03 FCC Test Report_DXX

FCC ID: AK8URXP40

Test Report

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FCCID_4411289

Test report No. : 12812924H-B-R2 Page : 1 of 34 Issued date : August 21, 2019 FCC ID : AK8URXP40 EMI TEST REPORT Test Report No. : 12812924H-B-R2 Applicant : Sony Corporation Type of Equipment : UHF SYNTHESIZED DIVERSITY TUNER Model No. : URX-P40 Test regulation : FCC Part 15 Subpart C: 2019 FCC ID : AK8URXP40 Test Result : Complied (Refer to SECTION 3.2) 1. This test report shall not be reproduced in full or partial, without the written approval of UL Japan, Inc. 2. The results in this report apply only to the sample tested. 3. This sample tested is in compliance with above regulation. 4. The test results in this report are traceable to the national or international standards. 5. This test report covers Radio technical requirements. It does not cover administrative issues such as Manual or non-Radio test related Requirements. (if applicable) 6. The all test items in this test report are conducted by UL Japan, Inc. Ise EMC Lab. 7. This test report must not be used by the customer to claim product certification, approval, or endorsement by NVLAP, NIST, or any agency of the Federal Government. 8. The information provided from the customer for this report is identified in SECTION 1. 9. This report is a revised version of 12812924H-B-R1. 12812924H-B-R1 is replaced with this report. Date of test: May 31 to June 2, 2019 Representative test engineer: Akihiko Maeda Engineer Consumer Technology Division Approved by: Tsubasa Takayama Leader Consumer Technology Division This laboratory is accredited by the NVLAP LAB CODE 200572-0, U.S.A. The tests reported herein have been performed in accordance with its terms of accreditation. *As for the range of Accreditation in NVLAP, you may refer to the WEB address, http://japan.ul.com/resources/emc_accredited/ The testing in which "Non-accreditation" is displayed is outside the accreditation scopes in UL Japan. There is no testing item of "Non-accreditation". UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124 Report Cover Page - 13-EM-F0429 Issue # 15.0

Test report No. : 12812924H-B-R2 Page : 2 of 34 Issued date : August 21, 2019 FCC ID : AK8URXP40 REVISION HISTORY Original Test Report No.: 12812924H-B Revision Test report No. Date Page revised Contents - 12812924H-B June 26, 2019 - - (Original) 1 12812924H-B-R1 August 9, 2019 P6 Correction of Worst margin of Conducted emission 1 12812924H-B-R1 August 9, 2019 P 19 Correction of test data 1 12812924H-B-R1 August 9, 2019 P 26 Addition of explanatory note for voltage 2 12812924H-B-R2 August 21, P8 Correction of Uncertainty for Frequency 2019 error UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124

Test report No. : 12812924H-B-R2 Page : 3 of 34 Issued date : August 21, 2019 FCC ID : AK8URXP40 CONTENTS PAGE SECTION 1: Customer information.......................................................................................................4 SECTION 2: Equipment under test (E.U.T.) .........................................................................................4 SECTION 3: Test specification, procedures & results..........................................................................6 SECTION 4: Operation of E.U.T. during testing ................................................................................10 SECTION 5: Conducted Emission ........................................................................................................13 SECTION 6: Radiated emission (Fundamental , Spurious Emission and Spectrum Mask) ...........14 SECTION 7: Other test..........................................................................................................................17 APPENDIX 1: Test data ........................................................................................................................18 Conducted Emission .........................................................................................................................18 Fundamental emission and Spectrum Mask ......................................................................................20 Spurious emission .............................................................................................................................21 20dB Bandwidth and 99 % Occupied Bandwidth.............................................................................23 Frequency Tolerance .........................................................................................................................25 APPENDIX 2: Test instruments ...........................................................................................................28 APPENDIX 3: Photographs of test setup .............................................................................................30 Conducted Emission .........................................................................................................................30 Radiated Emission.............................................................................................................................31 Worst Case Position ..........................................................................................................................32 UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124

Test report No. : 12812924H-B-R2 Page : 4 of 34 Issued date : August 21, 2019 FCC ID : AK8URXP40 SECTION 1: Customer information Company Name : Sony Global Manufacturing & Operations Corporation Address : 8-4, Shiomi, Kisarazu-shi, Chiba, 292-0834 Japan Telephone Number : +81-438-37-4704 Contact Person : Youhei Hisano *Remarks Sony Global Manufacturing & Operations Corporation (Subsidiary Company Name) is on behalf of the applicant: Sony Corporation. The information provided from the customer is as follows; - Applicant, Type of Equipment, Model No. FCC ID on the cover and other relevant pages - SECTION 1: Customer information - SECTION 2: Equipment under test (E.U.T.) - SECTION 4: Operation of E.U.T. during testing * The laboratory is exempted from liability of any test results affected from the above information in SECTION 2 and 4. SECTION 2: Equipment under test (E.U.T.) 2.1 Identification of E.U.T. Type of Equipment : UHF SYNTHESIZED DIVERSITY TUNER Model No. : URX-P40 Serial No. : Refer to Section 4, Clause 4.2 Rating : DC 3 V (Battery), DC 5 V (USB) Receipt Date of Sample : April 22, 2019 (Information from test lab.) Country of Mass-production : Korea Condition of EUT : Engineering prototype (Not for Sale: This sample is equivalent to mass-produced items.) Modification of EUT : No Modification by the test lab 2.2 Product Description Model: URX-P40 (referred to as the EUT in this report) is a UHF SYNTHESIZED DIVERSITY TUNER. Radio Specification Clock frequency(ies) in the system : DSP: 12 MHz (SPXO) PLL: 26 MHz (TCXO) Operating temperature : 0 deg. C to +50 deg. C UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124

Test report No. : 12812924H-B-R2 Page : 5 of 34 Issued date : August 21, 2019 FCC ID : AK8URXP40 Radio Specification [URX-P40] [Radio microphone part] Radio type : Receiver Modulation type : Frequency Modulation Channel spacing : 125 kHz Frequency of operation : URX-P40(UC14) : 470.125MHz - 541.875MHz URX-P40(UC25) : 536.125MHz - 607.875MHz URX-P40(U90) : 941.625MHz - 951.875MHz : 953.000MHz - 956.125MHz : 956.625MHz - 959.625MHz IF Frequency : 1st: 243.95 MHz 2nd: 10.8 MHz LO Frequency : 1st: Receiving frequency + 243.95 MHz 2nd: 233.15 MHz Antenna type : 1/4 Lambda Monopole antenna [NFC part] *1) Radio Type : Transceiver Modulation type : ASK (amplitude-shift keying) Frequency of Operation : 13.56 MHz Method of frequency generation : Crystal unit (SPXO) Antenna Type : Loop Antenna Antenna Gain : -63.1 dBi *1) This test report applies to NFC part. UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124

