Test Report DSC

FCC ID: L2C0056TR

Test Report

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FCCID_2611522

Issue Date: May 3 , 2015 Prepared For: Delphi Electronics & Safety Report No.: 417124-20150503-01 The University of Michigan Radiation Laboratory 3228 EECS Building Ann Arbor, Michigan 48109-2122 USA Tel: (734) 483-4211 Fax: (734) 647-2106 e-mail: liepa@umich.edu Testing of Electromagnetic Emissions per USA: CFR Title 47, Part 15.231 Canada: IC RSS-210/GENe are herein reported for Delphi Electronics & Safety SFOB,UFOB0,UFOB2 Test Report No.: 417124-20150503-01 Copyright c 2015 Applicant/Provider: Delphi Electronics & Safety One Corporate Center, Kokomo Indiana 46904-9005 USA Phone: 765 451-5770, Fax: 765-451-0900 Contact Person: Brian W. Johnson; brian.w.johnson@delphi.com Measured by: Report Approved by: Dr. Valdis V. Liepa Dr. Valdis V. Liepa Report by: Report Date of Issue: May 3 , 2015 Dr. Valdis V. Liepa Results of testing completed on (or before) April 15, 2015 are as follows. Emissions: The transmitter intentional emissions COMPLY with the regulatory limit(s) by no less than 9.6 dB. Transmit chain spurious harmonic emissions COMPLY by no less than 5.5 dB. Unintentional spurious emissions from digital circuitry COMPLY with radiated emission limit(s) by more than 20 dB. The University of Michigan Radiation Laboratory, 3228 EECS Building, Ann Arbor, Michigan 48109-2122 USA Page 1 of 15

Issue Date: May 3 , 2015 Prepared For: Delphi Electronics & Safety Report No.: 417124-20150503-01 Contents 1 Test Specifications, General Procedures, and Location 4 1.1 Test Specification and General Procedures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 1.2 Test Location and Equipment Used . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 2 Configuration and Identification of the Equipment Under Test 6 2.1 Description and Declarations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 2.1.1 EUT Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 2.1.2 Modes of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 2.1.3 Variants . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 2.1.4 Test Samples . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 2.1.5 Functional Exerciser . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 2.1.6 Modifications Made . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 2.1.7 Production Intent . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 2.1.8 Declared Exemptions and Additional Product Notes . . . . . . . . . . . . . . . . . . . . . . . . 7 3 Emissions 8 3.1 General Test Procedures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 3.1.1 Radiated Test Setup and Procedures . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 3.1.2 Conducted Emissions Test Setup and Procedures . . . . . . . . . . . . . . . . . . . . . . . . . . 10 3.1.3 Power Supply Variation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 3.2 Intentional Emissions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 3.2.1 Fundamental Emission Pulsed Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 3.2.2 Fundamental Emission Bandwidth . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 3.2.3 Fundamental Emission Field Strength . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 3.3 Unintentional Emissions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 3.3.1 Transmit Chain Spurious Emissions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 The University of Michigan Radiation Laboratory, 3228 EECS Building, Ann Arbor, Michigan 48109-2122 USA Page 2 of 15

Issue Date: May 3 , 2015 Prepared For: Delphi Electronics & Safety Report No.: 417124-20150503-01 List of Tables 1 The University of Michigan Radiation Laboratory Equipment List . . . . . . . . . . . . . . . . . . . . 5 2 EUT Declarations. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 3 Fundamental Emission Pulsed Operation. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 4 Fundamental Emission Bandwidth. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 5 Fundamental Emission Field Strength. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 6 Transmit Chain Spurious Emissions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 List of Figures 1 Photos of EUT. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 2 EUT Test Configuration Diagram. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 3 Radiated Emissions Diagram of the EUT. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 4 Radiated Emissions Test Setup Photograph(s). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 5 Fundamental Emission Pulsed Operation. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 5 Fundamental Emission Pulsed Operation. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 6 Fundamental Emission Bandwidth. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 The University of Michigan Radiation Laboratory, 3228 EECS Building, Ann Arbor, Michigan 48109-2122 USA Page 3 of 15

