03 FCC Test Report_DXX

FCC ID: AK8DMPZ1

Test Report

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FCCID_4022453

Test report No. : 12442164S-K-R1 Page : 1 of 26 Issued date : September 20, 2018 FCC ID : AK8DMPZ1 RADIO TEST REPORT Test Report No. : 12442164S-K-R1 Applicant : Sony Corporation Type of Equipment : Digital Music Player Model No. : DMP-Z1 FCC ID : AK8DMPZ1 Test regulation : FCC Part 15 Subpart C: 2018 * NFC part Test Result : Complied 1. This test report shall not be reproduced in full or partial, without the written approval of UL Japan, Inc. 2. The results in this report apply only to the sample tested. 3. This sample tested is in compliance with the limits of the above regulation. 4. The test results in this test report are traceable to the national or international standards. 5. This test report must not be used by the customer to claim product certification, approval, or endorsement by any agency of the Federal Government. 6. This test report covers Radio technical requirements. It does not cover administrative issues such as Manual or non-Radio test related Requirements. (if applicable) 7. The all test items in this test report are conducted by UL Japan, Inc. Shonan EMC Lab. 8. The opinions and the interpretations to the result of the description in this report are outside scopes where UL Japan has been accredited. 9. This report is a revised version of 12442164S-K. 12442164S-K is replaced with this report. Date of test: August 6 to 23, 2018 Representative test engineer: Shiro Kobayashi Engineer Consumer Technology Division Approved by: Toyokazu Imamura Leader Consumer Technology Division The testing in which "Non-accreditation" is displayed is outside the accreditation scopes in UL Japan. RTL02610 There is no testing item of "Non-accreditation". UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401 13-EM-F0429

