Test Report Cover and Registration Radiated Emissions

FCC ID: ACLAP7B51

Test Report

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FCCID_503502

                           Exhibit 1A                                                    ACLAPT7B51




                                                                                               Page . 1
                                ENGINEERING TEST REPORT




                                                                                          Nov. 12, 2004
 Report No .      CALR—FCC—267


This is to certify that the MICROWAVE OVEN from which the following data has been
derived properly complies with the requirements of " FCC Rules and Regulations Part
18 Subpart C " as of the date the measurements were made.



1. Manufacturer of Device :                     Shanghai Matsushita Microwave Oven Company Ltd.


                                                898 Long Dong Road, Shanghai
                                                Shanghai 201203, China
2. Description of Device

  a.      FCC ID.                               :    ACLAP7B851
  b.      Model No.                             :    NN—H765SWF
  c.      Serial No.                            :    PP5002
  d.       Operating Frequency                  :    2450 MHz
  e.       Output RF Power                      :0   1250 W (BY IEC 705)
  f.      Power Consumption                     :     120 V. 60 Hz
  g.       Magnetron Type                       :    Matsushita 2M261
  h.      Employed Mode                         :    Turn table
   i.     Door Seal Type                        :    Choke


3. Measurement Procedure Used            _:   FCC/OST MP—5


4. Measurement Site

        Name                 Panasonic Magnetron Lab.
                             Panasonic Industrial Company

        Address        :     1707 N. Randall Road
                             Elgin, Illinois 60123—7847

        Description of this test facility has been filed with the FCC. (Feb. 26, 1987,
        File # 31010/EQU 4—3—0A ) Registration number 96247


                                                                Page . 2


5. Date of Measuremer      Nov. 12, 2004




6. Measurement Data        :    See Attached " Data Summary "




Tested By




Mitsuhiro Okamoto
Applications Manager of Magnetron
Panasonic Industria! Company



Document Created: 2004-12-01 14:52:46
Document Modified: 2004-12-01 14:52:46

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