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FCC ID: IYZ-AK01

Test Report

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TEST REPORT Test report no.: 1-3894/11-01-15-A Testing laboratory Applicant CETECOM ICT Services GmbH Marquardt GmbH Untertuerkheimer Strasse 6 – 10 Schloss-Str. 16 66117 Saarbruecken / Germany 78604 Rietheim-Wellheim / GERMANY Phone: + 49 681 5 98 - 0 Phone: +49 7424 99-0 Fax: + 49 681 5 98 - 9075 Fax: +49 742 499-2532 Internet: http://www.cetecom.com Contact: Daniel Lutz e-mail: ict@cetecom.com e-mail: daniel.lutz@marquardt.de Phone: +49 742 499-2769 Accredited Testing Laboratory: The testing laboratory (area of testing) is accredited according to DIN EN ISO/IEC 17025 (2005) by the Deutsche Akkreditierungsstelle GmbH (DAkkS) The accreditation is valid for the scope of testing procedures as stated in the accreditation certificate with Manufacturer the registration number: D-PL-12076-01-01 Marquardt GmbH Area of Testing: Schloss-Str. 16 Radio Communications & EMC (RCE) 78604 Rietheim-Wellheim / GERMANY Test standard/s 47 CFR Part 15 Title 47 of the Code of Federal Regulations; Chapter I; Part 15 - Radio frequency devices RSS - 210 Issue 8 Spectrum Management and Telecommunications Radio Standards Specification - Licence-exempt Radio Apparatus (All Frequency Bands): Category I Equipment For further applied test standards please refer to section 3 of this test report. Test Item Kind of test item: Keyless entry system 315-433 MHz 21,85 KHz LF Model name: AK01 (comfort key) FCC ID: IYZ-AK01 IC: 2701A-AK01 Frequency: 433.45 MHz – 434.39 MHz Technology tested: proprietary Antenna: Integrated antenna Power supply: 3.0 V DC by battery (CR2032) Temperature range: -20°C to +70°C This test report is electronically signed and valid without handwriting signature. For verification of the electronic signatures, the public keys can be requested at the testing laboratory. Test report authorised: Test performed: cn=Christoph Schneider, o=CETECOM ICT cn=Marco Bertolino, o=CETECOM ICT Services GmbH, ou=SND-120402, Services GmbH, ou=BTL-100826, email=marco.bertolino@cetecom.com, c=DE email=christoph.schneider@cetecom.com, 2014.07.15 07:00:18 +02'00' c=DE 2014.07.11 15:35:08 +02'00' Marco Bertolino Christoph Schneider Testing Manager Expert 2014-07-11 Page 1 of 26

Test report no.: 1-3894/11-01-15-A 1 Table of contents 1 Table of contents ............................................................................................................................................2 2 General information .......................................................................................................................................3 2.1 Notes and disclaimer ..........................................................................................................................3 2.2 Application details ...............................................................................................................................3 3 Test standard/s ...............................................................................................................................................3 4 Test environment ............................................................................................................................................4 5 Test item ..........................................................................................................................................................4 5.1 Additional information ........................................................................................................................4 6 Test laboratories sub-contracted .................................................................................................................4 7 Description of the test setup .........................................................................................................................5 7.1 Radiated measurements chamber F ..................................................................................................5 7.2 Radiated measurements chamber C .................................................................................................6 8 Summary of measurement results ...............................................................................................................7 9 Additional comments .....................................................................................................................................8 10 Measurement results ..............................................................................................................................9 10.1 Timing of the transmitter .................................................................................................................9 10.2 Emission bandwidth ......................................................................................................................11 10.3 Field strength of the fundamental ................................................................................................14 10.4 Field strength of the harmonics and spurious ...........................................................................15 11 Test equipment and ancillaries used for tests ...................................................................................23 12 Observations .........................................................................................................................................24 Annex A Document history ..........................................................................................................................25 Annex B Further information ........................................................................................................................25 Annex C Accreditation Certificate ...............................................................................................................26 2014-07-11 Page 2 of 26

