Test report

FCC ID: BKEF

Test Report

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FCCID_3167307

Test report No. : 11389963S-B-R1 Page : 1 of 24 Issued date : October 19, 2016 FCC ID : BKEF RADIO TEST REPORT Test Report No.: 11389963S-B-R1 Applicant : Nintendo Co., Ltd. Type of Equipment : Bluetooth Product Model No. : CTR-013 FCC ID : BKEF Test regulation : FCC Part 15 Subpart C: 2016 Test result : Complied 1. This test report shall not be reproduced in full or partial, without the written approval of UL Japan, Inc. 2. The results in this report apply only to the sample tested. 3. This sample tested is in compliance with the limits of the above regulation. 4. The test results in this test report are traceable to the national or international standards. 5. This test report must not be used by the customer to claim product certification, approval, or endorsement by any agency of the Federal Government. 6. The opinions and the interpretations to the result of the description in this report are outside scopes where UL Japan has been accredited. 7. This test report covers Radio technical requirements. It does not cover administrative issues such as Manual or non-Radio test related Requirements. (if applicable) 8. This report is a revised version of 11389963S-B. 11389963S-B is replaced with this report. Date of test: August 5 to 17, 2016 Representative test engineer: Hiroyuki Morikawa Engineer Consumer Technology Division Approved by : Akio Hayashi Leader Consumer Technology Division The testing in which "Non-accreditation" is displayed is outside the accreditation scopes in UL Japan. RTL02610 There is no testing item of "Non-accreditation". UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN 13-EM-F0429 Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 11389963S-B-R1 Page : 2 of 24 Issued date : October 19, 2016 FCC ID : BKEF REVISION HISTORY Original Test Report No.: 11389963S-B Revision Test report No. Date Page revised Contents - (Original) 11389963S-B October 14, 2016 - - 1 11389963S-B-R1 October 19, 2016 18-20 Correction of typo UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 11389963S-B-R1 Page : 3 of 24 Issued date : October 19, 2016 FCC ID : BKEF Contents Page SECTION 1: Customer information ........................................................................................ 4 SECTION 2: Equipment under test (E.U.T.) .......................................................................... 4 SECTION 3: Test specification, procedures & results ........................................................... 5 SECTION 4: Operation of E.U.T. during testing.................................................................... 8 SECTION 5: Radiated emission (Fundamental and Spurious emission) ............................. 9 SECTION 6: 20dB bandwidth & Occupied bandwidth (99 %) ........................................... 11 SECTION 7: Frequency tolerances ........................................................................................ 11 APPENDIX 1: Data of Radio tests .......................................................................................... 12 APPENDIX 2: Test instruments ............................................................................................. 21 APPENDIX 3: Photographs of test setup ............................................................................... 