FCC Test Report_DXX

FCC ID: BKEJAN001

Test Report

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FCCID_3408213

Test report No. : 11656716S-A-R2 Page : 1 of 29 Issued date : May 30, 2017 FCC ID : BKEJAN001 RADIO TEST REPORT Test Report No.: 11656716S-A-R2 Applicant : Nintendo Co., Ltd. Type of Equipment : Portable Game Machine Model No. : JAN-001 FCC ID : BKEJAN001 Test regulation : FCC Part15 Subpart C: 2016 Test result : Complied 1. This test report shall not be reproduced in full or partial, without the written approval of UL Japan, Inc. 2. The results in this report apply only to the sample tested. 3. This sample tested is in compliance with the limits of the above regulation. 4. The test results in this test report are traceable to the national or international standards. 5. The opinions and the interpretations to the result of the description in this report are outside scopes where UL Japan has been accredited. 6. This test report covers Radio technical requirements. It does not cover administrative issues such as Manual or non-Radio test related Requirements. (if applicable) 7. This report is a revised version of 11656716S-A-R1. 11656716S-A-R1 is replaced with this report. Date of test: February 27 to March 16, 2017 Representative test engineer: Kazutaka Takeyama Engineer Consumer Technology Division Approved by : Akio Hayashi Leader Consumer Technology Division The testing in which "Non-accreditation" is displayed is outside the accreditation scopes in UL Japan. RTL02610 There is no testing item of "Non-accreditation". UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN 13-EM-F0429 Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 11656716S-A-R2 Page : 2 of 29 Issued date : May 30, 2017 FCC ID : BKEJAN001 REVISION HISTORY Original Test Report No.: 11656716S-A Revision Test report No. Date Page revised Contents - (Original) 11656716S-A May 10, 2017 - - 1 11656716S-A-R1 May 22, 2017 4 Correction of specification 2 11656716S-A-R2 May 30, 2017 4-5 Correction UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 11656716S-A-R2 Page : 3 of 29 Issued date : May 30, 2017 FCC ID : BKEJAN001 Contents Page SECTION 1: Customer information ........................................................................................ 4 SECTION 2: Equipment under test (E.U.T.) .......................................................................... 4 SECTION 3: Test specification, procedures & results ........................................................... 5 SECTION 4: Operation of E.U.T. during testing.................................................................... 8 SECTION 5: Conducted emission .......................................................................................... 10 SECTION 6: Radiated emission ............................................................................................. 11 SECTION 7: 20 dB bandwidth & Occupied bandwidth (99 %) .......................................... 13 SECTION 8: Frequency Tolerance ........................................................................................ 13 APPENDIX 1: Data of Radio tests .......................................................................................... 14 APPENDIX 2: Test instruments ............................................................................................. 25 APPENDIX 3: Photographs of test setup ............................................................................... 26 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 11656716S-A-R2 Page : 4 of 29 Issued date : May 30, 2017 FCC ID : BKEJAN001 SECTION 1: Customer information Company Name : Nintendo Co., Ltd. Address : 11-1 Hokotate-cho, Kamitoba, Minami-ku, Kyoto 601-8501, Japan Telephone Number : +81-75-662-9600 Facsimile Number : +81-75-662-9624 Contact Person : Kazuya Kuramoto SECTION 2: Equipment under test (E.U.T.) 2.1 Identification of E.U.T. Type of Equipment : Portable Game Machine Model No. : JAN-001 Serial No. : Refer to Section 4, Clause 4.2 Rating : DC 3.7 V (battery) AC 100 – 120 V, 50 / 60 Hz (AC Adapter) Receipt Date of Sample : February 28, 2017 Country of Mass-production : China Condition of EUT : Production prototype (Not for Sale: This sample is equivalent to mass-produced items.) Modification of EUT : No Modification by the test lab 2.2 Product description Model: JAN-001 (referred to as the EUT in this report) is a Portable Game Machine with Wireless LAN. General Specification Clock frequency(ies) in the system : Wireless LAN: 40 MHz, NFC: 13 MHz Radio Specification WLAN (IEEE802.11b/g, IEEE802.11) Radio Type : Transceiver Frequency of Operation : 2412 MHz - 2472 MHz Modulation : DSSS Antenna type : Dipole Antenna Antenna Gain : 1.28 dBi Operating Temperature : +5 deg. C - +35 deg. C NFC Radio Type : Transceiver Frequency of Operation : 13.56 MHz Modulation : ASK Antenna type : Loop Operating Temperature : +5 deg.C to +35 deg C. UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 11656716S-A-R2 Page : 5 of 29 Issued date : May 30, 2017 FCC ID : BKEJAN001 SECTION 3: Test specification, procedures & results 3.1 Test specification Test specification : FCC Part 15 Subpart C FCC Part 15 final revised on November 14, 2016 and effective December 14, 2016 Title : FCC 47 CFR Part 15 Radio Frequency Device Subpart C Intentional Radiators Section 15.207 Conducted limits Section 15.209 Radiated emission limits, general requirements Section 15.215 Additional provisions to the general radiated emission limitations. Section 15.225 Operation within the bands 13.110 - 14.010 MHz. 3.2 Procedures & Results Item Test Procedure Specification Remarks Deviation Worst Margin Results ANSI C63.10:2013 FCC 15.207 Conducted 6 Standard test methods 9.2 dB - N/A Complied emission <IC> (13.56 MHz, AV, N) <IC>RSS-Gen 8.8 RSS-Gen 8.8 ANSI C63.10:2013 Electric field strength FCC 15.225 (a) 6 Standard test methods of Fundamental Radiated N/A 71.4 dB (Vertical) Complied <IC> emission <IC>RSS-Gen 6.4, 6.12 RSS-210 B.6 Electric field strength ANSI C63.10:2013 FCC 15.225 of Spurious emission 6 Standard test methods (b)(c) 45.7 dB (within the Radiated N/A (13.110 MHz, Complied <IC> 13.110-14.010 MHz <IC>RSS-Gen 6.4, 6.13 Horizontal & Vertical) RSS-210 B.6 band) Electric field strength ANSI C63.10:2013 FCC 15.209 of Spurious emission 6 Standard test methods FCC 15.225 (d) 8.5 dB (outside of the <IC> Radiated N/A Complied (43.57 MHz, Vertical) 13.110-14.010 MHz <IC>RSS-Gen 6.4, 6.13 RSS-210 B.6 band) ANSI C63.10:2013 FCC 15.215 (c) 20dB bandwidth 6 Standard test methods Radiated N/A - - <IC> - <IC> - ANSI C63.10:2013 FCC 15.225 (e) 6 Standard test methods Frequency tolerance Radiated N/A - Complied <IC> <IC> RSS-Gen 6.11, 8.11 RSS-210 B.6 Note: UL Japan’s Work Procedures No. 13-EM-W0420 and 13-EM-W0422 FCC Part 15.31 (e) The EUT is supplied the power from battery and the test was performed with the full-charged battery. Therefore, the EUT complies with the requirement. FCC Part 15.203 Antenna requirement It is impossible for end users to replace the antenna, because the antenna is mounted inside of the EUT. Therefore, the EUT complies with the requirement. UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 11656716S-A-R2 Page : 6 of 29 Issued date : May 30, 2017 FCC ID : BKEJAN001 3.3 Addition to standard Item Test Procedure Specification Remarks Worst Margin Results Occupied ANSI C63.10:2013 Bandwidth 6.Standard test methods RSS-Gen 4.6.1 Conducted - - (99 %) RSS-Gen 6.6 Note: UL Japan’s EMI Work Procedures No.13-EM-W0420 and 13-EM-W0422. * Other than above, no addition, exclusion nor deviation has been made from the standard. 3.4 Uncertainty The following uncertainties have been calculated to provide a confidence level of 95 % using a coverage factor k = 2. Shonan EMC Lab. Item Frequency range Uncertainty (+/-) No. 1 SAC / SR No. 2 SAC / SR No. 3 SAC / SR No. 4 SAC / SR No. 5,6,8 SR Conducted emission (AC Mains) LISN 150 kHz-30 MHz 2.6 dB 2.5 dB 2.6 dB 2.5 dB 2.5 dB Radiated emission 9 kHz-30 MHz 3.1 dB 3.1 dB 3.1 dB - - (Measurement distance: 3 m) 30 MHz-200 MHz 4.6 dB 4.4 dB 4.6 dB - - 200 MHz-1 GHz 5.8 dB 5.7 dB 5.8 dB - - 1 GHz-13 GHz 4.9 dB 4.9 dB 4.9 dB - - Radiated emission 13 GHz-18 GHz 4.6 dB 4.6 dB 4.6 dB - - (Measurement distance: 1 m) 18 GHz-40 GHz 4.9 dB 4.9 dB 4.9 dB - - SAC=Semi-Anechoic Chamber SR= Shielded Room is applied besides radiated emission Antenna terminal test Uncertainty (+/-) Power Measurement above 1 GHz (Average Detector)_SPM-06 0.72 dB Power Measurement above 1 GHz (Peak Detector)_SPM-06 0.85 dB Power Measurement above 1 GHz (Average Detector)_SPM-07 0.74 dB Power Measurement above 1 GHz (Peak Detector)_SPM-07 0.91 dB Spurious emission (Conducted) below 1GHz 1.6 dB Spurious emission (Conducted) 1 GHz-3 GHz 1.3 dB Spurious emission (Conducted) 3 GHz-18 GHz 2.2 dB Spurious emission (Conducted) 18 GHz-26.5 GHz 2.3 dB Spurious emission (Conducted) 26.5 GHz-40 GHz 2.4 dB Bandwidth Measurement 1.01 % Duty cycle and Time Measurement 0.012 % Conducted emission test The data listed in this test report has enough margin, more than the site margin. Radiated emission test The data listed in this test report has enough margin, more than the site margin. UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 11656716S-A-R2 Page : 7 of 29 Issued date : May 30, 2017 FCC ID : BKEJAN001 3.5 Test location UL Japan, Inc. Shonan EMC Lab. 1-22-3, Megumigaoka, Hiratsuka-shi, Kanagawa-ken 259-1220 JAPAN Telephone number : +81 463 50 6400 Facsimile number : +81 463 50 6401 JAB Accreditation No. : RTL02610 Size of reference IC Maximum Width x Depth x ground plane (m) / Registration measurement Height (m) horizontal No. distance conducting plane No.1 Semi-anechoic chamber 2973D-1 20.6 x 11.3 x 7.65 20.6 x 11.3 10 m No.2 Semi-anechoic chamber 2973D-2 20.6 x 11.3 x 7.65 20.6 x 11.3 10 m