Test report no.: 1-3894/11-01-15-A 2 General information 2.1 Notes and disclaimer The test results of this test report relate exclusively to the test item specified in this test report. CETECOM ICT Services GmbH does not assume responsibility for any conclusions and generalizations drawn from the test results with regard to other specimens or samples of the type of the equipment represented by the test item. The test report may only be reproduced or published in full. Reproduction or publication of extracts from the report requires the prior written approval of CETECOM ICT Services GmbH. The testing service provided by CETECOM ICT Services GmbH has been rendered under the current "General Terms and Conditions for CETECOM ICT Services GmbH". CETECOM ICT Services GmbH will not be liable for any loss or damage resulting from false, inaccurate, inappropriate or incomplete product information provided by the customer. Under no circumstances does the CETECOM ICT Services GmbH test report include any endorsement or warranty regarding the functionality, quality or performance of any other product or service provided. Under no circumstances does the CETECOM ICT Services GmbH test report include or imply any product or service warranties from CETECOM ICT Services GmbH, including, without limitation, any implied warranties of merchantability, fitness for purpose, or non-infringement, all of which are expressly disclaimed by CETECOM ICT Services GmbH. All rights and remedies regarding vendor’s products and services for which CETECOM ICT Services GmbH has prepared this test report shall be provided by the party offering such products or services and not by CETECOM ICT Services GmbH. In no case this test report can be considered as a Letter of Approval. This test report is electronically signed and valid without handwritten signature. For verification of the electronic signatures, the public keys can be requested at the testing laboratory. 2.2 Application details Date of receipt of order: 2013-11-11 Date of receipt of test item: 2014-05-15 Start of test: 2014-05-21 End of test: 2014-06-04 Person(s) present during the test: -/- 3 Test standard/s Test standard Test standard description 47 CFR Part 15 Title 47 of the Code of Federal Regulations; Chapter I; Part 15 - Radio frequency devices RSS - 210 Issue 8 Spectrum Management and Telecommunications Radio Standards Specification - Licence-exempt Radio Apparatus (All Frequency Bands): Category I Equipment 2014-07-11 Page 3 of 26

Test report no.: 1-3894/11-01-15-A 4 Test environment Tnom +22 °C during room temperature tests Temperature: Tmax +70 °C during high temperature tests Tmin -20 °C during low temperature tests Relative humidity content: 48 % Barometric pressure: not relevant for this kind of testing Vnom 3.0 V DC by battery (CR2032) Power supply: Vmax 3.1 V Vmin 2.55 V 5 Test item Kind of test item : Keyless entry system 315-433 MHz 21,85 KHz LF Type identification : AK01 (comfort key) S/N serial number : -/- HW hardware status : -/- SW software status : -/- Frequency band [MHz] : 433.45 MHz – 434.39 MHz Type of modulation : 2-FSK Number of channels : 3 Antenna : Integrated antenna Power supply : 3.0 V DC by battery (CR2032) Temperature range : -20°C to +70 °C 5.1 Additional information Test setup- and EUT-photos are included in test report: 1-3894/11-01-01_AnnexE 1-3894/11-01-01_AnnexF 1-3894/11-01-01_AnnexD 6 Test laboratories sub-contracted None 2014-07-11 Page 4 of 26

Test report no.: 1-3894/11-01-15-A 7 Description of the test setup 7.1 Radiated measurements chamber F The radiated measurements are performed in vertical and horizontal plane in the frequency range from 9 kHz to 1 GHz in semi-anechoic chambers. The EUT is positioned on a non-conductive support with a height of 0.80 m above a conductive ground plane that covers the whole chamber. The receiving antennas are confirmed with specifications ANSI C63. These antennas can be moved over the height range between 1.0 m and 4.0 m in order to search for maximum field strength emitted from EUT. The measurement distances between EUT and receiving antennas are indicated in the test setups for the various frequency ranges. For each measurement, the EUT is rotated in all three axes until the maximum field strength is received. The wanted and unwanted emissions are received by spectrum analysers where the detector modes and resolution bandwidths over various frequency ranges are set according to requirement ANSI C63. Equipment table: Equipment Type Manufacturer Serial No. INV. No Cetecom Switch-Unit 3488A HP Meßtechnik 2719A14505 300000368 DC power supply, 60Vdc, 6032A HP Meßtechnik 2920A04466 300000580 50A, 1200 W EMI Test Receiver ESCI 3 R&S 100083 300003312 Amplifier JS42-00502650-28-5A MITEQ 1084532 300003379 Antenna Tower Model 2175 ETS-LINDGREN 64762 300003745 Positioning Controller Model 2090 ETS-LINDGREN 64672 300003746 Turntable Interface-Box Model 105637 ETS-LINDGREN 44583 300003747 TRILOG Broadband Test- VULB9163 Schwarzbeck 295 300003787 Antenna 30 MHz - 3 GHz CBT (Bluetooth Tester + CBT 1153.9000K35, CBT- R&S 100313 300003516 EDR Signalling) B55, CBT-K55 2014-07-11 Page 5 of 26