Test report No. : 1281292 4H—B—R2 Page : 6 of 34 Issued date : August 21, 2019 rce in : AKBURXP4D SECTION 3: Test specification, procedures & results 31 Test Specification Test Specification FCC Part 15 Subpart C FCC Part 15 final revised on June 4, 2019 and effective July 5, 2019 except 15.258 Title FCC 47CFR Part15 Radio Frequency Device Subpart C Intentional Radiators Section 15.207 Conducted limits Section 15.225 Operation within the band 13.110 MHz —14.010 MHz. * The revision on June 4, 2019, does not affect the test specification applied to the EUT . * Also the EUT complies with FCC Part 15 Subpart B. 32 Procedures and results Item Test Procedure Specification Worst margin Results_| Remarks |ANSI C63.10:2013 6.09 dB Conducted emission |6 Standard test methods [Section 15.207 0.19524 MHz Complied . ,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,, QP, L. a |<IC=RSS—Gen 8.8 <IC=RSS—Gen 8.8 Without Tag us |ANSI C63.10:2013 Electric Field Strength 6 Standard test methods |Section 15.225(a) 72.68 dB. Complied of Fundamental ' 13.56000 MHz, QP, bg Radiated Emission |<IC>RSS—Gen6.4,6.12_|<IC=RSS—210 B.6_ 0 deg. |ANSI C63.10:2013 Section 6 Standard test methods . 46.54 dB, Complied . Spectrum Mask __ _ __ 152250)(€) _ 13.11000 MHz, QP ty Radiated |<IC=RSS—Gen 6.4, 6.13 _|<IC> RSS—210 B.6 |ANSI C63.10:2013 204B Bandwidth 6 Standard test methods |Section15.215(c) See data Conghed Radiated erc= _ <c=. _ |ANSI C63.10:2013 . mm Section 15.209, 8.68 dB . Electric .Fleld St.tex?g'h 6 Standard test methods Section 15 225 (d) 352.560 MHz, Complied Radiated of Spurious Emission |.________.____________.____.|.........020000002 Hotizontal, QP d |<IC=RSS—Gen 6.4, 6.13 _|<IC=RSS—210 B.6 " |ANSI C63.10:2013 6 Standard test method: i . i . Frequency Tolerance andard test methods |Section 15.225(e) See data Conghed Radiated |<IC en 6.11,8.11 |<IC> RSS—210 B.6 [Note: UL Japan, Inc.‘s EMI Work Proceduzes No. 13—EM—W0420 and 13—EM—W0422 a) Refer to APPENDIX 1 (data of Conducted Emission) [b) Refer to APPENDIX 1 (data of Fundamental emission and Spectrum Mask) c) Refer to APPENDIX 1 (data of 200B Bandwidth and 99 % Occupied Bandwidth) d) Refer to APPENDIX 1 (data of Spurious emission} e) Refer to APPENDIX 1 (data of Frecuency Tolerance) Symbols: Complied The data of this test item has enough margin, more than the measurement uncertainty. Complied# The data of this test item meets the limits unless the measurementuncertainty is taken into consideration. UL Japan, Inc. Ise EMC Lab. 4383—326 Asama—cho, Ise—shi, Mie—ken 516—0021 IAPAN Telephone +81 596 24 8999 Facsimile +81 596 24 8124

Test report No. : 12812924H-B-R2 Page : 7 of 34 Issued date : August 21, 2019 FCC ID : AK8URXP40 FCC Part 15.31 (e) This EUT provides stable voltage constantly to RF Module regardless of input voltage. Therefore, this EUT complies with the requirement. However, the supply voltage was varied and tested at 85 % and 115 % of the nominal rated supply voltage during frequency tolerance test according to Section 15.225(e). FCC Part 15.203 Antenna requirement The antenna is not removable from the EUT. Therefore, the equipment complies with the antenna requirement of Section 15.203. UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124

Test report No. : 12812924H-B-R2 Page : 8 of 34 Issued date : August 21, 2019 FCC ID : AK8URXP40 3.3 Addition to standard Item Test Procedure Specification Worst margin Results Remarks 99 % Occupied - <IC>RSS-Gen 6.7 - N/A Radiated Band Width a) Note: UL Japan, Inc.’s EMI Work Procedures No. 13-EM-W0420 and 13-EM-W0422. a) Refer to APPENDIX 1 (data of 20dB Bandwidth and 99 % Occupied Bandwidth) Other than above, no addition, exclusion nor deviation has been made from the standard. 3.4 Uncertainty There is no applicable rule of uncertainty in this applied standard. Therefore, the following results are derived depending on whether or not laboratory uncertainty is applied. The following uncertainties have been calculated to provide a confidence level of 95% using a coverage factor k = 2. Conducted emission Frequency range using AMN(LISN) (+/-) 0.009 MHz to 0.15 MHz 3.8 dB 0.15 MHz to 30 MHz 3.4 dB Radiated emission Test distance (+/-) 9 kHz to 30 MHz 3m 3.3 dB 10 m 3.2 dB *Measurement distance Radiated emission (Below 1 GHz) Polarity (3 m*)(+/-) (10 m*)(+/-) 30 MHz to 200 MHz 200 MHz to 1000 MHz 30 MHz to 200 MHz 200 MHz to 1000 MHz Horizontal 4.8 dB 5.2 dB 4.8 dB 5.0 dB Vertical 5.0 dB 6.3 dB 4.9 dB 5.0 dB Radiated emission (Above 1 GHz) (3 m*)(+/-) (1 m*)(+/-) (10 m*)(+/-) 1 GHz to 6 GHz 6 GHz to 18 GHz 10 GHz to 26.5 GHz 26.5 GHz to 40 GHz 1 GHz to 18 GHz 5.0 dB 5.3 dB 5.8 dB 5.8 dB 5.2 dB * Measurement distance Antenna terminal test Uncertainty (+/-) Frequency error 13.56 MHz 0.01541 ppm UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124

Test report No. : 12812924H-B-R2 Page : 9 of 34 Issued date : August 21, 2019 FCC ID : AK8URXP40 3.5 Test Location UL Japan, Inc. Ise EM C Lab. *NVLAP Lab. code: 200572-0 / FCC Test Firm Registration Number: 199967 / ISED Lab Company Number: 2973C 4383-326 Asama-cho, Ise-shi, M ie-ken 516-0021 JAPAN Telephone: +81 596 24 8999, Facsimile: +81 596 24 8124 M aximum Width x Depth x Size of reference ground plane (m) / Test site Other rooms measurement Height (m) horizontal conducting plane distance No.1 semi-anechoic No.1 Power source 19.2 x 11.2 x 7.7 7.0 x 6.0 10 m chamber room No.2 semi-anechoic 7.5 x 5.8 x 5.2 4.0 x 4.0 - 3m chamber No.3 semi-anechoic No.3 Preparation 12.0 x 8.5 x 5.9 6.8 x 5.75 3m chamber room No.3 shielded room 4.0 x 6.0 x 2.7 N/A - - No.4 semi-anechoic No.4 Preparation 12.0 x 8.5 x 5.9 6.8 x 5.75 3m chamber room No.4 shielded room 4.0 x 6.0 x 2.7 N/A - - No.5 semi-anechoic 6.0 x 6.0 x 3.9 6.0 x 6.0 - - chamber No.5 measurement 6.4 x 6.4 x 3.0 6.4 x 6.4 - - room No.6 shielded room 4.0 x 4.5 x 2.7 4.0 x 4.5 - - No.6 measurement 4.75 x 5.4 x 3.0 4.75 x 4.15 - - room No.7 shielded room 4.7 x 7.5 x 2.7 4.7 x 7.5 - - No.8 measurement 3.1 x 5.0 x 2.7 3.1 x 5.0 - - room No.9 measurement 8.8 x 4.6 x 2.8 2.4 x 2.4 - - room No.11 measurement 6.2 x 4.7 x 3.0 4.8 x 4.6 - - room * Size of vertical conducting plane (for Conducted Emission test) : 2.0 x 2.0 m for No.1, No.2, No.3, and No.4 semi-anechoic chambers and No.3 and No.4 shielded rooms. 3.6 Test data, Test instruments, and Test set up Refer to APPENDIX. UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124