No.3 Semi-anechoic chamber 2973D-3 12.7 x 7.7 x 5.35 12.7 x 7.7 5m No.4 Semi-anechoic chamber - 8.1 x 5.1 x 3.55 8.1 x 5.1 - No.1 shielded room - 6.8 x 4.1 x 2.7 6.8 x 4.1 - No.2 shielded room - 6.8 x 4.1 x 2.7 6.8 x 4.1 - No.3 shielded room - 6.3 x 4.7 x 2.7 6.3 x 4.7 - No.4 shielded room - 4.4 x 4.7 x 2.7 4.4 x 4.7 - No.5 shielded room - 7.8 x 6.4 x 2.7 7.8 x 6.4 - No.6 shielded room - 7.8 x 6.4 x 2.7 7.8 x 6.4 - No.8 shielded room - 3.45 x 5.5 x 2.4 3.45 x 5.5 - No.1 Measurement room - 2.55 x 4.1 x 2.5 - - 3.6 Test setup, Data of EMI & Test instruments Refer to APPENDIX. UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 11656716S-A-R2 Page : 8 of 29 Issued date : May 30, 2017 FCC ID : BKEJAN001 SECTION 4: Operation of E.U.T. during testing 4.1 Operating mode The EUT exercise program used during testing was designed to exercise the various system components in a manner similar to typical use. Test item Operating mode Tested frequency All items except for Frequency Tolerance NFC Communication 13.56 MHz NFC transmitting Frequency Tolerance NFC transmitting (Unmodulated) 13.56 MHz Software: NFC RF TEST.exe version 0.2.0.0 Power setting: Fixed The carrier level and noise levels were confirmed with and without Tag, and the test was made with the condition that has the maximum noise. Combinations of the worst case: Radiated emission Radiated emission (Below 30 MHz) Radiated emission (Above 30 MHz) (Carrier) With Tag (NFC type B) With Tag (NFC type B) With Tag (NFC type B) Justification: The system was configured in typical fashion (as customer would normally use it) for testing. UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 11656716S-A-R2 Page : 9 of 29 Issued date : May 30, 2017 FCC ID : BKEJAN001 4.2 Configuration of tested system All items except for Frequency Tolerance C1, C2 or C3 B 1 2 A: EUT D AC 120 V/ 60 Hz E F Frequency Tolerance 1 DC 3.3 V to A: EUT DC 4.255 V E F *Cabling and setup were taken into consideration and test data was taken under worse case conditions. Description of EUT and Support equipment No. Item Model number Serial number Manufacturer Remarks A Portable Game Machine JAN-001 NJG0000017176 NINTENDO EUT B AC Adaptor WAP-002 - Mitsumi - C1 Cubic Tag NVL-01 H4VW1D1MRIO NINTENDO Type A C2 Tag Card - 31 - Type B C3 Tag Card - 44 - Type F D Headphones - - - - E CTR Card CTR-005 - - - F Micro SD Card - - Transcend - List of cables used No. Cable Name Length (m) Shield Remarks Cable Connector 1 DC 1.9 Unshielded Unshielded - 2 Headphones 0.8 Unshielded Unshielded - UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 11656716S-A-R2 Page : 10 of 29 Issued date : May 30, 2017 FCC ID : BKEJAN001 SECTION 5: Conducted emission 5.1 Operating environment Test place : See test data (APPENDIX 1) Temperature : See test data (APPENDIX 1) Humidity : See test data (APPENDIX 1) 5.2 Test configuration EUT was placed on a platform of nominal size, 1.0 m by 1.5 m, raised 0.8 m above the conducting ground plane. The table is made of Styrofoam and covered with polyvinyl chloride. That has very low permittivity. The rear of tabletop was located 40 cm to the vertical conducting plane. The rear of EUT, including peripherals was aligned and was flushed with rear of tabletop. All other surfaces of tabletop were at least 80 cm from any other grounded conducting surface. EUT was located 80 cm from LISN and excess AC cable was bundled in center. I/O cables that were connected to the peripherals were bundled in center. They were folded back and for the forming a bundle 30 cm to 40 cm long and were hanged at a 40 cm height to the ground plane. Each EUT current-carrying power lead, except the ground (safety) lead, was individually connected through a LISN to the input power source. All unused 50 ohm connectors of the LISN were resistively terminated in 50 ohm when not connected to the measuring equipment. Photographs of the set up are shown in APPENDIX 3. 5.3 Test conditions Frequency range : 0.15 MHz - 30 MHz EUT position : Table top 5.4 Test procedure The AC Mains Terminal Continuous disturbance Voltage had been measured with the EUT via AC adapter within a Shielded room. The EUT via AC adapter was connected to a Line Impedance Stabilization Network (LISN). An overview sweep with peak detection has been performed. The measurements had been performed with a quasi-peak detector and if required, an average detector. The conducted emission measurements were made with the following detection of the test receiver. Detection Type : Quasi-Peak/ Average IF Bandwidth : 9 kHz 5.5 Results Summary of the test results : Pass Refer to APPENDIX 1 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 11656716S-A-R2 Page : 11 of 29 Issued date : May 30, 2017 FCC ID : BKEJAN001 SECTION 6: Radiated emission 6.1 Operating environment Test place : See test data (APPENDIX 1) Temperature : See test data (APPENDIX 1) Humidity : See test data (APPENDIX 1) 6.2 Test configuration EUT was placed on a polystyrene platform of nominal size, 0.5 m by 0.5 m, raised 0.8 m above the conducting ground plane. That has very low permittivity. Photographs of the set up are shown in APPENDIX 3. 6.3 Test procedure The Radiated Electric Field Strength intensity has been measured on a semi-anechoic chamber with a ground plane at a distance of 3 m. Although these tests were performed other than open area test site, adequate comparison measurements were confirmed against 30 m open are test site. Therefore sufficient tests were made to demonstrate that the alternative site produces results that correlate with the ones of tests made in an open field based on KDB 937606. These tests were performed in semi anechoic chamber. Therefore the measured level of emissions may be higher than if measurements were made without a ground plane. However test results were confirmed to pass against standard limit. The Radiated Electric Field Strength intensity has been measured with a ground plane and at a distance of 3 m. Frequency: From 9 kHz to 30 MHz at distance 3 m (Refer to Figure 2) The EUT was rotated a full revolution in order to obtain the maximum value of the electric field intensity. The measurements were performed for vertical polarization (antenna angle: 0 deg., 45 deg., 90 deg. and 135 deg.) and horizontal polarization. Drawing of the antenna direction is shown in Figure 1. Frequency: From 30 MHz to 1 GHz at distance 3 m (Refer to Figure 2). The measuring antenna height was varied between 1 and 4 m and EUT was rotated a full revolution in order to obtain the maximum value of the electric field intensity. The measurements were performed for both vertical and horizontal antenna polarization. Measurements were performed with QP, PK, and AV detector. The radiated emission measurements were made with the following detector function of the test receiver. 9 kHz to 90 kHz & 90 kHz to 150 kHz 490 kHz to 30 MHz to 1 GHz 110 kHz to 150 kHz 110 kHz to 490 kHz 30 MHz Detector Type PK/AV QP PK/AV QP QP IF Bandwidth 200 Hz 200 Hz 10 kHz 9 kHz 120 kHz Distance factor -80 dB -80 dB -80 dB -40 dB - *1) Measuring Loop antenna Biconical antenna (30 MHz - 299.99 MHz) Logperiodic (300 MHz - 1 GHz) *1) FCC 15.31 (f)(2) (9kHz-30MHz) Distance Factor: 40 x log (3 m / 300 m) = -80 dB Distance Factor: 40 x log (3 m / 30 m) = -40 dB UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 11656716S-A-R2 Page : 12 of 29 Issued date : May 30, 2017 FCC ID : BKEJAN001 Figure 1. Direction of the Loop Antenna Side View (Vertical) Top View (Vertical) EUT 135 deg. 90 deg. EUT 45 deg. 0 deg. Front side: 0 deg. Front side: 0 deg. Forward direction: Forward direction: clockwise clockwise Top View (Horizontal) EUT Antenna was not rotated. Figure 2. Antenna angle Radiated Emission No.3 Semi-Anechoic Chamber (Antenna angle) (Below 1GHz) 90 deg. g. de 45 Biconical Antenna 3m / 3t 0 deg. / Logperiodic Antenna TurnTable 3m 6.4 Results Summary of the test results : Pass Refer to APPENDIX 1 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 11656716S-A-R2 Page : 13 of 29 Issued date : May 30, 2017 FCC ID : BKEJAN001 SECTION 7: 20 dB bandwidth & Occupied bandwidth (99 %) Test procedure The test was measured with a spectrum analyzer using a test fixture. Test Span RBW VBW Sweep Detector Trace Instrument used 20 dB 20 MHz 10 kHz 30 kHz Auto Peak Max Hold Spectrum Bandwidth Analyzer 99 % Enough width to 1 to 5 % of Three Auto (Single) Sample Max Hold Spectrum Occupied display Span times *1) Analyzer Bandwidth 20 dB Bandwidth of RBW *1) The measurement was performed with Max Hold since the duty cycle was not 100 %. Summary of the test results: Pass Refer to APPENDIX 1 SECTION 8: Frequency Tolerance Test procedure The test was measured with a frequency counter using a test fixture. The temperature test was started after the temperature stabilization time of 30 minutes. The test was begun from 50 deg.C and the temperature was lowered each 10 deg.C. Summary of the test results: Pass Refer to APPENDIX 1 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test Report No. ： 11656716S-A-R2 APPENDIX 1: Data of Radio tests DATA OF CONDUCTED EMISSION TEST UL Japan,Inc. Shonan EMC Lab. No.3 Shielded Room Date : 2017/03/16 Company : NINTENDO CO., LTD Mode : NFC type B transmitting Kind of EUT : Refer to section 2.2 Order No. : 11656716S Model No. : JAN-001 Power : AC 120V / 60Hz Serial No. : J-009 NJG000017176 Temp./Humi. : 22 deg.C / 28 %RH Remarks : - Limit1 : FCC 15C(15.207) QP Limit2 : FCC 15C(15.207) AV Engineer : Hiroyuki Morikawa 80 Limit1(QP) 70 Limit2(AV) 60 N(PK) N(QP/AV) RFI Voltage [dBuV] 50 40 30 20 10 0 .2 .3 .5 .7 1 2 3 5 7 10 20 .15 30 Frequency [MHz] 80 Limit1(QP) 70 Limit2(AV) 60 L1(PK) L1(QP/AV) RFI Voltage [dBuV] 50 40 30 20 10 0 .2 .3 .5 .7 1 2 3 5 7 10 20 .15 Frequency [MHz] 30 Calculation:Result[dBuV]=Reading[dBuV]+C.Fac(LISN+Cable+ATT)[dB] LISN: SLS-05 14 of 29

