RF Exposure report

FCC ID: 2AONI-PRO-VSKN01

RF Exposure Info

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FCCID_4001455

ORLAB REPORT No. : $Z18080155S01 _ FCC RF EXPOSURE EVALUATION REPORT APPLICANT : Vaultek Safe, Inc. PRODUCT NAME : Smart key Nano MODEL NAME : VSK—N BRAND NAME : Vaultek FCC ID : 2AONI—PRO—VSKNO1 STANDARD(S) : 470FR 21093 KDB 447498 ISSUE DATE : 2018—09—07 Gan Y(aesnt Tested by: Gan Yueming(Test engineer) Approved by: [Ef;jl Zb [ Peng Huarui (Supervisor) NOTE: This document is issued by MORLAB, the test report shall not be reproduced except in full without prior written permission of the company. The test results apply only to the particular sample(s) tested and to the specific tests carried out which is available on request for validation and information contirmed at our website. SHENZHEN MORLAB CONMMUNICATIONS TECHNOLOGY Co., Ltd. Tel: 86—755—36608555 Fax: 86—755—36600525 m @ M o RLAB rits Buising A, Fe‘vang Science Park, No.8 LongChang Road, Block67, BacAn Distrct, ShenZhen , GuangDong Province, P. R. China Hitp:wwwmortab.on E—mail: service@morlab.cn

ORLAB, REPORT No. : $Z180801559S01 «w DIRECTORY 1. TeGCANIG@L INfOFMAtIQN—— mm menneneennneeenneennerennerene en en en e reneneenn en en en en nn n a 1.1 Applicant @ahd MaNUfaCtUFEr INfOFMAtiQA mm eneennrenneenn en rens a 1.2 Equipment Under TeSt (EUT) D@SCGriDtIOQN «==— e mmemmmenmmennenennenennnennnrenneens a 1.3 PhOtOGraPRS Of the@ EUT— e emmmmememennnennenennnneennerenn en enennernnnenennenennenennn en en en 5 1.4 —Id@Ntific@tiOn Of @ll US@QU EUT m meemmemenmeennenennennnrennerninrennennrneennneennerennrnene s 6 1.5 Appligd Ref@F@NC@ DOCUM@NIS «e eeeemememennnennnennnn en enennenennnnennenennn en en en 6 2. DeVvice CategOry @Nd RF EXPOSUF@ LiMit e emmemennennennnenennenennenennnnennnnernneee 7 3. RF EXPOSUF@ EV@IUAtION «m mmmemmemnnnennenennenennnnennnenenenennnennnnennnn en en en ennen en en en 8 ANNEX A G@NQ@rAl INfOFMATION mm nnnn en en rrrenenerne en ereneneenn en en en en ernnnennn n 9 MORLAB mmbridnaFevenySoencePas,ho.stangonangRosd, .. Block87, BaoAn Distrct, Shenzhen , GuangDong Province, P. R. China TerHite:wweimorlab.on 80—755—30000005 Fax se7os—goe00ss E—mail service@morlab.on Page? or 8

ORLAB, ' REPORT No. : $Z180801559S01 Change History Date Reason for change 2018—09—07 First edition SHENZHEN MORLAB COMMUNICATIONS TECHNOLOGY Go., Ltd. Tel: 86—765—a0808555 Fax 8e—755—s0c08025 M o RLAB FL1—3, Building A, Fe/Yang Science Park, No.8 LongChang Road, Block67, BacAn Distrct, ShenZhen , GuangDong Province, P. R. China Hitp:/wwwimorlab.on E—mail service@morlab.on Paged or 8

ORLAB, REPORT No. : $Z180801559S01 «w 1. Technical Information Note: Provide by manufacturer. 1.1 Applicant and Manufacturer Information Applicant: Vaultek Safe, Inc. Applicant Address: 37 N Orange Ave.Suite 800B Orlando, FL 32801, United States Manufacturer: Jeritech Electronics, Ltd. Manufacturer Address: gsiir;nanyong Industrial Estate, Shigi Town, Panyu, GuangZhou, 1.2 Equipment Under Test (EUT) Description EUT Type: Smart key Nano Hardware Version: R12 Software Version: R12 Frequency Bands: 433.92MHz Modulation Mode: ASK Antenna Type: PCB Antenna Antenna Gain: 1.36dBi Note: 1. For a more detailed description, please refer to specification or user‘s manual supplied by the applicant and/or manufacturer SHENZHEN MORLAB COMMUNICATIONS TECHNOLOGY Co., Ltd. Tel: 86—755—36608555 Fax 8o—756—36008025 M o RLAB FL1—3, Building A, FeiYang Science Park, No.8 LongChang Road, Block67, BacAn Distrct, ShenZhen , GuangDong Province, P. R. China Hitp:/wwwimorlab.on E—mail service@morlab.on Paged or 8

ORLAB} ' REPORT No. : $Z18080155501 1.3 Photographs of the EUT 1. EUT front view uoo ooo H‘H”\H"Il Oe oacacacccca (3 S hy o oes ui m O?Loe ND mmm nM m Nmtttttumimn.—_s 2. EUT rear view o _— ~ e .— o or og oz or DOLos os oz o9 os ovr 0€ O0Z / @l imimimimiminmmmimmmml Nes3 SHENZHEN MORLAB COMMUNICATIONS TECHNOLOGY Co., Ltd Tel: 86—755—36608555 Fax: 86—755—36008525 MORLAB aisswagac FL1—3, Building A, FeiYang Science Park, No.8 LongChang Road, Block67, BacAn District, ShenZhen , GuangDong Province, P. R. China Hitp:/www morlab.cn E—mail: service@morlab.cn PageS 0f 9