Issue Date: May 3 , 2015 Prepared For: Delphi Electronics & Safety Report No.: 417124-20150503-01 1 Test Specifications, General Procedures, and Location 1.1 Test Specification and General Procedures The ultimate goal of Delphi Electronics & Safety is to demonstrate that the Equipment Under Test (EUT) complies with the Rules and/or Directives below. Detailed in this report are the results of testing the Delphi Electronics & Safety SFOB,UFOB0,UFOB2 for compliance to: Country/Region Rules or Directive Referenced Section(s) United States Code of Federal Regulations CFR Title 47, Part 15.231 Canada Industry Canada IC RSS-210/GENe Delphi Electronics & Safety has determined that the equipment under test is subject to the rules and directives above at the date of this testing. In conjunction with these rules and directives, the following specifications and procedures are followed herein to demonstrate compliance (in whole or in part) with these regulations. ”Methods of Measurement of Radio-Noise Emissions from Low-Voltage Electri- ANSI C63.4:2009 cal and Electronic Equipment in the Range of 9 kHz to 40 GHz” ”Information Technology Equipment (ITE) Limits and methods of measure- ICES-003; Issue 5 (2012) ment” Industry Canada ”The Measurement of Occupied Bandwidth” The University of Michigan Radiation Laboratory, 3228 EECS Building, Ann Arbor, Michigan 48109-2122 USA Page 4 of 15

Issue Date: May 3 , 2015 Prepared For: Delphi Electronics & Safety Report No.: 417124-20150503-01 1.2 Test Location and Equipment Used Test Location The EUT was fully tested by The University of Michigan Radiation Laboratory, 3228 EECS Building, Ann Arbor, Michigan 48109-2122 USA. The Test Facility description and attenuation characteristics are on file with the FCC Laboratory, Columbia, Maryland (FCC Reg. No: 91050) and with Industry Canada, Ottawa, ON (File Ref. No: IC 2057A-1). Test Equipment Pertinent test equipment used for measurements at this facility is listed in Table 1. The quality system employed at The University of Michigan Radiation Laboratory has been established to ensure all equipment has a clearly identifiable classification, calibration expiry date, and that all calibrations are traceable to the SI through NIST, other recognized national laboratories, accepted fundamental or natural physical constants, ratio type of calibration, or by comparison to consensus standards. Table 1: The University of Michigan Radiation Laboratory Equipment List . Description Manufacturer/Model SN Quality Num. Last Cal By / Date Due Spectrum Analyzer Hewlett Packard / 8593E 3412A01131 HP8593E1 Agilent / Jul-2015 RLDP-1,- Dipole Set (20-1000 MHz) UM / RLDP UMDIP1 UM / Jul-2015 2,-3 Ridge-Horn Antenna Univ. of Michigan / VVL 5 UMRH1 UM / Jul-2015 The University of Michigan Radiation Laboratory, 3228 EECS Building, Ann Arbor, Michigan 48109-2122 USA Page 5 of 15

Issue Date: May 3 , 2015 Prepared For: Delphi Electronics & Safety Report No.: 417124-20150503-01 2 Configuration and Identification of the Equipment Under Test 2.1 Description and Declarations The EUT is a vehicular Remote Keyless Entry Transmitter. The EUT is approximately 4 x 4 x 1 cm (approx.) in dimension, and is depicted in Figure 1. It is powered by a 3 VDC lithium coin cell battery. This device is a remote keyless entry transmitter used for locking and ignition of a motor cycle. Table 2 outlines provider declared EUT specifications. Figure 1: Photos of EUT. Table 2: EUT Declarations. General Declarations Equipment Type: RKE Transmitter Country of Origin: USA Nominal Supply: 3 VDC Oper. Temp Range: Not Declared Frequency Range: 433.9 MHz Antenna Dimension: Not Declared Antenna Type: PCB Trace Antenna Gain: Integral Number of Channels: 1 Channel Spacing: N/A ASK Alignment Range: Not Declared Type of Modulation: FSK United States FCC ID Number: L2C0056TR Classification: DSC Canada IC Number: 3432A-0056TR Classification: Remote Control Device 2.1.1 EUT Configuration The EUT is configured for testing as depicted in Figure 2. EUT Delphi Electronics & Safety Model: SFOB,UFOB0,UFOB2 FCC ID: L2C0056TR IC: 3432A-0056TR Figure 2: EUT Test Configuration Diagram. The University of Michigan Radiation Laboratory, 3228 EECS Building, Ann Arbor, Michigan 48109-2122 USA Page 6 of 15