22 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 11389963S-B-R1 Page : 4 of 24 Issued date : October 19, 2016 FCC ID : BKEF SECTION 1: Customer information Company Name : Nintendo Co., Ltd. Address : 11-1 Hokotate-cho, Kamitoba, Minami-ku, Kyoto, 601-8501 Japan Telephone Number : +81-75-662-9600 Facsimile Number : +81-75-662-9624 Contact Person : Yoshihiro Tanaka SECTION 2: Equipment under test (E.U.T.) 2.1 Identification of E.U.T. Type of Equipment : Bluetooth Product Model No. : CTR-013 Serial No. : Refer to Section 4, Clause 4.2 Rating : DC 3.0 V (Battery) Receipt Date of Sample : August 1, 2016 Country of Mass-production : China Condition of EUT : Production prototype (Not for Sale: This sample is equivalent to mass-produced items.) Modification of EUT : No Modification by the test lab. 2.2 Product Description Model: CTR-013 (referred to as the EUT in this report) is a Bluetooth Product. The clock frequencies used in the EUT : 13 MHz, 16 MHz, 26 MHz Radio Specification Bluetooth low energy Radio Type : Transceiver Frequency of Operation : 2402 MHz - 2480 MHz Modulation : GFSK Antenna type : Inverted F (Pattern) Antenna Gain : -1.64 dBi RFID Equipment type : Transceiver Frequency of operation : 13.56 MHz Type of modulation : ASK ITU code : A1D UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 11389963S-B-R1 Page : 5 of 24 Issued date : October 19, 2016 FCC ID : BKEF SECTION 3: Test specification, procedures & results 3.1 Test specification Test specification : FCC Part 15 Subpart C FCC part 15 final revised on April 6, 2016. Title : FCC 47CFR Part15 Radio Frequency Device Subpart C Intentional Radiators Section 15.207 Conducted limits Section 15.209 Radiated emission limits, general requirements Section 15.215 Additional provisions to the general radiated emission limitations Section 15.225 Operation within the band 13.110-14.010 MHz The EUT has been tested for compliance with FCC Part 15 Subpart B. Refer to the test report 11389967S-B. 3.2 Procedures & Results Item Test Procedure Specification Remarks Deviation Worst Margin Results ANSI C63.10:2013 FCC 15.207 Conducted 6 Standard test methods N/A - - - emission <IC> *1) <IC>RSS-Gen 8.8 RSS-Gen 8.8 ANSI C63.10:2013 Electric field strength FCC 15.225 (a) 6 Standard test methods 61.89 dB of Fundamental Radiated N/A Complied <IC> Polarization: Vertical emission <IC>RSS-Gen 6.4, 6.12 RSS-210 B.6 Electric field strength ANSI C63.10:2013 FCC 15.225 of Spurious emission 6 Standard test methods (b)(c) 39.29 dB (within the Radiated N/A Freq.: 13.553 MHz Complied <IC> 13.110-14.010 MHz <IC>RSS-Gen 6.4, 6.13 Polarization: Horizontal RSS-210 B.6 band) Electric field strength ANSI C63.10:2013 FCC 15.209 of Spurious emission 6 Standard test methods FCC 15.225 (d) 12.25 dB (outside of the Radiated N/A Freq.: 40.680 MHz Complied <IC> 13.110-14.010 MHz <IC>RSS-Gen 6.4, 6.13 Polarization: Vertical RSS-210 B.6 band) ANSI C63.10:2013 FCC 15.215 (c) 20dB bandwidth 6 Standard test methods Radiated N/A - - <IC> - <IC> - ANSI C63.10:2013 FCC 15.225 (e) 6 Standard test methods Frequency tolerance Radiated N/A - Complied <IC> <IC> RSS-Gen 6.11, 8.11 RSS-210 B.6 Note: UL Japan’s Work Procedures No. 13-EM-W0420 and 13-EM-W0422 *1) The test is not applicable since the EUT has no AC mains. FCC Part 15.31 (e) This EUT provides stable voltage (DC 2.7 V) constantly to RF part regardless of input voltage. Therefore, this EUT complies with the requirement. FCC Part 15.203 Antenna requirement It is impossible for end users to replace the antenna, because the antenna is mounted inside of the EUT. Therefore, the equipment complies with the requirement. UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 11389963S-B-R1 Page : 6 of 24 Issued date : October 19, 2016 FCC ID : BKEF 3.3 Addition to standard Item Test Procedure Specification Remarks Worst Margin Results Occupied RSS-Gen 6.6 - Radiated - - Bandwidth (99 %) Note: UL Japan’s Work Procedures No. 13-EM-W0420 and 13-EM-W0422 * Other than above, no addition, exclusion nor deviation has been made from the standard. 