Test report No. : 12812924H-B-R2 Page : 10 of 34 Issued date : August 21, 2019 FCC ID : AK8URXP40 SECTION 4: Operation of E.U.T. during testing 4.1 Operating Mode(s) The mode is used : Mode Remarks *1) 1) Transmitting mode (Tx) The EUT Transmits and Receives at the same time (USB power Supply/ Battery power Supply/ and there is no receiving mode. MI-Shoe power Supply) The EUT was operated in a manner similar to typical use during the tests. The EUT Transmits and Receives at the same time and there is no receiving mode. Test Item Operating mode *2) Conducted Emission Tx Mod on, with Tag, without Tag Electric Field Strength of Fundamental Emission Tx Mod on, without Tag* Spectrum Mask Tx Mod on, without Tag* 20 dB Bandwidth Tx Mod on, without Tag* 99 % OccupiedBandwidth Electric Field Strength of Spurious Emission Tx Mod on, without Tag* Frequency Tolerance Tx Mod off *1) EUT has 3 kinds of power supply conditions (USB power Supply/ Battery power Supply/ MI-Shoe power Supply) , the tests were performed with the worst case. *2) After the comparison of the test data between with Tag and without Tag, the tests were performed with the worst case. Justification: The system was configured in typical fashion (as a user would normally use it) for testing. Frequency Tolerance: Temperature : -20 deg. C to +50 deg. C Step 10 deg. C (-30deg.C: Reference) Voltage : Normal Voltage DC 3 V (Battery) Maximum Voltage DC 3.45 V, Minimum Voltage DC 2.55 V (DC 3 V ±15 %) *This EUT provides stable voltage constantly to RF Part regardless of input voltage Frequency Tolerance: Temperature : -20 deg. C to +50 deg. C Step 10 deg. C (-30deg.C: Reference) Voltage : Normal Voltage DC 5 V (USB) Maximum Voltage DC 5.75 V,(DC 5 V +15 %) Minimum Voltage DC 4.61 V (Minimum Operating Voltage) *This EUT provides stable voltage constantly to RF Part regardless of input voltage Frequency Tolerance: Temperature : -20 deg. C to +50 deg. C Step 10 deg. C (-30deg.C: Reference) Voltage : Normal Voltage DC 7.2 V (MI-Shoe) Maximum Voltage DC 8.28 V, Minimum Voltage DC 6.12 V (DC 7.2 V ±15 %) *This EUT provides stable voltage constantly to RF Part regardless of input voltage UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124

Test report No. : 12812924H-B-R2 Page : 11 of 34 Issued date : August 21, 2019 FCC ID : AK8URXP40 4.2 Configuration and peripherals (USB power Supply/ Battery power Supply) C B 2 1 A 3 D 4 E 5 AC 120 V / 60 Hz : Standard Ferrite Core (MI-Shoe power Supply) C B 2 1 A F G * Cabling and setup were taken into consideration and test data was taken under worse case conditions. UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124

Test report No. : 12812924H-B-R2 Page : 12 of 34 Issued date : August 21, 2019 FCC ID : AK8URXP40 Description of EUT and Support equipment No. Item Model number Serial number Manufacturer Remark UHF URX-P40 ES No.001 Sony Corporation EUT A SYNTHESIZED DIVERSITY TUNER B 47kΩ terminator - - - - C Stereo headphone MDR-CD380 - Sony Corporation - D Laptop PC CF-N8HWCDPS OBKSA07449 Panasonic - E AC Adapter CF-AA6372B 6372BM40X17298B Panasonic - SHOE MOUNT SMAD-P5 ES No.001 Sony Corporation - F ADAPTOR G Li-ion Battery NP-FV100 - Sony Corporation - List of cables used No. Name Length (m) Shield Remark Cable Connector 1 Audio Cable 1.5 Shielded Shielded - 2 Headphone Cable 3.5 Shielded Shielded - 3 USB Cable 1.2 Shielded Shielded - 4 DC Cable 1.1 Unshielded Unshielded - 5 AC Cable 0.9 Unshielded Unshielded - UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124

Test report No. : 12812924H-B-R2 Page : 13 of 34 Issued date : August 21, 2019 FCC ID : AK8URXP40 SECTION 5: Conducted Emission Test Procedure and conditions EUT was placed on a urethane platform of nominal size, 1.0 m by 1.5 m, raised 0.8 m above the conducting ground plane. The rear of tabletop was located 40 cm to the vertical conducting plane. The rear of EUT, including peripherals aligned and flushed with rear of tabletop. All other surfaces of tabletop were at least 80 cm from any other grounded conducting surface. EUT was located 80 cm from a Line Impedance Stabilization Network (LISN)/ Artificial mains Network (AMN) and excess AC cable was bundled in center. For the tests on EUT with other peripherals (as a whole system) I/O cables that were connected to the peripherals were bundled in center. They were folded back and forth forming a bundle 30 cm to 40 cm long and were hanged at a 40 cm height to the ground plane. All unused 50 ohm connectors of the LISN (AMN) were resistivity terminated in 50 ohm when not connected to the measuring equipment. The AC Mains Terminal Continuous disturbance Voltage has been measured with the EUT in a Semi Anechoic Chamber. The EUT was connected to a LISN (AMN). An overview sweep with peak detection has been performed. [Test Setup] EUT Attenuator Test receiver LISN Ground plane The test results and limit are rounded off to one decimal place, so some differences might be observed. Detector : QP and CISPR AV Measurement range : 0.15 MHz - 30 MHz Test data : APPENDIX Test result : Pass UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124