Test report no.: 1-3894/11-01-15-A 7.2 Radiated measurements chamber C Equipment table: Equipment Type Manufacturer Serial No. INV. No Cetecom MXE EMI Receiver 20 Hz N9038A Agilent Technologies MY51210197 300004405 bis 26,5 GHz TRILOG Broadband Test- VULB9163 Schwarzbeck 371 300003854 Antenna 30 MHz - 3 GHz WRCG2400/2483- Band Reject filter Wainwright 11 300003351 2375/2505-50/10SS Highpass Filter WHKX7.0/18G-8SS Wainwright 18 300003789 Double-Ridged Waveguide 3115 EMCO 8812-3088 300001032 Horn Antenna 1-18.0GHz Active Loop Antenna 6502 EMCO 8905-2342 300000256 Anechoic chamber FAC 3/5m MWB / TDK 87400/02 300000996 Switch / Control Unit 3488A HP Meßtechnik * 300000199 Switch / Control Unit 3488A HP Meßtechnik 2719A15013 300001156 MPL IEC625 Bus Isolating Transformer Erfi 91350 300001155 Regeltrenntravo Three-Way Power Splitter, 11850C HP Meßtechnik 300000997 50 Ohm Amplifier js42-00502650-28-5a Parzich GMBH 928979 300003143 CBT (Bluetooth Tester + CBT 1153.9000K35, CBT- R&S 100313 300003516 EDR Signalling) B55, CBT-K55 2014-07-11 Page 6 of 26

Test report no.: 1-3894/11-01-15-A 8 Summary of measurement results No deviations from the technical specifications were ascertained There were deviations from the technical specifications ascertained TC Identifier Description Verdict Date Remark CFR Part 15 RF-Testing Passed 2014-07-11 -/- RSS 210, Issue 8, Annex 8 Test Temperature Power Source Specification Test Case Pass Fail NA NP Remark Conditions Voltages Clause Timing of the transmitter § 15.35 (c)/ (Duty cycle correction Nominal Nominal -/- RSS-GEN factor ) § 15.231 (a) (1)/ Switch off time Nominal Nominal -/- RSS-210 Issue 8 § 15.231 (3) (c)/ Emission Bandwidth Nominal Nominal -/- RSS-210 Issue 8 § 15.231 (b)/ Fieldstrength of Nominal Nominal -/- RSS-210 Issue 8 Fundamental § 15.209/ Fieldstrength of Nominal Nominal -/- RSS-210 Issue 8 harmonics and spurious § 15.209/ Receiver spurious Nominal Nominal -/- RSS-GEN emissions (radiated) Note: NA = Not Applicable; NP = Not Performed 2014-07-11 Page 7 of 26

Test report no.: 1-3894/11-01-15-A 9 Additional comments Reference documents: None Special test descriptions: None Configuration descriptions: None 2014-07-11 Page 8 of 26