Test report No. : 12442164S-K-R1 Page : 2 of 26 Issued date : September 20, 2018 FCC ID : AK8DMPZ1 REVISION HISTORY Original Test Report No.: 12442164S-K Revision Test report No. Date Page revised Contents - (Original) 12442164S-K September 7, 2018 - - 1 12442164S-K-R1 September 20, 2018 4 Correction of Rating: from “AC 100 V - 240 V, 50 Hz / 60 Hz” to “DC 19.5 V” Correction of Radio specification from “Bluetooth BDR” to “Bluetooth BDR/EDR” Correction of modulation from “GFSK, FHSS” to “GFSK, /4-DQPSK, 8DPSK, FHSS” 8, 10 Addition of figure UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 12442164S-K-R1 Page : 3 of 26 Issued date : September 20, 2018 FCC ID : AK8DMPZ1 CONTENTS PAGE SECTION 1: Customer information.......................................................................................................4 SECTION 2: Equipment under test (E.U.T.) .........................................................................................4 SECTION 3: Test specification, procedures & results..........................................................................5 SECTION 4: Operation of E.U.T. during testing ..................................................................................7 SECTION 5: Conducted Emission ..........................................................................................................8 SECTION 6: Radiated Emission .............................................................................................................9 SECTION 7: 20 dB bandwidth & Occupied bandwidth (99 %) ........................................................12 SECTION 8: Frequency Tolerance.......................................................................................................12 APPENDIX 1: Test data ........................................................................................................................13 Conducted Emission ......................................................................................................................... 13 Radiated Emission............................................................................................................................. 14 Frequency Tolerance ......................................................................................................................... 17 20 dB Bandwidth and 99 % Occupied Bandwidth ............................................................................ 21 APPENDIX 2: Test instruments ...........................................................................................................23 APPENDIX 3: Photographs of test setup .............................................................................................24 Conducted Emission ......................................................................................................................... 24 Radiated Spurious Emission ............................................................................................................. 25 Tag used for the test as representative .............................................................................................. 26 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 12442164S-K-R1 Page : 4 of 26 Issued date : September 20, 2018 FCC ID : AK8DMPZ1 SECTION 1: Customer information Company Name : Sony Corporation Brand Name : SONY Address : 1-7-1 Konan, Minato-ku, Tokyo 108-0075, Japan SECTION 2: Equipment under test (E.U.T.) 2.1 Identification of E.U.T. Type of Equipment : Digital Music Player Model No. : DMP-Z1 Serial No. : Refer to Clause 4.2 Rating : DC 19.5 V Receipt Date of Sample : March 27, 2018 Country of Mass-production : Malaysia Condition of EUT : Engineering prototype (Not for Sale: This sample is equivalent to mass-produced items.) Modification of EUT : No Modification by the test lab. 2.2 Product Description Model: DMP-Z1 (referred to as the EUT in this report) is a Digital Music Player. Radio Specification Bluetooth BDR/EDR Radio Type : Transceiver Frequency of Operation : 2402 MHz - 2480 MHz Modulation : GFSK, /4-DQPSK, 8DPSK, FHSS Antenna type : Inverted F Antenna Gain : 1.9 dBi Clock frequency (Maximum) : 26 MHz NFC Radio Type : Transceiver Frequency of Operation : 13.56 MHz Modulation : ASK Antenna type : Loop Clock frequency (Maximum) : 27.12 MHz UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 12442164S-K-R1 Page : 5 of 26 Issued date : September 20, 2018 FCC ID : AK8DMPZ1 SECTION 3: Test specification, procedures & results 3.1 Test Specification Test Specification : FCC Part 15 Subpart C FCC Part 15 final revised on March 12, 2018 and effective April 11, 2018 Title : FCC 47 CFR Part 15 Radio Frequency Device Subpart C Intentional Radiators Section 15.207 Conducted limits Section 15.209 Radiated emission limits, general requirements Section 15.215 Additional provisions to the general radiated emission limitations. Section 15.225 Operation within the bands 13.110 - 14.010 MHz. * Also the EUT complies with FCC Part 15 Subpart B. 3.2 Procedures and results Item Test Procedure Specification Worst margin Results Remarks FCC: ANSI C63.10-2013 FCC: Section 15.207 10.3 dB Conducted Emission 6. Standard test methods Complied - (0.48757 MHz, AV, N) IC: RSS-Gen 8.8 IC: RSS-Gen 8.8 FCC: ANSI C63.10-2013 FCC: Section 15.225 (a) Electric Field Strength of 6. Standard test methods 72.0 dB (Vertical, QP) Complied Radiated Fundamental Emission IC: RSS-Gen 6.4, 6.12 IC: RSS-210 B.6 Electric Field Strength of FCC: ANSI C63.10-2013 FCC: Section 15.225 6. Standard test methods (b)(c) 45.2 dB Spurious Emission IC: RSS-Gen 6.4, 6.13 IC: RSS-210 B.6 (14.010 MHz, Complied Radiated (within the 13.110-14.010 Horizontal, QP) MHz band) Electric Field Strength of FCC: ANSI C63.10-2013 FCC: Section 15.209 6. Standard test methods Section 15.225 (d) 24.4 dB Spurious Emission IC: RSS-Gen 6.4, 6.13 IC: RSS-210 B.6 (189.83 MHz, Complied Radiated (outside of the Horizontal, QP) 13.110-14.010 MHz band) FCC: ANSI C63.10-2013 FCC: Section 15.215 (c) 20dB Bandwidth 6. Standard test methods - Complied Radiated IC: - IC: - FCC: ANSI C63.10-2013 FCC: Section 15.225 (e) Frequency tolerance 6. Standard test methods - Complied Radiated IC: RSS-Gen 6.11, 8.11 IC: RSS-210 B.6 Note: UL Japan, Inc.’s EMI Work Procedures No. 13-EM-W0420 and 13-EM-W0422. Symbols: Complied The data of this test item has enough margin, more than the measurement uncertainty. Complied# The data of this test item meets the limits unless the measurement uncertainty is taken into consideration. FCC Part 15.31 (e) This EUT provides stable voltage constantly to RF transmitter regardless of input voltage. Therefore, this EUT complies with the requirement. FCC Part 15.203 Antenna requirement It is impossible for end users to replace the antenna, because the antenna is mounted inside of the EUT. Therefore, the equipment complies with the antenna requirement of Section 15.203. 3.3 Addition to standard Item Test Procedure Specification Worst margin Results Remarks 99% Occupied Bandwidth IC: RSS-Gen 6.6 IC: - N/A - Radiated * Other than above, no addition, exclusion nor deviation has been made from the standard. UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 12442164S-K-R1 Page : 6 of 26 Issued date : September 20, 2018 FCC ID : AK8DMPZ1 3.4 Uncertainty The following uncertainties have been calculated to provide a confidence level of 95 % using a coverage factor k=2. Shonan EMC Lab. Item Frequency range Uncertainty (+/-) No. 1 SAC / SR No. 2 SAC / SR No. 3 SAC / SR No. 4 SAC / SR No. 5,6,8 SR Conducted emission (AC Mains) LISN 150 kHz-30 MHz 2.5 dB 2.5 dB 2.5 dB 2.6 dB 2.6 dB Radiated emission 9 kHz-30 MHz 3.2 dB 3.2 dB 3.3 dB - - (Measurement distance: 3 m) 30 MHz-200 MHz 4.9 dB 4.8 dB 4.9 dB - - 200 MHz-1 GHz 6.1 dB 6.1 dB 6.1 dB - - 1 GHz-6 GHz 4.7 dB 4.7 dB 4.7 dB - - 6 GHz-18 GHz 5.3 dB 5.3 dB 5.3 dB - - 18 GHz-40 GHz 5.6 dB 5.6 dB 5.6 dB - - Radiated emission 1 GHz-18 GHz 5.6 dB 5.6 dB 5.6 dB - - (Measurement distance: 1 m) 18 GHz-40 GHz 5.9 dB 5.9 dB 5.9 dB - - SAC=Semi-Anechoic Chamber SR= Shielded Room is applied besides radiated emission 3.5 Test Location UL Japan, Inc. Shonan EM C Lab. 1-22-3, M egumigaoka, Hiratsuka-shi, Kanagawa-ken 259-1220 JAPAN Telephone: +81 463 50 6400, Facsimile: +81 463 