Issue Date: May 3 , 2015 Prepared For: Delphi Electronics & Safety Report No.: 417124-20150503-01 2.1.2 Modes of Operation The EUT can be activated either automatically by encoded LF interrogation resulting from a button press on the vehicle, or in the case of the two-button variant it can be manually activated by button press. Response to encoded LF (automatic) interrogation is a single FSK transmitted frame. Response to a manual button press is a set of ASK modulated frames. 2.1.3 Variants There are three variants of the EUT. Model SFOB employs a plastic-only housing and can be activated only by external encoded LF interrogation. Model UFOB0 employs a plastic housing with a snap-in metal trunk key and can be activated only by external encoded LF interrogation. Model UFOB2 employs a plastic housing with a snap-in metal trunk key and two physical button switches populated to the PCB. This model can be activated by external encoded LF interrogation or by manual button press. All three models employ the same electronics and PCB, with UFOB2 as the ”fully populated” version with two mechanical SMT switches. 2.1.4 Test Samples Six samples in total were provided. Three normal samples (one of each variant) and three samples modified for CW transmission. Unmodified samples were also used for photographs. 2.1.5 Functional Exerciser Normal operating EUT functionality was verified by observation of transmitted signal and by interrogation with a paired LF transmitter. 2.1.6 Modifications Made There were no modifications made to the EUT by this laboratory. 2.1.7 Production Intent The EUT appears to be a production ready sample. 2.1.8 Declared Exemptions and Additional Product Notes None. The University of Michigan Radiation Laboratory, 3228 EECS Building, Ann Arbor, Michigan 48109-2122 USA Page 7 of 15

Issue Date: May 3 , 2015 Prepared For: Delphi Electronics & Safety Report No.: 417124-20150503-01 3 Emissions 3.1 General Test Procedures 3.1.1 Radiated Test Setup and Procedures Radiated electromagnetic emissions from the EUT are first pre-scanned in our shielded anechoic chamber. Spectrum and modulation characteristics of all emissions are recorded. Instrumentation, including spectrum analyzers and other test equipment as detailed in Section 1.2 are employed. After indoor pre-scans, emission measurements are made on our outdoor 3-meter Open Area Test Site (OATS). If the EUT connects to auxiliary equipment and is table or floor standing, the configurations prescribed in relevant test standards are followed. Alternatively, a layout closest to normal use (as declared by the provider) is employed if the resulting emissions appear to be worst-case in such a configuration. See Figure 3. All intentionally radiating elements that are not fixed-mounted in use are placed on the test table lying flat, on their side, and on their end (3-axes) and the resulting worst case emissions are recorded. If the EUT is fixed-mounted in use, measurements are made with the device oriented in the manner consistent with installation and then emissions are recorded. Long Interface Cables EUT Power Long Interface Cables (to AUX) AUX Power (to EUT) Equipment Under Test Auxiliary (EUT) Short Interface Cables Equipment (AUX) Radiated Emissions Table Figure 3: Radiated Emissions Diagram of the EUT. If the EUT exhibits spurious emissions due to internal receiver circuitry, such emissions are measured with an appropriate carrier signal applied. For devices with intentional emissions below 30 MHz, a shielded loop antenna is used. It is placed at a 1 meter receive height. Emissions between 30 MHz and 1 GHz are measured using tuned dipoles and/or calibrated broadband antennas. For both horizontal and vertical polarizations, the test antenna is raised and lowered from 1 to 4 m in height until a maximum emission level is detected. The EUT is then rotated through 360o in azimuth until the highest emission is detected. The test antenna is then raised and lowered one last time from 1 to 4 m and the worst case value is recorded. Emissions above 1 GHz are characterized using standard gain horn antennas or calibrated broadband ridge-horn antennas on our OATS with a 2.4m x 2.4m square of AN-79 or H-4 absorber placed over the ground screen between the EUT and the test antenna. Care is taken to ensure that test receiver resolution and video bandwidths meet the regulatory requirements, and that the emission bandwidth of the EUT is not reduced. Photographs of the test setup employed are depicted in Figure 4. Where regulations allow for direct measurement of field strength, power values (dBm) measured on the test receiver / analyzer are converted to dBµV/m at the regulatory distance, using Edist = 107 + PR + KA − KG + KE − CF where PR is the power recorded on spectrum analyzer, in dBm, KA is the test antenna factor in dB/m, KG is the combined pre-amplifier gain and cable loss in dB, KE is duty correction factor (when applicable) in dB, and CF is a distance conversion (employed only if limits are specified at alternate distance) in dB. This field strength value is then compared with the regulatory limit. If effective isotropic radiated power (EIRP) is computed, it is computed as EIRP (dBm) = E3m (dBµV /m) − 95.2. The University of Michigan Radiation Laboratory, 3228 EECS Building, Ann Arbor, Michigan 48109-2122 USA Page 8 of 15