Test Report No. ： 11656716S-A-R2 DATA OF CONDUCTED EMISSION TEST UL Japan,Inc. Shonan EMC Lab. No.3 Shielded Room Date : 2017/03/16 Company : NINTENDO CO., LTD Mode : NFC type B transmitting Kind of EUT : Refer to section 2.2 Order No. : 11656716S Model No. : JAN-001 Power : AC 120V / 60Hz Serial No. : J-009 NJG000017176 Temp./Humi. : 22 deg.C / 28 %RH Remarks : - Limit1 : FCC 15C(15.207) QP Limit2 : FCC 15C(15.207) AV Engineer : Hiroyuki Morikawa << QP/AV DATA >> Reading Results Limit Margin Freq. C.Fac No. <QP> <AV> <QP> <AV> <QP> <AV> <QP> <AV> Phase Comment [MHz] [dBuV] [dBuV] [dB] [dBuV] [dBuV] [dBuV] [dBuV] [dB] [dB] 1 0.23165 31.60 25.50 12.41 44.01 37.91 62.39 52.39 18.3 14.4 N 2 0.34574 28.90 24.10 12.43 41.33 36.53 59.06 49.06 17.7 12.5 N 3 0.46164 23.50 19.30 12.44 35.94 31.74 56.66 46.66 20.7 14.9 N 4 0.56715 23.20 18.70 12.44 35.64 31.14 56.00 46.00 20.3 14.8 N 5 0.68918 25.50 18.80 12.46 37.96 31.26 56.00 46.00 18.0 14.7 N 6 0.79568 22.70 18.40 12.45 35.15 30.85 56.00 46.00 20.8 15.1 N 7 0.92328 25.50 19.90 12.46 37.96 32.36 56.00 46.00 18.0 13.6 N 8 1.06691 27.20 21.10 12.48 39.68 33.58 56.00 46.00 16.3 12.4 N 9 1.15145 26.20 19.90 12.49 38.69 32.39 56.00 46.00 17.3 13.6 N 10 1.26698 26.10 19.60 12.49 38.59 32.09 56.00 46.00 17.4 13.9 N 11 1.42675 22.90 15.40 12.51 35.41 27.91 56.00 46.00 20.5 18.0 N 12 2.45996 25.80 17.70 12.56 38.36 30.26 56.00 46.00 17.6 15.7 N 13 13.56000 30.90 27.70 13.05 43.95 40.75 60.00 50.00 16.0 9.2 N 14 0.23169 32.30 23.00 12.41 44.71 35.41 62.39 52.39 17.6 16.9 L1 15 0.35819 27.90 18.40 12.43 40.33 30.83 58.77 48.77 18.4 17.9 L1 16 0.47728 25.80 17.20 12.44 38.24 29.64 56.39 46.39 18.1 16.7 L1 17 0.58888 27.10 20.40 12.45 39.55 32.85 56.00 46.00 16.4 13.1 L1 18 0.71331 27.70 20.40 12.46 40.16 32.86 56.00 46.00 15.8 13.1 L1 19 0.83673 27.60 21.90 12.45 40.05 34.35 56.00 46.00 15.9 11.6 L1 20 0.95874 27.50 21.80 12.47 39.97 34.27 56.00 46.00 16.0 11.7 L1 21 1.04480 26.80 21.40 12.48 39.28 33.88 56.00 46.00 16.7 12.1 L1 22 1.15900 27.00 21.40 12.49 39.49 33.89 56.00 46.00 16.5 12.1 L1 23 1.27712 27.40 21.60 12.49 39.89 34.09 56.00 46.00 16.1 11.9 L1 24 1.39386 27.90 20.30 12.51 40.41 32.81 56.00 46.00 15.5 13.1 L1 25 1.51202 27.00 19.20 12.51 39.51 31.71 56.00 46.00 16.4 14.2 L1 26 1.62485 25.80 18.30 12.51 38.31 30.81 56.00 46.00 17.6 15.1 L1 27 2.64796 26.30 18.00 12.57 38.87 30.57 56.00 46.00 17.1 15.4 L1 28 13.56000 28.30 27.00 13.05 41.35 40.05 60.00 50.00 18.6 9.9 L1 Calculation:Result[dBuV]=Reading[dBuV]+C.Fac(LISN+Cable+ATT)[dB] LISN: SLS-05 15 of 29

