HAC RF Report 4788869687-S2V2 FCC HAC_RF Emission Report

FCC ID: A3LSMA205G

Test Report

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FCCID_4196936

HAC RF EMISSIONS TEST REPORT FCC 47 CFR § 20.19 ANSI C63.19-2011 For GSM/WCDMA/LTE Phone + BT/BLE and DTS b/g/n MODEL NUMBER : SM-A205G/DS, SM-A205G FCC ID: A3LSMA205G REPORT NUMBER: 4788869687-S2V2 ISSUE DATE: 3/8/2019 Prepared for SAMSUNG ELECTRONICS CO., LTD. 129 SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 16677, KOREA Prepared by UL Korea, Ltd. 26th floor, 152, Teheran-ro, Gangnam-gu Seoul, 06236, Korea Suwon Test Site: UL Korea, Ltd. Suwon Laboratory 218 Maeyeong-ro, Yeongtong-gu, Suwon-si, Gyeonggi-do, 16675, Korea TEL: (031) 337-9902 FAX: (031) 213-5433 FAX: (510) 661-0888 TL-637

Report No.: 4788869687-S2V2 Issue Date: 3/8/2019 Revision History Rev. Date Revisions Revised By V1 2/26/2019 Initial Issue Sunghoon Kim V2 3/8/2019 Revised Sec.1, Sec.6.1, Sec.8, Sec.12 and Appendix B&C Sunghoon Kim - Updated test data in GSM1900 Page 2 of 17 UL Korea, Ltd. Suwon Laboratory UL-QP-23-10(00) This report shall not be reproduced except in full, without the written approval of UL Korea, Ltd

Report No.: 4788869687-S2V2 Issue Date: 3/8/2019 Table of Contents 1. Attestation of Test Results ............................................................................................................. 4 2. Test Methodology ........................................................................................................................... 5 3. Facilities and Accreditation ........................................................................................................... 5 4. Calibration and Uncertainty ........................................................................................................... 5 4.1. Measuring Instrument Calibration ............................................................................................... 5 4.2. Measurement Uncertainty ........................................................................................................... 6 5. System Specifications .................................................................................................................... 7 6. System Validation ........................................................................................................................... 8 6.1. System Validation Results .......................................................................................................... 9 7. Average Antenna Input Power & Evaluation for Low-power Exemption..................................... 9 8. Device Under Test......................................................................................................................... 10 8.1. Air Interfaces and Operating Mode ........................................................................................... 10 9. Modulation Interference Factor (MIF) .......................................................................................... 11 10. HAC RF Emissions Test Procedure ............................................................................................. 12 11. RF Emissions Measurement Criteria ........................................................................................... 15 12. HAC (RF Emissions) Test Results ............................................................................................... 15 12.1. Worst Case RF Emission Test Plot ........................................................................................... 16 Appendixes ......................................................................................................................................... 17 4788869687-S2V2 Appendix A: Setup Photo ...................................................................................... 17 4788869687-S2V2 Appendix B: System Validation Plots .................................................................... 17 4788869687-S2V2 Appendix C: Test Plots.......................................................................................... 17 4788869687-S2V2 Appendix D: MIF Attestation Letter........................................................................ 17 4788869687-S2V2 Appendix E: Probe Certificates ............................................................................. 17 4788869687-S2V2 Appendix F: Dipole Certificates ............................................................................. 17 4788869687-S2V2 Appendix G: UID Specifications ............................................................................ 17 Page 3 of 17 UL Korea, Ltd. Suwon Laboratory UL-QP-23-10(00) This report shall not be reproduced except in full, without the written approval of UL Korea, Ltd

