(%)Air p(hpa): 26(C)/60%90thpa Model No.: Neez Test Engineer: Chris Test Mode: reibaNEC Remarkc POE Power s00 dtwin FCC Closs B 3M Radation Marg5 an anl—. l—l ; ,—' ioq $ s ao suooo —vzron 2ooo srion aioon snn cinon roson stoo oo o0 e No. Frequency Factor Reading Level Limit Margin Det. (maz) (dB/m) (aBuy) (aBuv/m} (aBuvim} (as) 1 s1.0309 —15.03 s1.09 ss.08 40.00 a.01 posk 2 s1.5200 —15.07 4825 a1de 40.00 a.02 or 3 232.7209 —10.01 4531 3440 46.00 1160 peak a 279.2000 .29 4297 aa.08 46.00 —11.92__| peak s se1.6109 7.69 44.07 ss.a8 46.00 a.02 posk s 4g7.e300 .49 asce so83 4s.00 15.17__|. peak 7 799.2100 181 aa04 3485 46.00 —11.15 peak Note: Measure Level (dBuVim) = Reading Level (dBuY) + Factor (0B) Factor (dB) = Cable Loss (dB) + Antenna Factor (dB/m) — Pre_Ampitier Gain (GB) +« Cerpess Technology (Guzhou) Co.,Ltc. Issued Date Aug. 16, 2019 s—rp—s0s vi.0 Page No 24 or 2

CA Report No.: SEFF1907088—A & Test Distance: 3M Test Standard: FCC Claas B 3M Radiation Ant, Polarization: Verticat Test item: Radiation Emission Test Time: rn8e48t0.8407 Applicant: Mitac Digital Technology Power Rating: aC rrovisatie Company Product: Tablet Temp{G)Hum.(%o)Alr p(hpa): 26(C)/60%0903hpa Model No.: neer Test Engineer: Ghis Test Mode: reibaNeC Remarkc: POE Power 800 dtwin FCC Closs 2M Radation Haigh 5 an § ——— 7 an l—‘ & s & an won —r2rm —>am smm siem ciem on mem Toom oo e No. Frequency Factor Reading Level Limit Margin Det. (meiz) (aB/m) (aBuy) (aBuvim) (aBuvim) (as) 1 20.0000 .25 sa.70 as.s4 40.00 48 poak 2 se.1300 455 s7.i1 4258 40.00 258 poak a se.e200 485 s1.24 as.so 40.00 aan or 4 2re.3100 «38 4088 s28 4s.00 1852 peak s 248.2200 7. 40.50 s258 4s.00 1844 pek s 487.ga0o s49 40.38 aago 4s.00 sn poak 7 ss2.1000 221 sass 4076 4s.00 s24 poak Note: Measure Level (dBuVim) = Reading Level (dBuV) + Factor (0B) Factor (dB) = Cable Loss (dB) + Antenna Factor (dB/m) — Pre_Ampltier Gain (B) * Cerpass Technology (GuzhouCo., Ltc. Issued Date Aug. 16, 2019 S—rp—508 ¥1.0 Page No 25 of 29

i1 o Report No.: SEFF1907033—A 6. Frequency Stability 6.1 Test Limit The frequency tolerance of the carrier signal shall be maintained within +£0.01% of the operating frequency over a temperature variation of —20 °C to +50 °C at normal supply voltage, and for a variation in the primary supply voltage from 85% to 115% of the rated supply voltage at a temperature of 20°C. For battery operated equipment, the equipment tests shall be performed using a new battery. 6.2 Test Procedure . The EUT was placed inside the Temperature and Humidity chamber. o B G N — . The transmitter output was connected to spectrum analyzer. . Turn the EUT on and couple its output to a spectrum analyzer. . Turn the EUT off and set the chamber to the highest temperature specified. . Allow sufficient time (approximately 30 min) for the temperature of the chamber to stabilize, turn the EUT on and measure the operating frequency after 2, 5, and 10 minutes. . Repeat step 2 and 3 with the temperature chamber set to the lowest temperature. & 7. The test chamber was allowed to stabilize at +20 degree C for a minimum of 30 minutes. The supply voltage was then adjusted on the EUT from 85% to 115% and the frequency record. 6.3 Test Setup Temperature and Humidity Cham ber ~— Spectrunm BB Analyzer o /\ 2BB O O l } to * %__._ DC Power Suply ud Cerpass Technology (Suzhou) Co., Ltd. Issued Date : Aug. 16, 2019 S—FD—506 V1.0 Page No. : 26 of 29