Test Report No. ： 11656716S-A-R2 Data of Electric field strength of Fundamental emission and Spurious emission within the band: FCC15.225(a)(b)(c) UL Japan, Inc. Shonan EMC Lab., No.3 Semi Anechoic Chamber Company: NINTENDO CO., LTD Regulation: FCC Part15 Subpart C 15.225 Equipment: Refer to section 2.2 Test Distance: 3m Model: JAN-001 Date: February 27, 2017 Sample No.: NJG000017176 Temperature: 22 deg.C Power: AC 120 V/ 60 Hz Humidity: 35 %RH Mode: Transmitting 13.56 MHz ENGINEER: Kazutaka Takeyama Remarks: : NFC type B, with tag (Axis:Hor_Y / Ver_Y) , Vertical polarization (antenna angle) of the worst case: 0deg Fundamental emission No. FREQ Test Receiver Antenna Loss AMP Distance RESULT LIMIT MARGIN Reading Factor GAIN factor (30m) Hor Ver Hor Ver Hor Ver [MHz] [dBuV] [dBuV] [dB/m] [dB] [dB] [dB] [dBuV/m] [dBuV/m] [dBuV/m] [dB] [dB] 1 13.560 50.3 59.3 18.9 6.5 32.1 -40.0 3.5 12.5 83.9 80.4 71.4 Calculation:Result[dBuV/m]=Reading[dBuV]+Ant.Fac[dB/m]+Loss(Cable+ATT)[dB]-Gain(AMP)[dB]+Distance factor[dB] Distance factor: 40 x log (3m/30m) = -40 dB Limits (30m) ･13.553MHz to 13.567MHz : 83.9dBuV/m (FCC 15.225(a)) Spurious emission within the band No. FREQ Test Receiver Antenna Loss AMP Distance RESULT LIMIT MARGIN Reading Factor GAIN factor (30m) Hor Ver Hor Ver Hor Ver [MHz] [dBuV] [dBuV] [dB/m] [dB] [dB] [dB] [dBuV/m] [dBuV/m] [dBuV/m] [dB] [dB] 1 13.110 30.5 30.5 19.0 6.5 32.1 -40.0 -16.2 -16.2 29.5 45.7 45.7 2 13.410 30.3 30.5 18.9 6.5 32.1 -40.0 -16.5 -16.25 40.5 57.0 56.8 3 13.553 36.4 44.8 18.9 6.5 32.1 -40.0 -10.4 -2.0 50.4 60.8 52.4 4 13.567 36.2 44.4 18.9 6.5 32.1 -40.0 -10.6 -2.4 50.4 61.0 52.8 5 13.710 30.5 30.5 18.8 6.5 32.1 -40.0 -16.3 -16.32 40.5 56.8 56.8 6 14.010 30.6 30.6 18.8 6.5 32.1 -40.0 -16.3 -16.29 29.5 45.8 45.8 Calculation:Result[dBuV/m]=Reading[dBuV]+Ant.Fac[dB/m]+Loss(Cable+ATT)[dB]-Gain(AMP)[dB]+Distance factor[dB] Outside filed strength frequencies ･Fc±7kHz:13.553MHz to 13.567MHz ･Fc±150kHz:13.410MHz to 13.710MHz ･Fc±450kHz:13.110MHz to 14.010MHz Fc = 13.56MHz Limits (30m) ･13.410MHz to 13.553MHz and 13.567MHz to 13.710MHz : 50.4dBuV/m (FCC 15.225(b)) ･13.110MHz to 13.410MHz and 13.710MHz to 14.010MHz : 40.5dBuV/m (FCC 15.225(c)) ･Below 13.110MHz and Above 14.010MHz : 29.5dBuV/m (FCC 15.225(d)and FCC 15.209) UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220 Telephone :+81 463 50 6400 Facsimile : +81 463 50 6401 16 of 29

