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United States Patent | 5,329,471 |
Swoboda , et al. | July 12, 1994 |
An emulation device including a serial scan testability interface having at least first and second scan paths, and state machine circuitry connected and responsive to said second scan path generally operable for emulation control of logical circuitry associated with said emulation device.
Inventors: | Swoboda; Gary L. (Sugar Land, TX), Daniels; Martin D. (Houston, TX), Coomes; Joseph A. (Missouri City, TX) |
Assignee: |
Texas Instruments Incorporated
(Dallas,
TX)
|
Appl. No.: | 08/084,787 |
Filed: | June 29, 1993 |
Application Number | Filing Date | Patent Number | Issue Date | ||
911250 | Jul., 1992 | ||||
387549 | Jul., 1989 | ||||
093463 | Sep., 1987 | ||||
057078 | Jun., 1987 | 4860290 | Jun., 1987 | ||
Current U.S. Class: | 703/23 ; 703/13; 714/28; 714/30; 714/727; 714/E11.15; 714/E11.167; 714/E11.168; 714/E11.216 |
Current International Class: | G01R 31/3185 (20060101); G01R 31/28 (20060101); G06F 11/22 (20060101); G06F 11/36 (20060101); G06F 11/26 (20060101); G06F 9/45 (20060101); G06F 11/00 (20060101); G06F 11/34 (20060101); G06F 11/32 (20060101); G06F 015/20 () |
Field of Search: | 364/578,579,580 371/16.1,16.2,22.3 395/500 |
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