Test report no.: 1-3894/11-01-15-A 10 Measurement results 10.1 Timing of the transmitter Measurement: Measurement parameter Detector: Peak Sweep time: 200 ms (single sweep) Resolution bandwidth: 10 kHz Video bandwidth: 30 kHz Span: Zero span Trace-Mode: Clear write Limits: FCC IC Timing of the transmitter (c) Unless otherwise specified, e.g. Section 15.255(b), when the radiated emission limits are expressed in terms of the average value of the emission, and pulsed operation is employed, the measurement field strength shall be determined by averaging over one complete pulse train, including blanking intervals, as long as the pulse train does not exceed 0.1 seconds. As an alternative (provided the transmitter operates for longer than 0.1 seconds) or in cases where the pulse train exceeds 0.1 seconds, the measured field strength shall be determined from the average absolute voltage during a 0.1 second interval during which the field strength is at its maximum value. The exact method of calculating the average field strength shall be submitted with any application for certification or shall be retained in the measurement data file for equipment subject to notification or verification. 2014-07-11 Page 9 of 26

Test report no.: 1-3894/11-01-15-A Result: Plot 1: Timing of the Transmitter RBW 10 kHz Marker 1 [T1 ] VBW 30 kHz -31.19 dBm Ref -10 dBm Att 20 dB SWT 200 ms -255.034844 as -10 Delta 1 [T1 ] -2.08 dB 103.600000 ms A -20 SGL 1 AP CLRWR 1 TRG -30 1 -40 -50 -60 TRG -60 dBm 3DB -70 -80 -90 -100 -110 Center 433.47 MHz 20 ms/ Date: 2.JUN.2014 15:08:29 Transmit time (Tx on, longest burst) = 103.6 ms → No duty cycle correction factor. Result: passed 2014-07-11 Page 10 of 26

Test report no.: 1-3894/11-01-15-A 10.2 Emission bandwidth Measurement: Measurement of the 20 dB bandwidth of the modulated signal Measurement parameter Detector: Peak Sweep time: Auto Resolution bandwidth: 3 kHz Video bandwidth: 10 kHz Span: 500 kHz Trace-Mode: Max hold Limits: FCC IC Emission bandwidth The OBW shall not be wider than 0.25% of the centre frequency, here maximum 1082.5 kHz. Result: 20 dB bandwidth [kHz] channel low mid high 153.00 127.00 152.00 Measurement uncertainty ± 10 kHz Result: passed 2014-07-11 Page 11 of 26

Test report no.: 1-3894/11-01-15-A Plot 1: channel low * RBW 3 kHz Marker 1 [T1 ] VBW 10 kHz -18.39 dBm Ref -10 dBm Att 10 dB SWT 60 ms 433.470000000 MHz -10 OBW153.000000000 kHz 1 Temp 1 [T1 OBW] -50.80 dBm A -20 433.394000000 MHz 1 PK Temp 2 [T1 OBW] MAXH -30 -47.58 dBm 433.547000000 MHz -40 T2 T1 -50 -60 3DB -70 -80 -90 -100 -110 Center 433.47 MHz 50 kHz/ Span 500 kHz Date: 2.JUN.2014 14:41:41 Plot 2: channel mid * RBW 3 kHz Marker 1 [T1 ] VBW 10 kHz -25.48 dBm Ref -10 dBm Att 10 dB SWT 60 ms 433.920000000 MHz -10 OBW127.000000000 kHz Temp 1 [T1 OBW] -61.70 dBm A -20 1 433.857000000 MHz 1 PK Temp 2 [T1 OBW] MAXH -30 -62.99 dBm 433.984000000 MHz -40 -50 T1 -60 T2 3DB -70 -80 -90 -100 -110 Center 433.92 MHz 50 kHz/ Span 500 kHz Date: 2.JUN.2014 14:42:31 2014-07-11 Page 12 of 26

Test report no.: 1-3894/11-01-15-A Plot 3: channel high * RBW 3 kHz Marker 1 [T1 ] VBW 10 kHz -27.21 dBm Ref -10 dBm Att 10 dB SWT 60 ms 434.370000000 MHz -10 OBW152.000000000 kHz Temp 1 [T1 OBW] -60.99 dBm A -20 1 434.294000000 MHz 1 PK Temp 2 [T1 OBW] MAXH -30 -60.92 dBm 434.446000000 MHz -40 -50 T1 T2 -60 3DB -70 -80 -90 -100 -110 Center 434.37 MHz 50 kHz/ Span 500 kHz Date: 2.JUN.2014 14:43:18 2014-07-11 Page 13 of 26