50 6401 JAB Accreditation No. RTL02610 FCC Test Firm Registration Number: 839876 M aximum IC Registration Width x Depth x Size of reference ground plane (m) / Test site measurement Number Height (m) horizontal conducting plane distance No.1 Semi-anechoic 2973D-1 20.6 x 11.3 x 7.65 20.6 x 11.3 10 m chamber No.2 Semi-anechoic 2973D-2 20.6 x 11.3 x 7.65 20.6 x 11.3 10 m chamber No.3 Semi-anechoic 2973D-3 12.7 x 7.7 x 5.35 12.7 x 7.7 5m chamber No.4 Semi-anechoic - 8.1 x 5.1 x 3.55 8.1 x 5.1 - chamber No.1 Shielded room - 6.8 x 4.1 x 2.7 6.8 x 4.1 - No.2 Shielded room - 6.8 x 4.1 x 2.7 6.8 x 4.1 - No.3 Shielded room - 6.3 x 4.7 x 2.7 6.3 x 4.7 - No.4 Shielded room - 4.4 x 4.7 x 2.7 4.4 x 4.7 - No.5 Shielded room - 7.8 x 6.4 x 2.7 7.8 x 6.4 - No.6 Shielded room - 7.8 x 6.4 x 2.7 7.8 x 6.4 - No.8 shielded room - 3.45 x 5.5 x 2.4 3.45 x 5.5 - No.1 M easurement - 2.55 x 4.1 x 2.5 - - room 3.6 Test data, Test instruments, and Test set up Refer to APPENDIX. UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 12442164S-K-R1 Page : 7 of 26 Issued date : September 20, 2018 FCC ID : AK8DMPZ1 SECTION 4: Operation of E.U.T. during testing 4.1 Operating Mode(s) Test item Operating mode Tested frequency All items except for Frequency Tolerance NFC Communication 13.56 MHz Frequency Tolerance NFC Transmitting (Unmodulated) 13.56 MHz EUT Firmware: Diagnosis ver.: 3.04.02 (TEST MODE) Power setting: Fixed The carrier level and noise levels were confirmed with and without Tag, and the test was made with the condition that has the maximum noise. Worst case: With Tag (Type F) 4.2 Configuration and peripherals : Standard Ferrite Core C or D 3 E 4 F A: EUT 1 2 or 2’ H G B AC 120 V / 60 Hz * Setup(s) were taken into consideration and test data was taken under worse case conditions. Description of EUT and Support equipment No. Item Model number Serial number Manufacturer Remarks 1000687 *1) A Digital Music Player DMP-Z1 Sony Corporation EUT 1000688 *2) B AC Adapter ACDP-045L01 1805000181 Sony Corporation - C Type A Tag - - Sony Corporation - D Type F Tag - - Sony Corporation - E Headphones MDR-1AM2 - Sony Corporation - F Headphones MDR-1AM2 - Sony Corporation - G micro SDHC card SR-8C4 TVLN003068885 Sony Corporation - H micro SDHC card SR-16C4 TPSN002554976 Sony Corporation - *1) Used for Frequency Tolerance test and Bandwidth measurement test *2) Used for Conducted Emission test and Radiated Emission test List of cables used No. Name Length (m) Shield Remarks Cable Connector 1 DC 1.4 Unshielded Unshielded - 2 AC 0.5 Unshielded Unshielded *3) 2’ AC 1.8 Unshielded Unshielded *4) 3 Audio 1.2 Unshielded Unshielded - 4 Audio 1.2 Unshielded Unshielded - *3) Used for expect for Conducted Emission test *4) Used for Conducted Emission test UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 12442164S-K-R1 Page : 8 of 26 Issued date : September 20, 2018 FCC ID : AK8DMPZ1 SECTION 5: Conducted Emission Test configuration EUT was placed on a platform of nominal size, 1.0 m by 1.5 m, raised 0.8 m above the conducting ground plane. The table is made of expanded polystyrol and expanded polypropylene and the table top is covered with polycarbonate. That has very low permittivity. The rear of tabletop was located 40 cm to the vertical conducting plane. The rear of peripherals was aligned and was flushed with rear of tabletop. All other surfaces of tabletop were at least 80 cm from any other grounded conducting surface. EUT was located 80 cm from LISN and excess AC cable was bundled in center. I/O cables that were connected to the peripherals were bundled in center. They were folded back and for the forming a bundle 30 cm to 40 cm long and were hanged at a 40 cm height to the ground plane. Each EUT current-carrying power lead, except the ground (safety) lead, was individually connected through a LISN to the input power source. Photographs of the set up are shown in APPENDIX 3. EUT Attenuator Test receiver LISN Ground plane Test procedure The AC Mains Terminal Continuous disturbance Voltage had been measured with the EUT within a Shielded room. The EUT was connected to a Line Impedance Stabilization Network (LISN). An overview sweep with peak detection has been performed. The measurements had been performed with a quasi-peak detector and if required, a CISPR average detector. The conducted emission measurements were made with the following detection of the test receiver. Detection Type : Quasi-Peak/ CISPR Average IF Bandwidth : 9 kHz Measurement range : 0.15 MHz - 30 GHz Test data : APPENDIX Test result : Pass UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 12442164S-K-R1 Page : 9 of 26 Issued date : September 20, 2018 FCC ID : AK8DMPZ1 SECTION 6: Radiated Emission Test Procedure EUT was placed on a platform of nominal size, 1.0 m by 1.5 m, raised 0.8 m above the conducting ground plane. The table is made of expanded polystyrol and expanded polypropylene and the table top is covered with polycarbonate. That has very low permittivity. The Radiated Electric Field Strength has been measured in a Semi Anechoic Chamber with a ground plane. The Radiated Electric Field Strength intensity has been measured on a semi-anechoic chamber with a ground plane at a distance of 3 m. Although these tests were performed other than open area test site, adequate comparison measurements were confirmed against 30 m open are test site. Therefore sufficient tests were made to demonstrate that the alternative site produces results that correlate with the ones of tests made in an open field based on KDB 414788. These tests were performed in semi anechoic chamber. Therefore the measured level of emissions may be higher than if measurements were made without a ground plane. However test results were confirmed to pass against standard limit. The Radiated Electric Field Strength intensity has been measured with a ground plane and at a distance of 3 m. Frequency: From 9 kHz to 30 MHz at distance 3 m (Refer to Figure 2) The EUT was rotated a full revolution in order to obtain the maximum value of the electric field intensity. The measurements were performed for vertical polarization (antenna angle: 0 deg., 45 deg., 90 deg. and 135 deg.) and horizontal polarization. Drawing of the antenna direction is shown in Figure 1. Frequency: From 30 MHz to 1 GHz at distance 3 m (Refer to Figure 2). The measuring antenna height was varied between 1 m and 4 m and EUT was rotated a full revolution in order to obtain the maximum value of the electric field intensity. The measurements were performed for both vertical and horizontal antenna polarization. Measurements were performed with QP, PK, and AV detector. The radiated emission measurements were made with the following detector function of the test receiver. 9 kHz to 90 kHz & 90 kHz to 150 kHz 490 kHz to 30 MHz to 1 GHz 110 kHz to 150 kHz 110 kHz to 490 kHz 30 MHz Detector Type PK/AV QP PK/AV QP QP IF Bandwidth 200 Hz 200 Hz 10 kHz 9 kHz 120 kHz Distance factor -80 dB -80 dB -80 dB -40 dB - *1) Measuring antenna Loop antenna Biconical (30 MHz - 199.99 MHz) Logperiodic (200 MHz - 1 GHz) *1) FCC 15.31 (f)(2) (9 kHz-30 MHz) Distance Factor: 40 x log (3 m / 300 m) = -80 dB Distance Factor: 40 x log (3 m / 30 m) = -40 dB UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 12442164S-K-R1 Page : 10 of 26 Issued date : September 20, 2018 FCC ID : AK8DMPZ1 Figure 1. Direction of the Loop Antenna Side View (Vertical) Top View (Vertical) EUT 135 deg. 90 deg. EUT 45 deg. 0 deg. Front side: 0 deg. Forward direction: clockwise Front side: 0 deg. Forward direction: clockwise Top View (Horizontal) EUT Antenna was not rotated. Figure 2. Antenna angle Radiated Emission No.3 Semi-Anechoic Chamber (Antenna angle) (Below 1GHz) 90 deg. g. de 45 Biconical Antenna 0 deg. 3m / 3t / Logperiodic Antenna TurnTable 3m Figure 3. Connection and configuration of test equipment UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 12442164S-K-R1 Page : 11 of 26 Issued date : September 20, 2018 FCC ID : AK8DMPZ1 The test results and limit are rounded off to one decimal place, so some differences might be observed. Measurement range : 9 kHz - 1 GHz Test data : APPENDIX Test result : Pass * No spurious emission from the EUT was detected. UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