ORLAB! REPORT No. : $Z18080155S01 J 1.4 Identification of all used EUT The EUT identity consists of numerical and letter characters, the letter character indicates the test sample, and the following two numerical characters indicate the software version of the test sample. EUT U. Hardware Version Software Version Identity 1# R12 R12 1.5 Applied Reference Documents Leading reference documents for testing: No. Identity Document Title 1 47 CFR§2.1093 Radio frequency Radiation Exposure Evaluation: Potable devices 2 KDB 447498 DO1v06 General RF Exposure Guidance SHENZHEN MORLAB COMMUNICATIONS TECHNOLOGY Go., Ltd. Tel: 86—755—36608555 Fax: 86—756—36608525 MORLAB FL1—3, Building A, FeiYang Science Park, No.8 LongChang Road, Block67, BaoAn District, ShenZhen , GuangDong Province, F. R. China Hitp?/wwisemorlab.on E—mail: service@morlab.on Pages or 8

ORLAB, ' REPORT No. : $Z180801559S01 2. Device Category and RF Exposure Limit Per user manual, this device is a Smart Door Lock. Based on 47CFR 2.1093, this device belongs to portable device category with General Population/Uncontrolled exposure. Portable Devices: 47CFR 2.1093(b) For purposes of this section, a portable device is defined as a transmitting device designed to be used so that the radiating structure(s) of the device is/are within 20 centimeters of the body of the user. GENERAL POPULATION / UNCONTROLLED EXPOSURE 47CFR 2.1093(d) (2) Limits for General Population/Uncontrolled exposure: 0.08 W/kg as averaged over the whole—body and spatial peak SAR not exceeding 1.6 W/kg as averaged over any 1 gram of tissue (defined as a tissue volume in the shape of a cube). Exceptions are the hands, wrists, feet and ankles where the spatial peak SAR shall not exceed 4 W/kg, as averaged over any 10 grams of tissue (defined as a tissue volume in the shape of a cube). General Population/Uncontrolled limits apply when the general public may be exposed, or when persons that are exposed as a consequence of their employment may not be fully aware of the potential for exposure or do not exercise control over their exposure. Warning labels placed on consumer devices such as cellular telephones will not be sufficient reason to allow these devices to be evaluated subject to limits for occupational/controlled exposure in paragraph (d)(1) of this section. SHENZHEN MORLAB COMMUNICATIONS TECHNOLOGY Co., Ltd. Tel: 86—755—36608555 Fax 8o—756—36008025 M o RLAB FL1—3, Building A, FeiYang Science Park, No.8 LongChang Road, Block67, BacAn Distrct, ShenZhen , GuangDong Province, P. R. China Hitp:/wwwimorlab.on E—mail service@morlab.on Page? or 8

ORLAB, ' REPORT No. : $Z180801559S01 3. RF Exposure Evaluation Guidance: 1. This device belongs to a low—power transmitter, and using with the host, so standalone SAR evaluation is required. 2. According to KDB 447498, maximum source—based time—average power will be used for calculating MPE. 3. According to KDB 447498 section 4.3.1, the 1—9 SAR test exclusion thresholds at test separation Distances s 50 mm are determined by: [{max. power of channel, including tune—up tolerance, mW)/(min. test separation distance, mm)] [Vf(GHz)] s 3.0 The maximum power of this device is 1dBm. The maximum tune—up limit power is 1.26mW @ 433.92MHz When the Smart key Nano is used on the hand, so use 5mm as the most conservative minimum test separation distance, [{max. power of channel, including tune—up tolerance, mW)/({min. test separation distance, mm)] —[Vf(GHz)] =0.17 <8.0. Therefore SAR measurement is unnecessary. SHENZHEN MORLAB COMMUNICATIONS TECHNOLOGY Co., Ltd. Tel: 86—755—36608555 Fax 8o—756—36008025 M o RLAB FL1—3, Building A, FeiYang Science Park, No.8 LongChang Road, Block67, BacAn Distrct, ShenZhen , GuangDong Province, P. R. China Hitp:/wwwimorlab.on E—mail service@morlab.on PageB or 8

ORLAB! REPORT No. : $Z18080155S01 «w Annex A General Information 1. Identification of the Responsible Testing Laboratory Company Name: Shenzhen Morlab Communications Technology Co., Ltd. Department: Morlab Laboratory Address: FL.3, Building A, FeiYang Science Park, No.8 LongChang Road, Block 67, BaoAn District, ShenZhen, GuangDong Province, P. R. China Responsible Test Lab Manager: Mr. Su Feng Telephone: +86 755 36698555 Facsimile: +86 755 36698525 2. Identification of the Responsibl e Testing Location Name: Shenzhen Morlab Communications Technology Co., Ltd. Morlab Laboratory Address: FL.3, Building A, FeiYang Science Park, No.8 LongChang Road, Block 67, BaoAn District, ShenZhen, GuangDong Province, P. R. China END OF REPORT SHENZHEN MORLAB COMMUNICATIONS TECHNOLOGY Co., Ltd. Tel: 86—755—36608555 Fax 8o—756—36008025 M o RLAB FL1—3, Building A, FeiYang Science Park, No.8 LongChang Road, Block7, BaoAn Distrct, ShenZhen , GuangDong Province, P R. China Hitp:Jwwwimorlab.on E—mai: service@morlab.cn Page® or 8


Document Created: 2018-09-10 09:37:35
Document Modified: 2018-09-10 09:37:35
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