Test Report No. ： 11656716S-A-R2 Radiated Emission UL Japan, Inc. Shonan EMC Lab. No.3 Semi Anechoic Chamber Company: NINTENDO CO., LTD Regulation: FCC Part15 Subpart C 15.225 Equipment: Refer to section 2.2 Test Distance: 3m Model: JAN-001 Date: February 27, 2017 February 28, 2017 Sample No.: NJG000017176 Temperature: 22 deg.C 23 deg.C Power: AC 120 V/ 60 Hz Humidity: 35 %RH 30 %RH Mode: Transmitting 13.56 MHz ENGINEER: Kazutaka TakeyamaKazutaka Takeyama EUT axis: Below 30 MHz( Horizontal Y-axis, Vertical Y-axis), NFC type B, with Tag Above 30 MHz( Horizontal: X-axis, Vertical: X-axis), NFC type B, with Tag Remarks: Polarity Frequency Detector Reading Ant.Fac. Loss Gain Distance Factor Result Limit Margin Height Angle Remark [MHz] [dBuV] [dB/m] [dB] [dB] [dB] [dBuV/m] [dBuV/m] [dB] [cm] [deg.] Hori. 6.51 QP 30.6 19.1 6.3 32.2 -40.0 -16.1 29.5 45.6 - 359 * Limit: 30m Hori. 27.12 QP 30.1 18.6 6.7 32.1 -40.0 -16.7 29.5 46.2 - 359 * Limit: 30m Hori. 94.92 QP 34.8 9.1 7.6 32.1 0.0 19.4 43.5 24.1 200 266 Hori. 201.087 QP 46.6 11.4 8.1 32.0 0.0 34.2 43.5 9.3 166 253 Hori. 268.121 QP 35.2 12.3 8.5 31.9 0.0 24.1 46.0 21.9 100 1 Hori. 938.634 QP 29.2 22.1 11.2 30.6 0.0 31.8 46.0 14.2 100 293 Vert. 27.12 QP 30.5 18.6 6.7 32.1 -40.0 -16.3 29.5 45.8 - 359 * Limit: 30m Vert. 43.57 QP 33.4 12.9 6.9 32.1 0.0 21.0 29.5 8.5 100 154 Vert. 50.19 QP 31.6 10.7 7.0 32.1 0.0 17.1 29.5 12.4 100 289 Vert. 77.437 QP 35.6 6.2 7.5 32.1 0.0 17.3 40.0 22.8 100 24 Vert. 117.994 QP 30.0 12.6 7.4 32.1 0.0 17.9 43.5 25.6 225 2 Vert. 201.087 QP 42.2 11.4 8.1 32.0 0.0 29.8 46.0 16.3 100 167 Vert. 268.118 QP 32.8 12.3 8.5 31.9 0.0 21.7 46.0 24.3 100 105 Result = Reading + Ant Factor + Loss (Cable+ATT+ΔAF(above 30MHz)) - Gain(Amprifier) + Distance factor(below 30MHz) * Other frequency noises omitted in this report were not seen or have enough margin (more than 20dB). * Carrier level (Result at 3m): Hor= 43.5dBuV/m, Ver= 52.5 dBuV/m UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220 Telephone :+81 463 50 6400 Facsimile : +81 463 50 6401 17 of 29