Test report no.: 1-3894/11-01-15-A 10.3 Field strength of the fundamental Measurement: Measurement parameter Detector: Peak / average Sweep time: Auto Video bandwidth: 3 MHz Resolution bandwidth: 3 MHz Span: 5 MHz Trace-Mode: Max hold Limits: FCC IC Field strength of the fundamental. In addition to the provisions of Section 15.205, the field strength of emissions from intentional radiators operated under this Section shall not exceed the following: Fundamental Frequency (MHz) Field strength of Fundamental Measurement distance (m) (µV/m) 40.66 – 40.70 2,250 3 70-130 1,250 3 130-174 1,250 to 3,750 3 174-260 3,750 3 260-470 3,750 to 12,500 3 Above 470 12,500 3 Where F is the frequency in MHz, the formulas for calculating the maximum permitted fundamental field strengths are as follows: - for the band 130-174 MHz, μV/m at 3 meters = 56.81818(F) - 6136.3636; - for the band 260-470 MHz, μV/m at 3 meters = 41.6667(F) - 7083.3333. Result: TEST CONDITIONS MAXIMUM Field Strength (dBµV/m at 3 m distance) Frequency 433.47 MHz 433.92 MHz 434.37 MHz Mode Peak Average Peak Average Peak Average Tnom Vnom 80.74 80.74* 80.02 80.02* 80.00 80.00* Measurement uncertainty ±3dB *Value recalculated from Peak-to-Average correction factor described in 10.1 Result: passed 2014-07-11 Page 14 of 26

Test report no.: 1-3894/11-01-15-A 10.4 Field strength of the harmonics and spurious Measurement: Measurement parameter Detector: Average / Quasi Peak Sweep time: Auto Resolution bandwidth: 100 kHz Video bandwidth: 30 kHz Span: See plots Trace-Mode: Max hold Limits: FCC IC Field strength of the fundamental. In addition to the provisions of Section 15.205, the field strength of emissions from intentional radiators operated under this Section shall not exceed the following: Fundamental Frequency (MHz) Field strength of spurious Measurement distance (m) (µV/m) 40.66 – 40.70 225 3 70-130 125 3 130-174 125 to 375 3 174-260 375 3 260-470 375 to 1,250 3 Above 470 1,250 3 The maximum permitted unwanted emission level is 20 dB below the maximum permitted fundamental level. Spurious emissions shall be attenuated to the average (or, alternatively, CISPR quasi-peak) limits shown in this table or to the general limits shown in Section 15.209, whichever limit permits a higher field strength. FCC IC SUBCLAUSE § 15.209 Field strength of the harmonics and spurious. Frequency (MHz) Field strength (µV/m) Measurement distance (m) 0.009 – 0.490 2400/F(kHz) 300 0.490 – 1.705 24000/F(kHz) 30 1.705 – 30 30 30 30 – 88 100 3 88 – 216 150 3 216 – 960 200 3 above 960 500 3 2014-07-11 Page 15 of 26

Test report no.: 1-3894/11-01-15-A Results: EMISSION LIMITATIONS Limit max. allowed Amplitude of emission f Detector Results [MHz] [dBµV/m] [dBµV/m] No peaks close to the limit detected. Result: passed Note: The limit was recalculated with 20 dB / decade (Part 15.31) for all radiated spurious emissions 30 MHz to 1 GHz from 3 meter limit to a 10 meter distance. (40dB/decade for emissions < 30MHz) 2014-07-11 Page 16 of 26

Test report no.: 1-3894/11-01-15-A Plots low channel Plot 1: 9 kHz – 30 MHz; magnetic 130 dBµV/m 120 110 100 90 80 70 60 50 - Class - QPeak 40 30 20 10 0 9kHz 100k 1M 10M 30MHz Frequency (MHz) Plot 2: 30 MHz – 1000 MHz 60 55 50 45 F C C _ 1 0 m_ B 40 Level in dBµV/m 35 30 25 20 15 10 5 0 30M 50 60 80 100M 200 300 400 500 8 0 0 1 ,0 5 G F re q u e n c y in H z 2014-07-11 Page 17 of 26

