MG3-2010

FCC ID

Equipment:

Universal Electronics Inc -2010

201 East Sandpointe Ave, 8th Floor, Santa Ana, CA 92707 United States

Application
Frequency Range
Final Action Date
Granted
z5fJQlSiDOf2dL4VPyOdlw==
369.5-394.3
2011-05-19
APPROVED
File NameDocument TypeDateDirect
Duty Cycle Plots Part 4Test Report 2011-05-19 00:00:00 pdf
Duty Cycle Plots Part 3Test Report 2011-05-19 00:00:00 pdf
Duty Cycle Plots Part 2Test Report 2011-05-19 00:00:00 pdf
Duty Cycle Plots Part 1Test Report 2011-05-19 00:00:00 pdf
User ManualUsers Manual 2011-05-19 00:00:00 pdf
Test Setup PhotosTest Setup Photos 2011-05-19 00:00:00 pdf
Test ReportTest Report 2011-05-19 00:00:00 pdf
Internal PhotosInternal Photos 2011-05-19 00:00:00 pdf
FCC ID Label and Location Part 2ID Label/Location Info 2011-05-19 00:00:00 pdf
FCC ID Label and Location Part 1ID Label/Location Info 2011-05-19 00:00:00 pdf
External PhotosExternal Photos 2011-05-19 00:00:00 pdf
CorrespondenceCover Letter(s) 2011-05-19 00:00:00 pdf
Confidentiality Request LetterCover Letter(s) 2011-05-19 00:00:00 pdf
No duplicate submittal letterAttestation Statements 2011-05-19 00:00:00 pdf
Letter of Authority and Anti-Drug Abuse LetterAttestation Statements 2011-05-19 00:00:00 pdf
Block DiagramBlock Diagram N/A
Operational DescriptionOperational Description N/A
SchematicsSchematics N/A

Application Details:

EquipmentEchoStar Semtech SX1241 Remote 2011
FRN0013581079
Grantee CodeMG3
Product Code-2010
Applicant BusinessUniversal Electronics Inc
Business Address201 East Sandpointe Ave, 8th Floor , Santa Ana,California United States 92707
TCB ScopeA1: Low Power Transmitters below 1 GHz (except Spread Spectrum), Unintentional Radiators, EAS (Part 11) & Consumer ISM devices
TCB Email[email protected]
ApplicantJesse Mendez – Sr. Electrical Core Engineer
Applicant Phone 9701
Applicant Fax714-918-4100
Applicant Email[email protected]
Applicant MailStop
Test FirmCompatible Electronics, Inc.
Test Firm ContactJeff Klinger
Test Firm Phone
Test Firm Fax7145791850
Test Firm Email[email protected]
Certified ByKyle Fujimoto – Test Engineer

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