Test report No. : 12442164S-K-R1 Page : 12 of 26 Issued date : September 20, 2018 FCC ID : AK8DMPZ1 SECTION 7: 20 dB bandwidth & Occupied bandwidth (99 %) Test procedure The test was measured with a spectrum analyzer using a test fixture. Test Span RBW VBW Sweep Detector Trace Instrument used 20 dB 2 to 5 times of OBW 1 to 5 % Three Auto Peak Max Hold Spectrum Bandwidth of OBW times Analyzer of RBW 99 % Enough width to display 1 to 5 % Three Auto Peak Max Hold Spectrum Occupied measured Bandwidth of Span times Analyzer Bandwidth of RBW Test data : APPENDIX Test result : Pass SECTION 8: Frequency Tolerance Test procedure The test was measured with a frequency counter using a test fixture. The temperature test was started after the temperature stabilization time of 30 minutes. The test was begun from 50 deg.C and the temperature was lowered each 10 deg.C. Test data : APPENDIX Test result : Pass UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa-ken, 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401

APPENDIX 1: Test data Test Report No. ： 12442164S-K-R1 DATA OF CONDUCTED EMISSION TEST UL Japan,Inc. Shonan EMC Lab. No.3 Shielded Room Date : 2018/08/13 Company : Sony Corporation Mode : NFC Communication Kind of EUT : Digital Music Player Order No. : 12442164S Model No. : DMP-Z1 Power : AC 120 V / 60 Hz Serial No. : 1000688 Temp./Humi. : 24 deg.C / 43 %RH Remarks : with Tag F Limit1 : FCC 15C(15.207) QP Limit2 : FCC 15C(15.207) AV Engineer : Shiro Kobayashi 80 Limit1(QP) 70 Limit2(AV) 60 N(PK) N(QP/AV) RFI Voltage [dBuV] 50 L1(PK) L1(QP/AV) 40 30 20 10 0 .2 .3 .5 .7 1 2 3 5 7 10 20 .15 30 Frequency [MHz] Reading Results Limit Margin Freq. C.Fac No. <QP> <AV> <QP> <AV> <QP> <AV> <QP> <AV> Phase Comment [MHz] [dBuV] [dBuV] [dB] [dBuV] [dBuV] [dBuV] [dBuV] [dB] [dB] 1 0.15000 35.26 23.08 12.38 47.64 35.46 66.00 56.00 18.3 20.5 N 2 0.18350 29.64 19.28 12.39 42.03 31.67 64.33 54.33 22.3 22.6 N 3 0.41267 20.08 15.15 12.42 32.50 27.57 57.59 47.59 25.0 20.0 N 4 0.48757 27.74 23.46 12.40 40.14 35.86 56.21 46.21 16.0 10.3 N 5 0.80474 8.12 2.98 12.45 20.57 15.43 56.00 46.00 35.4 30.5 N 6 13.56000 11.99 6.58 13.04 25.03 19.62 60.00 50.00 34.9 30.3 N 7 17.43000 16.91 11.75 13.21 30.12 24.96 60.00 50.00 29.8 25.0 N 8 27.12000 6.68 0.96 13.56 20.24 14.52 60.00 50.00 39.7 35.4 N 9 0.15000 36.04 22.78 12.38 48.42 35.16 66.00 56.00 17.5 20.8 L1 10 0.18364 29.09 18.29 12.39 41.48 30.68 64.32 54.32 22.8 23.6 L1 11 0.41150 17.71 12.69 12.43 30.14 25.12 57.62 47.62 27.4 22.5 L1 12 0.48649 25.67 21.36 12.41 38.08 33.77 56.23 46.23 18.1 12.4 L1 13 0.74994 6.96 1.59 12.44 19.40 14.03 56.00 46.00 36.6 31.9 L1 14 13.56000 10.95 5.77 13.04 23.99 18.81 60.00 50.00 36.0 31.1 L1 15 17.36000 16.45 11.09 13.20 29.65 24.29 60.00 50.00 30.3 25.7 L1 16 27.12000 5.99 0.16 13.56 19.55 13.72 60.00 50.00 40.4 36.2 L1 Calculation:Result[dBuV]=Reading[dBuV]+C.Fac(LISN(AMN)+Cable+ATT)[dB] LISN(AMN)=SLS-05 13 of 26

