RF Exposure

FCC ID: 2AANZHY-LTHR

RF Exposure Info

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FCCID_3798912

                      RF EXPOSURE
                       REPORT


                       FCC ID:2AANZHY-LTHR


                      Date of issue: Mar. 06, 2018

Report Number:               MTi180306E013


Sample Description:          Leather Pro Metallic Finish & Molded PU Look Wireless
                             Folding Headphone


Model(s):                    HY-LTHR, HY-LTHR-BLK, HY-LTHR-RSE, HY-LTHR-SLV, HY-
                             LTHR-GLD


Applicant:                   DGL Group LTD.


Address:
                             195 Raritan Center Parkway, Edison, New Jersey, United
                             States



Date of Test:                Jan. 29, 2018 to Mar. 06, 2018




                        Shenzhen Microtest Co., Ltd.
                           http://www.mtitest.com


                                                            - Page 2 of 4 -                           Report No.: MTi180306E013




                                      TEST RESULT CERTIFICATION

Applicant’s name ................. : DGL Group LTD.
Address ................................. : 195 Raritan Center Parkway, Edison, New Jersey, United States
Manufacture's Name ............ : China Etech Groups Ltd
Address ................................. : Room 3A15, Floor4, Block C, Bao Yuan HuaFeng Headquater,
                                            Economy Building, Xixiang Road, Baoan District, Shenzhen
Product description
Product name ............................: Leather Pro Metallic Finish & Molded PU Look Wireless Folding
                                           Headphone

Trademark:                                  HYPE

Model and/or type reference . : HY-LTHR

Serial Model ...............................: HY-LTHR-BLK, HY-LTHR-RSE, HY-LTHR-SLV, HY-LTHR-GLD

RF Exposure Procedures ....... : KDB 447498 D01 v06


This device described above has been tested by Shenzhen Microtest Co., Ltd and the test results
show that the equipment under test (EUT) is in compliance with the FCC requirements. And it is
applicable only to the tested sample identified in the report.




                     Tested by:

                                                                     Amy Lu                              Mar. 06, 2018


                   Reviewed by:


                                                                     Blue Zheng                          Mar. 06 2018

                 Approved by:

                                                                     Smith Chen                          Mar. 06, 2018




This test report is valid for the tested samples only. It cannot be reproduced except in full without prior written consent of Shenzhen
Microtest Co., Ltd.

  Tel:(86-755)88850135            Fax: (86-755) 88850136                   Web: http://www.mtitest.com           E-mail: mti@51mti.com
  Address: No.102A & 302A, East Block, Hengfang Industrial Park, Xingye Road, Xixiang, Bao'an District, Shenzhen, Guangdong, China


                                                            - Page 3 of 4 -                           Report No.: MTi180306E013


1. Standalone SAR test exclusion considerations
Unless specifically required by the published RF exposure KDB procedures, standalone 1-g head or
body and 10-g extremity SAR evaluation for general population exposure conditions, by measurement
or numerical simulation, is not required when the corresponding SAR Test Exclusion Threshold
condition(s), listed below, is (are) satisfied.
These test exclusion conditions are based on source-based time-averaged maximum conducted
output power of the RF channel requiring evaluation, adjusted for tune-up tolerance, and the minimum
test separation distance required for the exposure conditions.
The minimum test separation distance defined in 4.1 f) is determined by the smallest distance from
the antenna and radiating structures or outer surface of the device, according to the host form factor,
exposure conditions and platform requirements, to any part of the body or extremity of a user or
bystander.
To qualify for SAR test exclusion, the test separation distances applied must be fully explained and
justified, typically in the SAR measurement or SAR analysis report, by the operating configurations
and exposure conditions of the transmitter and applicable host platform requirements, according to
the required published RF exposure KDB procedures.
When no other RF exposure testing or reporting are required, a statement of justification and
compliance must be included in the equipment approval, in lieu of the SAR report, to qualify for SAR
test exclusion.
When required, the device specific conditions described in the other published RF exposure KDB
procedures must be satisfied before applying these SAR test exclusion provisions.
a)    For 100 MHz to 6 GHz and test separation distances ≤ 50 mm, the 1-g and 10-g SAR test
      exclusion thresholds are determined by the following:
[(max. power of channel, including tune-up tolerance, mW) / (min. test separation distance,
mm)] · [√f(GHz)] ≤ 3.0 for 1-g SAR, and ≤ 7.5 for 10-g extremity SAR,where
      f(GHz) is the RF channel transmit frequency in GHz
      Power and distance are rounded to the nearest mW and mm before calculation
      The result is rounded to one decimal place for comparison
      The values 3.0 and 7.5 are referred to as numeric thresholds in step b) below
The test exclusions are applicable only when the minimum test separation distance is ≤ 50 mm, and
for transmission frequencies between 100 MHz and 6 GHz. When the minimum test separation
distance is < 5 mm, a distance of 5 mm according to 4.1 f) is applied to determine SAR test exclusion.