Report No.: 4788869687-S2V2 Issue Date: 3/8/2019 1. Attestation of Test Results Applicant Name SAMSUNG ELECTRONICS CO.,LTD. FCC ID A3LSMA205G Model Name SM-A205G/DS, SM-A205G FCC 47 CFR § 20.19 Applicable Standards ANSI C63.19-2011 HAC Rating M3 Date Tested 2/22/2019 and 3/8/2019 Test Results Pass UL Korea, Ltd. tested the above equipment in accordance with the requirements set forth in the above standards. All indications of Pass/Fail in this report are opinions expressed by UL Korea, Ltd. based on interpretations and/or observations of test results. Measurement Uncertainties were not taken into account and are published for informational purposes only. The test results show that the equipment tested is capable of demonstrating compliance with the requirements as documented in this report.. Note: The results documented in this report apply only to the tested sample, under the conditions and modes of operation as described herein. This document may not be altered or revised in any way unless done so by UL Korea, Ltd. and all revisions are duly noted in the revisions section. Any alteration of this document not carried out by UL Korea, Ltd. will constitute fraud and shall nullify the document. This report must not be used by the client to claim product certification, approval, or endorsement by IAS, any agency of the Federal Government, or any agency of any government. Approved & Released By: Prepared By: Justin Park Sunghoon Kim Lead Test Engineer Test Engineer UL Korea, Ltd. Suwon Laboratory UL Korea, Ltd. Suwon Laboratory Page 4 of 17 UL Korea, Ltd. Suwon Laboratory UL-QP-23-10(00) This report shall not be reproduced except in full, without the written approval of UL Korea, Ltd

Report No.: 4788869687-S2V2 Issue Date: 3/8/2019 2. Test Methodology The tests documented in this report were performed in accordance with ANSI C63.19-2011 Methods of Measurement of Compatibility between Wireless Communications Devices and Hearing Aids abd FCC Published procedure KDB 285076 D01 HAC Guidance v05 KDB 285076 D03 HAC FAQ v01 TCB workshop updates 3. Facilities and Accreditation The test sites and measurement facilities used to collect data are located at Suwon SAR 2 Room (HAC) UL Korea, Ltd. is accredited by IAS, Laboratory Code TL-637. The full scope of accreditation can be viewed at http://www.iasonline.org/PDF/TL/TL-637.pdf. 4. Calibration and Uncertainty 4.1. Measuring Instrument Calibration The measuring equipment utilized to perform the tests documented in this report has been calibrated in accordance with the manufacturer's recommendations, and is traceable to recognized national standards. Name of Equipment Manufacturer Type/Model Serial No. Cal. Due Date MXG Analog Signal Generator Agilent N5181A MY50145882 8-7-2019 Power Sensor Agilent U2000A MY54260010 8-7-2019 Power Sensor Agilent U2000A MY54260007 8-7-2019 Power Amplifier EXODUS 1410025-AMP2027-10003 10003 8-8-2019 Directional Coupler Agilent 772D MY52180193 8-7-2019 Directional Coupler Agilent 778D MY52180432 8-7-2019 Low Pass Filter MICROLAB LA-15N 03943 8-7-2019 Low Pass Filter FILTRON L14012FL 1410003S 8-7-2019 Attenuator Agilent 8491B/003 MY39269292 8-7-2019 Attenuator Agilent 8491B/010 MY39269315 8-7-2019 Attenuator Agilent 8491B/020 MY39269298 8-7-2019 Data Acquisition Electronics (SAR2) SPEAG DAE4 1447 3-15-2019 E-Field Probe* SPEAG EF3DV3 4064 11-15-2019 Calibration Dipole SPEAG CD835V3 1000 1-17-2020 Calibration Dipole SPEAG CD1880V3 1000 1-17-2020 Calibration Dipole SPEAG CD2600V3 1009 1-17-2020 Radio Communication Tester R &S CMW 500 150314 8-9-2019 Note(s): *: According to SPEAG’s Technical Report, “MIF Verification”, Doc # TR-FB-12.09.04-1, issued date: 9/4/2012. E-field probes are calibrated with specified uncertainty according to ISO 17025 as described in their calibration certificate. The MIF according to the definition in ANSI C63.19 is specific for a modulation and can therefore be used as a constant value if the probe has been PMR calibrated. Page 5 of 17 UL Korea, Ltd. Suwon Laboratory UL-QP-23-10(00) This report shall not be reproduced except in full, without the written approval of UL Korea, Ltd