Test report no.: 1-3894/11-01-15-A Plot 2: 1 GHz – 7 GHz 80 dBµV/m - Class - Peak 70 60 - Class - Average 50 40 30 20 10 0 1GHz 7GHz Frequency (MHz) 2014-07-11 Page 18 of 26

Test report no.: 1-3894/11-01-15-A Plots middle channel Plot 1: 9 kHz – 30 MHz; magnetic 130 dBµV/m 120 110 100 90 80 70 60 50 - Class - QPeak 40 30 20 10 0 9kHz 100k 1M 10M 30MHz Frequency (MHz) Plot 2: 30 MHz – 1000 MHz 60 55 50 45 F C C _ 1 0 m_ B 40 Level in dBµV/m 35 30 25 20 15 10 5 0 30M 50 60 80 100M 200 300 400 500 8 0 0 1 ,0 5 G F re q u e n c y in H z 2014-07-11 Page 19 of 26

Test report no.: 1-3894/11-01-15-A Plot 2: 1 GHz – 7 GHz 80 dBµV/m - Class - Peak 70 60 - Class - Average 50 40 30 20 10 0 1GHz 7GHz Frequency (MHz) 2014-07-11 Page 20 of 26

Test report no.: 1-3894/11-01-15-A Plots middle channel Plot 1: 9 kHz – 30 MHz; magnetic 130 dBµV/m 120 110 100 90 80 70 60 50 - Class - QPeak 40 30 20 10 0 9kHz 100k 1M 10M 30MHz Frequency (MHz) Plot 2: 30 MHz – 1000 MHz 60 55 50 45 F C C _ 1 0 m_ B 40 Level in dBµV/m 35 30 25 20 15 10 5 0 30M 50 60 80 100M 200 300 400 500 8 0 0 1 ,0 5 G F re q u e n c y in H z 2014-07-11 Page 21 of 26

Test report no.: 1-3894/11-01-15-A Plot 2: 1 GHz – 7 GHz 80 dBµV/m - Class - Peak 70 60 - Class - Average 50 40 30 20 10 0 1GHz 7GHz Frequency (MHz) 2014-07-11 Page 22 of 26

Test report no.: 1-3894/11-01-15-A 11 Test equipment and ancillaries used for tests Typically, the calibrations of the test apparatus are commissioned to and performed by an accredited calibration laboratory. The calibration intervals are determined in accordance with the DIN EN ISO/IEC 17025. In addition to the external calibrations, the laboratory executes comparison measurements with other calibrated test systems or effective verifications. Weekly chamber inspections and range calibrations are performed. Where possible, rf-generating and signalling equipment as well as measuring receivers and analyzers are connected to an external high-precision 10 MHz reference (GPS-based or rubidium frequency standard). In order to simplify the identification of the equipment used at some special tests, some items of test equipment and ancillaries can be provided with an identifier or number in the equipment list below (Lab/Item). INV. No Kind of Last Next No. Lab / Item Equipment Type Manufact. Serial No. Cetecom Calibration Calibration Calibration DC power HP 1 n. a. supply, 60Vdc, 6032A 2818A03450 300001040 Ve 12.01.2012 12.01.2015 Meßtechnik 50A, 1200 W Double-Ridged Waveguide 2 n. a. 3115 EMCO 8812-3088 300001032 vlKI! 08.05.2013 08.05.2015 Horn Antenna 1-18.0GHz Anechoic MWB / 3 n. a. FAC 3/5m 87400/02 300000996 ev chamber TDK Switch / Control HP 4 n. a. 3488A * 300000199 ne Unit Meßtechnik Artificial Mains 5 9 9 kHz to 30 ESH3-Z5 R&S 828576/020 300001210 Ve 30.01.2014 30.01.2016 MHz MPL IEC625 Isolating 6 9 Bus Erfi 91350 300001155 ne Transformer Regeltrennt ravo Active Loop Kontron 7 90 Antenna 10 6502 8905-2342 300000256 k 13.06.2013 13.06.2015 Psychotech kHz to 30 MHz js42- Parzich 8 n. a. Amplifier 00502650- 928979 300003143 ne GMBH 28-5a WRCG185 Band Reject 5/1910- 9 n. a. Wainwright 7 300003350 ev filter 1835/1925- 40/8SS WRCG240 Band Reject 0/2483- 10 n. a. Wainwright 11 300003351 ev filter 2375/2505- 50/10SS WHKX7.0/1 11 n. a. Highpass Filter Wainwright 18 300003789 ne 8G-8SS TRILOG Broadband Schwarzbe 12 n. a. VULB9163 371 300003854 vlKI! 14.10.2011 14.10.2014 Test-Antenna ck 30 MHz - 3 GHz MXE EMI Agilent 13 n. a. Receiver 20 Hz N9038A Technologi MY51210197 300004405 k 13.03.2014 13.03.2015 bis 26,5 GHz es Agilent 4U RF Switch 14 n. a. L4491A Technologi MY50000037 300004509 ne Platform es HP 15 45 Switch-Unit 3488A 2719A14505 300000368 g Meßtechnik DC power HP 16 50 supply, 60Vdc, 6032A 2920A04466 300000580 ne Meßtechnik 50A, 1200 W EMI Test 17 n. a. ESCI 3 R&S 100083 300003312 k 27.01.2014 27.01.2015 Receiver Funkstörmesse 18 n. a. mpfänger 20Hz- ESU26 R&S 100037 300003555 k 28.02.2014 28.02.2015 26,5GHz ETS- 19 n. a. Antenna Tower Model 2175 64762 300003745 izw LINDGREN Positioning ETS- 20 n. a. Model 2090 64672 300003746 izw Controller LINDGREN Turntable Model ETS- 21 n. a. 44583 300003747 izw Interface-Box 105637 LINDGREN TRILOG Schwarzbe 22 n. a. VULB9163 295 300003787 k 22.04.2014 22.04.2016 Broadband ck 2014-07-11 Page 23 of 26