3.4 Uncertainty The following uncertainties have been calculated to provide a confidence level of 95 % using a coverage factor k = 2. Shonan EMC Lab. Item Frequency range Uncertainty (+/-) No. 1 SAC / SR No. 2 SAC / SR No. 3 SAC / SR No. 4 SAC / SR Conducted emission (AC Mains) LISN 150 kHz-30 MHz 2.1 dB 2.1 dB 2.6 dB 2.2 dB Radiated emission 9 kHz-30 MHz 2.7 dB 2.7 dB 3.1 dB - (Measurement distance: 3 m) 30 MHz-300 MHz 4.4 dB 4.4 dB 4.6 dB - 300 MHz-1 GHz 5.6 dB 5.5 dB 5.3 dB - 1 GHz-13 GHz 5.2 dB 5.2 dB 5.2 dB - Radiated emission 13 GHz-18 GHz 4.9 dB 4.9 dB 4.9 dB - (Measurement distance: 1 m) 18 GHz-40 GHz 4.9 dB 4.9 dB 4.9 dB - SAC=Semi-Anechoic Chamber SR= Shielded Room is applied besides radiated emission Antenna terminal test Uncertainty (+/-) Power Measurement above 1 GHz (Average Detector)_SPM 0.76 dB Power Measurement above 1 GHz (Peak Detector)_SPM-06 0.79 dB Power Measurement above 1 GHz (Average Detector)_SPM 0.74 dB Power Measurement above 1 GHz (Peak Detector)_SPM-07 1.08 dB Spurious emission (Conducted) below 1GHz 1.5 dB Spurious emission (Conducted) 1 GHz-3 GHz 1.7 dB Spurious emission (Conducted) 3 GHz-18 GHz 2.4 dB Spurious emission (Conducted) 18 GHz-26.5 GHz 2.5 dB Spurious emission (Conducted) 26.5 GHz-40 GHz 2.5 dB Bandwidth Measurement 0.66 % Duty cycle and Time Measurement 0.012 % Radiated emission The data listed in this test report has enough margin, more than site margin. UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 11389963S-B-R1 Page : 7 of 24 Issued date : October 19, 2016 FCC ID : BKEF 3.5 Test location UL Japan, Inc. Shonan EM C Lab. 1-22-3, M egumigaoka, Hiratsuka-shi, Kanagawa-ken 259-1220 JAPAN Telephone: +81 463 50 6400, Facsimile: +81 463 50 6401 JAB Accreditation No. RTL02610 M aximum IC Registration Width x Depth x Size of reference ground plane (m) / Test site measurement Number Height (m) horizontal conducting plane distance No.1 Semi-anechoic 2973D-1 20.6 x 11.3 x 7.65 20.6 x 11.3 10m chamber No.2 Semi-anechoic 2973D-2 20.6 x 11.3 x 7.65 20.6 x 11.3 10m chamber No.3 Semi-anechoic 2973D-3 12.7 x 7.7 x 5.35 12.7 x 7.7 5m chamber No.4 Semi-anechoic - 8.1 x 5.1 x 3.55 8.1 x 5.1 - chamber No.1 Shielded room - 6.8 x 4.1 x 2.7 6.8 x 4.1 - No.2 Shielded room - 6.8 x 4.1 x 2.7 6.8 x 4.1 - No.3 Shielded room - 6.3 x 4.7 x 2.7 6.3 x 4.7 - No.4 Shielded room - 4.4 x 4.7 x 2.7 4.4 x 4.7 - No.5 Shielded room - 7.8 x 6.4 x 2.7 7.8 x 6.4 - No.6 Shielded room - 7.8 x 6.4 x 2.7 7.8 x 6.4 - No.8 shielded room - 3.45 x 5.5 x 2.4 3.45 x 5.5 - No.1 M easurement - 2.55 x 4.1 x 2.5 - - room 3.6 Test setup, Data of test & Test instruments Refer to APPENDIX 1 to 3. UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 11389963S-B-R1 Page : 8 of 24 Issued date : October 19, 2016 FCC ID : BKEF SECTION 4: Operation of E.U.T. during testing 4.1 Operating mode The EUT exercise program used during testing was designed to exercise the various system components in a manner similar to typical use. Test item Operating mode Tested frequency All items Transmitting 13.56 MHz Software: NFC Stack Test Tool ver. 1.41 Power settings: Fixed The carrier level and noise levels were confirmed with and without Tag, and the test was made with the condition that has the maximum noise. Combinations of the worst case Radiated emission (Carrier) Radiated spurious emission Radiated spurious emission (Below 30 MHz) (Above 30 MHz) With Tag (type A) With Tag (type A) With Tag (type B) Justification: The system was configured in typical fashion (as customer would normally use it) for testing. 