Test Report No. ： 12442164S-K-R1 Data of Electric field strength of Fundamental emission and Spurious emission within the band: FCC15.225(a)(b)(c) UL Japan, Inc. Shonan EMC Lab., No.3 Semi Anechoic Chamber Company: SONY Regulation: FCC Part15 Subpart C 15.225 Equipment: Digital Music Player Test Distance: 3m Model: DMP-Z1 Date: August 13, 2018 Sample No.: 1000688 Temperature: 21 deg.C Power: AC 120 V, 60 Hz Humidity: 55 %RH Mode: NFC Communication ENGINEER: Shiro Kobayashi Remarks: : NFC type F , Vertical polarization (antenna angle) of the worst case: 0 deg Fundamental emission No. FREQ Test Receiver Antenna Loss AMP Distance RESULT LIMIT MARGIN Reading Factor GAIN factor (30m) Hor Ver Hor Ver Hor Ver [MHz] [dBuV] [dBuV] [dB/m] [dB] [dB] [dB] [dBuV/m] [dBuV/m] [dBuV/m] [dB] [dB] 1 13.560 50.1 58.7 19.1 6.3 32.2 -40.0 3.3 11.9 83.9 80.6 72.0 Calculation:Result[dBuV/m]=Reading[dBuV]+Ant.Fac[dB/m]+Loss(Cable+ATT)[dB]-Gain(AMP)[dB]+Distance factor[dB] Distance factor: 40 x log (3 m/30 m) = -40 dB Limits (30m) ･13.553 MHz to 13.567 MHz : 83.9 dBuV/m (FCC 15.225(a)) Spurious emission within the band No. FREQ Test Receiver Antenna Loss AMP Distance RESULT LIMIT MARGIN Reading Factor GAIN factor (30m) Hor Ver Hor Ver Hor Ver [MHz] [dBuV] [dBuV] [dB/m] [dB] [dB] [dB] [dBuV/m] [dBuV/m] [dBuV/m] [dB] [dB] 1 13.110 30.9 30.7 19.2 6.3 32.2 -40.0 -15.9 -16.0 29.5 45.4 45.5 2 13.410 30.9 30.8 19.2 6.3 32.2 -40.0 -15.9 -16 40.5 56.4 56.5 3 13.553 37.7 44.8 19.1 6.3 32.2 -40.0 -9.1 -2.0 50.4 59.5 52.4 4 13.567 37.5 44.6 19.1 6.3 32.2 -40.0 -9.3 -2.2 50.4 59.7 52.6 5 13.710 30.9 30.9 19.1 6.3 32.2 -40.0 -15.9 -15.95 40.5 56.4 56.5 6 14.010 31.1 30.8 19.1 6.3 32.2 -40.0 -15.7 -16.07 29.5 45.2 45.6 Calculation:Result[dBuV/m]=Reading[dBuV]+Ant.Fac[dB/m]+Loss(Cable+ATT)[dB]-Gain(AMP)[dB]+Distance factor[dB] Outside filed strength frequencies ･Fc±7 kHz:13.553 MHz to 13.567 MHz ･Fc±150 kHz:13.410 MHz to 13.710 MHz ･Fc±450 kHz:13.110 MHz to 14.010 MHz Fc = 13.56 MHz Limits (30 m) ･13.410 MHz to 13.553 MHz and 13.567 MHz to 13.710 MHz : 50.4 dBuV/m (FCC 15.225(b)) ･13.110 MHz to 13.410 MHz and 13.710 MHz to 14.010 MHz : 40.5 dBuV/m (FCC 15.225(c)) ･Below 13.110 MHz and Above 14.010 MHz : 29.5 dBuV/m (FCC 15.225(d)and FCC 15.209) UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220 Telephone :+81 463 50 6400 Facsimile : +81 463 50 6401 14 of 26