Test report No. : 12812924H-B-R2 Page : 14 of 34 Issued date : August 21, 2019 FCC ID : AK8URXP40 SECTION 6: Radiated emission (Fundamental , Spurious Emission and Spectrum Mask) Test Procedure EUT was placed on a urethane platform of nominal size, 1.0 m by 1.5 m, raised 0.8 m above the conducting ground plane. The Radiated Electric Field Strength has been measured in a Semi Anechoic Chamber with a ground plane. Frequency: From 9 kHz to 30 MHz The EUT was rotated a full revolution in order to obtain the maximum value of the electric field intensity. The measurements were performed for vertical polarization (antenna angle: 0 deg., 45 deg., 90 deg., and 135 deg.) and horizontal polarization. *Refer to Figure 1 about Direction of the Loop Antenna. Frequency: From 30 MHz to 1 GHz The measuring antenna height varied between 1 and 4 m and EUT was rotated a full revolution in order to obtain the maximum value of the electric field intensity. The measurements were performed for both vertical and horizontal antenna polarization. The test was made with the detector (RBW/VBW) in the following table. When using Spectrum analyzer, the test was made with adjusting span to zero by using peak hold. Test Antennas are used as below; Frequency Below 30 MHz 30 MHz to 200 MHz 200 MHz to 1 GHz Antenna Type Loop Biconical Logperiodic Frequency From 9 kHz to 90 From 90 kHz to From 150 kHz From 490 kHz From 30 MHz kHz 110 kHz to 490 kHz to 30 MHz to 1 GHz and From 110 kHz to 150 kHz Instrument used Test Receiver Detector PK / AV QP PK / AV QP QP IF Bandwidth 200 Hz 200 Hz 9 kHz 9 kHz 120 kHz Test Distance 3 m *1) 3 m *1) 3 m *1) 3 m *2) 3m *1) Distance Factor: 40 x log (3 m / 300 m) = -80 dB *2) Distance Factor: 40 x log (3 m / 30 m) = -40 dB The test was performed on the worst mode by comparing modes, USB Supply, Battery Supply and MI-Shoe Supply. Although these tests were performed other than open field test site, adequate comparison measurements were confirmed against 30 m open field test site. Therefore sufficient tests were made to demonstrate that the alternative site produces results that correlate with the ones of tests made in an open field based on KDB 414788. These tests were performed in semi anechoic chamber. Therefore the measured level of emissions may be higher than if measurements were made without a ground plane. However test results were confirmed to pass against standard limit. UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124

Test report No. : 12812924H-B-R2 Page : 15 of 34 Issued date : August 21, 2019 FCC ID : AK8URXP40 [Test Setup] Below 1 GHz Test Distance: 3 m - The carrier level and noise levels were confirmed at each position of X, Y and Z axes of EUT to see the position of maximum noise, and the test was made at the position that has the maximum noise. The test results and limit are rounded off to one decimal place, so some differences might be observed. Measurement range : 9 kHz - 1 GHz Test data : APPENDIX 1 Test result : Pass UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124

Test report No. : 12812924H-B-R2 Page : 16 of 34 Issued date : August 21, 2019 FCC ID : AK8URXP40 Figure 1: Direction of the Loop Antenna Side View (Vertical) EUT Top View (Horizontal) EUT Antenna was not rotated. Top View (Vertical) 135deg EUT 90deg 45deg 0deg Front side: 0 deg. Forward direction: clockwise UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124

Test report No. : 12812924H-B-R2 Page : 17 of 34 Issued date : August 21, 2019 FCC ID : AK8URXP40 SECTION 7: Other test Test Span RBW VBW Sweep Detector Trace Instrument used 20 dB Bandwidth Between 2.0 times and 1 to 5 % Three times Auto Peak Max Hold Spectrum Analyzer 5.0 times of the OBW of OBW of RBW 99 % Occupied Between 1.5 times and 1 to 5 % Three times Auto Peak *1) Max Hold Spectrum Analyzer Bandwidth 5.0 times of the OBW of OBW of RBW *1) Frequency - - - - - - Frequency counter Tolerance *1) The measurement was performed with Peak detector, Max Hold since the duty cycle was not 100 %. Peak hold was applied as Worst-case measurement. Test data : APPENDIX Test result : Pass UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124

Test report No. : 12812924H-B-R2 Page : 18 of 34 Issued date : August 21, 2019 FCC ID : AK8URXP40 APPENDIX 1: Test data Conducted Emission Report No. 12812924H Test place Ise EMC Lab. Semi Anechoic Chamber No.3 Date June 1, 2019 Temperature / Humidity 23 deg. C / 58 % RH Engineer Akihiko Maeda Mode Mode 1 (with USB power Supply), With Tag Limit : FCC_Part 15 Subpart C(15.207) 90 Limit1(QP) Limit2(AV) 80 N (PK) N (QP/CAV) 70 L (PK) L (QP/CAV) 60 RFI Voltage [dBuV] 50 40 30 20 10 0 .2M .3M .5M .7M 1M 2M 3M 5M 7M 10M 20M .15M 30M Frequency [Hz] Reading Results Limit Margin Freq. LISN LOSS No. <QP> <CAV> <QP> <CAV> <QP> <AV> <QP> <AV> Phase Comment [MHz] [dBuV] [dBuV] [dB] [dB] [dBuV] [dBuV] [dBuV] [dBuV] [dB] [dB] 1 0.15000 37.80 14.50 0.06 13.15 51.01 27.71 66.00 56.00 14.99 28.29 N 2 0.19525 43.10 24.20 0.06 13.15 56.31 37.41 63.80 53.80 7.49 16.39 N 3 0.26078 32.40 14.60 0.05 13.16 45.61 27.81 61.40 51.40 15.79 23.59 N 4 0.32861 26.10 14.80 0.05 13.17 39.32 28.02 59.50 49.50 20.18 21.48 N 5 4.89475 12.10 7.80 0.15 13.44 25.69 21.39 56.00 46.00 30.31 24.61 N 6 13.56000 28.10 27.70 0.30 13.68 42.08 41.68 60.00 50.00 17.92 8.32 N Career 7 20.51695 23.30 18.40 0.37 13.84 37.51 32.61 60.00 50.00 22.49 17.39 N 8 0.15000 38.10 14.70 0.06 13.15 51.31 27.91 66.00 56.00 14.69 28.09 L 9 0.19497 43.50 24.20 0.06 13.15 56.71 37.41 63.80 53.80 7.09 16.39 L 10 0.25922 33.30 14.80 0.05 13.16 46.51 28.01 61.50 51.50 14.99 23.49 L 11 0.32363 28.80 14.80 0.05 13.17 42.02 28.02 59.60 49.60 17.58 21.58 L 12 4.90661 13.90 8.20 0.15 13.44 27.49 21.79 56.00 46.00 28.51 24.21 L 13 13.56000 27.80 27.50 0.30 13.68 41.78 41.48 60.00 50.00 18.22 8.52 L Career 14 20.44495 23.20 18.30 0.37 13.84 37.41 32.51 60.00 50.00 22.59 17.49 L CHART: WITH FACTOR Peak hold data. CALCULATION : RESULT = READING + C.F (LISN + CABLE + ATT) Except for the above table: adequate margin data below the limits. UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124