4.2 Configuration and peripherals B1 or A: EUT B2 or B3 * Test data was taken under worse case conditions. Description of EUT and support equipment No. Item Model number Serial number Manufacturer Remarks A Bluetooth Product CTR-013 5 Mitsumi Electric Co., Ltd. EUT B1 RFID Tag NVL-001 314000AAADW2 Nintendo Co., Ltd. Type A B2 RFID Tag ST23ZR08 - ST Microelectronics Type B B3 RFID Tag - - - Type F UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 11389963S-B-R1 Page : 9 of 24 Issued date : October 19, 2016 FCC ID : BKEF SECTION 5: Radiated emission (Fundamental and Spurious emission) 5.1 Operating environment Test place : See test data (APPENDIX 1) Temperature : See test data (APPENDIX 1) Humidity : See test data (APPENDIX 1) 5.2 Test configuration EUT was placed on a platform of nominal size, 1.0 m by 1.5 m, raised 0.8 m above the conducting ground plane. The table is made of Styrofoam and covered with polyvinyl chloride. That has very low permittivity. Photographs of the set up are shown in Appendix 1. 5.3 Test conditions Frequency range : 9 kHz - 1 GHz Test distance : 3m EUT position : Table top 5.4 Test procedure The Radiated Electric Field Strength intensity has been measured on a semi-anechoic chamber with a ground plane at a distance of 3 m. Although these tests were performed other than open area test site, adequate comparison measurements were confirmed against 30 m open are test site. Therefore sufficient tests were made to demonstrate that the alternative site produces results that correlate with the ones of tests made in an open field based on KDB 937606. These tests were performed in semi anechoic chamber. Therefore the measured level of emissions may be higher than if measurements were made without a ground plane. However test results were confirmed to pass against standard limit. The Radiated Electric Field Strength intensity has been measured with a ground plane and at a distance of 3 m Frequency: From 9 kHz to 30 MHz at distance 3 m The EUT was rotated a full revolution in order to obtain the maximum value of the electric field intensity. The measurements were performed for vertical polarization (antenna angle: 0 deg.to 360 deg.) and horizontal polarization. Drawing of the antenna direction is shown in Figure 1. Frequency: From 30 MHz to 1 GHz at distance 3 m (Refer to Figure 2). The measuring antenna height was varied between 1 and 4 m and EUT was rotated a full revolution in order to obtain the maximum value of the electric field intensity. The measurements were performed for both vertical and horizontal antenna polarization. Measurements were performed with QP, PK, and AV detector. The radiated emission measurements were made with the following detector function of the test receiver. 9 kHz to 90 kHz & 90 kHz to 150 kHz 490 kHz to 30 MHz to 1 GHz 110 kHz to 150 kHz 110 kHz to 490 kHz 30 MHz Detector Type PK/AV QP PK/AV QP QP IF Bandwidth 200 Hz 200 Hz 9 kHz 9 kHz 120 kHz Measuring Loop antenna Biconical (30 MHz-299.99 MHz) antenna Logperiodic (300 MHz-1 GHz) * FCC 15.31 (f)(2) (9 kHz-30 MHz) 9 kHz – 490 kHz [Limit at 3 m]= [Limit at 300 m]-40 log (3 [m]/300 [m]) 490 kHz – 30 MHz [Limit at 3 m]= [Limit at 30 m]-40 log (3 [m]/30 [m]) UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 11389963S-B-R1 Page : 10 of 24 Issued date : October 19, 2016 FCC ID : BKEF The carrier level and noise levels were confirmed at each position of X, Y and Z axes of EUT to see the position of maximum noise, and the test was made at the position that has the maximum noise. Refer to the data. 5.5 Results Summary of the test results : Pass No spurious emissions exceeded the fundamental emission level. Refer to APPENDIX 1. Figure 1. Direction of the Loop Antenna Horizontal (Top View) EUT Antenna was not rotated. Vertical (Side View) (Top View) EUT 135deg 90deg EUT 45deg 0deg Front side: 0 deg. Forward direction: clockwise Figure 2. Antenna angle Radiated Emission No.1 Semi-Anechoic Chamber (Antenna angle) (Below 1GHz) Biconical Antenna TurnTable 45 de 17 d