Report No.: 4788869687-S2V2 Issue Date: 3/8/2019 4.2. Measurement Uncertainty Uncertainty (Ci) Std. Unc.(±%) Error Description Probe Dist. Div. value (±%) E E Measurement System Probe Calibration 5.1 N 1 1 5.1 Axial Isotropy 4.7 R 1.732 1 2.7 Sensor Displacement 16.5 R 1.732 1 9.5 Boundary Effects 2.4 R 1.732 1 1.4 Phantom Boundary Effects 7.2 R 1.732 1 4.1 Linearity 4.7 R 1.732 1 2.7 Scaling to PMR Calibration 10.0 R 1.732 1 5.8 System Detection Limit 1.0 R 1.732 1 0.6 Readout Electronics 0.3 N 1 1 0.3 Response Time 0.8 R 1.732 1 0.5 Integration Time 2.6 R 1.732 1 1.5 RF Ambient Conditions 3.0 R 1.732 1 1.7 RF Reflections 12.0 R 1.732 1 6.9 Probe Positioner 1.2 R 1.732 1 0.7 Probe Positioning 4.7 R 1.732 1 2.7 Extrapolation and Interpolation 1.0 R 1.732 1 0.6 Test sample Related Test Positioning Vertical 4.7 R 1.732 1 2.7 Test Positioning Lateral 1.0 R 1.732 1 0.6 Device Holder and Phantom 2.4 R 1.732 1 1.4 Power Drift 5.0 R 1.732 1 2.9 Phantom and Setup Related Phantom Thickness 2.4 R 1.732 1 1.4 Combined Std. Uncertainty 16.3 Expanded Std. Uncertainty on Power (Coverage Factor for 95%, k = 2) 32.6 Expanded Std. Uncertainty on Field 16.3 Notesfor table 1. N - Nomal 2. R - Rectangular 3. Div. - Divisor used to obtain standard uncertainty 4. Ci - is te sensitivity coefficient Page 6 of 17 UL Korea, Ltd. Suwon Laboratory UL-QP-23-10(00) This report shall not be reproduced except in full, without the written approval of UL Korea, Ltd

Report No.: 4788869687-S2V2 Issue Date: 3/8/2019 5. System Specifications E-field measurements are performed using the DASY52 automated dosimetric assessment system. The DASY52 is made by Schmid & Partner Engineering AG (SPEAG) in Zurich, Switzerland. The DASY52 HAC Extension consists of the following parts: Test Arch Phantom The specially designed Test Arch allows high precision positioning of both the device and any of the validation dipoles. EF3DV3 Isotropic E-Field Probe Construction: One dipole parallel, two dipoles normal to probe axis Interleaved sensors Built-in shielding against static charges PEEK enclosure material Calibration: In air from 100 MHz to 3.0 GHz (absolute accuracy ±6.0%, k=2) ISO/IEC 17025 calibration service available. Frequency: 40 MHz – >6 GHz (can be extended to < 20 MHz); Linearity: ±0.2 dB (100 MHz – 3 GHz) Directivity: ± 0.2 dB in air (rotation around probe axis) ± 0.4 dB in air (rotation normal to probe axis) Dynamic Range: 2 V/m to > 1000 V/m; Linearity: ± 0.2 dB Dimensions: Overall length: 337 mm (Tip: 20 mm) Tip diameter: 3.9 mm (Body: 12 mm) Distance from probe tip to dipole centers: 1.5 mm Sensor displacement to probe's calibration point: <0.7 mm Application: General near-field measurements up to 6 GHz HAC measurements up to 6 GHz Field component measurements Fast automatic scanning in phantoms Page 7 of 17 UL Korea, Ltd. Suwon Laboratory UL-QP-23-10(00) This report shall not be reproduced except in full, without the written approval of UL Korea, Ltd