Issue Date: May 3 , 2015 Prepared For: Delphi Electronics & Safety Report No.: 417124-20150503-01 When presenting data at each frequency, the highest measured emission under all possible EUT orientations (3-axes) is reported. Figure 4: Radiated Emissions Test Setup Photograph(s). The University of Michigan Radiation Laboratory, 3228 EECS Building, Ann Arbor, Michigan 48109-2122 USA Page 9 of 15

Issue Date: May 3 , 2015 Prepared For: Delphi Electronics & Safety Report No.: 417124-20150503-01 3.1.2 Conducted Emissions Test Setup and Procedures Battery Power Conducted Spurious The EUT is not subject to measurement of power line conducted emissions as it is powered solely by its internal battery. 3.1.3 Power Supply Variation Tests at extreme supply voltages are made if required by the the procedures specified in the test standard, and results of this testing are detailed in this report. In the case the EUT is designed for operation from a battery power source, the extreme test voltages are evaluated over the range specified in the test standard; no less than ±10% of the nominal battery voltage declared by the manufacturer. For all battery operated equipment, worst case intentional and spurious emissions are re-checked employing a new (fully charged) battery. The University of Michigan Radiation Laboratory, 3228 EECS Building, Ann Arbor, Michigan 48109-2122 USA Page 10 of 15

Issue Date: May 3 , 2015 Prepared For: Delphi Electronics & Safety Report No.: 417124-20150503-01 3.2 Intentional Emissions 3.2.1 Fundamental Emission Pulsed Operation Test Setup & Procedure The test equipment and facilities were setup in accordance with the standards and procedures listed in Section 1.1. Environmental conditions were set at the appropriate temperature and thermal balance was checked with a thermocouple based probe. Duty cycle is reported for all relevant modes of operation. The test equipment employed includes HP8593E1, UMDIP1. Measurement Results The details and results of testing the EUT are summarized in Table 3. Plots showing the measurements made to obtain these values are provided in Figure 5. Table 3: Fundamental Emission Pulsed Operation. The EUT is capable of two types of transmission. When automatically activated via encoded LF interrogation, the EUT transmits a single FSK frame 25ms in length in response. When manually activated via button press, the EUT will transmit 50.5 ms ASK frames that repeat every 127 ms for as long as the button in depressed. Each frame is Manchester encoded with a 0.135 ms / 0.250 ms duty. Duty Cycle Computation Delphi HD; FCC/IC 1 KEASK = (50.5 ms x 0.135 ms / 0.250 ms) / 100 ms = 0.273 or -11.3 dB 2 KEFSK = 25 ms / 100 ms = 0.250 or -12.0 dB Meas. U of Mich.; 4/11/2015 Figure 5(a): Fundamental Emission Pulsed Operation. The University of Michigan Radiation Laboratory, 3228 EECS Building, Ann Arbor, Michigan 48109-2122 USA Page 11 of 15