eg. g. Measuring Distance 2m / 1t 5m / 5t 10m : RED LINE 0 deg. 3m : GREEN LINE eg. -17 d g. de 5 -4 Logperiodic Antenna UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 11389963S-B-R1 Page : 11 of 24 Issued date : October 19, 2016 FCC ID : BKEF SECTION 6: 20dB bandwidth & Occupied bandwidth (99 %) Test procedure The test was measured with a spectrum analyzer using a test fixture. Results Summary of the test results: Pass Refer to APPENDIX 1. SECTION 7: Frequency tolerances Test procedure The test was measured with a spectrum analyzer using a test fixture. The temperature test was started after the temperature stabilization time of 30 minutes. The test was begun from 50 deg.C and the temperature was lowered each 10 deg.C. Results Summary of the test results: Pass Refer to APPENDIX 1. UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test Report No. ： 11389963S-B-R1 APPENDIX 1: Data of Radio tests Data of Electric field strength of Fundamental emission and Spurious emission within the band: FCC15.225(a)(b)(c) UL Japan, Inc. Shonan EMC Lab., No.1 Semi Anechoic Chamber Company: MITSUMI ELECTRIC CO., LTD. Regulation: FCC Part15 Subpart C 15.225 Equipment: RFID Product Test Distance: 3m Model: CTR-013 Date: Augst 8, 2016 Sample No.: 5 Temperature: 24 deg.C Power: DC3 V Humidity: 55 %RH Mode: Transmitting 13.56MHz ENGINEER: Hiroyuki Morikawa Remarks: : TAG: Type A (Axis:Hor_Y / Ver_Y) , Vertical polarization (antenna angle) of the worst case: 0 degree Fundamental emission No. FREQ Test Receiver Antenna Loss AMP Distance RESULT LIMIT MARGIN Reading Factor GAIN factor (30m) Hor Ver Hor Ver Hor Ver [MHz] [dBuV] [dBuV] [dB/m] [dB] [dB] [dB] [dBuV/m] [dBuV/m] [dBuV/m] [dB] [dB] 1 13.560 60.50 68.80 18.38 6.67 31.84 -40.0 13.71 22.01 83.90 70.19 61.89 Calculation:Result[dBuV/m]=Reading[dBuV]+Ant.Fac[dB/m]+Loss(Cable+ATT)[dB]-Gain(AMP)[dB]+Distance factor[dB] Distance factor: 40 x log (3m/30m) = -40 dB Limits (30m) ･13.553MHz to 13.567MHz : 83.9dBuV/m (FCC 15.225(a)) Spurious emission within the band No. FREQ Test Receiver Antenna Loss AMP Distance RESULT LIMIT MARGIN Reading Factor GAIN factor (30m) Hor Ver Hor Ver Hor Ver [MHz] [dBuV] [dBuV] [dB/m] [dB] [dB] [dB] [dBuV/m] [dBuV/m] [dBuV/m] [dB] [dB] 1 13.110 30.00 29.90 18.37 6.66 31.84 -40.0 -16.81 -16.91 29.50 46.31 46.41 2 13.410 30.10 30.00 18.37 6.67 31.84 -40.0 -16.70 -16.80 40.50 57.20 57.30 3 13.553 57.90 54.80 18.38 6.67 31.84 -40.0 11.11 8.01 50.40 39.29 42.39 4 13.567 56.10 54.40 18.38 6.67 31.84 -40.0 9.31 7.61 50.40 41.09 42.79 5 13.710 30.00 30.10 18.38 6.67 31.84 -40.0 -16.79 -16.69 40.50 57.29 57.19 6 14.010 30.00 30.00 18.38 6.68 31.84 -40.0 -16.78 -16.78 29.50 46.28 46.28 Calculation:Result[dBuV/m]=Reading[dBuV]+Ant.Fac[dB/m]+Loss(Cable+ATT)[dB]-Gain(AMP)[dB]+Distance factor[dB] Outside filed strength frequencies ･Fc±7kHz:13.553MHz to 13.567MHz ･Fc±150kHz:13.410MHz to 13.710MHz ･Fc±450kHz:13.110MHz to 14.010MHz Fc = 13.56MHz Limits (30m) ･13.410MHz to 13.553MHz and 13.567MHz to 13.710MHz : 50.4dBuV/m (FCC 15.225(b)) ･13.110MHz to 13.410MHz and 13.710MHz to 14.010MHz : 40.5dBuV/m (FCC 15.225(c)) ･Below 13.110MHz and Above 14.010MHz : 29.5dBuV/m (FCC 15.225(d)and FCC 15.209) UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220 Telephone :+81 463 50 6400 Facsimile : +81 463 50 6401 12 of 24