Report No.: 4788869687—52V2 Issue Date: 3/8/2019 6. System Validation The test setup was validated when first contfigured and verified periodically thereafter to ensure proper function. The procedure provided in this section is a validation procedure using dipole antennas for which the field levels were computed by numeric modeling. Procedure: Place a dipole antenna meeting the requirements given in ANSI €63.19 in the normally occupied by the WD. The dipole antenna serves as a known source for an electrical and magnetic output. Position the E—field probe so that the following occurs: The probes and their cables are parallel to the coaxial feed of the dipole antenna The probe cables and the coaxial feed of the dipole antenna approach the measurement area from opposite directions The center point of the probe element(s) is 15 mm from the closest surface of the dipole elements. Scan the length of the dipole with the E—field probe and record the two maximum values found near the dipole ends. Average the two readings and compare the reading to the expected value in the calibration certificate or the expected value in this standard. diagram Electric Field Probe 15 mm to top edge of dipole elementl RF Signal Generator |__| Amfififier RF Power Meter Page 8 of 17 UL Korea, Ltd. Suwon Laboratory UL—QP—23—10(00) This report shall not be reproduced except in full, without the written approval of UL Korea, Ltd

Report No.: 4788869687-S2V2 Issue Date: 3/8/2019 6.1. System Validation Results Max. measured from Average Deviation Target (V/m) Plot SAR Date Dipole Type_Serial #_Freq. Dipole Cal. max. above (note 1) above high end above low end (From SPEAG) No. Lab Due Data (V/m) (V/m) arm (V/m) ±% SAR 2 02-22-2019 CD835V3_SN:1000_(835MHz) 01-17-2020 105.80 104.90 105.35 110.00 -4.23 1 SAR 2 03-08-2019 CD1880V3_SN:1000_(1880MHz) 01-17-2020 95.27 92.96 94.12 88.50 6.34 2 SAR 2 02-22-2019 CD2600V3_SN:1009_(2600MHz) 01-17-2020 95.74 92.81 94.28 87.00 8.36 3 Notes: 1) Delta (Deviation) % = 100 * (Measured value minus Target value) divided by the Target value. Deltas within ±25% are acceptable, of which 12% is deviation and 13% is measurement uncertainty. 2) The maximum E-field or were evaluated and compared to the target values provided by SPEAG in the calibration certificate of specific dipoles. 3) Please refer to the appendix for detailed measurement data and plots. 7. Average Antenna Input Power & Evaluation for Low-power Exemption An RF air interface technology of a device is exempt from testing when its average antenna input power plus its MIF is ≤17 dBm for any of its operating modes. If a device supports multiple RF air interfaces, each RF air interface shall be evaluated individually. Average Antenna Worst Case MIF Input Power Air-Interface HAC Tested Note Input Power (dBm)1 (dB) plus its MIF (dBm) GSM850 33.5 3.63 37.13 Yes 1 GSM1900 30.5 3.63 34.13 Yes 1 W-CDMA Band II 24.5 -27.23 -2.73 No 1 W-CDMA Band IV 25.0 -27.23 -2.23 No 1 W-CDMA Band V 25.5 -27.23 -1.73 No 1 LTE Band 2 25.0 -9.76 15.24 No 1 LTE Band 4 25.0 -9.76 15.24 No 1 LTE Band 5 25.5 -9.76 15.74 No 1 LTE Band 12 25.5 -9.76 15.74 No 1 LTE Band 13 24.0 -9.76 14.24 No 1 LTE Band 17 25.5 -9.76 15.74 No 1 LTE Band 41 25.0 -1.44 23.56 Yes 1 LTE Band 66 25.0 -9.76 15.24 No 1 802.11b Antenna 12.0 -2.02 9.98 No 2 802.11g Antenna 12.0 0.12 12.12 No 2 802.11n Antenna 12.0 -3.15 8.85 No 2 Note(s): 1. Max tune-up limit. 2. WLAN are support to power reduction during voice call. Page 9 of 17 UL Korea, Ltd. Suwon Laboratory UL-QP-23-10(00) This report shall not be reproduced except in full, without the written approval of UL Korea, Ltd