Test report no.: 1-3894/11-01-15-A Test-Antenna 30 MHz - 3 GHz EMI Test Receiver 9 kHz 23 n. a. ESPI3 R&S 101713 300004059 k 24.01.2014 24.01.2015 - 3 GHz incl. Preselector DC Power 24 n. a. 1108-32 Heiden 001802 300001383 Ve 29.01.2014 29.01.2017 Supply 0 – 32V Temperature Heraeus 25 n. a. VT 4002 521/83761 300002326 Ve 26.09.2013 26.09.2015 Test Chamber Voetsch Signal Analyzer 20Hz-26,5GHz- 26 n. a. FSiQ26 R&S 835111/0004 300002678 Ve 15.01.2013 15.01.2015 150 to + 30 DBM Agenda: Kind of Calibration k calibration / calibrated EK limited calibration ne not required (k, ev, izw, zw not required) zw cyclical maintenance (external cyclical maintenance) ev periodic self verification izw internal cyclical maintenance Ve long-term stability recognized g blocked for accredited testing vlkI! Attention: extended calibration interval NK! Attention: not calibrated *) next calibration ordered / currently in progress 12 Observations No observations exceeding those reported with the single test cases have been made. 2014-07-11 Page 24 of 26

Test report no.: 1-3894/11-01-15-A Annex A Document history Version Applied changes Date of release Initial release 2014-06-06 -A Corrected FCC ID 2014-07-11 Annex B Further information Glossary AVG - Average DUT - Device under test EMC - Electromagnetic Compatibility EN - European Standard EUT - Equipment under test ETSI - European Telecommunications Standard Institute FCC - Federal Communication Commission FCC ID - Company Identifier at FCC HW - Hardware IC - Industry Canada Inv. No. - Inventory number N/A - Not applicable PP - Positive peak QP - Quasi peak S/N - Serial number SW - Software 2014-07-11 Page 25 of 26

Test report no.: 1-3894/11-01-15-A Annex C Accreditation Certificate Front side of certificate Back side of certificate Note: The current certificate including annex is published on our website (see link below) or may be received from CETECOM ICT Services on request. http://www.cetecom.com/eu/de/cetecom-group/europa/deutschland-saarbruecken/akkreditierungen.html 2014-07-11 Page 26 of 26


Document Created: 2014-07-15 07:00:18
Document Modified: 2014-07-15 07:00:18
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