12 Report No.: SEFF1907033—A & 6.4. Test Result Test fom Frequency Stabilty Measurement Test Engineer. Ohis Test Date 20190802 Test Mode Transmiting by NFC—RFID Mezsured Frequercy Power Supply() Temporature (G) Frequency Erer Part 15225 Lint (WHa zo 13.se0075 a.ooosssw soor% 10 1a.e0070 a.ooosssw sa01% o 13.se008s a.oo0sa0% so01% 10 1a.se0076 a.ooossow so01% 12 2o 1a.se0o8e a.o00s05% so01% so 1a.se0092 a.ooosren so01% 10 1a.se0070 o.ooosssw so01% so 13.se0081 a.o00s07% so01% 102 20 18560077 0.000583% 20.01% 188 20 18560085 0.000627% 20.01% Gerpass Technology (Suzhou) Go, L1d. Iesues Date Aug 16, 2010 s—ro sns vio Page No 27 arzo

Co P Report No.: SEFF1907033—A. 7. 200B Bandwidth Measurement 7.1 Test Limit Per 15.215 (c) Intentional radiators operating under the alternative provisions to the general emission limits, as contained in $§ 15.217 through 15.257 and in Subpart E of this part, must be designed to ensure that the 20 dB bandwidth of the emission, or whatever bandwidth may otherwise be specified in the specific rule section under which the equipment operates, is contained within the frequency band designated in the rule section under which the equipment is operated. The requirement to contain the designated bandwidth of the emission within the specified frequency band includes the effects from frequency sweeping, frequency hopping and other modulation techniques that may be employed as well as the frequency stability of the transmitter over expected variations in temperature and supply voltage. If a frequency stability is not specified in the regulations, it is recommended that the fundamental emission be kept within at least the central 80% of the permitted band in order to minimize the possibility of out—of—band operation. 7.2 Test Procedure 1. Check the calibration of the measuring instrument using either an internal calibrator or a known signal from an external generator. 2. Position the EUT without connection to measurementinstrument. Turn on the EUT and connect it to measurement instrument. Then set it to any one convenient frequency within its operating range. Set a reference level on the measuring instrument equal to the highest peak value. 3. Measure the frequency difference of two frequencies that were attenuated 20 dB from the reference level. Record the frequency difference as the emission bandwidth. 7.3 Test Setup Spectrum Analyzer Cerpass Technology (Suzhou) Co., Ltd. Issued Date .: Aug. 16, 2019 s—FD—506 vi.0 Page No. : 28 of 29

L2, o— Report No.: SEFF1907033— A 74 Test Result Test Item 200B Bandwidth Measurement Test Engineer: Chris Test Date 2019—08—02 Test Mode Transmitting by NFC+RFID Frequency 200B Bandwidth (MHz) (Hz) 13.56 136 20 dB Emission Bandwidth ® rew 30 mz Marker 1 [T1 j vew 100 mz 16.92 dBm Refo30.5 dBm *att 30 as swr 1215 s 13.560082000 mrz 30 cfffet 10[5 as mas [Th] 20|00 as mw 136. 000000p00 mz z0 i Temp 1| [T1 ndbl > —sl06 as 13,. 560016600 M_E[m boccel 10 " Berp—2—EB—nab; * —3127. aBm| VE 13560152000 maz | 9 \év\ |—40 Center 13.56 MHz 100 Hz/ Span 1 kHz Date: 2.AUG.2019 19:18:51 ***** END OF REPORT ***** Cerpass Technology (Suzhou) Co., Ltd. Issued Date _: Aug. 16, 2019 S—FD—506 ¥1.0 Page No. : 29 of 29


Document Created: 2019-10-08 15:53:42
Document Modified: 2019-10-08 15:53:42
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