Test Report No. ： 11389963S-B-R1 Radiated Emission UL Japan, Inc. Shonan EMC Lab. No.1 Semi Anechoic Chamber Company: MITSUMI ELECTRIC CO., LTD. Regulation: FCC Part15 Subpart C 15.225 Equipment: RFID Product Test Distance: 3m Model: CTR-013 Date: Augst 8 , 2016 Sample No.: 5 Temperature: 24 deg.C Power: DC3 V Humidity: 55 %RH Mode: Transmitting 13.56MHz ENGINEER: Hiroyuki Morikawa EUT axis: Below 30MHz( Horizontal Y-axis, Vertical Y-axis), NFC type A, with Tag Above 30MHz( Horizontal: Y-axis, Vertical: Y-axis), NFC type B, with Tag Remarks: Polarity Frequency Detector Reading Ant.Fac. Loss Gain Distance Factor Result Limit Margin Height Angle Remark [MHz] [dBuV] [dB/m] [dB] [dB] [dB] [dBuV/m] [dBuV/m] [dB] [cm] [deg.] Hori. 27.12 QP 29.40 18.64 6.97 31.83 -40.0 -16.82 29.50 46.32 - 0 * Limit: 30m Hori. 40.680 QP 30.36 13.71 7.26 31.82 19.51 40.00 20.49 241 221 Hori. 54.240 QP 23.93 9.05 7.42 31.82 8.58 40.00 31.40 320 211 Hori. 67.800 QP 30.63 6.26 7.36 31.81 12.44 40.00 27.56 278 34 Hori. 81.360 QP 22.21 6.12 8.35 31.81 4.87 40.00 35.13 244 232 Hori. 94.920 QP 30.18 8.77 8.29 31.80 15.44 43.50 28.06 174 29 Vert. 27.12 QP 29.40 18.64 6.97 31.83 -40.0 -16.82 29.50 46.32 - 0 * Limit: 30m Vert. 40.680 QP 38.60 13.71 7.26 31.82 27.75 40.00 12.25 100 129 Vert. 54.240 QP 27.48 9.05 7.42 31.82 12.13 40.00 27.87 100 309 Vert. 67.800 QP 36.33 6.26 7.36 31.81 18.14 40.00 21.86 100 315 Vert. 81.360 QP 24.65 6.12 8.35 31.81 7.31 40.00 32.69 100 309 Vert. 94.920 QP 38.40 8.77 8.29 31.80 23.66 43.50 19.84 100 138 Result = Reading + Ant Factor + Loss (Cable+ATT+ΔAF(above 30MHz)) - Gain(Amprifier) + Distance factor(below 30MHz) * Other frequency noises omitted in this report were not seen or have enough margin (more than 20dB). * Carrier level (Result at 3m): Hor= 53.7dBuV/m, Ver= 62 dBuV/m UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220 Telephone :+81 463 50 6400 Facsimile : +81 463 50 6401 13 of 24

Test Report No. ： 11389963S-B-R1 Radiated Emission (Worst mode plot) UL Japan, Inc. Shonan EMC Lab. No.1 Semi Anechoic Chamber Company: MITSUMI ELECTRIC CO., LTD. Regulation: FCC Part15 Subpart C 15.225 Equipment: RFID Product Test Distance: 3m Model: CTR-013 Date: Augst 8 , 2016 Sample No.: 5 Temperature: 24 deg.C Power: DC3 V Humidity: 55 %RH Mode: Transmitting 13.56MHz ENGINEER: Hiroyuki Morikawa EUT axis: Below 30MHz( Horizontal Y-axis, Vertical Y-axis), NFC type A, with Tag Above 30MHz( Horizontal: Y-axis, Vertical: Y-axis), NFC type B, with Tag Remarks: These plots data contains sufficient number to show the trend of characteristic features for EUT. Spurious emission plot 90 80 70 60 50 Result [dBμV/m] 40 30 QP,AV Limit 20 PK Limit 10 Hori./QP,AV 0 Hori./PK -10 Vert./QP,AV -20 Vert./PK -30 -40 -50 -60 0.001 0.01 0.1 1 10 100 1000 Frequency [MHz] Within band plot 90 80 70 60 50 Result [dBμV/m] 40 30 20 QP Limit 10 Hori./QP 0 Vert./QP -10 -20 -30 -40 -50 -60 13 13.2 13.4 13.6 13.8 14 Frequency [MHz] UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220 Telephone :+81 463 50 6400 Facsimile : +81 463 50 6401 14 of 24

Test Report No. ： 11389963S-B-R1 20dB bandwidth & 99% Occupied bandwidth: FCC 15.215 / RSS-Gen UL Japan, Inc. Shonan EMC Lab. No.5 Shielded Room Company: MITSUMI ELECTRIC CO., LTD. Regulation: FCC Part15 Subpart C 15.215 Equipment: RFID Product Model: CTR-013 Date: August 17, 2016 Sample No.: 5 Temperature: 23 deg.C Power: DC3 V Humidity: 55 %RH Mode: Transmitting 13.56MHz ENGINEER: Kazutaka Takeyama : TAG: Type A 20dB Bandwidth: 5.101 kHz 99% Occupied Bandwidth: 11.738 kHz UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220 Telephone :+81 463 50 6400 Facsimile : +81 463 50 6401 15 of 24

Test Report No. ： 11389963S-B-R1 20dB bandwidth & 99% Occupied bandwidth: FCC 15.215 / RSS-Gen UL Japan, Inc. Shonan EMC Lab. No.5 Shielded Room Company: MITSUMI ELECTRIC CO., LTD. Regulation: FCC Part15 Subpart C 15.215 Equipment: RFID Product Model: CTR-013 Date: August 17, 2016 Sample No.: 5 Temperature: 23 deg.C Power: DC3 V Humidity: 55 %RH Mode: Transmitting 13.56MHz ENGINEER: Kazutaka Takeyama : TAG: Type B 20dB Bandwidth: 3.105 kHz 99% Occupied Bandwidth: 2.550 kHz UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220 Telephone :+81 463 50 6400 Facsimile : +81 463 50 6401 16 of 24