Test Report No. ： 11656716S-A-R2 Radiated Emission (Worst mode plot) UL Japan, Inc. Shonan EMC Lab. No.3 Semi Anechoic Chamber Company: NINTENDO CO., LTD Regulation: FCC Part15 Subpart C 15.225 Equipment: Refer to section 2.2 Test Distance: 3m Model: JAN-001 Date: February 27, 2017 Sample No.: NJG000017176 Temperature: 22 deg.C Power: AC 120 V/ 60 Hz Humidity: 35 %RH Mode: Transmitting 13.56 MHz ENGINEER: Kazutaka Takeyama EUT axis: Below 30 MHz( Horizontal Y-axis, Vertical Y-axis), NFC type B, with Tag Above 30 MHz( Horizontal: X-axis, Vertical: X-axis), NFC type B, with Tag Remarks: These plots data contains sufficient number to show the trend of characteristic features for EUT. Spurious emission plot 90 80 70 60 50 Result [dBμV/m] 40 30 QP,AV Limit 20 PK Limit 10 Hori./QP,AV 0 Hori./PK -10 Vert./QP,AV -20 Vert./PK -30 -40 -50 -60 0.001 0.01 0.1 1 10 100 1000 Frequency [MHz] Within band plot 90 80 70 60 50 Result [dBμV/m] 40 30 20 QP Limit 10 Hori./QP 0 Vert./QP -10 -20 -30 -40 -50 -60 13 13.2 13.4 13.6 13.8 14 Frequency [MHz] UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220 Telephone :+81 463 50 6400 Facsimile : +81 463 50 6401 18 of 29