Test report No. : 12812924H-B-R2 Page : 19 of 34 Issued date : August 21, 2019 FCC ID : AK8URXP40 Conducted Emission Report No. 12812924H Test place Ise EMC Lab. Semi Anechoic Chamber No.3 Date June 1, 2019 Temperature / Humidity 23 deg. C / 58 % RH Engineer Akihiko Maeda Mode Mode 1 (with USB power Supply), Without Tag Limit : FCC_Part 15 Subpart C(15.207) 90 Limit1(QP) Limit2(AV) 80 N (PK) N (QP/CAV) 70 L (PK) L (QP/CAV) 60 RFI Voltage [dBuV] 50 40 30 20 10 0 .2M .3M .5M .7M 1M 2M 3M 5M 7M 10M 20M .15M 30M Frequency [Hz] Reading Results Limit Margin Freq. LISN LOSS No. <QP> <CAV> <QP> <CAV> <QP> <AV> <QP> <AV> Phase Comment [MHz] [dBuV] [dBuV] [dB] [dB] [dBuV] [dBuV] [dBuV] [dBuV] [dB] [dB] 1 0.15000 38.50 15.20 0.06 13.15 51.71 28.41 66.00 56.00 14.29 27.59 N 2 0.19461 44.00 24.40 0.06 13.15 57.21 37.61 63.80 53.80 6.59 16.19 N 3 0.25941 33.70 14.70 0.05 13.16 46.91 27.91 61.50 51.50 14.59 23.59 N 4 0.32394 28.40 14.30 0.05 13.17 41.62 27.52 59.60 49.60 17.98 22.08 N 5 4.76219 12.60 7.00 0.15 13.43 26.18 20.58 56.00 46.00 29.82 25.42 N 6 13.56000 27.10 26.50 0.30 13.68 41.08 40.48 60.00 50.00 18.92 9.52 N Career 7 20.67675 23.40 18.50 0.37 13.84 37.61 32.71 60.00 50.00 22.39 17.29 N 8 0.15000 39.60 16.20 0.06 13.15 52.81 29.41 66.00 56.00 13.19 26.59 L 9 0.19524 44.50 25.20 0.06 13.15 57.71 38.41 63.80 53.80 6.09 15.39 L 10 0.26310 34.60 17.00 0.05 13.16 47.81 30.21 61.30 51.30 13.49 21.09 L 11 0.32424 30.00 15.90 0.05 13.17 43.22 29.12 59.60 49.60 16.38 20.48 L 12 4.78033 13.30 8.00 0.15 13.43 26.88 21.58 56.00 46.00 29.12 24.42 L 13 13.56000 26.80 26.40 0.30 13.68 40.78 40.38 60.00 50.00 19.22 9.62 L Career 14 20.59655 23.60 18.90 0.37 13.84 37.81 33.11 60.00 50.00 22.19 16.89 L CHART: WITH FACTOR Peak hold data. CALCULATION : RESULT = READING + C.F (LISN + CABLE + ATT) Except for the above table: adequate margin data below the limits. UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124

Test report No. : 12812924H-B-R2 Page : 20 of 34 Issued date : August 21, 2019 FCC ID : AK8URXP40 Fundamental emission and Spectrum Mask Report No. 12812924H Test place Ise EMC Lab. Semi Anechoic Chamber No.3 Date May 31, 2019 Temperature / Humidity 24 deg. C / 42 % RH Engineer Akihiko Maeda Mode Mode 1 (with USB power Supply) Limit : FCC15.225(a), 9-90kHz:PK, 110-490kHz:PK, other:QP 150 Limit1(QP) 140 130 0deg(QP) 120 110 45deg(QP) 100 Field Strength [dBuV/m] 90 90deg(QP) 80 Except EUT 70 60 50 40 30 20 10 0 -10 -20 -30 12.66M 14.46M Frequency [Hz] Reading Result Limit Margin Freq. Ant.Fac Loss Gain Table No. <QP> <QP> <QP> <QP> Antenna Comment [MHz] [dBuV] [dB/m] [dB] [dB] [dBuV/m] [dBuV/m] [dB] [deg] 1 13.11000 29.20 19.29 -33.30 32.23 -17.04 29.50 46.54 0deg 183 2 13.41000 29.20 19.26 -33.29 32.23 -17.06 40.50 57.56 0deg 183 3 13.55300 39.70 19.24 -33.29 32.23 -6.58 50.40 56.98 0deg 183 4 13.56000 57.50 19.24 -33.29 32.23 11.22 83.90 72.68 0deg 181 0deg 5 13.56000 53.20 19.24 -33.29 32.23 6.92 83.90 76.98 0deg 160 45deg 6 13.56000 49.80 19.24 -33.29 32.23 3.52 83.90 80.38 0deg 269 90deg 7 13.56000 53.10 19.24 -33.29 32.23 6.82 83.90 77.08 0deg 13 135deg 8 13.56000 57.40 19.24 -33.29 32.23 11.12 83.90 72.78 0deg 188 180deg 9 13.56000 46.30 19.24 -33.29 32.23 0.02 83.90 83.88 0deg 190 Hori 10 13.56000 48.50 19.24 -33.29 32.23 2.22 83.90 81.68 0deg 198 0deg with Tag 11 13.56700 39.70 19.24 -33.29 32.23 -6.58 50.40 56.98 0deg 183 12 13.71000 29.10 19.23 -33.28 32.23 -17.18 40.50 57.68 0deg 183 13 14.01000 29.10 19.20 -33.27 32.23 -17.20 29.50 46.70 0deg 183 CHART: WITH FACTOR ANT TYPE: - 30 MHz: LOOP, 30 MHz - 200 MHz: BICONICAL, 200 MHz - 1000 MHz: LOGPERIODIC, 1000 MHz -: HORN CALCULATION: RESULT = READING + ANT FACTOR + LOSS(CABLE + ATT) - GAIN(AMP) Result of the fundamental emission at 3 m without Distance factor QP Ant Deg [deg] Frequency Detector Reading Ant Loss Gain Duty Result Limit Margin Remark 消すな Factor Factor [MHz] [dBuV] [dB/m] [dB] [dB] [dB] [dBuV/m] [dBuV/m] [dB] 0 13.56000 QP 57.5 19.2 6.7 32.2 - 51.2 - - Fundamental Result = Reading + Ant Factor + Loss (Cable+Attenuator+Filter) - Gain(Amprifier) 消すな UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124