Test Report No. ： 11389963S-B-R1 20dB bandwidth & 99% Occupied bandwidth: FCC 15.215 / RSS-Gen UL Japan, Inc. Shonan EMC Lab. No.5 Shielded Room Company: MITSUMI ELECTRIC CO., LTD. Regulation: FCC Part15 Subpart C 15.215 Equipment: RFID Product Model: CTR-013 Date: August 17, 2016 Sample No.: 5 Temperature: 23 deg.C Power: DC3 V Humidity: 55 %RH Mode: Transmitting 13.56MHz ENGINEER: Kazutaka Takeyama : TAG: Type F 20dB Bandwidth: 5.077 kHz 99% Occupied Bandwidth: 12.292 kHz UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220 Telephone :+81 463 50 6400 Facsimile : +81 463 50 6401 17 of 24

Test Report No. ： 11389963S-B-R1 Data of Frequency Tolerance UL Japan, Inc. Shonan EMC Lab. No.5 Shielded room Company MITSUMI ELECTRIC CO., LTD. Equipment RFID Product Regulation FCC Part15 Subpart C 15.225 (e) Model CTR-013 Date Augst 5, 2016 Serial No. 5 Temperature 24 deg.C Power DC 3V Humidity 40 %RH Mode Transmitting 13.56 MHz ENGINEER Hikaru Shirasawa Temperature Variation: -20deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.559869 -0.000131 -0.00097 0.010 after 2minutes 13.56 13.559904 -0.000096 -0.00071 0.010 after 5minutes 13.56 13.559882 -0.000118 -0.00087 0.010 after 10minutes 13.56 13.559900 -0.000100 -0.00074 0.010 Temperature Variation: -10deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.559933 -0.000067 -0.00049 0.010 after 2minutes 13.56 13.559941 -0.000059 -0.00044 0.010 after 5minutes 13.56 13.559935 -0.000065 -0.00048 0.010 after 10minutes 13.56 13.559936 -0.000064 -0.00047 0.010 Temperature Variation: 0deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.559966 -0.000034 -0.00025 0.010 after 2minutes 13.56 13.559970 -0.000030 -0.00022 0.010 after 5minutes 13.56 13.559971 -0.000029 -0.00021 0.010 after 10minutes 13.56 13.559969 -0.000031 -0.00023 0.010 Temperature Variation: 10deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.559975 -0.000025 -0.00018 0.010 after 2minutes 13.56 13.559974 -0.000026 -0.00019 0.010 after 5minutes 13.56 13.559975 -0.000025 -0.00018 0.010 after 10minutes 13.56 13.559974 -0.000026 -0.00019 0.010 Temperature Variation: 20deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.559968 -0.000032 -0.00024 0.010 after 2minutes 13.56 13.559968 -0.000032 -0.00024 0.010 after 5minutes 13.56 13.559967 -0.000033 -0.00024 0.010 after 10minutes 13.56 13.559966 -0.000034 -0.00025 0.010 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401 18 of 24

Test Report No. ： 11389963S-B-R1 Data of Frequency Tolerance Temperature Variation: 30deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.559955 -0.000045 -0.00033 0.010 after 2minutes 13.56 13.559954 -0.000046 -0.00034 0.010 after 5minutes 13.56 13.559953 -0.000047 -0.00035 0.010 after 10minutes 13.56 13.559953 -0.000047 -0.00035 0.010 Temperature Variation: 40deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.559943 -0.000057 -0.00042 0.010 after 2minutes 13.56 13.559943 -0.000057 -0.00042 0.010 after 5minutes 13.56 13.559942 -0.000058 -0.00043 0.010 after 10minutes 13.56 13.559942 -0.000058 -0.00043 0.010 Temperature Variation: 50deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.559939 -0.000061 -0.00045 0.010 after 2minutes 13.56 13.559940 -0.000060 -0.00044 0.010 after 5minutes 13.56 13.559941 -0.000059 -0.00044 0.010 after 10minutes 13.56 13.559941 -0.000059 -0.00044 0.010 Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup #VALUE! #VALUE! 0.010 after 2minutes #VALUE! #VALUE! 0.010 after 5minutes #VALUE! #VALUE! 0.010 after 10minutes #VALUE! #VALUE! 0.010 Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup #VALUE! #VALUE! 0.010 after 2minutes #VALUE! #VALUE! 0.010 after 5minutes #VALUE! #VALUE! 0.010 after 10minutes #VALUE! #VALUE! 0.010 Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup #VALUE! #VALUE! 0.010 after 2minutes #VALUE! #VALUE! 0.010 after 5minutes #VALUE! #VALUE! 0.010 after 10minutes #VALUE! #VALUE! 0.010 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401 19 of 24