Test Report No. ： 11656716S-A-R2 Data of Frequency Tolerance UL Japan, Inc. Shonan EMC Lab. No.5 Shielded room Company NINTENDO CO., LTD Equipment Refer to section 2.2 Regulation FCC Part15 Subpart C 15.225 (e) Model JAN-001 Date March 2, 2017 Serial No. NGE000000659 Temperature 19 deg.C Power DC 3.7 V Humidity 33 %RH Mode Transmitting 13.56 MHz ENGINEER Hikaru Shirasawa Temperature Variation: -20deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.560011 0.000011 0.00008 0.010 after 2minutes 13.56 13.560047 0.000047 0.00035 0.010 after 5minutes 13.56 13.560051 0.000051 0.00038 0.010 after 10minutes 13.56 13.560053 0.000053 0.00039 0.010 Temperature Variation: -10deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.560055 0.000055 0.00041 0.010 after 2minutes 13.56 13.560071 0.000071 0.00052 0.010 after 5minutes 13.56 13.560073 0.000073 0.00054 0.010 after 10minutes 13.56 13.560074 0.000074 0.00055 0.010 Temperature Variation: 0deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.560073 0.000073 0.00054 0.010 after 2minutes 13.56 13.560075 0.000075 0.00055 0.010 after 5minutes 13.56 13.560073 0.000073 0.00054 0.010 after 10minutes 13.56 13.560071 0.000071 0.00052 0.010 Temperature Variation: 10deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.560068 0.000068 0.00050 0.010 after 2minutes 13.56 13.560061 0.000061 0.00045 0.010 after 5minutes 13.56 13.560056 0.000056 0.00041 0.010 after 10minutes 13.56 13.560052 0.000052 0.00038 0.010 Temperature Variation: 20deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.560048 0.000048 0.00035 0.010 after 2minutes 13.56 13.560036 0.000036 0.00027 0.010 after 5minutes 13.56 13.560028 0.000028 0.00021 0.010 after 10minutes 13.56 13.560024 0.000024 0.00018 0.010 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401 19 of 29

Test Report No. ： 11656716S-A-R2 Data of Frequency Tolerance Temperature Variation: 30deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.560019 0.000019 0.00014 0.010 after 2minutes 13.56 13.560006 0.000006 0.00004 0.010 after 5minutes 13.56 13.560000 0.000000 0.00000 0.010 after 10minutes 13.56 13.559995 -0.000005 -0.00004 0.010 Temperature Variation: 40deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.559989 -0.000011 -0.00008 0.010 after 2minutes 13.56 13.559976 -0.000024 -0.00018 0.010 after 5minutes 13.56 13.559972 -0.000028 -0.00021 0.010 after 10minutes 13.56 13.559970 -0.000030 -0.00022 0.010 Temperature Variation: 50deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.559966 -0.000034 -0.00025 0.010 after 2minutes 13.56 13.559960 -0.000040 -0.00029 0.010 after 5minutes 13.56 13.559959 -0.000041 -0.00030 0.010 after 10minutes 13.56 13.559958 -0.000042 -0.00031 0.010 Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup #VALUE! #VALUE! 0.010 after 2minutes #VALUE! #VALUE! 0.010 after 5minutes #VALUE! #VALUE! 0.010 after 10minutes #VALUE! #VALUE! 0.010 Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup #VALUE! #VALUE! 0.010 after 2minutes #VALUE! #VALUE! 0.010 after 5minutes #VALUE! #VALUE! 0.010 after 10minutes #VALUE! #VALUE! 0.010 Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup #VALUE! #VALUE! 0.010 after 2minutes #VALUE! #VALUE! 0.010 after 5minutes #VALUE! #VALUE! 0.010 after 10minutes #VALUE! #VALUE! 0.010 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401 20 of 29

Test Report No. ： 11656716S-A-R2 Data of Frequency Tolerance UL Japan, Inc. Shonan EMC Lab. No.5 Shielded room Company NINTENDO CO., LTD Equipment Refer to section 2.2 Regulation FCC Part15 Subpart C 15.225 (e) Model JAN-001 Date March 3, 2017 Serial No. NGE000000659 Temperature 20 deg.C Power DC 3.7 V Humidity 38 %RH Mode Transmitting 13.56 MHz ENGINEER Hikaru Shirasawa Voltage Variation: DC 3.3 V * Voltage was DC 3.3 V since the EUT did not Temperature Variation: 20deg.C operate with the voltage below 3.3 V. Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.560021 0.000021 0.00015 0.010 after 2minutes 13.56 13.560014 0.000014 0.00010 0.010 after 5minutes 13.56 13.560009 0.000009 0.00007 0.010 after 10minutes 13.56 13.560006 0.000006 0.00004 0.010 Voltage Variation: DC 4.255 V Temperature Variation: 20deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.560033 0.000033 0.00024 0.010 after 2minutes 13.56 13.560018 0.000018 0.00013 0.010 after 5minutes 13.56 13.560013 0.000013 0.00010 0.010 after 10minutes 13.56 13.560006 0.000006 0.00004 0.010 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401 21 of 29

Test Report No. ： 11656716S-A-R2 20dB bandwidth & 99% Occupied bandwidth: FCC 15.215 / RSS-Gen UL Japan, Inc. Shonan EMC Lab. No.5 Shielded Room Company: NINTENDO CO., LTD Regulation: FCC Part15 Subpart C 15.215 Equipment: Refer to section 2.2 Model: JAN-001 Date: March 2, 2017 Sample No.: NJG000017176 Temperature: 19 deg.C Power: DC 3.7 V Humidity: 33 %RH Mode: Transmitting 13.56 MHz ENGINEER: Hikaru Shirasawa : NFC type B, with tag 20dB Bandwidth: 3.037 kHz 99% Occupied Bandwidth: 20.467 kHz UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220 Telephone :+81 463 50 6400 Facsimile : +81 463 50 6401 22 of 29