Issue Date: May 3 , 2015 Prepared For: Delphi Electronics & Safety Report No.: 417124-20150503-01 Figure 5(b): Fundamental Emission Pulsed Operation. The University of Michigan Radiation Laboratory, 3228 EECS Building, Ann Arbor, Michigan 48109-2122 USA Page 12 of 15

Issue Date: May 3 , 2015 Prepared For: Delphi Electronics & Safety Report No.: 417124-20150503-01 3.2.2 Fundamental Emission Bandwidth Test Setup & Procedure The test equipment and facilities were setup in accordance with the standards and procedures listed in Section 1.1. Environmental conditions were set at the appropriate temperature and thermal balance was checked with a thermocouple based probe. Emission bandwidth (EBW) of the EUT is measured with the device placed in the test mode(s) with the shortest available frame length and minimum frame spacing. The 20 dB EBW is measured as the max-held peak-detected signal when the IF bandwidth is greater than or equal to 1% of the receiver span. For complex modulations other than ASK and FSK, the 99% emission bandwidth per IC test procedures has a different result, and is also reported. The test equipment employed includes HP8593E1, UMDIP1. Measurement Results The details and results of testing the EUT are summarized in Table 4. Plots showing the measurements made to obtain these values are provided in Figure 6. Table 4: Fundamental Emission Bandwidth. The emission bandwidth of the signal is shown in the following Figure. The allowed 99% bandwidth is 0.25% of 433.9 MHz, or 1085 kHz. Measured Emission Bandwidth Delphi HD; FCC/IC EBW meas. # (kHz) 1 63.0 Meas. U of Mich.; 4/11/2015 Figure 6: Fundamental Emission Bandwidth. The University of Michigan Radiation Laboratory, 3228 EECS Building, Ann Arbor, Michigan 48109-2122 USA Page 13 of 15

Issue Date: May 3 , 2015 Prepared For: Delphi Electronics & Safety Report No.: 417124-20150503-01 3.2.3 Fundamental Emission Field Strength Test Setup & Procedure The test equipment and facilities were setup in accordance with the standards and procedures listed in Section 1.1. Environmental conditions were set at the appropriate temperature and thermal balance was checked with a thermocouple based probe. Fundamental emissions are measured at the regulatory distance on our OATS. The test equipment employed includes HP8593E1, UMDIP1. Measurement Results The details and results of testing the EUT are summarized in Table 5. Table 5: Fundamental Emission Field Strength. Frequency Range Det IF Bandwidth Video Bandwidth 25 MHz ≤ f ≤ 1 000 MHz Pk/QPk 120 kHz 300 kHz f > 1 000 MHz Pk 1 MHz 3 MHz f > 1 000 MHz Avg 1 MHz 10kHz Fundamental Radiated Emission Delphi HD; FCC/IC Freq. Ant. Ant. Pr Det. Ka Kg E3* E3lim Pass # MHz Used Pol. dBm Used dB/m dB dBµV/m dBµV/m dB Comments 1 MOST POPULATED SAMPLE 2 433.9 Dip H -28.3 Pk 21.5 20.6 68.3 80.8 12.5 flat Two-button w/key in 3 433.9 Dip V -26.9 Pk 21.5 20.6 69.7 80.8 11.1 side 4 VARIANTS/VARIATIONS 5 433.9 Dip V -26.3 Pk 21.5 20.6 70.3 80.8 10.5 side Two-button w/key out 6 433.9 Dip V -26.3 Pk 21.5 20.6 70.3 80.8 10.5 side No-button w/key in 7 433.9 Dip V -26.1 Pk 21.5 20.6 70.5 80.8 10.3 side No-button w/key out 8 433.9 Dip V -25.4 Pk 21.5 20.6 71.2 80.8 9.6 side No-button no/key 9 10 * Includes 11.3 dB Duty Cycle 11 Meas. U of Mich.; 4/11/2015 Fundamental Emission vs. Supply Voltage 15.0 Relative Received Power (dB) 13.0 11.0 9.0 7.0 5.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 Supply Voltage (V) The University of Michigan Radiation Laboratory, 3228 EECS Building, Ann Arbor, Michigan 48109-2122 USA Page 14 of 15