Test Report No. ： 11389963S-B-R1 Data of Frequency Tolerance UL Japan, Inc. Shonan EMC Lab. No.5 Shielded room Company MITSUMI ELECTRIC CO., LTD. Equipment RFID Product Regulation FCC Part15 Subpart C 15.225 (e) Model CTR-013 Date Augst 5, 2016 Serial No. 5 Temperature 24 deg.C Power DC 3V Humidity 40 %RH Mode Transmitting 13.56 MHz ENGINEER Hikaru Shirasawa Voltage Variation: DC 2.55 V Temperature Variation: 20deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.559967 -0.000033 -0.00024 0.010 after 2minutes 13.56 13.559967 -0.000033 -0.00024 0.010 after 5minutes 13.56 13.559966 -0.000034 -0.00025 0.010 after 10minutes 13.56 13.559966 -0.000034 -0.00025 0.010 Voltage Variation: DC 3.45 V Temperature Variation: 20deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.559966 -0.000034 -0.00025 0.010 after 2minutes 13.56 13.559966 -0.000034 -0.00025 0.010 after 5minutes 13.56 13.559965 -0.000035 -0.00026 0.010 after 10minutes 13.56 13.559965 -0.000035 -0.00026 0.010 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401 20 of 24

Test Report No. ： 11389963S-B-R1 Test Report No ： APPENDIX 2 Test Instruments EMI test equipment Control No. Instrument Manufacturer Model No Serial No Test Item Calibration Date * Interval(month) SFC-01 Microwave Counter Agilent 53151A US40511493 TF 2016/04/13 * 12 SCH-01 Temperature and Espec PL-1KT 14020837 TF 2016/04/14 * 12 Humidity Chamber SSCA-01 Search coil LANGER RF-R 400-1 02-0634 TF Pre Check SOS-09 Humidity Indicator A&D AD-5681 4061484 TF 2015/12/07 * 12 KTS-07 Digital Tester SANWA PC500 7019232 TF 2015/11/18 * 12 SSA-03 Spectrum Analyzer Agilent E4448A MY48250152 TF 2015/09/16 * 12 SAF-01 Pre Amplifier SONOMA 310N 290211 RE 2016/02/19 * 12 KAT6-04 Attenuator INMET 18N-6dB - RE 2015/12/18 * 12 SAT3-09 Attenuator JFW 50HF-003N - RE 2016/08/04 * 12 SBA-01 Biconical Antenna Schwarzbeck BBA9106 91032664 RE 2015/10/11 * 12 SCC-A1/A3/A5 Coaxial Cable&RF Fujikura/Fujikura/Suhne 8D2W/12DSFA/14 -/0901-269(RF RE 2016/04/22 * 12 /A7/A8/A13/S Selector r/Suhner/Suhner/Suhn 1PE/141PE/141PE Selector) RSE-01 er/TOYO /141PE/NS4906 SCC-A2/A4/A6 Coaxial Cable&RF Fujikura/Fujikura/Suhne 8D2W/12DSFA/14 -/0901-269(RF RE 2016/04/22 * 12 /A7/A8/A13/S Selector r/Suhner/Suhner/Suhn 1PE/141PE/141PE Selector) RSE-01 er/TOYO /141PE/NS4906 SLA-01 Logperiodic Antenna Schwarzbeck UHALP9108A UHALP 9108-A RE 2015/10/11 * 12 0888 SOS-01 Humidity Indicator A&D AD-5681 4062555 RE 2015/10/22 * 12 STR-01 Test Receiver Rohde & Schwarz ESU40 100093 RE 2015/11/06 * 12 KJM-09 Measure KOMELON KMC-36 - RE - SAEC-01(NSA) Semi-Anechoic Chamber TDK SAEC-01(NSA) 1 RE 2016/07/14 * 12 COTS-SEMI-1 EMI Software TSJ TEPTO-DV(RE,CE, - RE - RFI,MF) SLP-02 Loop Antenna Rohde & Schwarz HFH2-Z2 100218 RE 2015/11/14 * 12 SAT6-12 Attenuator HIROSE ELECTRIC AT-406(40) - RE 2016/08/04 * 12 CO.,LTD. The expiration date of the calibration is the end of the expired month . As for some calibrations performed after the tested dates , those test equipment have been controlled by means of an unbroken chains of calibrations . All equipment is calibrated with valid calibrations . Each measurement data is traceable to the national or international standards . Test Item： RE: Radiated emission , TF: Test Fixture tests End of Report 㼁㻸㻌㻶 㼍㼜㼍㼚㻘㻌㻵㼚㼏㻚㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻌㻼㼍㼓㼑㻌㻦 21 of 24


Document Created: 2016-10-19 09:40:39
Document Modified: 2016-10-19 09:40:39
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