Test Report No. ： 12442164S-K-R1 Radiated Emission UL Japan, Inc. Shonan EMC Lab. No.3 Semi Anechoic Chamber Company: SONY Regulation: FCC Part15 Subpart C 15.225 Equipment: Digital Music Player Test Distance: 3m Model: DMP-Z1 Date: August 13, 2018 Sample No.: 1000688 Temperature: 21 deg.C Power: AC 120 V, 60 Hz Humidity: 55 %RH Mode: NFC Communication ENGINEER: Shiro Kobayashi EUT axis: Below 30 MHz, NFC type F, with Tag Above 30MHz, NFC type F, with Tag Remarks: Polarity Frequency Detector Reading Ant.Fac. Loss Gain Distance Factor Result Limit Margin Height Angle Remark [MHz] [dBuV] [dB/m] [dB] [dB] [dB] [dBuV/m] [dBuV/m] [dB] [cm] [deg.] Hori. 27.12 QP 30.5 18.6 6.5 32.2 -40.0 -16.6 29.5 46.1 - 0 * Limit: 30m Hori. 189.83 QP 27.0 16.4 7.8 32.1 0.0 19.1 43.5 24.4 176 272 Hori. 216.96 QP 26.7 11.1 8.2 32.1 0.0 14.0 46.0 32.0 159 222 Hori. 230.52 QP 23.3 11.4 8.3 32.0 0.0 10.9 46.0 35.1 140 248 Hori. 244.08 QP 26.9 11.7 8.3 32.0 0.0 14.9 46.0 31.1 144 248 Hori. 325.439 QP 26.4 14.5 8.9 32.0 0.0 17.7 46.0 28.3 100 253 Hori. 352.559 QP 23.6 15.2 9.0 32.0 0.0 15.9 46.0 30.1 100 210 Hori. 360.007 QP 25.2 15.2 9.1 32.0 0.0 17.5 46.0 28.5 100 211 Hori. 461.039 QP 21.6 16.8 9.5 32.0 0.0 16.0 46.0 30.0 100 278 Vert. 27.12 QP 30.5 18.6 6.5 32.2 -40.0 -16.6 29.5 46.1 - 0 * Limit: 30m Vert. 40.680 QP 24.7 14.6 6.7 32.2 0.0 13.7 40.0 26.3 100 85 Vert. 67.800 QP 27.9 6.8 6.6 32.2 0.0 9.2 40.0 30.9 177 228 Vert. 162.719 QP 24.7 15.2 7.9 32.1 0.0 15.7 43.5 27.8 100 182 Vert. 189.839 QP 26.9 16.4 7.8 32.1 0.0 19.0 43.5 24.5 100 200 Vert. 325.44 QP 22.6 14.5 8.9 32.0 0.0 14.0 46.0 32.0 160 168 Vert. 352.56 QP 22.6 15.2 9.0 32.0 0.0 14.8 46.0 31.2 168 193 Vert. 360.01 QP 22.9 15.2 9.1 32.0 0.0 15.2 46.0 30.8 160 327 Result = Reading + Ant Factor + Loss (Cable+ATT+ΔAF(above 30 MHz)) - Gain(Amprifier) + Distance factor(below 30 MHz) * Other frequency noises omitted in this report were not seen or have enough margin (more than 20 dB). * Carrier level (Result at 3 m): Hor= 43.3 dBuV/m, Ver= 51.9 dBuV/m UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220 Telephone :+81 463 50 6400 Facsimile : +81 463 50 6401 15 of 26

Test Report No. ： 12442164S-K-R1 Radiated Emission (Worst mode plot) UL Japan, Inc. Shonan EMC Lab. No.3 Semi Anechoic Chamber Company: SONY Regulation: FCC Part15 Subpart C 15.225 Equipment: Digital Music Player Test Distance: 3m Model: DMP-Z1 Date: August 13, 2018 Sample No.: 1000688 Temperature: 21 deg.C Power: AC 120 V, 60 Hz Humidity: 55 %RH Mode: NFC Communication ENGINEER: Shiro Kobayashi EUT axis: Below 30 MHz, NFC type F, with Tag Above 30MHz, NFC type F, with Tag Remarks: These plots data contains sufficient number to show the trend of characteristic features for EUT. Spurious emission plot 90 80 70 60 50 Result [dBμV/m] 40 30 QP,AV Limit 20 PK Limit 10 Hori./QP,AV 0 Hori./PK -10 Vert./QP,AV -20 Vert./PK -30 -40 -50 -60 0.001 0.01 0.1 1 10 100 1000 Frequency [MHz] Within band plot 90 80 70 60 50 Result [dBμV/m] 40 30 20 QP Limit 10 Hori./QP 0 Vert./QP -10 -20 -30 -40 -50 -60 13 13.2 13.4 13.6 13.8 14 Frequency [MHz] UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220 Telephone :+81 463 50 6400 Facsimile : +81 463 50 6401 16 of 26

Test Report No. ： 12442164S-K-R1 Data of Frequency Tolerance UL Japan, Inc. Shonan EMC Lab. No.5 Shielded room Company SONY Equipment Digital Music Player Regulation FCC Part15 Subpart C 15.225 (e) Model DMP-Z1 Date August 6, 2018 Serial No. 1000687 Temperature 25 deg.C Power DC 19.5 V(AC Adapter Output) Humidity 43 %RH Mode NFC Transmitting(Unmodulated) ENGINEER Kazuya Noda Temperature Variation: -20deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.559927 -0.000073 -0.00054 0.010 after 2minutes 13.56 13.559929 -0.000071 -0.00052 0.010 after 5minutes 13.56 13.559922 -0.000078 -0.00058 0.010 after 10minutes 13.56 13.559920 -0.000080 -0.00059 0.010 Temperature Variation: -10deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.559986 -0.000014 -0.00010 0.010 after 2minutes 13.56 13.559987 -0.000013 -0.00010 0.010 after 5minutes 13.56 13.559985 -0.000015 -0.00011 0.010 after 10minutes 13.56 13.559982 -0.000018 -0.00013 0.010 Temperature Variation: 0deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.560014 0.000014 0.00010 0.010 after 2minutes 13.56 13.560013 0.000013 0.00010 0.010 after 5minutes 13.56 13.560014 0.000014 0.00010 0.010 after 10minutes 13.56 13.560010 0.000010 0.00007 0.010 Temperature Variation: 10deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.560019 0.000019 0.00014 0.010 after 2minutes 13.56 13.560025 0.000025 0.00018 0.010 after 5minutes 13.56 13.560020 0.000020 0.00015 0.010 after 10minutes 13.56 13.560019 0.000019 0.00014 0.010 Temperature Variation: 20deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.559990 -0.000010 -0.00007 0.010 after 2minutes 13.56 13.559996 -0.000004 -0.00003 0.010 after 5minutes 13.56 13.559997 -0.000003 -0.00002 0.010 after 10minutes 13.56 13.560003 0.000003 0.00002 0.010 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401 16 of 25