b)    For 100 MHz to 6 GHz and test separation distances > 50 mm, the 1-g and 10-g SAR test
      exclusion thresholds are determined by the following (also illustrated in Appendix B):
       1)    {[Power allowed at numeric threshold for 50 mm in step a)] + [(test separation distance – 50
             mm)·(f(MHz)/150)]} mW, for 100 MHz to 1500 MHz
         2) {[Power allowed at numeric threshold for 50 mm in step a)] + [(test separation distance – 50
             mm)·10]} mW, for > 1500 MHz and ≤ 6 GHz
c)    For frequencies below 100 MHz, the following may be considered for SAR test exclusion (also
      illustrated in Appendix C):
       1)    For test separation distances > 50 mm and < 200 mm, the power threshold at the
             corresponding test separation distance at 100 MHz in step b) is multiplied by [1 +
             log(100/f(MHz))]
       2)    For test separation distances ≤ 50 mm, the power threshold determined by the equation in c)
             1) for 50 mm and 100 MHz is multiplied by ½
This test report is valid for the tested samples only. It cannot be reproduced except in full without prior written consent of Shenzhen
Microtest Co., Ltd.

  Tel:(86-755)88850135            Fax: (86-755) 88850136                   Web: http://www.mtitest.com           E-mail: mti@51mti.com
  Address: No.102A & 302A, East Block, Hengfang Industrial Park, Xingye Road, Xixiang, Bao'an District, Shenzhen, Guangdong, China


                                                            - Page 4 of 4 -                           Report No.: MTi180306E013

      3) SAR measurement procedures are not established below 100 MHz.
When SAR test exclusion cannot be applied, a KDB inquiry is required to determine SAR evaluation
requirements for any SAR test results below 100 MHz to be acceptable.



2. SAR Test Exclucsion Thresholds
According to the KDB 447498 D01 v06
The SAR Exclusion Threshold Level:

= 3.0 × (d) ÷        f

= 3.0 × 5 ÷        2.480 mW

= 9.53 mW

Where,

    f is the RF channel transmit frequency in GHz
    d is min. test separation distance in mm (5mm)
Therefore

Source-based time-averaged Conducted output power is 0.53mW < 9.53mW

So the transmitter complies with the RF exposure requirements and the SAR is not required




                                                      ----END OF REPORT----




This test report is valid for the tested samples only. It cannot be reproduced except in full without prior written consent of Shenzhen
Microtest Co., Ltd.

  Tel:(86-755)88850135            Fax: (86-755) 88850136                   Web: http://www.mtitest.com           E-mail: mti@51mti.com
  Address: No.102A & 302A, East Block, Hengfang Industrial Park, Xingye Road, Xixiang, Bao'an District, Shenzhen, Guangdong, China



Document Created: 2018-03-21 08:52:47
Document Modified: 2018-03-21 08:52:47

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