Issue Date: May 3 , 2015 Prepared For: Delphi Electronics & Safety Report No.: 417124-20150503-01 3.3 Unintentional Emissions 3.3.1 Transmit Chain Spurious Emissions Test Setup & Procedure The test equipment and facilities were setup in accordance with the standards and procedures listed in Section 1.1. Environmental conditions were set at the appropriate temperature and thermal balance was checked with a thermocouple based probe. Spurious radiated emissions measurements are performed to 10 times the highest fundamental operating frequency. The test equipment employed includes HP8593E1, UMDIP1, UMRH1. Measurement Results The details and results of testing the EUT are summarized in Table 6. Table 6: Transmit Chain Spurious Emissions. Frequency Range Det IF Bandwidth Video Bandwidth 25 MHz ≤ f ≤ 1 000 MHz Pk/QPk 120 kHz 300 kHz f > 1 000 MHz Pk 1 MHz 3 MHz f > 1 000 MHz Avg 1 MHz 10kHz Spurious Radiated Emissions Delphi HD; FCC/IC Freq. Ant. Ant. Pr Det. Ka Kg E3* E3lim Pass # MHz Used Pol. dBm Used dB/m dB dBµV/m dBµV/m dB Comments 1 MOST POPULATED SAMPLE 2 867.8 Dip H -64.4 Pk 27.8 17.2 41.9 60.8 18.9 flat 3 867.8 Dip V -66.1 Pk 27.8 17.2 40.2 60.8 20.6 end 4 1301.8 Horn H -53.9 Pk 20.7 28.1 34.4 54.0 19.6 flat 5 1735.7 Horn H -54.5 Pk 21.9 28.1 35.0 60.8 25.8 flat 6 2169.6 Horn H -56.0 Pk 22.9 26.5 36.1 60.8 24.7 flat 7 2603.5 Horn H -45.5 Pk 24.1 25.7 48.6 60.8 12.2 flat 8 3037.4 Horn H -55.7 Pk 25.5 23.9 41.5 60.8 19.3 end 9 3471.4 Horn H -53.0 Pk 26.8 23.2 46.3 60.8 14.5 end 10 3905.3 Horn H -57.3 Pk 28.1 22.4 44.2 54.0 9.8 flat 11 4339.2 Horn H -67.4 Pk 29.5 16.2 41.5 54.0 12.5 end 12 13 VARIANTS/VARIATIONS (AT WORST CASE EMISSION) 14 3905.3 Horn H -58.9 Pk 28.1 22.4 42.6 54.0 11.4 side Two-button w/key out 15 3905.3 Horn H -55.9 Pk 28.1 22.4 45.6 54.0 8.4 side No-button w/key in 16 3905.3 Horn H -56.1 Pk 28.1 22.4 45.4 54.0 8.6 side No-button w/key out 17 3905.3 Horn H -53.0 Pk 28.1 22.4 48.5 54.0 5.5 side No-button no/key 18 19 * Includes 11.3 dB Duty Cycle. 20 Meas. U of Mich.; 4/11/2015 The University of Michigan Radiation Laboratory, 3228 EECS Building, Ann Arbor, Michigan 48109-2122 USA Page 15 of 15


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Document Modified: 2015-05-03 21:48:30
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