Report No.: 4788869687-S2V2 Issue Date: 3/8/2019 8. Device Under Test Normal operation Held to head Back Cover The Back Cover is not removable S/N Notes Test sample information R38M10DAH5X RF Emission Test R38M209R72N RF Emission Test 8.1. Air Interfaces and Operating Mode Air Bands C63.19 OTT Testing Required? Power Type Simultaneous Transmitter Interface (MHz) Tested1 Name of Voice Service Reduction 850 NA VO Yes Wi-Fi, BT N/A (CMRS) GSM 1900 No Yes GPRS/EDGE VD No Wi-Fi, BT NA Google Duo 850 1700 VO No1 Wi-Fi, BT N/A (CMRS) N/A W-CDMA (UMTS) 1900 Yes HSPA VD No1 Wi-Fi, BT N/A Google Duo 700 850 Yes LTE - FDD VD No1 Wi-Fi, BT VoLTE N/A 1700 Google Duo 1900 Yes LTE - TDD 2500 VD Yes Wi-Fi, BT VoLTE N/A Google Duo Yes Wi-Fi 2450 VD No1 WWAN VoWiFi N/A Google Duo BT 2450 DT No WWAN NA NA Type Note: VO: Legacy Cellular Voice Service 1. Evaluated for MIF and low power exemption. DT: Digital Transport only (no voice) VD: IP Voice Service over Digital Transport CMRS: Commercial Mobile Radio Service BT : Bluetooth Page 10 of 17 UL Korea, Ltd. Suwon Laboratory UL-QP-23-10(00) This report shall not be reproduced except in full, without the written approval of UL Korea, Ltd

Report No.: 4788869687-S2V2 Issue Date: 3/8/2019 9. Modulation Interference Factor (MIF) The HAC Standard ANSI C63.19 defines a new scaling using the Modulation Interference Factor (MIF) which replaces the need for the Articulation Weighting Factor (AWF) during the evaluation and is applicable to any modulation scheme. The Modulation Interference factor (MIF, in dB) is added to the measured average E-field (in dBV/m) and converts it to the RF Audio Interference level (in dBV/m). This level considers the audible amplitude modulation components in the RF E-field. CW fields without amplitude modulation are assumed to not interfere with the hearing aid electronics. Modulations without time slots and low fluctuations at low frequencies have low MIF values, TDMA modulations with narrow transmission and repetition rates of few 100 Hz have high MIF values and give similar classifications as ANSI C63.19. Definitions E-field probes have a bandwidth <10 kHz and can therefore not evaluate the RF envelope in the full audio band. DASY52 is therefore using the “indirect” measurement method according to ANSI C63.19 which is the primary method. These near field probes read the averaged E-field measurement. Especially for the new high peak-to- average (PAR) signal types, the probes shall be linearized by probe modulation response (PMR) calibration in order to not overestimate the field reading. The evaluation method or the MIF is defined in ANSI C63.19 section D.7. An RMS demodulated RF signal is fed to a spectral filter (similar to an A weighting filter) and forwarded to a temporal filter acting as a quasi-peak detector. The averaged output of these filtering is called to a 1 kHz 80% AM signal as reference. MIF measurement requires additional instrumentation and is not well suited for evaluation by the end user with reasonable uncertainty It may alternatively be determined through analysis and simulation, because it is constraint and characteristic for a communication signal. DASY52 uses well defined signals for PMR calibration. The MIF of these signals has been determined by simulation and is automatically applied. MIF values were not tested by a probe or as specified in the standards but are based on analysis provided by SPEAG for all the air interfaces (GSM, WCDMA, LTE, and Wi-Fi). The data included in this report are for the worst case operating modes. The UIDs used are listed below: UID Communication System Name MIF (dB) 10021-DAC GSM-FDD (TDMA, GMSK) 3.63 10011-CAB UMTS-FDD (WCDMA) -27.23 10170-CAE LTE-FDD (SC-FDMA, 1 RB, 20 MHz, 16QAM) -9.76 10182-CAE LTE-FDD (SC-FDMA, 1 RB, 15 MHz, 16QAM) -9.76 10176-CAF LTE-FDD (SC-FDMA, 1 RB, 10 MHz, 16QAM) -9.76 10173-CAF LTE-TDD (SC-FDMA, 1 RB, 20 MHz, 16QAM) -1.44 10061-CAB IEEE 802.11b WiFi 2.4 GHz (DSSS, 11 Mbps) -2.02 10077-CAB IEEE 802.11g WiFi 2.4 GHz (DSSS/OFDM, 54 Mbps) 0.12 10069-CAC IEEE 802.11a/n WiFi 5 GHz (OFDM, 54 Mbps) -3.15 10030-CAA IEEE 802.15.1 Bluetooth (GFSK, DH1) 1.02 A PMR calibrated probe is linearized for the selected waveform over the full dynamic range within the uncertainty specified in its calibration certificate. E-field probes have a bandwidth <10 kHz and can therefore not evaluate the RF envelope in the full audio band. DASY52 is therefore using the \indirect" measurement method according to ANSI C63.19 which is the primary method. These near field probes read the averaged E-field measurement. Especially for the new high peak-to-average (PAR) signal types, the probes shall be linearized by PMR calibration in order to not overestimate the field reading. The MIF measurement uncertainty is estimated as follows, for modulation frequencies from slotted waveforms with fundamental frequency and at least 2 harmonics within 10 kHz:  0.2 dB for MIF -7 to +5 dB,  0.5 dB for MIF -13 to +11 dB  1 dB for MIF > -20 dB Page 11 of 17 UL Korea, Ltd. Suwon Laboratory UL-QP-23-10(00) This report shall not be reproduced except in full, without the written approval of UL Korea, Ltd

