MPE report

FCC ID: 2AG32MBS3100190

RF Exposure Info

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FCCID_4347030

TEST REPORT Reference No. .................... : WTS19S04025068W-2 FCC ID ................................ : 2AG32MBS3100190 Applicant ............................ : Baicells Technologies Co., Ltd. Address .............................. : 3F, Hui Yuan Development Building, No.1 Shangdi Information Industry Base, Haidian Dist., Beijing, China Manufacturer .................... : The same as above Address .............................. : The same as above Product............................... : LTE Base Station Model(s). ............................ : mBS31001 Brand Name ....................... : BaiCells Standards........................... : FCC 1.1307 Date of Receipt sample .... : 2019-04-23 Date of Test ....................... : 2019-04-24 to 2019-06-28 Date of Issue ...................... : 2019-07-02 Test Result ......................... : Pass Remarks: The results shown in this test report refer only to the sample(s) tested, this test report cannot be reproduced, except in full, without prior written permission of the company. The report would be invalid without specific stamp of test institute and the signatures of compiler and approver. Prepared By: Waltek Services (Shenzhen) Co., Ltd. Address: 1/F., Fukangtai Building, West Baima Road, Songgang Street, Baoan District, Shenzhen, Guangdong, China Tel :+86-755-83551033 Fax:+86-755-83552400 Compiled by: Approved by: Ford Wang / Project Engineer Philo Zhong / Manager Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn Page 1 of 9

Reference No.: WTS19S04025068W-2 Page 2 of 9 2 Laboratories Introduction Waltek Services (Shenzhen) Co., Ltd is a professional third-party testing and certification laboratory with multi-year product testing and certification experience, established strictly in accordance with ISO/IEC 17025 requirements, and accredited by ILAC (International Laboratory Accreditation Cooperation) member. A2LA (American Association for Laboratory Accreditation, the certification number is 4243.01) of USA, CNAS (China National Accreditation Service for Conformity Assessment, the registration number is L3110) of China. Meanwhile, Waltek has got recognition as registration and accreditation laboratory from EMSD (Electrical and Mechanical Services Department), and American Energy star, FCC (The Federal Communications Commission), CEC (California energy efficiency), ISED (Innovation, Science and Economic Development Canada). It’s the strategic partner and data recognition laboratory of international authoritative organizations, such as Intertek (ETL-SEMKO), TÜV Rheinland, TÜV SÜD, etc. Waltek Services (Shenzhen) Co., Ltd is one of the largest and the most comprehensive third party testing laboratory in China. Our test capability covered four large fields: safety test. Electro Magnetic Compatibility (EMC), and energy performance, wireless radio. As a professional, comprehensive, justice international test organization, we still keep the scientific and rigorous work attitude to help each client satisfy the international standards and assist their product enter into globe market smoothly. Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn

Reference No.: WTS19S04025068W-2 Page 3 of 9 Test Facility: A. Accreditations for Conformity Assessment (International) Country/Region Scope Covered By Scope Note USA FCC ID \ DOC \ VOC 1 Canada IC ID \ VOC 2 Japan MIC-T \ MIC-R - Europe EMCD \ RED - Taiwan NCC - ISO/IEC 17025 Hong Kong OFCA - Australia RCM - India WPC - Thailand NTC - Singapore IDA - Note: 1. FCC Designation No.: CN1201. Test Firm Registration No.: 523476. 2. ISED CAB identifier: CN0013 B. TCBs and Notify Bodies Recognized Testing Laboratory. Recognized Testing Laboratory of … Notify body number TUV Rheinland Intertek Optional. TUV SUD SGS Phoenix Testlab GmbH 0700 Element Materials Technology Warwick Ltd 0891 Timco Engineering, Inc. 1177 Eurofins Product Service GmbH 0681 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn

Reference No.: WTS19S04025068W-2 Page 4 of 9 3 Contents Page 1 COVER PAGE ........................................................................................................................................... 1 2 LABORATORIES INTRODUCTION ................................................................................................................... 2 3 CONTENTS ............................................................................................................................................................ 4 4 REVISION HISTORY ............................................................................................................................................ 5 5 GENERAL INFORMATION .................................................................................................................................. 6 5.1 GENERAL DESCRIPTION OF E.U.T. ................................................................................................................ 6 5.2 DETAILS OF E.U.T. ......................................................................................................................................... 6 6 TEST SUMMARY .................................................................................................................................................. 7 7 RF EXPOSURE ...................................................................................................................................................... 8 7.1 REQUIREMENTS............................................................................................................................................... 8 7.2 THE PROCEDURES / LIMIT................................................................................................................................ 8 7.3 MPE CALCULATION METHOD ......................................................................................................................... 9 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn

Reference No.: WTS19S04025068W-2 Page 5 of 9 4 Revision History Date of Date of Test report No. Receipt Date of Test Purpose Comment Approved Issue sample 2019-04-24 WTS19S04025 2019-04-23 to 2019-06- 2019-07-02 original - Valid 068W-2 28 Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn

Reference No.: WTS19S04025068W-2 Page 6 of 9 5 General Information 5.1 General Description of E.U.T. Product: LTE Base Station Model(s): mBS31001 Model Description: N/A Note: N/A 5.2 Details of E.U.T. Operation Frequency: 3655MHz~3695MHz Type of Modulation: QPSK, 16QAM, 64QAM Antenna installation: External antenna Antenna Gain: 9.0dBi Ratings: DC 48V, 1.5A Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn

Reference No.: WTS19S04025068W-2 Page 7 of 9 6 Test Summary Test Items Test Requirement Result Maximum Permissible Exposure 1.1307(b)(1) PASS (Exposure of Humans to RF Fields) Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn

Reference No.: WTS19S04025068W-2 Page 8 of 9 7 RF Exposure Test Requirement: FCC Part 1.1307 Test Mode: The EUT work in test mode(Tx). 7.1 Requirements Systems operating under the provisions of this section shall be operated in a manner that ensures that the public is not exposed to radio frequency energy levels in excess limit for maximum permissible exposure. In accordance with 47 CFR FCC Part 2 Subpart J, section 2.1091 this device has been defined as a mobile device whereby a distance of 0.2m normally can be maintained between the user and the device. 7.2 The procedures / limit FCC Part 1.1307: (A) Limits for Occupational / Controlled Exposure Magnetic Field Averaging Time Frequency Range Electric Field Power Density (S) Strength (H) |E|2,|H|2or S (MHz) Strength (E) (V/m) (mW/ cm2) (A/m) (minutes) 0.3-3.0 614 1.63 (100)* 6 3.0-30 1842 / f 4.89 / f (900 / f)* 6 30-300 61.4 0.163 1.0 6 300-1500 F/300 6 1500-100,000 5 6 (B) Limits for General Population / Uncontrolled Exposure Magnetic Field Averaging Time Frequency Range Electric Field Power Density (S) Strength (H) |E|2,|H|2 or S (MHz) Strength (E) (V/m) (mW/ cm2) (A/m) (minutes) 0.3-1.34 614 1.63 (100)* 30 1.34-30 824/f 2.19/f (180/f)* 30 30-300 27.5 0.073 0.2 30 300-1500 F/1500 30 1500-100,000 1.0 30 Note: f = frequency in MHz ; *Plane-wave equivalent power density Waltek Services (Shenzhen) Co.,Ltd. http://www.waltek.com.cn

Reference No.: WTS1950402506BW—2 Page 9 of 9 7.3 MPE Calculation Method Predication of MPE limit at a given distance m 4n‘ 8 = power densily (in appropriate units, e.g. mW/om®) P = powerinput to the antenna(in appropriate units, e.9., mW). G = power gain of the antennain the cirection of interest relative to an isotropic radiator, the power gain factor, is normally numeric gain. R = cistance to the canter of radiation of the antenna(appropriate units, e.4., or) From the peak EUT RF output power, the minimum mobile separation distance, d=40om, as well as the gain of the used antenna, the RF powerdensity can be obtained Remark ECC Part 1.1907. Mode Antenn@ Antonna Gain MaxPeak Output| Peak Output| Power Density| Limit of Power Gain (@8)| (numenic) Power(dBm) |Power (mW)| (mWiorn®) Density (mWion‘) ure 2.00 zes Ee 1esa.30 o.rze1 10 Waltek Services (Shenzhen) Co. Ltd. hilp Jwenwaltek.com.on


Document Created: 2019-07-08 03:50:03
Document Modified: 2019-07-08 03:50:03
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