Test report No. : 12812924H-B-R2 Page : 21 of 34 Issued date : August 21, 2019 FCC ID : AK8URXP40 Spurious emission Report No. 12812924H Test place Ise EMC Lab. Semi Anechoic Chamber No.3 Date May 31, 2019 Temperature / Humidity 24 deg. C / 42 % RH Engineer Akihiko Maeda (Below 30 MHz) Mode Mode 1 (with USB power Supply) Limit : FCC15.225(a), 9-90kHz:PK, 110-490kHz:PK, other:QP 100 Limit1(QP) 90 Limit2(AV) 80 70 0deg(QP/AV) 60 Except EUT Field Strength [dBuV/m] 50 40 30 20 10 0 -10 -20 -30 -40 -50 -60 -70 .01M .02M.03M .05M.07M.1M .2M .3M .5M .7M 1M 2M 3M 5M 7M 10M 20M 30M Frequency [Hz] Reading Result Limit Margin Freq. Ant.Fac Loss Gain Table No. <QP> <AV> <QP> <AV> <QP> <AV> <QP> <AV> Antenna Comment [MHz] [dBuV] [dBuV] [dB/m] [dB] [dB] [dBuV/m] [dBuV/m] [dBuV/m] [dBuV/m] [dB] [dB] [deg] 1 27.12000 34.90 --- 20.13 -32.98 32.22 -10.17 --- 29.50 29.50 39.67 --- 0deg 181 CHART: WITH FACTOR ANT TYPE: - 30 MHz: LOOP, 30 MHz - 200 MHz: BICONICAL, 200 MHz - 1000 MHz: LOGPERIODIC, 1000 MHz -: HORN CALCULATION: RESULT = READING + ANT FACTOR + LOSS(CABLE + ATT) - GAIN(AMP) UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124

Test report No. : 12812924H-B-R2 Page : 22 of 34 Issued date : August 21, 2019 FCC ID : AK8URXP40 Spurious emission Report No. 12812924H Test place Ise EMC Lab. Semi Anechoic Chamber No.3 Date June 1, 2019 Temperature / Humidity 23 deg. C / 58 % RH Engineer Akihiko Maeda (Above 30 MHz) Mode Mode 1 (with MI-Shoe power Supply ) Limit : FCC15.209 3 m, below 1 GHz:QP, above 1 GHz:AV/PK 110 Limit1(QP) 100 Hori.(QP) 90 Vert.(QP) 80 Field Strength [dBuV/m] 70 60 50 40 30 20 10 0 50 70 100 200 300 500 700 30 1000 Frequency [MHz] Reading Result Limit Margin Freq. Ant.Fac Loss Gain Pola. Height Angle Ant. No. <QP> <QP> <QP> <QP> Comment Type [MHz] [dBuV] [dB/m] [dB] [dB] [dBuV/m] [dBuV/m] [dB] [H/V] [cm ] [deg] 1 108.480 28.80 11.48 8.30 32.14 16.44 43.50 27.06 Hori. 286 154 BA 2 216.960 45.20 11.04 9.39 32.02 33.61 46.00 12.39 Hori. 147 184 LA22 3 251.903 47.70 11.76 9.69 31.98 37.17 46.00 8.83 Hori. 114 188 LA22 4 325.440 41.20 14.34 10.26 31.93 33.87 46.00 12.13 Hori. 100 166 LA22 5 339.000 39.20 14.79 10.36 31.93 32.42 46.00 13.58 Hori. 100 311 LA22 6 352.560 43.70 15.08 10.47 31.93 37.32 46.00 8.68 Hori. 100 321 LA22 7 108.480 27.30 11.48 8.30 32.14 14.94 43.50 28.56 Vert. 100 353 BA 8 216.960 38.60 11.04 9.39 32.02 27.01 46.00 18.99 Vert. 182 98 LA22 9 251.903 38.10 11.76 9.69 31.98 27.57 46.00 18.43 Vert. 160 238 LA22 10 325.440 40.00 14.34 10.26 31.93 32.67 46.00 13.33 Vert. 100 266 LA22 11 339.000 33.50 14.79 10.36 31.93 26.72 46.00 19.28 Vert. 100 70 LA22 12 352.560 37.60 15.08 10.47 31.93 31.22 46.00 14.78 Vert. 125 70 LA22 CHART: WITH FACTOR ANT TYPE: - 30 MHz: LOOP, 30 MHz - 200 MHz: BICONICAL, 200 MHz - 1000 MHz: LOGPERIODIC, 1000 MHz -: HORN CALCULATION: RESULT = READING + ANT FACTOR + LOSS(CABLE + ATT) - GAIN(AMP) UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124

Test report No. : 12812924H-B-R2 Page : 23 of 34 Issued date : August 21, 2019 FCC ID : AK8URXP40 20dB Bandwidth and 99 % Occupied Bandwidth Report No. 12812924H Test place Ise EMC Lab. Semi Anechoic Chamber No.3 Date June 1, 2019 Temperature / Humidity 23 deg. C / 58 % RH Engineer Akihiko Maeda Mode Mode 1 (with USB power Supply), With Tag FREQ 20dB Bandwidth 99% Occupied Bandwidth [MHz] [kHz] [kHz] 13.56 228.29 436.75 UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124

Test report No. : 12812924H-B-R2 Page : 24 of 34 Issued date : August 21, 2019 FCC ID : AK8URXP40 20dB Bandwidth and 99 % Occupied Bandwidth Report No. 12812924H Test place Ise EMC Lab. Semi Anechoic Chamber No.3 Date June 1, 2019 Temperature / Humidity 23 deg. C / 58 % RH Engineer Akihiko Maeda Mode Mode 1, Without Tag FREQ 20dB Bandwidth 99% Occupied Bandwidth [MHz] [kHz] [kHz] 13.56 228.16 435.92 UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124