Test Report No. ： 11656716S-A-R2 20dB bandwidth & 99% Occupied bandwidth: FCC 15.215 / RSS-Gen UL Japan, Inc. Shonan EMC Lab. No.5 Shielded Room Company: NINTENDO CO., LTD Regulation: FCC Part15 Subpart C 15.215 Equipment: Refer to section 2.2 Model: JAN-001 Date: March 2, 2017 Sample No.: NJG000017176 Temperature: 19 deg.C Power: DC 3.7 V Humidity: 33 %RH Mode: Transmitting 13.56 MHz ENGINEER: Hikaru Shirasawa : NFC type A, with tag 20dB Bandwidth: 5.098 kHz 99% Occupied Bandwidth: 37.580 kHz UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220 Telephone :+81 463 50 6400 Facsimile : +81 463 50 6401 23 of 29

Test Report No. ： 11656716S-A-R2 20dB bandwidth & 99% Occupied bandwidth: FCC 15.215 / RSS-Gen UL Japan, Inc. Shonan EMC Lab. No.5 Shielded Room Company: NINTENDO CO., LTD Regulation: FCC Part15 Subpart C 15.215 Equipment: Refer to section 2.2 Model: JAN-001 Date: March 2, 2017 Sample No.: NJG000017176 Temperature: 19 deg.C Power: DC 3.7 V Humidity: 33 %RH Mode: Transmitting 13.56 MHz ENGINEER: Hikaru Shirasawa : NFC type F, with tag 20dB Bandwidth: 8.690 kHz 99% Occupied Bandwidth: 31.273 kHz UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220 Telephone :+81 463 50 6400 Facsimile : +81 463 50 6401 24 of 29

Test Report No. ： 11656716S-A-R2 Test Report No ： APPENDIX 23 Test Instruments EMI test equipment Control No. Instrument Manufacturer Model No Serial No Test Item Calibration Date * Interval(month) SAEC-03(NSA) Semi-Anechoic Chamber TDK SAEC-03(NSA) 3 RE 2016/07/15 * 12 SLP-02 Loop Antenna Rohde & Schwarz HFH2-Z2 100218 RE 2016/10/28 * 12 SAT6-12 Attenuator HIROSE ELECTRIC AT-406(40) - RE 2016/08/04 * 12 CO.,LTD. SCC-C1/C2/C Coaxial Cable&RF Fujikura/Fujikura/Suhne 8D2W/12DSFA/14 -/0901-271(RF RE 2016/04/22 * 12 3/C4/C5/C10/ Selector r/Suhner/Suhner/Suhn 1PE/141PE/141PE Selector) SRSE-03 er/TOYO /141PE/NS4906 SAF-03 Pre Amplifier SONOMA 310N 290213 RE 2017/02/09 * 12 STR-06 Test Receiver Rohde & Schwarz ESCI 101259 RE, CE 2016/03/28 * 12 COTS-SEMI-1 EMI Software TSJ TEPTO-DV(RE,CE, - RE, CE - RFI,MF) SOS-05 Humidity Indicator A&D AD-5681 4062518 RE 2016/10/12 * 12 SJM-02 Measure KOMELON KMC-36 - RE, CE - STS-03 Digital Hitester Hioki 3805-50 080997823 RE, CE 2016/10/17 * 12 SBA-03 Biconical Antenna Schwarzbeck BBA9106 91032666 RE 2016/10/18 * 12 SLA-07 Logperiodic Antenna Schwarzbeck VUSLP9111B 196 RE 2017/01/26 * 12 SAT6-08 Attenuator HIROSE ELECTRIC AT-406(40) - RE 2016/08/04 * 12 CO.,LTD. SFC-01 Microwave Counter Agilent 53151A US40511493 AT 2016/04/13 * 12 SCH-01 Temperature and Espec PL-1KT 14020837 AT 2016/04/14 * 12 Humidity Chamber SCC-G14 Coaxial Cable Suhner SUCOFLEX 102 31600/2 AT 2016/03/23 * 12 SAT10-09 Attenuator Weinschel Corp. 54A-10 W5692 AT 2016/11/07 * 12 SOS-09 Humidity Indicator A&D AD-5681 4061484 AT,TF 2016/12/13 * 12 KTS-07 Digital Tester SANWA PC500 7019232 AT,TF 2016/10/17 * 12 STF-01 Test Fixture - - - TF - SSA-03 Spectrum Analyzer Agilent E4448A MY48250152 TF 2016/09/26 * 12 SCC-C9/C10/S Coaxial Cable&RF Suhner/Suhner/TOYO RG223U/141PE/N -/0901-271(RF CE 2016/04/22 * 12 RSE-03 Selector S4906 Selector) SLS-05 LISN Rohde & Schwarz ENV216 100516 CE 2017/02/27 * 12 SAT3-07 Attenuator JFW 50HF-003N - CE 2016/09/23 * 12 SOS-06 Humidity Indicator A&D AD-5681 4062118 CE 2016/12/13 * 12 The expiration date of the calibration is the end of the expired month . As for some calibrations performed after the tested dates , those test equipment have been controlled by means of an unbroken chains of calibrations . All equipment is calibrated with valid calibrations . Each measurement data is traceable to the national or international standards . Test Item： CE: Conducted emission , RE: Radiated emission , AT: Antenna terminal conducted test (Frequency tolerance ), TF: Test Fixture (Bandwidth) End of Report UL Japan, Inc. Page : 25 of 29


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