Report No.: 4788869687-S2V2 Issue Date: 3/8/2019 10. HAC RF Emissions Test Procedure The following are step-by-step test procedures. a) Confirm proper operation of the field probe, probe measurement system and other instrumentation and the positioning system. b) Position the WD in its intended test position. c) Set the WD to transmit a fixed and repeatable combination of signal power and modulation characteristic that is representative of the worst case (highest interference potential) encountered in normal use. Transiently occurring start-up, changeover, or termination conditions, or other operations likely to occur less than 1% of the time during normal operation, may be excluded from consideration. d) The center sub-grid shall be centered on the T-Coil mode perpendicular measurement point or the acoustic output, as appropriate. Locate the field probe at the initial test position in the 50 mm by 50 mm grid, which is contained in the measurement plane, refer to illustrated in Figure 1. If the field alignment method is used, align the probe for maximum field reception. e) Record the reading at the output of the measurement system f) Scan the entire 50 mm by 50 mm region in equally spaced increments and record the reading at each measurement point. The distance between measurement points shall be sufficient to assure the identification of the maximum reading. g) Identify the five contiguous sub-grids around the center sub-grid whose maximum reading is the lowest of all available choices. This eliminates the three sub-grids with the maximum readings. Thus, the six areas to be used to determine the WD’s highest emissions are identified. h) Identify the maximum reading within the non-excluded sub-grids identified in step g). i) Convert the highest field reading within identified in step h) to RF audio interference level, in V/m, by taking the square root of the reading and then dividing it by the measurement system transfer function, established in 5.5.1.1 Convert this result to dB(V/m) by taking the base-10 logarithm and multiplying by 20. Indirect measurement method Replacing step i), the RF audio interference level in dB (V/m) is obtained by adding the MIF (in dB) to the maximum steady-state rms field-strength reading, in dB (V/m), from step h). Use this result to determine the category rating j) Compare this RF audio interference level with the categories in Clause 8 (ANSI C63.19) and record the resulting WD category rating k) For the T-Coil mode M-rating assessment, determine whether the chosen perpendicular measurement point is contained in an included sub-grid of the first scan. If so, then a second scan is not necessary. The first scan and resultant category rating may be used for the T-Coil mode M rating. Otherwise, repeat step a) through step i), with the grid shifted so that it is centered on the perpendicular measurement point. Record the WD category rating. Page 12 of 17 UL Korea, Ltd. Suwon Laboratory UL-QP-23-10(00) This report shall not be reproduced except in full, without the written approval of UL Korea, Ltd

Report No.: 4788869687-S2V2 Issue Date: 3/8/2019 Figure 1 - WD reference and plane for RF emission measurements Page 13 of 17 UL Korea, Ltd. Suwon Laboratory UL-QP-23-10(00) This report shall not be reproduced except in full, without the written approval of UL Korea, Ltd

Report No.: 4788869687-S2V2 Issue Date: 3/8/2019 Test flowchart Per ANSI-63.19-2011 Page 14 of 17 UL Korea, Ltd. Suwon Laboratory UL-QP-23-10(00) This report shall not be reproduced except in full, without the written approval of UL Korea, Ltd