Test Report No. ： 12442164S-K-R1 Data of Frequency Tolerance Temperature Variation: 30deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.559970 -0.000030 -0.00022 0.010 after 2minutes 13.56 13.559967 -0.000033 -0.00024 0.010 after 5minutes 13.56 13.559970 -0.000030 -0.00022 0.010 after 10minutes 13.56 13.559975 -0.000025 -0.00018 0.010 Temperature Variation: 40deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.559941 -0.000059 -0.00044 0.010 after 2minutes 13.56 13.559940 -0.000060 -0.00044 0.010 after 5minutes 13.56 13.559945 -0.000055 -0.00041 0.010 after 10minutes 13.56 13.559944 -0.000056 -0.00041 0.010 Temperature Variation: 50deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.559932 -0.000068 -0.00050 0.010 after 2minutes 13.56 13.559931 -0.000069 -0.00051 0.010 after 5minutes 13.56 13.559927 -0.000073 -0.00054 0.010 after 10minutes 13.56 13.559927 -0.000073 -0.00054 0.010 Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup #VALUE! #VALUE! 0.010 after 2minutes #VALUE! #VALUE! 0.010 after 5minutes #VALUE! #VALUE! 0.010 after 10minutes #VALUE! #VALUE! 0.010 Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup #VALUE! #VALUE! 0.010 after 2minutes #VALUE! #VALUE! 0.010 after 5minutes #VALUE! #VALUE! 0.010 after 10minutes #VALUE! #VALUE! 0.010 Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup #VALUE! #VALUE! 0.010 after 2minutes #VALUE! #VALUE! 0.010 after 5minutes #VALUE! #VALUE! 0.010 after 10minutes #VALUE! #VALUE! 0.010 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401 17 of 25

Test Report No. ： 12442164S-K-R1 Data of Frequency Tolerance UL Japan, Inc. Shonan EMC Lab. No.5 Shielded room Company SONY Equipment Digital Music Player Regulation FCC Part15 Subpart C 15.225 (e) Model DMP-Z1 Date August 23, 2018 Serial No. 1000687 Temperature 26 deg.C Power DC 19.5 V(AC Adapter Output) Humidity 47 %RH Mode NFC Transmitting(Unmodulated) ENGINEER Kazuya Noda Voltage Variation: DC 16.575 V Temperature Variation: 20deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.559971 -0.000029 -0.00021 0.010 after 2minutes 13.56 13.559961 -0.000039 -0.00029 0.010 after 5minutes 13.56 13.559962 -0.000038 -0.00028 0.010 after 10minutes 13.56 13.559966 -0.000034 -0.00025 0.010 Voltage Variation: DC 22.425 V Temperature Variation: 20deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.559966 -0.000034 -0.00025 0.010 after 2minutes 13.56 13.559970 -0.000030 -0.00022 0.010 after 5minutes 13.56 13.559965 -0.000035 -0.00026 0.010 after 10minutes 13.56 13.559967 -0.000033 -0.00024 0.010 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401 18 of 25

Test Report No. ： 12442164S-K-R1 Data of Frequency Tolerance UL Japan, Inc. Shonan EMC Lab. No.5 Shielded room Company SONY Equipment Digital Music Player Regulation FCC Part15 Subpart C 15.225 (e) Model DMP-Z1 Date August 23, 2018 Serial No. 1000687 Temperature 26 deg.C Power DC 3.7V(Battery Output) Humidity 47 %RH Mode NFC Transmitting(Unmodulated) ENGINEER Kazuya Noda Voltage Variation: DC 3.145 V Temperature Variation: 20deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.559971 -0.000029 -0.00021 0.010 after 2minutes 13.56 13.559965 -0.000035 -0.00026 0.010 after 5minutes 13.56 13.559965 -0.000035 -0.00026 0.010 after 10minutes 13.56 13.559966 -0.000034 -0.00025 0.010 Voltage Variation: DC 4.255 V Temperature Variation: 20deg.C Original Measure Frequency Frequency Limit Test Conditions Frequency Frequency Error tolerance (MHz) (MHz) (MHz) (%) (%) startup 13.56 13.559966 -0.000034 -0.00025 0.010 after 2minutes 13.56 13.559966 -0.000034 -0.00025 0.010 after 5minutes 13.56 13.559971 -0.000029 -0.00021 0.010 after 10minutes 13.56 13.559971 -0.000029 -0.00021 0.010 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa 259-1220 JAPAN Telephone : +81 463 50 6400 Facsimile : +81 463 50 6401 19 of 25

