C4ZAB000005

FCC ID

Equipment:

Seiko Instruments Inc AB000005

8, Nakase 1-chome, Mihama-ku Chiba-shi 261-8507, Chiba, N/A N/A Japan

Application
Frequency Range
Final Action Date
Granted
GqeJZiajIilmNWg/beNGPw==
5180.0-5320.0
2016-09-19
APPROVED
GqeJZiajIilmNWg/beNGPw==
5260.0-5320.0
2016-09-19
APPROVED
GqeJZiajIilmNWg/beNGPw==
5500.0-5700.0
2016-09-19
APPROVED
GqeJZiajIilmNWg/beNGPw==
5745.0-5825.0
2016-09-19
APPROVED
3YqvW2J5j93zlLUt9eEBzw==
2412.0-2462.0
2016-09-27
APPROVED
File NameDocument TypeDateDirect
Schematics_20160601_v1 - IFWL-001_Schematics.pdfSchematics 2017-01-04 00:00:00 pdf
Operational Description_20160616_v1 - IFWL-001_Operational_Description_rev160617Operational Description 2016-09-27 00:00:00 pdf
Operational Description_20160616_v1 - IFWL-001_Operation_Description_Inquiry1606Operational Description 2016-09-27 00:00:00 pdf
Operational Description_20160601_v1 - IFWL-001_Antenna information.pdfOperational Description 2016-09-27 00:00:00 pdf
Block Diagrams_20160601_v1 - IFWL-001_Block diagram.pdfBlock Diagram 2017-01-04 00:00:00 pdf
User Manual_20160616_v1 - IFWL-001_User Manual_rev 160617.pdfUsers Manual 2016-09-27 00:00:00 pdf
Test Setup Photos_20160601_v1 - IFWL-001_Test Setup Photos 160617.pdfTest Setup Photos 2016-09-27 00:00:00 pdf
Test Report_20160616_v1 - IFWL-001_Test report_15C_2_Rev 160617.pdfTest Report 2016-09-27 00:00:00 pdf
Test Report_20160616_v1 - IFWL-001_Test report_15C_1_Rev 160617.pdfTest Report 2016-09-27 00:00:00 pdf
RF Exposure Info._20160616_v1 - RF Exposure statement_rev160617.pdfRF Exposure Info 2016-09-27 00:00:00 pdf
Internal Photos_20160601_v1 - IFWL-001_Internal Photos.pdfInternal Photos 2016-09-27 00:00:00 pdf
ID Label & Location Info._20160601_v1 - IFWL-001_Label_Layout.pdfID Label/Location Info 2016-09-27 00:00:00 pdf
External Photos_20160601_v1 - IFWL-001_External Photos.pdfExternal Photos 2016-09-27 00:00:00 pdf
Cover Letters_20160601_v1 - ModularApprovalRequest.pdfCover Letter(s) 2016-09-27 00:00:00 pdf
Cover Letters_20160601_v1 - Long-term Confidential_letter.pdfCover Letter(s) 2016-09-27 00:00:00 pdf
Cover Letters_20160601_v1 - Agent_authorization_letter.pdfCover Letter(s) 2016-09-27 00:00:00 pdf
Test Report_20160621_v1 - IFWL-001_Test report_DFS_rev 160621 160617.pdfTest Report 2016-09-19 00:00:00 pdf
Test Report_20160616_v1 - IFWL-001_Test report_15E_3_Rev 160617.pdfTest Report 2016-09-19 00:00:00 pdf
Test Report_20160616_v1 - IFWL-001_Test report_15E_2_Rev 160617.pdfTest Report 2016-09-19 00:00:00 pdf
Test Report_20160616_v1 - IFWL-001_Test report_15E_1_Rev 160617.pdfTest Report 2016-09-19 00:00:00 pdf
Cover Letters_20160601_v1 - KDB 594280 D02 v01r02 U-NII Device SW Security StateSDR Software/Security Inf 2016-09-27 00:00:00 N/A
KDB 594280 D02 v01r03 U-NII Device SW Security Statement 0914.pdfSDR Software/Security Inf 2016-09-27 00:00:00 N/A

Application Details:

EquipmentModule
FRN0007812530
Grantee CodeC4Z
Product CodeAB000005
Applicant BusinessSeiko Instruments Inc
Business Address8, Nakase 1-chome, Mihama-ku Chiba-shi 261-8507, Chiba,N/A Japan
TCB ScopeA4: UNII devices & low power transmitters using spread spectrum techniques
TCB Email[email protected]
Applicantatsuhiko ikeda – Quality Assurance Department General Manager
Applicant Phone
Applicant Fax81 43 211-8019
Applicant Email[email protected]
Applicant MailStop
Test FirmTUV SUD Zacta Ltd. Yonezawa Testing Center
Test Firm ContactJun Shimanuki
Test Firm Phone
Test Firm Fax81-238-28-2888
Test Firm Email[email protected]
Certified ByJun Shimanuki –
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