Test report No. : 12812924H-B-R2 Page : 25 of 34 Issued date : August 21, 2019 FCC ID : AK8URXP40 Frequency Tolerance Report No. 12812924H Test place Ise EMC Lab. Shielded Room No.6 Date May 31, 2019 Temperature / Humidity 24 deg. C / 45 % RH Engineer Hiroyuki Furutaka Mode Mode 1 (with Battery power Supply) Test condition Tested Measured Frequency Result Limit Temp. Voltage timing frequency error [deg. C] [V] [MHz] [MHz] [%] [ppm] [+/- %] 50 3 Power on 13.559974 -0.000026 -0.00019 -1.9 0.01 + 2 min. 13.559968 -0.000032 -0.00024 -2.4 0.01 + 5 min. 13.559966 -0.000034 -0.00025 -2.5 0.01 + 10 min. 13.559966 -0.000034 -0.00025 -2.5 0.01 40 3 Power on 13.560007 0.000007 0.00005 0.5 0.01 + 2 min. 13.559993 -0.000007 -0.00005 -0.5 0.01 + 5 min. 13.559992 -0.000008 -0.00006 -0.6 0.01 + 10 min. 13.559991 -0.000009 -0.00007 -0.7 0.01 30 3 Power on 13.560044 0.000044 0.00032 3.2 0.01 + 2 min. 13.560030 0.000030 0.00022 2.2 0.01 + 5 min. 13.560030 0.000030 0.00022 2.2 0.01 + 10 min. 13.560030 0.000030 0.00022 2.2 0.01 20 3 Power on 13.560060 0.000060 0.00044 4.4 0.01 + 2 min. 13.560048 0.000048 0.00035 3.5 0.01 + 5 min. 13.560045 0.000045 0.00033 3.3 0.01 + 10 min. 13.560044 0.000044 0.00032 3.2 0.01 20 2.55 Power on 13.560054 0.000054 0.00040 4.0 0.01 (3V -15%) + 2 min. 13.560039 0.000039 0.00029 2.9 0.01 + 5 min. 13.560039 0.000039 0.00029 2.9 0.01 + 10 min. 13.560041 0.000041 0.00030 3.0 0.01 20 3.45 Power on 13.560050 0.000050 0.00037 3.7 0.01 (3V +15%) + 2 min. 13.560041 0.000041 0.00030 3.0 0.01 + 5 min. 13.560040 0.000040 0.00029 2.9 0.01 + 10 min. 13.560041 0.000041 0.00030 3.0 0.01 10 3 Power on 13.560130 0.000130 0.00096 9.6 0.01 + 2 min. 13.560121 0.000121 0.00089 8.9 0.01 + 5 min. 13.560119 0.000119 0.00088 8.8 0.01 + 10 min. 13.560128 0.000128 0.00094 9.4 0.01 0 3 Power on 13.560169 0.000169 0.00125 12.5 0.01 + 2 min. 13.560157 0.000157 0.00116 11.6 0.01 + 5 min. 13.560160 0.000160 0.00118 11.8 0.01 + 10 min. 13.560161 0.000161 0.00119 11.9 0.01 -10 3 Power on 13.560178 0.000178 0.00131 13.1 0.01 + 2 min. 13.560176 0.000176 0.00130 13.0 0.01 + 5 min. 13.560178 0.000178 0.00131 13.1 0.01 + 10 min. 13.560179 0.000179 0.00132 13.2 0.01 -20 3 Power on 13.560179 0.000179 0.00132 13.2 0.01 + 2 min. 13.560179 0.000179 0.00132 13.2 0.01 + 5 min. 13.560178 0.000178 0.00131 13.1 0.01 + 10 min. 13.560175 0.000175 0.00129 12.9 0.01 Calculation formula: Frequency error = Measured frequency - Tested frequency Result [%] = Frequency error / Tested frequency * 100 *The test was begun from 50 deg.C and the temperature was lowered each 10 deg.C UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124

Test report No. : 12812924H-B-R2 Page : 26 of 34 Issued date : August 21, 2019 FCC ID : AK8URXP40 Frequency Tolerance Report No. 12812924H Test place Ise EMC Lab. Shielded Room No.6 Date June 2, 2019 Temperature / Humidity 24 deg. C / 45 % RH Engineer Hiroyuki Furutaka Mode Mode 1 (with USB power Supply) Test condition Tested Measured Frequency Result Limit Temp. Voltage timing frequency error [deg. C] [V] [MHz] [MHz] [%] [ppm] [+/- %] 50 5 Power on 13.559962 -0.000038 -0.00028 -2.8 0.01 + 2 min. 13.559958 -0.000042 -0.00031 -3.1 0.01 + 5 min. 13.559952 -0.000048 -0.00035 -3.5 0.01 + 10 min. 13.559943 -0.000057 -0.00042 -4.2 0.01 40 5 Power on 13.559981 -0.000019 -0.00014 -1.4 0.01 + 2 min. 13.559967 -0.000033 -0.00024 -2.4 0.01 + 5 min. 13.559962 -0.000038 -0.00028 -2.8 0.01 + 10 min. 13.559960 -0.000040 -0.00029 -2.9 0.01 30 5 Power on 13.560021 0.000021 0.00015 1.5 0.01 + 2 min. 13.560007 0.000007 0.00005 0.5 0.01 + 5 min. 13.559999 -0.000001 -0.00001 -0.1 0.01 + 10 min. 13.559997 -0.000003 -0.00002 -0.2 0.01 20 5 Power on 13.560067 0.000067 0.00049 4.9 0.01 + 2 min. 13.560043 0.000043 0.00032 3.2 0.01 + 5 min. 13.560037 0.000037 0.00027 2.7 0.01 + 10 min. 13.560032 0.000032 0.00024 2.4 0.01 20 4.61 Power on 13.560080 0.000080 0.00059 5.9 0.01 (Minimum Operating Voltage) + 2 min. 13.560056 0.000056 0.00041 4.1 0.01 + 5 min. 13.560053 0.000053 0.00039 3.9 0.01 + 10 min. 13.560053 0.000053 0.00039 3.9 0.01 20 5.75 Power on 13.560084 0.000084 0.00062 6.2 0.01 (5V +15%) + 2 min. 13.560059 0.000059 0.00044 4.4 0.01 + 5 min. 13.560049 0.000049 0.00036 3.6 0.01 + 10 min. 13.560053 0.000053 0.00039 3.9 0.01 10 5 Power on 13.560134 0.000134 0.00099 9.9 0.01 + 2 min. 13.560106 0.000106 0.00078 7.8 0.01 + 5 min. 13.560104 0.000104 0.00077 7.7 0.01 + 10 min. 13.560103 0.000103 0.00076 7.6 0.01 0 5 Power on 13.560159 0.000159 0.00117 11.7 0.01 + 2 min. 13.560139 0.000139 0.00103 10.3 0.01 + 5 min. 13.560140 0.000140 0.00103 10.3 0.01 + 10 min. 13.560139 0.000139 0.00103 10.3 0.01 -10 5 Power on 13.560163 0.000163 0.00120 12.0 0.01 + 2 min. 13.560161 0.000161 0.00119 11.9 0.01 + 5 min. 13.560160 0.000160 0.00118 11.8 0.01 + 10 min. 13.560163 0.000163 0.00120 12.0 0.01 -20 5 Power on 13.560150 0.000150 0.00111 11.1 0.01 + 2 min. 13.560167 0.000167 0.00123 12.3 0.01 + 5 min. 13.560165 0.000165 0.00122 12.2 0.01 + 10 min. 13.560164 0.000164 0.00121 12.1 0.01 Calculation formula: Frequency error = Measured frequency - Tested frequency Result [%] = Frequency error / Tested frequency * 100 *The test was begun from 50 deg.C and the temperature was lowered each 10 deg.C. ** Since the EUT does not operate at voltages below 4.60 V, the voltage confirmation test was performed at 4.61 V as lower limit. UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124