Test Report No. ： 12442164S-K-R1 20dB bandwidth & 99% Occupied bandwidth: FCC 15.215 / RSS-Gen UL Japan, Inc. Shonan EMC Lab. No.5 Shielded Room Company: SONY Regulation: FCC Part15 Subpart C 15.215 Equipment: Digital Music Player Model: DMP-Z1 Date: August 6, 2018 Sample No.: 1000687 Temperature: 25 deg.C Power: DC 19.5 V(AC Adapter Output) Humidity: 43 %RH Mode: NFC Communication ENGINEER: Kazuya Noda Tag A 20 dB Bandwidth: 441.742 kHz 99 % Occupied Bandwidth: 901.091 kHz 1.60E+02 -90.577 3.00E+02 99.999 3.00E+02 99.999 3.00E+02 99.999 Tag F 20 dB Bandwidth: 455.048 kHz 99 % Occupied Bandwidth: 598.658 kHz 1.60E+02 -90.577 3.00E+02 99.999 3.00E+02 99.999 3.00E+02 99.999 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220 Telephone :+81 463 50 6400 Facsimile : +81 463 50 6401 21 of 26

Test Report No. ： 12442164S-K-R1 20dB bandwidth & 99% Occupied bandwidth: FCC 15.215 / RSS-Gen UL Japan, Inc. Shonan EMC Lab. No.5 Shielded Room Company: SONY Regulation: FCC Part15 Subpart C 15.215 Equipment: Digital Music Player Model: DMP-Z1 Date: August 6, 2018 Sample No.: 1000687 Temperature: 25 deg.C Power: DC 19.5 V(AC Adapter Output) Humidity: 43 %RH Mode: NFC Communication ENGINEER: Kazuya Noda without Tag 20 dB Bandwidth: 199.001 kHz 99 % Occupied Bandwidth: 858.070 kHz 1.60E+02 -90.577 3.00E+02 99.999 3.00E+02 99.999 3.00E+02 99.999 UL Japan, Inc. Shonan EMC Lab. 1-22-3 Megumigaoka, Hiratsuka-shi, Kanagawa, Japan 259-1220 Telephone :+81 463 50 6400 Facsimile : +81 463 50 6401 22 of 26

Test Report No. ： 12442164S-K-R1 APPENDIX 2 Test Instruments EMI test equipment Control No. Instrument Manufacturer Model No Serial No Test Item Calibration Date * Interval(month) SSA-03 Spectrum Analyzer Agilent E4448A MY48250152 FT/BW 2017/08/20 * 12 SRENT-09 Spectrum Analyzer Agilent E4440A MY46186392 FT 2017/11/08 * 12 SSCA-01 Search coil LANGER RF-R 400-1 02-0634 FT/BW Pre Check KTS-07 Digital Tester SANWA PC500 7019232 FT/BW 2017/10/11 * 12 SOS-09 Humidity Indicator A&D AD-5681 4061484 FT/BW 2017/12/21 * 12 SCH-01 Temperature and Espec PL-1KT 14020837 FT 2018/04/11 * 12 Humidity Chamber SAEC-03(NSA) Semi-Anechoic TDK SAEC-03(NSA) 3 RE 2018/06/02 * 12 Chamber SBA-03 Biconical Antenna Schwarzbeck BBA9106 91032666 RE 2018/06/17 * 12 SLA-07 Logperiodic Antenna Schwarzbeck VUSLP9111B 196 RE 2018/06/17 * 12 SAT6-13 Attenuator JFW 50HF-006N - RE 2018/02/09 * 12 SCC-C1/C2/C Coaxial Cable&RF Fujikura/Fujikura/Suhn 8D2W/12DSFA/14 -/0901-271(RF RE 2018/04/09 * 12 3/C4/C5/C10/ Selector er/Suhner/Suhner/Suh 1PE/141PE/141PE Selector) SRSE-03 ner/TOYO /141PE/NS4906 SAF-03 Pre Amplifier SONOMA 310N 290213 RE 2018/02/16 * 12 STR-08 Test Receiver Rohde & Schwarz ESW44 101581 RE, CE 2017/11/24 * 12 COTS-SEMI-1 EMI Software TSJ TEPTO-DV(RE,CE, - RE, CE - RFI,MF) SOS-05 Humidity Indicator A&D AD-5681 4062518 RE 2017/10/30 * 12 SJM-02 Measure KOMELON KMC-36 - RE, CE - STS-03 Digital Hitester Hioki 3805-50 080997823 RE, CE 2017/10/16 * 12 SLP-02 Loop Antenna Rohde & Schwarz HFH2-Z2 100218 RE 2017/10/16 * 12 SCC-C9/C10/ Coaxial Cable&RF Suhner/Suhner/TOYO RG223U/141PE/N -/0901-271(RF CE 2018/04/09 * 12 SRSE-03 Selector S4906 Selector) SLS-05 LISN Rohde & Schwarz ENV216 100516 CE 2018/02/26 * 12 SAT3-07 Attenuator JFW 50HF-003N - CE 2017/09/08 * 12 SOS-06 Humidity Indicator A&D AD-5681 4062118 CE 2017/12/21 * 12 The expiration date of the calibration is the end of the expired month. As for some calibrations performed after the tested dates, those test equipment have been controlled by means of an unbroken chains of calibrations. All equipment is calibrated with valid calibrations. Each measurement data is traceable to the national or international standards. Test Item： CE: Conducted emission, RE: Radiated emission, FT: Frequency Tolerance BW: Bandwidth measurement UL Japan, Inc. Page : 23 of 26


Document Created: 2018-09-26 07:18:52
Document Modified: 2018-09-26 07:18:52
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