Report No.: 4788869687-S2V2 Issue Date: 3/8/2019 11. RF Emissions Measurement Criteria WD RF audio interference level caterories in logarithmic units E-field emissions Emission Categories < 960 MHz > 960 MHz Category M1 50 to 55 dB (V/m) 40 to 45 dB (V/m) Category M2 45 to 50 dB (V/m) 35 to 40 dB (V/m) Category M3 40 to 45 dB (V/m) 30 to 35 dB (V/m) Category M4 <40 dB (V/m) <30 dB (V/m) 12. HAC (RF Emissions) Test Results MIF values were not tested by a probe or as specified in the standards but are based on analysis provided by SPEAG for the following User Identifiers and air interfaces. The data included in this report are for the worst case operating modes. Refer to Appendix D and G for the MIF vales that represent the worst case operation modes. Results Results* Margin Plots Air-Interface Ch. No. Freq. (MHz) plus 0.2dB uncertaninty M-Rating (dB V/m) (dB) Page # (dB V/m) 128 824.2 34.35 34.55 5.45 M4 1 GSM850 190 836.6 34.43 34.63 5.37 M4 2 251 848.6 34.61 34.81 5.19 M4 3 512 1850.2 30.74 30.94 4.06 M3 4 GSM1900 661 1880 28.95 29.15 0.85 M4 5 810 1909.8 29.81 30.01 4.99 M3 6 39750 2506 22.13 22.33 7.67 M4 7 40185 2549.5 21.88 22.08 7.92 M4 8 LTE-TDD 40620 2593 21.08 21.28 8.72 M4 9 Band 41 41055 2636.5 19.77 19.97 10.03 M4 10 41490 2680 20.27 20.47 9.53 M4 11 W-CDMA & Refer to Section 7 Evaluation for Low-power Exemption. RF Emission testing for this device is required LTE-FDD & only for GSM voice modes and LTE-TDD. All other applicable air-interfaces are exempt from testing in M4 N/A Wi-Fi accordance with C63.19 Clause 4.4 and are rated M4. Note(s): *: Measured Audio Interference level in dB (V/m): indirect method (max rms field strength Plus MIF) Page 15 of 17 UL Korea, Ltd. Suwon Laboratory UL-QP-23-10(00) This report shall not be reproduced except in full, without the written approval of UL Korea, Ltd

Test Laboratoy: UL Kerea,Lts. Sovan Lanoratary Dare 200208 GsM 1900 Communieaton Sysen: uio 1oozt — DAC, GstFOD(TOMA,GHSH); Frequency 1802 Mz: uty Cyce: 12 oeos Phantom secton. RFSecion Dasve contguraton —Frove: EFaoN— sheooConF(, 1 1; Calbrtes: 201e—t1—15; — gensorSurtace (fa Surtce) — Eectonies DAE4 Snd47; Calbated: 20160315 — Prantom HAG Test Arch wih AMCC:Type: So HAc Por 20 — Measurement SN:DASY22, Verson 528 (8)SENMCAD X Verion146 1(r221) GSM1900 E—Field measurement/Voice_ch §12/Hearing Aid Compatibility Test (101x101X1); nrpolted grt 0000 mm, 00000 mm Device Refernce Pant 0,0,—43 mm Reterence Vae = 18 73 Vim, FowerDrt =—0.00 48 Appled ME = 303 «6 RE aucio interlrence leve= 2074 covim Emission categoy: M3 se asr Eo cass oss 3133 aBvim

Report No.: 4788869687-S2V2 Issue Date: 3/8/2019 Appendixes Refer to separated files for the following appendixes 4788869687-S2V2 Appendix A: Setup Photo 4788869687-S2V2 Appendix B: System Validation Plots 4788869687-S2V2 Appendix C: Test Plots 4788869687-S2V2 Appendix D: MIF Attestation Letter 4788869687-S2V2 Appendix E: Probe Certificates 4788869687-S2V2 Appendix F: Dipole Certificates 4788869687-S2V2 Appendix G: UID Specifications END OF REPORT Page 17 of 17 UL Korea, Ltd. Suwon Laboratory UL-QP-23-10(00) This report shall not be reproduced except in full, without the written approval of UL Korea, Ltd


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