Test report No. : 12812924H-B-R2 Page : 27 of 34 Issued date : August 21, 2019 FCC ID : AK8URXP40 Frequency Tolerance Report No. 12812924H Test place Ise EMC Lab. Shielded Room No.6 Date June 2, 2019 Temperature / Humidity 24 deg. C / 43 % RH Engineer Tomohisa Nakagawa Mode Mode 1 (with MI-Shoe power Supply) Test condition Tested Measured Frequency Result Limit Temp. Voltage timing frequency error [deg. C] [V] [MHz] [MHz] [%] [ppm] [+/- %] 50 7.2 Power on 13.559963 -0.000037 -0.00027 -2.7 0.01 + 2 min. 13.559948 -0.000052 -0.00038 -3.8 0.01 + 5 min. 13.559944 -0.000056 -0.00041 -4.1 0.01 + 10 min. 13.559941 -0.000059 -0.00044 -4.4 0.01 40 7.2 Power on 13.559973 -0.000027 -0.00020 -2.0 0.01 + 2 min. 13.559972 -0.000028 -0.00021 -2.1 0.01 + 5 min. 13.559961 -0.000039 -0.00029 -2.9 0.01 + 10 min. 13.559960 -0.000040 -0.00029 -2.9 0.01 30 7.2 Power on 13.560016 0.000016 0.00012 1.2 0.01 + 2 min. 13.560000 0.000000 0.00000 0.0 0.01 + 5 min. 13.559998 -0.000002 -0.00001 -0.1 0.01 + 10 min. 13.559999 -0.000001 -0.00001 -0.1 0.01 20 7.2 Power on 13.560071 0.000071 0.00052 5.2 0.01 + 2 min. 13.560051 0.000051 0.00038 3.8 0.01 + 5 min. 13.560047 0.000047 0.00035 3.5 0.01 + 10 min. 13.560045 0.000045 0.00033 3.3 0.01 20 6.12 Power on 13.560054 0.000054 0.00040 4.0 0.01 (7.2V -15%) + 2 min. 13.560043 0.000043 0.00032 3.2 0.01 + 5 min. 13.560043 0.000043 0.00032 3.2 0.01 + 10 min. 13.560043 0.000043 0.00032 3.2 0.01 20 8.28 Power on 13.560054 0.000054 0.00040 4.0 0.01 (7.2V +15%) + 2 min. 13.560043 0.000043 0.00032 3.2 0.01 + 5 min. 13.560043 0.000043 0.00032 3.2 0.01 + 10 min. 13.560043 0.000043 0.00032 3.2 0.01 10 7.2 Power on 13.560113 0.000113 0.00084 8.4 0.01 + 2 min. 13.560097 0.000097 0.00071 7.1 0.01 + 5 min. 13.560101 0.000101 0.00075 7.5 0.01 + 10 min. 13.560105 0.000104 0.00077 7.7 0.01 0 7.2 Power on 13.560166 0.000166 0.00122 12.2 0.01 + 2 min. 13.560148 0.000148 0.00109 10.9 0.01 + 5 min. 13.560147 0.000147 0.00108 10.8 0.01 + 10 min. 13.560146 0.000146 0.00108 10.8 0.01 -10 7.2 Power on 13.560165 0.000165 0.00121 12.1 0.01 + 2 min. 13.560163 0.000163 0.00120 12.0 0.01 + 5 min. 13.560163 0.000163 0.00120 12.0 0.01 + 10 min. 13.560164 0.000163 0.00121 12.1 0.01 -20 7.2 Power on 13.560154 0.000154 0.00114 11.4 0.01 + 2 min. 13.560165 0.000165 0.00122 12.2 0.01 + 5 min. 13.560163 0.000163 0.00120 12.0 0.01 + 10 min. 13.560161 0.000161 0.00119 11.9 0.01 Calculation formula: Frequency error = Measured frequency - Tested frequency Result [%] = Frequency error / Tested frequency * 100 *The test was begun from 50 deg.C and the temperature was lowered each 10 deg.C. UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124

Test report No. : 12812924H-B-R2 Page : 28 of 34 Issued date : August 21, 2019 FCC ID : AK8URXP40 APPENDIX 2: Test instruments Test Instruments Test Name LIMS ID Description Manufacturer Model Serial Last Calibration Cal Int Calibration Due Date Date FT 141561 Thermo- CUSTOM CTH-201 1401 01/11/2019 01/31/2020 12 Hygrometer FT 142523 DC Power Kikusui PMX18-2A VJ000068 - - - Supply FT 141498 Microwave ADVANTEST R5373 120100309 06/28/2018 06/30/2019 12 Counter RE 141582 Pre Amplifier SONOMA 310 260834 02/08/2019 02/29/2020 12 INSTRUMENT RE/CE 141216 Coaxial cable Fujikura/Suhner/ 5D-2W/SFM14 -/00640 07/03/2018 07/31/2019 12 TSJ /sucoform141- PE/421-010 RE 141413 Coaxial Cable UL Japan - - 06/12/2018 06/30/2019 12 RE 148897 Attenuator KEYSIGHT 8491A MY524623 12/20/2018 12/31/2019 12 49 RE 141254 Loop Antenna Rohde & HFH2-Z2 100017 10/11/2018 10/31/2019 12 Schwarz RE/CE 141949 Test Receiver Rohde & ESCI 100767 08/06/2018 08/31/2019 12 Schwarz RE 141901 Spectrum AGILENT E4440A MY482500 10/04/2018 10/31/2019 12 Analyzer 80 RE 141532 DIGITAL HIOKI 3805 51201197 01/29/2019 01/31/2020 12 HiTESTER RE 141554 Thermo- CUSTOM CTH-180 1301 01/11/2019 01/31/2020 12 Hygrometer RE 142008 AC3_Semi TDK Semi Anechoic DA-10005 06/26/2018 06/30/2020 24 Anechoic Chamber 3m Chamber(NSA) FT 141430 Temperature TABAI ESPEC PL-1KT 14007630 04/09/2019 04/30/2020 12 and Humidity Chamber FT 141547 DIGITAL HIOKI 3805 60500120 02/25/2019 02/29/2020 12 HiTESTER RE 178648 EMI TSJ TEPTO-DV - - - - measurement program RE 142183 Measure KOMELON KMC-36 - - - - FT 142645 Loop Antenna UL Japan - - - - - CE 141247 Attenuator JFW Industries, 50FP-013H2 N - 12/06/2018 12/31/2019 12 (13dB) Inc. CE 141357 LISN(AMN) Schwarzbeck NSLK8127 8127-729 07/24/2018 07/31/2019 12 RE 141424 Biconical Schwarzbeck BBA9106 1915 05/24/2019 05/31/2020 12 Antenna RE 141266 Logperiodic Schwarzbeck VUSLP9111B 911B-191 03/25/2019 03/31/2020 12 Antenna (200-1000MHz) UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124

Test report No. : 12812924H-B-R2 Page : 29 of 34 Issued date : August 21, 2019 FCC ID : AK8URXP40 *Hyphens for Last Calibration Date, Calibration Due Date and Cal Int (month) are instruments that Calibration is not required (e.g. software), or instruments checked in advance before use. The expiration date of the calibration is the end of the expired month. All equipment is calibrated with valid calibrations. Each measurement data is traceable to the national or international standards. As for some calibrations performed after the tested dates, those test equipment have been controlled by means of an unbroken chains of calibrations. Test item: CE: Conducted Emission RE: Radiated Emission FT: Frequency Tolerance UL Japan, Inc. Ise EMC Lab. 4383-326 Asama-cho, Ise-shi, Mie-ken 516-0021 JAPAN Telephone : +81 596 24 8999 Facsimile : +81 596 24 8124


Document Created: 2019-08-25 09:51:49
Document Modified: 2019-08-25 09:51:49
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